JPS58202862A - 表面検査方法及びその装置 - Google Patents
表面検査方法及びその装置Info
- Publication number
- JPS58202862A JPS58202862A JP8613482A JP8613482A JPS58202862A JP S58202862 A JPS58202862 A JP S58202862A JP 8613482 A JP8613482 A JP 8613482A JP 8613482 A JP8613482 A JP 8613482A JP S58202862 A JPS58202862 A JP S58202862A
- Authority
- JP
- Japan
- Prior art keywords
- mirror
- inspected
- straight line
- laser beam
- rod
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 8
- 238000000034 method Methods 0.000 title claims description 14
- 230000007547 defect Effects 0.000 claims description 8
- 230000003287 optical effect Effects 0.000 claims description 7
- 230000007246 mechanism Effects 0.000 claims description 3
- 239000003758 nuclear fuel Substances 0.000 abstract description 4
- 230000004907 flux Effects 0.000 abstract 1
- 230000002093 peripheral effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 4
- 238000005253 cladding Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 239000000446 fuel Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8613482A JPS58202862A (ja) | 1982-05-21 | 1982-05-21 | 表面検査方法及びその装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8613482A JPS58202862A (ja) | 1982-05-21 | 1982-05-21 | 表面検査方法及びその装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58202862A true JPS58202862A (ja) | 1983-11-26 |
| JPH032254B2 JPH032254B2 (de) | 1991-01-14 |
Family
ID=13878236
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8613482A Granted JPS58202862A (ja) | 1982-05-21 | 1982-05-21 | 表面検査方法及びその装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58202862A (de) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02195601A (ja) * | 1989-01-24 | 1990-08-02 | Kanegafuchi Chem Ind Co Ltd | 照明方法および照明装置ならびに物体の外観検査方法 |
| DE102014212633A1 (de) * | 2014-06-30 | 2015-12-31 | Inoex Gmbh | Messvorrichtung und Verfahren zur Vermessung von Prüfobjekten |
| WO2016188515A1 (de) * | 2015-05-22 | 2016-12-01 | Inoex Gmbh | Terahertz-messvorrichtung und verfahren zur vermessung von prüfobjekten mittels terahertz-strahlung |
-
1982
- 1982-05-21 JP JP8613482A patent/JPS58202862A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02195601A (ja) * | 1989-01-24 | 1990-08-02 | Kanegafuchi Chem Ind Co Ltd | 照明方法および照明装置ならびに物体の外観検査方法 |
| DE102014212633A1 (de) * | 2014-06-30 | 2015-12-31 | Inoex Gmbh | Messvorrichtung und Verfahren zur Vermessung von Prüfobjekten |
| DE102014212633B4 (de) * | 2014-06-30 | 2017-03-09 | Inoex Gmbh | Messvorrichtung und Verfahren zur Vermessung von Prüfobjekten |
| WO2016188515A1 (de) * | 2015-05-22 | 2016-12-01 | Inoex Gmbh | Terahertz-messvorrichtung und verfahren zur vermessung von prüfobjekten mittels terahertz-strahlung |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH032254B2 (de) | 1991-01-14 |
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