JPS576343A - Apparatus for chemical analysis - Google Patents

Apparatus for chemical analysis

Info

Publication number
JPS576343A
JPS576343A JP7979780A JP7979780A JPS576343A JP S576343 A JPS576343 A JP S576343A JP 7979780 A JP7979780 A JP 7979780A JP 7979780 A JP7979780 A JP 7979780A JP S576343 A JPS576343 A JP S576343A
Authority
JP
Japan
Prior art keywords
measured
sample
time
result
standard
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7979780A
Other languages
Japanese (ja)
Other versions
JPS6348301B2 (en
Inventor
Takashi Shiraishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP7979780A priority Critical patent/JPS576343A/en
Publication of JPS576343A publication Critical patent/JPS576343A/en
Publication of JPS6348301B2 publication Critical patent/JPS6348301B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)

Abstract

PURPOSE:To give warning at the time of holding an error in a result, by taking two measuring points and deciding the propriety of the result of analysis from a ratio of measured values of standard sample and sample to be measured at said points. CONSTITUTION:A changeover switch 2a is connected to a (a) at measuring time of standard sample and measured value at a time after the elapse of set time from a measuring part 1 is stored in a standard value storage part 3 after injection of reaction reagent. The switch 2a is then switched to (c) and the measured value at a time after the elapse of another set time is stored in a standard value storage part 3a. The switch 2a is connected to (b) in the case of sample to be measured and the measurements are carried out two times in the same way to give the measured value to an operation part 4. A ratio of data of the standard sample and sample to be measured at each point of time is obtained by the part 4 and the data are compared with each other. The result of analysis is then decided as right when the data are in the near range with each other. In this way, the result of decision of correction of errors together with that of the analysis of sample to be measured are displayed on an output part 6.
JP7979780A 1980-06-13 1980-06-13 Apparatus for chemical analysis Granted JPS576343A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7979780A JPS576343A (en) 1980-06-13 1980-06-13 Apparatus for chemical analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7979780A JPS576343A (en) 1980-06-13 1980-06-13 Apparatus for chemical analysis

Publications (2)

Publication Number Publication Date
JPS576343A true JPS576343A (en) 1982-01-13
JPS6348301B2 JPS6348301B2 (en) 1988-09-28

Family

ID=13700200

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7979780A Granted JPS576343A (en) 1980-06-13 1980-06-13 Apparatus for chemical analysis

Country Status (1)

Country Link
JP (1) JPS576343A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5777948A (en) * 1980-10-31 1982-05-15 Jeol Ltd Chemical analyzing method
JPH0278947A (en) * 1988-09-14 1990-03-19 Hitachi Ltd Deterioration inspection method and device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50152795A (en) * 1974-05-29 1975-12-09
JPS5110995A (en) * 1974-07-17 1976-01-28 Hikari Densokuki Kk SOKUTEIKITONIMOCHIIURU ANTEITENJIDOKENSHUTSUKAIROSOCHI
JPS5199591A (en) * 1975-02-28 1976-09-02 Nippon Kogaku Kk KAGAKUHANNOSOKUDOSOKUTEISOCHI
JPS53133480A (en) * 1977-04-27 1978-11-21 Jeol Ltd Apparatus for chemical analysis
JPS53133489A (en) * 1977-04-27 1978-11-21 Jeol Ltd Apparatus for chemical analysis

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50152795A (en) * 1974-05-29 1975-12-09
JPS5110995A (en) * 1974-07-17 1976-01-28 Hikari Densokuki Kk SOKUTEIKITONIMOCHIIURU ANTEITENJIDOKENSHUTSUKAIROSOCHI
JPS5199591A (en) * 1975-02-28 1976-09-02 Nippon Kogaku Kk KAGAKUHANNOSOKUDOSOKUTEISOCHI
JPS53133480A (en) * 1977-04-27 1978-11-21 Jeol Ltd Apparatus for chemical analysis
JPS53133489A (en) * 1977-04-27 1978-11-21 Jeol Ltd Apparatus for chemical analysis

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5777948A (en) * 1980-10-31 1982-05-15 Jeol Ltd Chemical analyzing method
JPH0278947A (en) * 1988-09-14 1990-03-19 Hitachi Ltd Deterioration inspection method and device

Also Published As

Publication number Publication date
JPS6348301B2 (en) 1988-09-28

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