JPS577505A - Detecting method for excess and deficient turn-tightening of cap and device thereof - Google Patents

Detecting method for excess and deficient turn-tightening of cap and device thereof

Info

Publication number
JPS577505A
JPS577505A JP8108780A JP8108780A JPS577505A JP S577505 A JPS577505 A JP S577505A JP 8108780 A JP8108780 A JP 8108780A JP 8108780 A JP8108780 A JP 8108780A JP S577505 A JPS577505 A JP S577505A
Authority
JP
Japan
Prior art keywords
turn
tightening
light
image
cap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8108780A
Other languages
Japanese (ja)
Other versions
JPS6310763B2 (en
Inventor
Kenzo Sano
Toshio Nishizawa
Shinsuke Tamai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meiji Seika Kaisha Ltd
Fuji Denki Automation KK
Original Assignee
Meiji Seika Kaisha Ltd
Fuji Denki Automation KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meiji Seika Kaisha Ltd, Fuji Denki Automation KK filed Critical Meiji Seika Kaisha Ltd
Priority to JP8108780A priority Critical patent/JPS577505A/en
Publication of JPS577505A publication Critical patent/JPS577505A/en
Publication of JPS6310763B2 publication Critical patent/JPS6310763B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Force Measurement Appropriate To Specific Purposes (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To enable the high-reliable detection of excess and deficient turn-tightening by means of a simple and inexpensive device, by a method wherein a turn-tightening part is irradiated with a light, and the number of light-receiving ranges, which are more than a set strength, is detected through the image-formation of a reflection light on an image sensor. CONSTITUTION:A turn-tightening part of a bin 1 with a cap, which forms the subject, is irradiated with a light from a light source 4, and a reflection light is image-formed on an image sensor 4, and a reflection light is image-formed on an image sensor 6 through a lens 5. If turn-tightening of a cap 3 is in a better condition, the reflection light is image-formed on one point as shown in a light ray 7. If the cap has hanging-down parts 15, 16 due to a poor turn-tightening, the reflection light shows 2 image-formation points or more as shown in light rays 8 and 9. With the bin 1 forwarded and rotated by means of a drive device, a pulse signal from an image sensor 6 is inputted to a decision circuit for good or bad turn-tightening condition, and the number of light-receiving ranges, which are more than a set strength, is found to decide the good or bad turn-tightening condition. This permits the high-reliable detection of excess and deficient turn-tightening by means of a simple and inexpensive device.
JP8108780A 1980-06-16 1980-06-16 Detecting method for excess and deficient turn-tightening of cap and device thereof Granted JPS577505A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8108780A JPS577505A (en) 1980-06-16 1980-06-16 Detecting method for excess and deficient turn-tightening of cap and device thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8108780A JPS577505A (en) 1980-06-16 1980-06-16 Detecting method for excess and deficient turn-tightening of cap and device thereof

Publications (2)

Publication Number Publication Date
JPS577505A true JPS577505A (en) 1982-01-14
JPS6310763B2 JPS6310763B2 (en) 1988-03-09

Family

ID=13736601

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8108780A Granted JPS577505A (en) 1980-06-16 1980-06-16 Detecting method for excess and deficient turn-tightening of cap and device thereof

Country Status (1)

Country Link
JP (1) JPS577505A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5004347A (en) * 1988-11-21 1991-04-02 Heuft-Qualiplus B.V. Method and an apparatus for inspecting the edge of a lid
US6658457B2 (en) 1999-03-19 2003-12-02 Fujitsu Limited Device and method for interconnecting distant networks through dynamically allocated bandwidth
JP2006300711A (en) * 2005-04-20 2006-11-02 Omron Corp Metal cap defect inspection method, adjustment method for the inspection, and metal cap defect inspection apparatus
WO2025047225A1 (en) * 2023-08-31 2025-03-06 パナソニックＩｐマネジメント株式会社 Inspection device and inspection method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4965256U (en) * 1972-09-16 1974-06-07
JPS5119581A (en) * 1974-08-08 1976-02-16 Mitsubishi Electric Corp HYOMENKETSUKANKENSASOCHI
JPS52167946U (en) * 1976-06-14 1977-12-20

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4965256U (en) * 1972-09-16 1974-06-07
JPS5119581A (en) * 1974-08-08 1976-02-16 Mitsubishi Electric Corp HYOMENKETSUKANKENSASOCHI
JPS52167946U (en) * 1976-06-14 1977-12-20

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5004347A (en) * 1988-11-21 1991-04-02 Heuft-Qualiplus B.V. Method and an apparatus for inspecting the edge of a lid
US6658457B2 (en) 1999-03-19 2003-12-02 Fujitsu Limited Device and method for interconnecting distant networks through dynamically allocated bandwidth
JP2006300711A (en) * 2005-04-20 2006-11-02 Omron Corp Metal cap defect inspection method, adjustment method for the inspection, and metal cap defect inspection apparatus
WO2025047225A1 (en) * 2023-08-31 2025-03-06 パナソニックＩｐマネジメント株式会社 Inspection device and inspection method

Also Published As

Publication number Publication date
JPS6310763B2 (en) 1988-03-09

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