JPS5771164A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS5771164A JPS5771164A JP55147831A JP14783180A JPS5771164A JP S5771164 A JPS5771164 A JP S5771164A JP 55147831 A JP55147831 A JP 55147831A JP 14783180 A JP14783180 A JP 14783180A JP S5771164 A JPS5771164 A JP S5771164A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- type
- resistor
- region
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/40—Resistors
- H10D1/43—Resistors having PN junctions
Landscapes
- Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To make a high-resistor element with a small occupied are by an N-P-N transistor process by a method wherein a one conductivity-type and high-concentration layer is diffused to reverse conductivity-type epitaxial layer provided on a substrate with the one conductivity-type from the position deviated in the transverse direction of the substrate side and the surface side. CONSTITUTION:After forming a P type impurity region 18 used as a diffusion source from a substrate side by ion implantation on a P type substrate 11 by an isolation region formation process, an N type epitaxial layer 12 is grown and the implantation region is simultaneously diffused upwards. Next, a P<+> diffusion layer 13A is formed on the surface of the layer 12 at the position alternatively offset from the diffusion layer 18 by a process diffusing a P<+> layer 13 demarcating the isolation region. Next, electrodes 16, 17 are provided by forming an N<+> region 14 on the layer 12 by a collector contact formation process, for example and a nearly U- shaped N type resistor layer is formed between the electrodes 16, 17. In this way, effective length of resistor can be increased comparing with normal pinch resistor and resistor element having a high resistance value can be made with a small area.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55147831A JPS5771164A (en) | 1980-10-22 | 1980-10-22 | Semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55147831A JPS5771164A (en) | 1980-10-22 | 1980-10-22 | Semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5771164A true JPS5771164A (en) | 1982-05-01 |
Family
ID=15439222
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55147831A Pending JPS5771164A (en) | 1980-10-22 | 1980-10-22 | Semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5771164A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2570545A1 (en) * | 1984-09-17 | 1986-03-21 | Sgs Microelettronica Spa | SEMICONDUCTOR DEVICE WITH UNDERGROUND RESISTANCE |
| JPS61150363A (en) * | 1984-12-25 | 1986-07-09 | Sony Corp | Manufacture of semiconductor device |
| JPS63271964A (en) * | 1987-04-28 | 1988-11-09 | Nippon Denso Co Ltd | Integrated resistance |
| JPH04365378A (en) * | 1991-06-13 | 1992-12-17 | Nec Corp | Semiconductor integrated circuit |
| JP2018074106A (en) * | 2016-11-04 | 2018-05-10 | アイシン精機株式会社 | Semiconductor device manufacturing method and chip having semiconductor device |
-
1980
- 1980-10-22 JP JP55147831A patent/JPS5771164A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2570545A1 (en) * | 1984-09-17 | 1986-03-21 | Sgs Microelettronica Spa | SEMICONDUCTOR DEVICE WITH UNDERGROUND RESISTANCE |
| JPS61150363A (en) * | 1984-12-25 | 1986-07-09 | Sony Corp | Manufacture of semiconductor device |
| JPS63271964A (en) * | 1987-04-28 | 1988-11-09 | Nippon Denso Co Ltd | Integrated resistance |
| JPH04365378A (en) * | 1991-06-13 | 1992-12-17 | Nec Corp | Semiconductor integrated circuit |
| JP2018074106A (en) * | 2016-11-04 | 2018-05-10 | アイシン精機株式会社 | Semiconductor device manufacturing method and chip having semiconductor device |
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