JPS5777921A - Infrared ray temperature detector - Google Patents

Infrared ray temperature detector

Info

Publication number
JPS5777921A
JPS5777921A JP55153391A JP15339180A JPS5777921A JP S5777921 A JPS5777921 A JP S5777921A JP 55153391 A JP55153391 A JP 55153391A JP 15339180 A JP15339180 A JP 15339180A JP S5777921 A JPS5777921 A JP S5777921A
Authority
JP
Japan
Prior art keywords
formula
ratio
epsilonb
epsilona
bpfs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55153391A
Other languages
Japanese (ja)
Other versions
JPS6137570B2 (en
Inventor
Kanji Ohashi
Kazuo Konya
Kunio Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP55153391A priority Critical patent/JPS5777921A/en
Publication of JPS5777921A publication Critical patent/JPS5777921A/en
Publication of JPS6137570B2 publication Critical patent/JPS6137570B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0801—Means for wavelength selection or discrimination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0865—Optical arrangements having means for replacing an element of the arrangement by another of the same type, e.g. an optical filter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/60—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature
    • G01J5/602—Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature using selective, monochromatic or bandpass filtering

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Abstract

PURPOSE:To achieve the measurement of accurate temperature of an object by passing energy radiated from the object through BPFs varied in the characteristics in such a manner as to be divided into two groups and determining the ratio of the level thereof between the groups detecting it. CONSTITUTION:Energy of infrared rays radiated from an object is projected to a detecting element 4 through a filter 3 to detect the level thereof. At this point, the filter 3 is rotated in the directions as shown in the drawing and perpendicular thereto. Consequently, the detecting element 4 outputs voltages Va and Vb corresponding to the BPFs 3a and 3b. When a ratio is determined between the output voltages with a processing circuit 5, Va/Vb is expressed by the formula (1). The use of the same optical system 1 cancels transmission factors ta and tb from the formula in the form of ta=tb.epsilona/epsilonb is regarded as a fixed constant C as there is a fixed relationship between the radiation factors epsilona and epsilonb. Thus, the formula (2) is derived from the formula (1). The ratio thus obtained is converted into linearity with a linearizer 9 and introduced into an indicator 6, thereby enabling the reading thereof as the temperature of the object in a directly readable manner.
JP55153391A 1980-10-31 1980-10-31 Infrared ray temperature detector Granted JPS5777921A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55153391A JPS5777921A (en) 1980-10-31 1980-10-31 Infrared ray temperature detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55153391A JPS5777921A (en) 1980-10-31 1980-10-31 Infrared ray temperature detector

Publications (2)

Publication Number Publication Date
JPS5777921A true JPS5777921A (en) 1982-05-15
JPS6137570B2 JPS6137570B2 (en) 1986-08-25

Family

ID=15561455

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55153391A Granted JPS5777921A (en) 1980-10-31 1980-10-31 Infrared ray temperature detector

Country Status (1)

Country Link
JP (1) JPS5777921A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6817758B2 (en) * 2001-04-04 2004-11-16 Noritake Co., Limited Temperature distribution measuring method and apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5518984A (en) * 1978-07-28 1980-02-09 Fujitsu Ltd Infrared ray chopper

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5518984A (en) * 1978-07-28 1980-02-09 Fujitsu Ltd Infrared ray chopper

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6817758B2 (en) * 2001-04-04 2004-11-16 Noritake Co., Limited Temperature distribution measuring method and apparatus

Also Published As

Publication number Publication date
JPS6137570B2 (en) 1986-08-25

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