JPS5759256A - Temperature test system - Google Patents

Temperature test system

Info

Publication number
JPS5759256A
JPS5759256A JP55133788A JP13378880A JPS5759256A JP S5759256 A JPS5759256 A JP S5759256A JP 55133788 A JP55133788 A JP 55133788A JP 13378880 A JP13378880 A JP 13378880A JP S5759256 A JPS5759256 A JP S5759256A
Authority
JP
Japan
Prior art keywords
air
temperature
discharge
damper
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55133788A
Other languages
Japanese (ja)
Other versions
JPS6125171B2 (en
Inventor
Kunihiro Ueshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55133788A priority Critical patent/JPS5759256A/en
Publication of JPS5759256A publication Critical patent/JPS5759256A/en
Publication of JPS6125171B2 publication Critical patent/JPS6125171B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To save the energy, by using effectively the heat generated from a device itself to be tested. CONSTITUTION:In the state of a normal operation of a device 1 to be tested, the air within a room or the cooled air given from the area under the floor is inhaled by a fan 12 and discharged to a discharge duct through a discharge port 14. In the case of a test at a high temperature, the air is circulated as shown by an arrow mark by an air circulator to increase the temperature. In this case, a heater 24 can be used to accelerate the increase of the temperature. When the temperature is increased too high, the air circulating path is closed by a damper 25 to discharge the air by a discharge fan 27. Then a damper 26 is opened to inhale the air within the room.
JP55133788A 1980-09-26 1980-09-26 Temperature test system Granted JPS5759256A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55133788A JPS5759256A (en) 1980-09-26 1980-09-26 Temperature test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55133788A JPS5759256A (en) 1980-09-26 1980-09-26 Temperature test system

Publications (2)

Publication Number Publication Date
JPS5759256A true JPS5759256A (en) 1982-04-09
JPS6125171B2 JPS6125171B2 (en) 1986-06-14

Family

ID=15113015

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55133788A Granted JPS5759256A (en) 1980-09-26 1980-09-26 Temperature test system

Country Status (1)

Country Link
JP (1) JPS5759256A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2536518A1 (en) * 1982-11-19 1984-05-25 Thomson Csf Mat Tel Heating enclosure for temperature testing of terminals.
JPS59206208A (en) * 1983-05-09 1984-11-22 Bridgestone Corp Pneumatic tire suitable for ice-snow road
JPS61165649A (en) * 1984-12-11 1986-07-26 Fujitsu Ltd Temperature testing apparatus
JPH0310272U (en) * 1989-06-16 1991-01-31
CN113514969A (en) * 2021-07-07 2021-10-19 福建省德盈电子有限公司 Aging test device for manufacturing liquid crystal display module and using method thereof

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2536518A1 (en) * 1982-11-19 1984-05-25 Thomson Csf Mat Tel Heating enclosure for temperature testing of terminals.
JPS59206208A (en) * 1983-05-09 1984-11-22 Bridgestone Corp Pneumatic tire suitable for ice-snow road
JPS61165649A (en) * 1984-12-11 1986-07-26 Fujitsu Ltd Temperature testing apparatus
JPH0310272U (en) * 1989-06-16 1991-01-31
CN113514969A (en) * 2021-07-07 2021-10-19 福建省德盈电子有限公司 Aging test device for manufacturing liquid crystal display module and using method thereof
CN113514969B (en) * 2021-07-07 2023-09-15 福建省德盈电子有限公司 Aging test device for manufacturing liquid crystal display module and application method thereof

Also Published As

Publication number Publication date
JPS6125171B2 (en) 1986-06-14

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