JPS5774672A - Conductor abnormality inspecting device - Google Patents

Abstract

PURPOSE:To accurately detect whether or not an abnormality is present in conductors, which are arranged in a high-density configuration, without allowing a measuring unit to contact them, by impressing inspection signals onto a conductor in turn and making a judgement as to whether or not an abnormality is present in the conductor on the basis of inspection output from other conductors. CONSTITUTION:When high-level inspection signals are impressed onto conductors 11-13 by making a changeover of a switch 22 by shortcircuiting the conductors 11- 13 which are insulated one another by a rubber conductor 31, at first, output of a NAND gate 15 which is corresponding to the conductor 11 becomes a low-level one. Outputs of NAND gates 16 and 17, which are then impressed with inspection outputs of the conductors 12 and 13, are made to become low-level ones by low-level detecting outputs of such an abnormal time as line breakage of the conductor 13, etc. Consequently, an inverter 29 generates a high-level output indicating a line breakage of the conductor 11 on an indicating circuit 30. Line breakages of the conductors 12 and 13 are also indicated in the same manner, and a shortcircuiting between the conductors 11-13 is also detected in the same manner. It is possible, by using this mechanism, to accurately detect presence of an abnormality among conductors of a high-density configuration without allowing a measuring unit to contact them and causing damages, etc. to them.