JPS58225344A - 濃度自動分析装置 - Google Patents

濃度自動分析装置

Info

Publication number
JPS58225344A
JPS58225344A JP57110197A JP11019782A JPS58225344A JP S58225344 A JPS58225344 A JP S58225344A JP 57110197 A JP57110197 A JP 57110197A JP 11019782 A JP11019782 A JP 11019782A JP S58225344 A JPS58225344 A JP S58225344A
Authority
JP
Japan
Prior art keywords
memory
image
curve
output
image element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57110197A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0215012B2 (2
Inventor
Toyotaro Iwata
岩田 豊太郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Tao Medical Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sysmex Corp, Tao Medical Electronics Co Ltd filed Critical Sysmex Corp
Priority to JP57110197A priority Critical patent/JPS58225344A/ja
Publication of JPS58225344A publication Critical patent/JPS58225344A/ja
Publication of JPH0215012B2 publication Critical patent/JPH0215012B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59Transmissivity
    • G01N21/5907Densitometers
    • G01N21/5911Densitometers of the scanning type

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP57110197A 1982-06-25 1982-06-25 濃度自動分析装置 Granted JPS58225344A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57110197A JPS58225344A (ja) 1982-06-25 1982-06-25 濃度自動分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57110197A JPS58225344A (ja) 1982-06-25 1982-06-25 濃度自動分析装置

Publications (2)

Publication Number Publication Date
JPS58225344A true JPS58225344A (ja) 1983-12-27
JPH0215012B2 JPH0215012B2 (2) 1990-04-10

Family

ID=14529504

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57110197A Granted JPS58225344A (ja) 1982-06-25 1982-06-25 濃度自動分析装置

Country Status (1)

Country Link
JP (1) JPS58225344A (2)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6154428A (ja) * 1984-08-24 1986-03-18 Shimadzu Corp デンシトメ−タ
FR2591389A1 (fr) * 1985-12-05 1987-06-12 Elf Aquitaine Transistor a effet de champ selectif aux ions et procede de fabrication
JP2006090864A (ja) * 2004-09-24 2006-04-06 Denka Seiken Co Ltd ワクチン中の特定成分の含量を求める方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6154428A (ja) * 1984-08-24 1986-03-18 Shimadzu Corp デンシトメ−タ
FR2591389A1 (fr) * 1985-12-05 1987-06-12 Elf Aquitaine Transistor a effet de champ selectif aux ions et procede de fabrication
JP2006090864A (ja) * 2004-09-24 2006-04-06 Denka Seiken Co Ltd ワクチン中の特定成分の含量を求める方法

Also Published As

Publication number Publication date
JPH0215012B2 (2) 1990-04-10

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