JPS5771164A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS5771164A
JPS5771164A JP55147831A JP14783180A JPS5771164A JP S5771164 A JPS5771164 A JP S5771164A JP 55147831 A JP55147831 A JP 55147831A JP 14783180 A JP14783180 A JP 14783180A JP S5771164 A JPS5771164 A JP S5771164A
Authority
JP
Japan
Prior art keywords
layer
type
resistor
region
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55147831A
Other languages
Japanese (ja)
Inventor
Tsunenori Yamauchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55147831A priority Critical patent/JPS5771164A/en
Publication of JPS5771164A publication Critical patent/JPS5771164A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00Resistors, capacitors or inductors
    • H10D1/40Resistors
    • H10D1/43Resistors having PN junctions

Landscapes

  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To make a high-resistor element with a small occupied are by an N-P-N transistor process by a method wherein a one conductivity-type and high-concentration layer is diffused to reverse conductivity-type epitaxial layer provided on a substrate with the one conductivity-type from the position deviated in the transverse direction of the substrate side and the surface side. CONSTITUTION:After forming a P type impurity region 18 used as a diffusion source from a substrate side by ion implantation on a P type substrate 11 by an isolation region formation process, an N type epitaxial layer 12 is grown and the implantation region is simultaneously diffused upwards. Next, a P<+> diffusion layer 13A is formed on the surface of the layer 12 at the position alternatively offset from the diffusion layer 18 by a process diffusing a P<+> layer 13 demarcating the isolation region. Next, electrodes 16, 17 are provided by forming an N<+> region 14 on the layer 12 by a collector contact formation process, for example and a nearly U- shaped N type resistor layer is formed between the electrodes 16, 17. In this way, effective length of resistor can be increased comparing with normal pinch resistor and resistor element having a high resistance value can be made with a small area.
JP55147831A 1980-10-22 1980-10-22 Semiconductor device Pending JPS5771164A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55147831A JPS5771164A (en) 1980-10-22 1980-10-22 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55147831A JPS5771164A (en) 1980-10-22 1980-10-22 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS5771164A true JPS5771164A (en) 1982-05-01

Family

ID=15439222

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55147831A Pending JPS5771164A (en) 1980-10-22 1980-10-22 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS5771164A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2570545A1 (en) * 1984-09-17 1986-03-21 Sgs Microelettronica Spa SEMICONDUCTOR DEVICE WITH UNDERGROUND RESISTANCE
JPS61150363A (en) * 1984-12-25 1986-07-09 Sony Corp Manufacture of semiconductor device
JPS63271964A (en) * 1987-04-28 1988-11-09 Nippon Denso Co Ltd Integrated resistance
JPH04365378A (en) * 1991-06-13 1992-12-17 Nec Corp Semiconductor integrated circuit
JP2018074106A (en) * 2016-11-04 2018-05-10 アイシン精機株式会社 Semiconductor device manufacturing method and chip having semiconductor device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2570545A1 (en) * 1984-09-17 1986-03-21 Sgs Microelettronica Spa SEMICONDUCTOR DEVICE WITH UNDERGROUND RESISTANCE
JPS61150363A (en) * 1984-12-25 1986-07-09 Sony Corp Manufacture of semiconductor device
JPS63271964A (en) * 1987-04-28 1988-11-09 Nippon Denso Co Ltd Integrated resistance
JPH04365378A (en) * 1991-06-13 1992-12-17 Nec Corp Semiconductor integrated circuit
JP2018074106A (en) * 2016-11-04 2018-05-10 アイシン精機株式会社 Semiconductor device manufacturing method and chip having semiconductor device

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