JPS58106944U - probe card - Google Patents
probe cardInfo
- Publication number
- JPS58106944U JPS58106944U JP336082U JP336082U JPS58106944U JP S58106944 U JPS58106944 U JP S58106944U JP 336082 U JP336082 U JP 336082U JP 336082 U JP336082 U JP 336082U JP S58106944 U JPS58106944 U JP S58106944U
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- printed circuit
- connection terminal
- terminal group
- probe card
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【図面の簡単な説明】
第１図は従来のブローブカードを表面より見た概略斜視
図、第２図は本案品の一実施例に用いられる第１のプリ
ント基板と第２のプリント基板を説明するための概略表
面図、第３図は第１のブリント基板走第２のプリント基
板が相互に接続された状態を示す概略断面図である。
１０・・・・・・第１のプリント基板、２０・・・・・
・第２のプリント基板。[Brief Description of the Drawings] Figure 1 is a schematic perspective view of a conventional probe card seen from the surface, and Figure 2 illustrates a first printed circuit board and a second printed circuit board used in an embodiment of this product. FIG. 3 is a schematic sectional view showing a state in which the first printed circuit board and the second printed circuit board are connected to each other. 10...First printed circuit board, 20...
-Second printed circuit board.
Claims (1)
とともに、前記複数個の探針に接続される第１の接続端
子群と前記複数個の外部接続端子に接続される第２の接
続端子群を具備する第１のプリント基板と、前記第１の
プリント基板の各接続端子群のそれぞれの接続端子に対
応して設けられた第３の接続端子群と第４の接続端子群
との間に所要の配線がされた第２のプリント基板を含み
、前記第１のプリント基板と前記第２のプリント基板の
各接続端子群の所要の接続端子は相互に接続されたもの
であることを特徴とするプローブカード。 （２）前記第１のプリント基板は、その表面に第２のプ
リント基板の裏面に形成された半田付部を逃げるための
凹部が形成されているものであることを特徴とする実用
新案登録請求の範囲第１項記載のプローブカード。 （３）前記第１のプリント基板は、その表面に、第２の
プリント基板の裏面に形成された半田付部を逃げるため
の突片が設けられているものであることを特徴とする実
用新案登録請求の範囲第１項記載のプローブカード。 （４）前記第１のプリント基板及び前記第２のプリント
基板の各接続端子群における接続端子はスルーホールで
形成されたものであることを特徴とする実用新案登録請
求の範囲第１項記載のプローブカード。 （５）前記第２のプリント基板は前記第３の接続端子群
に接続する配線端子群と、前記第４の接続端子群に接続
する別の配線端子君ｉを具備するものであることを特徴
とする実用新案登録請求の範囲第１項記載のプローブカ
ード。 （６）前記第２のプリント基板の第３の接続端子群と第
４の接続端子群との間の配線はリード線で行われるもの
であることを特徴とする実用新案登録請求の範囲第１項
記載のプローブカード。 （７）前記第２のプリント基板の第３の接続端子群と第
４の接続端子群との配線はプリント配線で行われるもの
であることを特徴とする実用新案登録請求の範囲第１項
記載のプローブカード。 （８）前記第１のプリント基板と前記第２のプリント基
板の各接続端子群の所要の接続端子の相互の接続はワイ
ヤで行われることを特徴とする実用新案登録請求の範囲
第１項記載のプローブカード。 ｛９｝前記第１のプリンｌ一基板と前記第２のプリント
基板の各接続端子群の所要の接続端子の相互の接続は圧
着端子で行われることを特徴とする実用新案登録請求の
範囲第１項記載のプローブカード。 ＣＩＯＩ前記第１のプリント基板と前記第２のプリント
基板の各接続端子群の所要の所続端子の相互の接続は着
脱自在のオスピンとメスピンで行われることを特徴とす
る実用新案登録請求の範囲第１項記載のプローブカード
。[Claims for Utility Model Registration] {1} A first connection terminal group that includes a plurality of probes and a plurality of external connection terminals, and a first connection terminal group that is connected to the plurality of probes and the plurality of external connection terminals. A first printed circuit board including a second connection terminal group connected to the connection terminal, and a third connection terminal provided corresponding to each connection terminal of each connection terminal group of the first printed circuit board. a second printed circuit board with required wiring between the first printed circuit board and the fourth connection terminal group, and the required connection terminals of each of the connection terminal groups of the first printed circuit board and the second printed circuit board are A probe card characterized in that the probe cards are interconnected. (2) A request for registration of a utility model characterized in that the first printed circuit board has a concave portion formed on its surface to allow the soldering portion formed on the back surface of the second printed circuit board to escape. The probe card described in item 1. (3) A utility model characterized in that the first printed circuit board is provided with a protrusion on its surface for escaping the soldered portion formed on the back surface of the second printed circuit board. A probe card according to claim 1. (4) The utility model registration claim 1, characterized in that the connection terminals in each connection terminal group of the first printed circuit board and the second printed circuit board are formed by through holes. probe card. (5) The second printed circuit board includes a wiring terminal group connected to the third connection terminal group and another wiring terminal i connected to the fourth connection terminal group. A probe card according to claim 1 of the utility model registration claim. (6) Utility model registration claim 1, characterized in that the wiring between the third connection terminal group and the fourth connection terminal group of the second printed circuit board is performed by lead wires. Probe card described in section. (7) Utility model registration claim 1, characterized in that the wiring between the third connection terminal group and the fourth connection terminal group of the second printed circuit board is performed by printed wiring. probe card. (8) A utility model registration claim 1, characterized in that the required connection terminals of each connection terminal group of the first printed circuit board and the second printed circuit board are connected to each other by wires. probe card. {9} Utility model registration claim 1, characterized in that the required connection terminals of each connection terminal group of the first printed circuit board and the second printed circuit board are connected to each other by crimp terminals. The probe card described in Section 1. CIOI A utility model registration claim characterized in that required terminals of each connection terminal group of the first printed circuit board and the second printed circuit board are connected to each other by detachable male pins and female pins. The probe card described in item 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP336082U JPS58106944U (en) | 1982-01-14 | 1982-01-14 | probe card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP336082U JPS58106944U (en) | 1982-01-14 | 1982-01-14 | probe card |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58106944U true JPS58106944U (en) | 1983-07-21 |
Family
ID=30016300
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP336082U Pending JPS58106944U (en) | 1982-01-14 | 1982-01-14 | probe card |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58106944U (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57128938A (en) * | 1981-02-04 | 1982-08-10 | Yamagata Nippon Denki Kk | Device for measuring characteristic of semiconductor |
-
1982
- 1982-01-14 JP JP336082U patent/JPS58106944U/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57128938A (en) * | 1981-02-04 | 1982-08-10 | Yamagata Nippon Denki Kk | Device for measuring characteristic of semiconductor |
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