JPS5774897A - Storage device - Google Patents

Storage device

Info

Publication number
JPS5774897A
JPS5774897A JP55151751A JP15175180A JPS5774897A JP S5774897 A JPS5774897 A JP S5774897A JP 55151751 A JP55151751 A JP 55151751A JP 15175180 A JP15175180 A JP 15175180A JP S5774897 A JPS5774897 A JP S5774897A
Authority
JP
Japan
Prior art keywords
readout
test
time required
storage device
selection circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55151751A
Other languages
Japanese (ja)
Inventor
Keiichi Adachi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55151751A priority Critical patent/JPS5774897A/en
Publication of JPS5774897A publication Critical patent/JPS5774897A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

PURPOSE:To decrease the time required for a test, by branching the readout information in plural stand-alone storage units and outputting it without passing through a selection circuit. CONSTITUTION:Readout outputs of plural stand-along storage units 11, 12... of a storage device 1 are sequentially outputted via a signal selection circuit 20. On the other hand, the readout outputs of the units 11, 12... are directly outputted by branch signal lines 51, 52... in parallel. Thus, the time required to test the device 1 can be reduced in comparison with that via the circuit 20.
JP55151751A 1980-10-28 1980-10-28 Storage device Pending JPS5774897A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55151751A JPS5774897A (en) 1980-10-28 1980-10-28 Storage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55151751A JPS5774897A (en) 1980-10-28 1980-10-28 Storage device

Publications (1)

Publication Number Publication Date
JPS5774897A true JPS5774897A (en) 1982-05-11

Family

ID=15525486

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55151751A Pending JPS5774897A (en) 1980-10-28 1980-10-28 Storage device

Country Status (1)

Country Link
JP (1) JPS5774897A (en)

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