JPS58182567A - 回路基板試験装置 - Google Patents

回路基板試験装置

Info

Publication number
JPS58182567A
JPS58182567A JP57065276A JP6527682A JPS58182567A JP S58182567 A JPS58182567 A JP S58182567A JP 57065276 A JP57065276 A JP 57065276A JP 6527682 A JP6527682 A JP 6527682A JP S58182567 A JPS58182567 A JP S58182567A
Authority
JP
Japan
Prior art keywords
test
circuit board
circuit boards
storage device
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57065276A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0330836B2 (2
Inventor
Masami Kaihara
貝原　正美
Toshiyuki Nakao
敏之 中尾
Seiichi Kurashina
蔵品　誠一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Hitachi High Tech Corp
Original Assignee
Hitachi Ltd
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Ltd
Priority to JP57065276A priority Critical patent/JPS58182567A/ja
Publication of JPS58182567A publication Critical patent/JPS58182567A/ja
Publication of JPH0330836B2 publication Critical patent/JPH0330836B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP57065276A 1982-04-21 1982-04-21 回路基板試験装置 Granted JPS58182567A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57065276A JPS58182567A (ja) 1982-04-21 1982-04-21 回路基板試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57065276A JPS58182567A (ja) 1982-04-21 1982-04-21 回路基板試験装置

Publications (2)

Publication Number Publication Date
JPS58182567A true JPS58182567A (ja) 1983-10-25
JPH0330836B2 JPH0330836B2 (2) 1991-05-01

Family

ID=13282234

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57065276A Granted JPS58182567A (ja) 1982-04-21 1982-04-21 回路基板試験装置

Country Status (1)

Country Link
JP (1) JPS58182567A (2)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63152570U (2) * 1987-03-26 1988-10-06
JPH0216076U (2) * 1988-07-19 1990-02-01

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63152570U (2) * 1987-03-26 1988-10-06
JPH0216076U (2) * 1988-07-19 1990-02-01

Also Published As

Publication number Publication date
JPH0330836B2 (2) 1991-05-01

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