JPS58144732A - 欠陥検査装置及び方法 - Google Patents

欠陥検査装置及び方法

Info

Publication number
JPS58144732A
JPS58144732A JP57026753A JP2675382A JPS58144732A JP S58144732 A JPS58144732 A JP S58144732A JP 57026753 A JP57026753 A JP 57026753A JP 2675382 A JP2675382 A JP 2675382A JP S58144732 A JPS58144732 A JP S58144732A
Authority
JP
Japan
Prior art keywords
circuit
image
picture
contour
noise
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57026753A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0444682B2 (fr
Inventor
Akihiko Nishide
明彦 西出
Masatsugu Kidode
正継 木戸出
Yorio Sawada
澤田　順夫
Hideo Numagami
沼上　英雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP57026753A priority Critical patent/JPS58144732A/ja
Publication of JPS58144732A publication Critical patent/JPS58144732A/ja
Publication of JPH0444682B2 publication Critical patent/JPH0444682B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP57026753A 1982-02-23 1982-02-23 欠陥検査装置及び方法 Granted JPS58144732A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57026753A JPS58144732A (ja) 1982-02-23 1982-02-23 欠陥検査装置及び方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57026753A JPS58144732A (ja) 1982-02-23 1982-02-23 欠陥検査装置及び方法

Publications (2)

Publication Number Publication Date
JPS58144732A true JPS58144732A (ja) 1983-08-29
JPH0444682B2 JPH0444682B2 (fr) 1992-07-22

Family

ID=12202039

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57026753A Granted JPS58144732A (ja) 1982-02-23 1982-02-23 欠陥検査装置及び方法

Country Status (1)

Country Link
JP (1) JPS58144732A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007271434A (ja) * 2006-03-31 2007-10-18 Mitsubishi Heavy Ind Ltd 検査装置、検査方法、検査プログラムおよび検査システム

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5263751A (en) * 1975-11-21 1977-05-26 Nippon Steel Corp Automatic detection of translating specific pattern
JPS5675141A (en) * 1979-11-22 1981-06-22 Fuji Photo Film Co Ltd Radiation picture treating method and its device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5263751A (en) * 1975-11-21 1977-05-26 Nippon Steel Corp Automatic detection of translating specific pattern
JPS5675141A (en) * 1979-11-22 1981-06-22 Fuji Photo Film Co Ltd Radiation picture treating method and its device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007271434A (ja) * 2006-03-31 2007-10-18 Mitsubishi Heavy Ind Ltd 検査装置、検査方法、検査プログラムおよび検査システム

Also Published As

Publication number Publication date
JPH0444682B2 (fr) 1992-07-22

Similar Documents

Publication Publication Date Title
Li et al. Improving automatic detection of defects in castings by applying wavelet technique
Wang et al. Automatic identification of different types of welding defects in radiographic images
Lashkia Defect detection in X-ray images using fuzzy reasoning
Mery et al. A review of methods for automated recognition of casting defects
Amza et al. Industrial image processing using fuzzy-logic
CN108022233A (zh) 一种基于改进型Canny算子的工件边缘提取方法
JPS61501174A (ja) ホツト鋼スラブの自動検査
US7162062B2 (en) Method of processing images
CN106778541B (zh) 一种基于视觉的多层梁中外梁孔的识别与定位方法
CN103149222A (zh) 射线实时成像中缺陷检测方法
DE112022005406B4 (de) KI-basierte Produktoberflächeninspektionsvorrichtung und Verfahren
CN109870730B (zh) 一种用于x光机图像解析度测试体定检的方法及系统
CN117876331B (zh) 一种基于光度立体视觉的表面缺陷检测及量化方法
Zhang et al. Automatic background recognition and removal (ABRR) in computed radiography images
Movafeghi et al. Defect detection enhancement using gaussian sparse models
Kamalakannan et al. Spatial smoothing based segmentation method for internal defect detection in X-ray images of casting components
CN116309211A (zh) 一种聚焦于多模态图像固有特性的红外与可见光图像融合方法
Radi et al. Segmenting welding flaws of non-horizontal shape
JPH0376402B2 (fr)
da Silva et al. State-of-the-art of weld seam inspection by radiographic testing: part i–image processing
JPS58144732A (ja) 欠陥検査装置及び方法
CN119246570A (zh) 一种钛合金棒材质量检测方法及系统
CN118736480A (zh) 一种应用于监控摄像头下的实时生活垃圾检测系统
Rebuffel et al. Defect detection method in digital radiography for porosity in magnesium castings
Ebrahimi et al. A hybrid approach of dynamic image processing and complex network to identify repetitive images of welding defects in radiographs of oil and gas pipelines