JPS5821880A - Manufacture of oxide superconductive thin film - Google Patents

Manufacture of oxide superconductive thin film

Info

Publication number
JPS5821880A
JPS5821880A JP56119217A JP11921781A JPS5821880A JP S5821880 A JPS5821880 A JP S5821880A JP 56119217 A JP56119217 A JP 56119217A JP 11921781 A JP11921781 A JP 11921781A JP S5821880 A JPS5821880 A JP S5821880A
Authority
JP
Japan
Prior art keywords
thin film
oxides
argon gas
lithium
titanium
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56119217A
Other languages
Japanese (ja)
Other versions
JPS6161717B2 (en
Inventor
Takashi Inukai
犬飼 隆
Toshiaki Murakami
敏明 村上
Minoru Suzuki
実 鈴木
Yoichi Enomoto
陽一 榎本
Takahiro Inamura
稲村 隆弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP56119217A priority Critical patent/JPS5821880A/en
Publication of JPS5821880A publication Critical patent/JPS5821880A/en
Publication of JPS6161717B2 publication Critical patent/JPS6161717B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00Superconducting devices
    • H10N60/80Constructional details
    • H10N60/85Superconducting active materials

Landscapes

  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
  • Superconductors And Manufacturing Methods Therefor (AREA)

Abstract

PURPOSE:To enable to obtan a thin oxide superconductive film by sputtering a powder mixture of the oxides of lithium and titanium as a target in argon gas. CONSTITUTION:Li, Ti and the oxides of these elements are combined to produce an Li1+XTi2-XO4, which is mixed to form a composition of -0.25<=X<=0.2. The mixture powder is hot pressed at approx. 900 deg.C in inert or reduced atmosphere, and is then annealed as a target. the mixture is sputtered in the argon gas and is accumulated in a thin film on a sapphire substrate.

Description

【発明の詳細な説明】 本発明は、 Li1+、T + 2−x O4よシなる
超伝導体を超伝導を利用したデバイス等への応用に際し
て必要となる酸化物超伝導薄膜の製造方法に関するもの
である。
[Detailed Description of the Invention] The present invention relates to a method for manufacturing an oxide superconducting thin film, which is necessary when applying superconductors such as Li1+ and T + 2-x O4 to devices using superconductivity. It is.

L j 1+X T I 2−X 04はスピネル構造
の酸化物であって、酸化物超伝導体の中では1oK以上
の超伝導転移温度を有するために、超伝導デバイスへの
応用が考えられる。これは組成が−0,25≦X≦02
の範囲では超伝導転移を起こし、x<:0.2では絶縁
性を示すようになる。このことは、たとえば。
L j 1 + This means that the composition is -0,25≦X≦02
In the range x, superconducting transition occurs, and in the range x<:0.2, it exhibits insulating properties. This is for example.

トンネル型ジョセフソン接合において同一結晶構造の酸
化物で接合を作製することができるようになるために、
超伝導体と絶縁体との間の熱膨張率の差が小さくて、従
来上記接合素子の問題点であったヒートサイクルに対す
る安定性を大きく改善できる可能性がある。ところが、
L I 1+X T 12−ア04超伝導体の製造方法
として焼結法、ホットプレス法スウェージング法、熔融
法などが試みられたが。
In order to be able to create tunnel-type Josephson junctions using oxides with the same crystal structure,
Since the difference in coefficient of thermal expansion between the superconductor and the insulator is small, there is a possibility that the stability against heat cycles, which has been a problem with the above-mentioned bonding elements in the past, can be greatly improved. However,
A sintering method, a hot press method, a swaging method, a melting method, and the like have been tried as methods for manufacturing the L I 1+X T 12-A04 superconductor.

これらの方法で製造したものは全て塊状であって薄膜形
状のものは全く得られていなかった。
All of the products produced by these methods were in the form of lumps, and no products in the form of thin films were obtained.

本発明の目的は、上記に説明したように従来技術では得
ることのできなかったTJ i1+X T I 2 x
 04よりなる酸化物超伝導薄膜を得ることのできる製
造方法を提供することにある。
The object of the present invention is to obtain TJ i1+X T I 2 x which could not be obtained with the prior art as explained above.
An object of the present invention is to provide a manufacturing method capable of obtaining an oxide superconducting thin film made of 04.

上記の目的のだめの1本発明の酸化物超伝導薄膜の製造
方法は、Li ++X T I 2 x 04で示され
るものにおいて、−0,25≦X≦0.2 であるよう
な組成を有するものにして、リチウム、チタニウム、リ
チウムの酸化物、チタニウムの酸化物、およびリチウム
とチタニウムを共に含む酸化物等よりなる群中より選択
された二種類以上のものを混合してなる粉末混合物、あ
るいはそれを反応させた粉末生成物、もしくはその焼結
体をターゲットとし、アルゴンガスまたはアルゴンガス
に少量の水素ガスを含む混合ガス雰囲気中、雰囲気ガス
圧力的1〜1oPa、  パワー約25o−4soWに
おいてスパッタリングすることにより基体表面上に酸化
物薄膜を形成し1次いで、該酸化物薄膜を約860〜9
40℃の温常において結晶化して酸化物超伝導薄膜とす
るととよりなるものである。
One of the above objects is the method for producing an oxide superconducting thin film of the present invention, which is represented by Li ++ and a powder mixture of two or more selected from the group consisting of lithium, titanium, lithium oxides, titanium oxides, oxides containing both lithium and titanium, or the like. Sputtering is performed using the reacted powder product or its sintered body as a target in an atmosphere of argon gas or a mixed gas containing argon gas and a small amount of hydrogen gas at an atmospheric gas pressure of 1 to 1oPa and a power of approximately 25o-4soW. By forming an oxide thin film on the substrate surface, the oxide thin film is
When it crystallizes at a temperature of 40° C. to form an oxide superconducting thin film, it becomes more stable.

とのような本発明の製造方法によれば、従来技術では得
られなかったL11+xTi2−x04よりなる超伝導
薄膜の製造を可能とするものである。
According to the manufacturing method of the present invention, it is possible to manufacture a superconducting thin film composed of L11+xTi2-x04, which could not be obtained using conventional techniques.

本発明におけるスパッタリング用ターゲットは以下の様
にして製造できる。原料粉末は1例えば。
The sputtering target in the present invention can be manufactured as follows. For example, the raw material powder is 1.

(イ)Li、  Ti、  TiO2;(ロ)Li20
. Ti、 TiO2;(ハ)Li20.T+20s 
、Too。;(ニ)LI2TI205 、T’+20s
  ;などの適当な組み合わせで、L11+1T i2
 x 04で示されるものにおいて、−〇、25≦X≦
02なる組成となるように配合し混合する。この混合粉
末、あるいは混合粉末を不活性雰囲気中もしくは還元性
雰囲気中で、約900℃の温度で反応させて得られたL
i1.−xTi2−x04粉末をターゲットに使用する
ことができるが、良好な膜質のものを得るため、および
膜の堆積速度を速くするだめには不適当であシ。
(a) Li, Ti, TiO2; (b) Li20
.. Ti, TiO2; (c) Li20. T+20s
, Too. ;(d) LI2TI205, T'+20s
With an appropriate combination such as; L11+1T i2
In what is indicated by x 04, -〇, 25≦X≦
Blend and mix to obtain a composition of 02. L obtained by reacting this mixed powder or mixed powder at a temperature of about 900°C in an inert atmosphere or a reducing atmosphere.
i1. -xTi2-x04 powder can be used as a target, but it is not suitable for obtaining good film quality and for increasing the film deposition rate.

そのためには塊状のものが良い。その最も簡便なものは
、上記の混合粉末あるいは反応させた粉末を不活性雰囲
気中もしくは還元性雰囲気中、約900℃の温度処理に
より製造したL l 14−X T I 2 x 04
焼結体である。
For that purpose, chunks are best. The simplest one is L l 14-X T I 2 x 04, which is produced by treating the above mixed powder or reacted powder at a temperature of about 900°C in an inert atmosphere or a reducing atmosphere.
It is a sintered body.

本発明におけるスパッタリングにおいては、ターゲット
の組成と形成された薄膜の組成との間の組成ずれを小さ
くするために、TI、Fマグネトロンスパッタリング法
を利用することが望ましい。この場合の雰囲気ガスには
、アルゴンガスもしくはアルゴンガスに少量の水素ガス
を加えた混合ガスを使用する。スパッタリングの条件は
、使用する装置に依存するので一部には言えないが、お
おむね雰囲気圧力は1〜10 Pa 、入力パワーは2
50〜450W、陽極電圧は22〜3.2 kV 、 
 陽極電流は180〜250 mA程度が適当である。
In sputtering in the present invention, it is desirable to use the TI,F magnetron sputtering method in order to reduce the composition deviation between the composition of the target and the composition of the formed thin film. As the atmospheric gas in this case, argon gas or a mixed gas of argon gas and a small amount of hydrogen gas is used. The sputtering conditions depend on the equipment used, so I cannot say anything about them, but generally the atmospheric pressure is 1 to 10 Pa, and the input power is 2.
50-450W, anode voltage 22-3.2 kV,
Appropriately, the anode current is about 180 to 250 mA.

雰囲気圧力が高過ぎると薄膜を形成できない場合があり
、低過ぎろと組成ずれが大きい場合がある。入力パワー
が大きい場合は薄膜の表面荒れを起こすようになる。
If the atmospheric pressure is too high, it may not be possible to form a thin film, and if the atmospheric pressure is too low, there may be large composition deviations. If the input power is large, the surface of the thin film will become rough.

上記のスパッタリング後の薄膜は無定形あるいは一部結
晶化したもので、電気抵抗率が高く、超伝導転移を起こ
さない。そこで、不活性雰囲気中あるいは還元性雰囲気
中、約860〜940℃の温度で加熱を行う。これによ
ってスピネル構造が出現し、薄膜は超伝導転移を起こす
ようになる。
The thin film after sputtering is amorphous or partially crystallized, has high electrical resistivity, and does not undergo superconducting transition. Therefore, heating is performed at a temperature of about 860 to 940° C. in an inert atmosphere or a reducing atmosphere. As a result, a spinel structure appears, and the thin film undergoes a superconducting transition.

加熱の際にLi 1+X T 12 x O4薄膜と基
板とが反応しないように、基板材質を選択する必要があ
る。
It is necessary to select the substrate material so that the Li 1+X T 12 x O4 thin film and the substrate do not react during heating.

以下に1本発明を実施例につき、それにより製せられた
薄膜の超伝導転移特性を示すグラフを参照して詳細に説
明する。
Hereinafter, the present invention will be explained in detail with reference to an example and a graph showing the superconducting transition characteristics of a thin film produced thereby.

害j飢例− 原料粉末TJ i2 T + 205とT i 20 
sを各1モル秤量し。
Harm J Famine - Raw material powder TJ i2 T + 205 and T i 20
Weigh out 1 mol of s each.

エチルアルコールとメノウ石を用いて約5時間湿式混合
を行った後、エチルアルコールを乾燥除去し、さらにメ
ノウ乳鉢を用いて約30分間混合した0 この混合粉末をグラファイト製のダイスに充填し、約6
時間、アルゴンガスと水素ガスの混合ガス雰囲気中、約
900℃の温度でホットプレスを行った。ひび割れを防
ぐだめに、引き続き同温度でアニールを行った。
After performing wet mixing using ethyl alcohol and agate stone for about 5 hours, the ethyl alcohol was removed by drying, and the mixed powder was further mixed for about 30 minutes using an agate mortar. 6
Hot pressing was performed at a temperature of about 900° C. for an hour in a mixed gas atmosphere of argon gas and hydrogen gas. In order to prevent cracks, subsequent annealing was performed at the same temperature.

このようにして製造した100φのLi T;20゜焼
結体をターゲットとした。スパッタリングはプレーナ型
RFマグネトロンスパンクリング装置を用いて行った。
The 100φ Li T; 20° sintered body produced in this manner was used as a target. Sputtering was performed using a planar RF magnetron spankling device.

雰囲気ガスはアルゴンガスを使用し、1〜9 Paの各
種の雰囲気ガス圧力下において、330Wで50〜60
分間、100−300℃のサファイア基板上に薄膜を堆
積させた。得られた薄膜の厚さは1〜1.5μm、膜形
成速度は170〜260A/minであった。
Argon gas was used as the atmospheric gas, and the temperature was 50 to 60 at 330 W under various atmospheric gas pressures of 1 to 9 Pa.
Thin films were deposited on sapphire substrates at 100-300° C. for minutes. The thickness of the obtained thin film was 1 to 1.5 μm, and the film formation rate was 170 to 260 A/min.

とれらの薄膜は淡青黒色から青黒色を呈したものであり
、無定形あるいは一部結晶化していた。
These thin films were pale blue-black to blue-black in color, and were amorphous or partially crystallized.

とれを水素ガス中、900℃の温度で結晶化したところ
2全て青黒色を呈し、スピネル相が成長しだQ スパッタリング雰囲気ガス圧力が1.3,6゜9 Pa
  の各圧力下で製造した各場合の、上記の薄膜の低温
における電気抵抗率を測定し、グラフに示したのが第1
図である。
When the sample was crystallized in hydrogen gas at a temperature of 900°C, all of the crystals exhibited a blue-black color and a spinel phase began to grow.Q The sputtering atmosphere gas pressure was 1.3.6°9 Pa.
The electrical resistivity at low temperature of the above thin film manufactured under each pressure was measured and shown in the graph.
It is a diagram.

第1図のグラフから分るように、雰囲気ガス圧力が6〜
9 Paの場合の薄膜の低温におけろ超伝導転移温度は
10.9〜11iK、転移幅は06〜o、 7 Kであ
って、とれらの値は他の方法で製造した塊状の化学量論
比組成であるL + ’r 1204と同等である。
As can be seen from the graph in Figure 1, the atmospheric gas pressure is 6~
In the case of 9 Pa, the superconducting transition temperature of the thin film at low temperature is 10.9 to 11 iK, the transition width is 06 to 7 K, and these values are the stoichiometry of bulk produced by other methods. It is equivalent to the stoichiometric composition L + 'r 1204.

以上説明したように、スパッタリング法を用いた本発明
により、超伝導デバイス等への応用に必要な酸化物超伝
導薄膜の製造が可能となった。
As explained above, the present invention using the sputtering method has made it possible to manufacture oxide superconducting thin films necessary for application to superconducting devices and the like.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例において、スパッタリングの雰
囲気ガスであるアルゴンガスの圧力を。 1〜9 Paの範囲で、変えて製造した各酸化物超伝導
薄膜の低温における電気抵抗率の測定値をグラフで示し
たものである。 特許出願人 日本電信電話公社 代理人弁理士 中村純之助
FIG. 1 shows the pressure of argon gas, which is the atmospheric gas for sputtering, in an embodiment of the present invention. This is a graph showing the measured values of the electrical resistivity at low temperatures of various oxide superconducting thin films manufactured at different temperatures in the range of 1 to 9 Pa. Patent applicant Junnosuke Nakamura, patent attorney representing Nippon Telegraph and Telephone Public Corporation

Claims (1)

【特許請求の範囲】 Ll 14−x Tl2−X 04 で示されるものに
おいて。 −025≦X≦02であるような組成を有するものにし
て、リチウム、チタニウム、リチウムの酸化物、チタニ
ウムの酸化物、およびリチウムとチタニウムを共に含む
酸化物等よシなる群中より選択された二種類以上のもの
を混合してなる粉末混合物、あるいはそれを反応させた
粉末生成物、もしくはその焼結体をターゲットとし、ア
ルゴンガスまたはアルゴンガスに少最の水素ガスを含む
混合ガス雰囲気中、雰囲気ガス圧力約1〜1o I’a
 。 パr7−約250〜450Wにおいてスパッタリングす
ることにより基体上に酸化物薄膜を形成し。 次いで、該酸化物薄膜を約860〜940℃の温度にお
いて結晶化して超伝導薄膜とすることからなることを特
徴とする酸化物超伝導薄膜の製造方法0
[Claims] In what is represented by Ll 14-x Tl2-X 04 . -025≦X≦02, and selected from the group consisting of lithium, titanium, oxides of lithium, oxides of titanium, and oxides containing both lithium and titanium. Targeting a powder mixture formed by mixing two or more types, a powder product obtained by reacting the same, or a sintered body thereof, in an atmosphere of argon gas or a mixed gas containing argon gas and a minimum amount of hydrogen gas, Atmospheric gas pressure approximately 1 to 1o I'a
. Par7 - Form an oxide thin film on the substrate by sputtering at about 250-450W. Next, the oxide thin film is crystallized at a temperature of about 860 to 940°C to form a superconducting thin film.
JP56119217A 1981-07-31 1981-07-31 Manufacture of oxide superconductive thin film Granted JPS5821880A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56119217A JPS5821880A (en) 1981-07-31 1981-07-31 Manufacture of oxide superconductive thin film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56119217A JPS5821880A (en) 1981-07-31 1981-07-31 Manufacture of oxide superconductive thin film

Publications (2)

Publication Number Publication Date
JPS5821880A true JPS5821880A (en) 1983-02-08
JPS6161717B2 JPS6161717B2 (en) 1986-12-26

Family

ID=14755846

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56119217A Granted JPS5821880A (en) 1981-07-31 1981-07-31 Manufacture of oxide superconductive thin film

Country Status (1)

Country Link
JP (1) JPS5821880A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62105075A (en) * 1985-10-31 1987-05-15 Furuno Electric Co Ltd Fish detecting method
JPS63190713A (en) * 1987-01-30 1988-08-08 Hitachi Ltd oxide superconducting material

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62105075A (en) * 1985-10-31 1987-05-15 Furuno Electric Co Ltd Fish detecting method
JPS63190713A (en) * 1987-01-30 1988-08-08 Hitachi Ltd oxide superconducting material

Also Published As

Publication number Publication date
JPS6161717B2 (en) 1986-12-26

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