JPS5776444A - Testing method for refractories - Google Patents

Testing method for refractories

Info

Publication number
JPS5776444A
JPS5776444A JP55152178A JP15217880A JPS5776444A JP S5776444 A JPS5776444 A JP S5776444A JP 55152178 A JP55152178 A JP 55152178A JP 15217880 A JP15217880 A JP 15217880A JP S5776444 A JPS5776444 A JP S5776444A
Authority
JP
Japan
Prior art keywords
section
scanning
cross
ray
refractories
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55152178A
Other languages
Japanese (ja)
Inventor
Isamu Taguchi
Kenichi Takimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP55152178A priority Critical patent/JPS5776444A/en
Publication of JPS5776444A publication Critical patent/JPS5776444A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

Landscapes

  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To observe a crack, deterioration, change of structure of the inner part of refractories in detail, by scanning a necessary cross section of the refractories plural times changing a scanning direction by a radiant ray and composing by operating a picture of the cross section from the intensity distribution. CONSTITUTION:A pair of an X-ray tube 12 and an X-ray detector 16, is moved in one body along a straight line 5 so as to pass a beam 14 of the tube 12 through an aimed cross section 2 of a firebrick 1. Detected value from the detector 16 is stored in a memory correspondingly to moving distance from starting point of scanning. When the first scanning of the section 2 is finishd, a pair of a radiant rays irradiation apparatus 11 and the detector 16, is rotated centering around the firebrick 1 on an extension face of the section 2 and the same scanning is carried out changing the direction of the beam 14. A reverse projection image is made from the intensity of the radiant ray stored in the memory by repeating this operation and a picture of the cross section is obtained overlapping said image by an operation processing apparatus.
JP55152178A 1980-10-31 1980-10-31 Testing method for refractories Pending JPS5776444A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55152178A JPS5776444A (en) 1980-10-31 1980-10-31 Testing method for refractories

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55152178A JPS5776444A (en) 1980-10-31 1980-10-31 Testing method for refractories

Publications (1)

Publication Number Publication Date
JPS5776444A true JPS5776444A (en) 1982-05-13

Family

ID=15534747

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55152178A Pending JPS5776444A (en) 1980-10-31 1980-10-31 Testing method for refractories

Country Status (1)

Country Link
JP (1) JPS5776444A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59221643A (en) * 1983-05-31 1984-12-13 Toshiba Corp Inspecting method of ceramic product
JPS60181640A (en) * 1984-02-29 1985-09-17 Nippon Steel Corp Radiation tomography for industrial use
JPS60203841A (en) * 1984-03-29 1985-10-15 Nippon Steel Corp X-ray transmission testing method of sintered ore and pellet

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50153981A (en) * 1974-05-28 1975-12-11
JPS5368994A (en) * 1976-12-02 1978-06-19 Toshiba Corp X-ray apparatus
JPS54122995A (en) * 1978-03-17 1979-09-22 Hitachi Medical Corp Xxray ct scanner
JPS5573247A (en) * 1978-11-27 1980-06-02 Philips Nv Tomographing inspection method and its device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50153981A (en) * 1974-05-28 1975-12-11
JPS5368994A (en) * 1976-12-02 1978-06-19 Toshiba Corp X-ray apparatus
JPS54122995A (en) * 1978-03-17 1979-09-22 Hitachi Medical Corp Xxray ct scanner
JPS5573247A (en) * 1978-11-27 1980-06-02 Philips Nv Tomographing inspection method and its device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59221643A (en) * 1983-05-31 1984-12-13 Toshiba Corp Inspecting method of ceramic product
JPS60181640A (en) * 1984-02-29 1985-09-17 Nippon Steel Corp Radiation tomography for industrial use
JPS60203841A (en) * 1984-03-29 1985-10-15 Nippon Steel Corp X-ray transmission testing method of sintered ore and pellet

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