JPS5764151A - Ae monitor - Google Patents
Ae monitorInfo
- Publication number
- JPS5764151A JPS5764151A JP55139892A JP13989280A JPS5764151A JP S5764151 A JPS5764151 A JP S5764151A JP 55139892 A JP55139892 A JP 55139892A JP 13989280 A JP13989280 A JP 13989280A JP S5764151 A JPS5764151 A JP S5764151A
- Authority
- JP
- Japan
- Prior art keywords
- circuits
- output
- discriminating
- signal
- discrimination
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012935 Averaging Methods 0.000 abstract 1
- 230000004069 differentiation Effects 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
PURPOSE:To obtain an AE monitor which has no possibility for producing errors in time difference by providing AE discriminating circuits which discriminate the beginning of the rise of AE waves. CONSTITUTION:The outputs of sensors S1-S3 are applied respectively via amplifieres 21-23, 31-33 to AE discriminating circuits 41-43, and the outputs of the circuits 41-43 are measured with a time difference measuring device 5, the results of measurement whereof are applied to a display device 7. In the circuits 41-43, the input signals are subjected to envelope detecting 8, averaging 9, and differentiating 10, 11, and an FF16 is turned of on discriminating 12 that the averaged signal exceeds the threshold value, Also, a signal is generated by the discrimination 13 that the discriminated output is positive, and a signal is generated by the discrimination 14 that the output of the differentiation 11 is positive. The FF16 is turned on by the output of the AND15 of the respectively produced signals.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55139892A JPS5764151A (en) | 1980-10-08 | 1980-10-08 | Ae monitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55139892A JPS5764151A (en) | 1980-10-08 | 1980-10-08 | Ae monitor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5764151A true JPS5764151A (en) | 1982-04-19 |
Family
ID=15256029
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55139892A Pending JPS5764151A (en) | 1980-10-08 | 1980-10-08 | Ae monitor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5764151A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62144011A (en) * | 1985-12-18 | 1987-06-27 | Hitachi Constr Mach Co Ltd | Apparatus for measuring reflected wave signal of ultrasonic wave |
| JPH01292873A (en) * | 1988-05-20 | 1989-11-27 | Nec Corp | Laser device oscillation frequency stabilization |
| JP2018084507A (en) * | 2016-11-24 | 2018-05-31 | 株式会社Ihi検査計測 | Reinforcement corrosion AE detection method and equipment |
-
1980
- 1980-10-08 JP JP55139892A patent/JPS5764151A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62144011A (en) * | 1985-12-18 | 1987-06-27 | Hitachi Constr Mach Co Ltd | Apparatus for measuring reflected wave signal of ultrasonic wave |
| JPH01292873A (en) * | 1988-05-20 | 1989-11-27 | Nec Corp | Laser device oscillation frequency stabilization |
| JP2018084507A (en) * | 2016-11-24 | 2018-05-31 | 株式会社Ihi検査計測 | Reinforcement corrosion AE detection method and equipment |
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