JPS5838435A - Oxide cathode structure - Google Patents
Oxide cathode structureInfo
- Publication number
- JPS5838435A JPS5838435A JP56135430A JP13543081A JPS5838435A JP S5838435 A JPS5838435 A JP S5838435A JP 56135430 A JP56135430 A JP 56135430A JP 13543081 A JP13543081 A JP 13543081A JP S5838435 A JPS5838435 A JP S5838435A
- Authority
- JP
- Japan
- Prior art keywords
- reducing agent
- cathode substrate
- oxide
- electron emission
- cathode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/13—Solid thermionic cathodes
- H01J1/20—Cathodes heated indirectly by an electric current; Cathodes heated by electron or ion bombardment
- H01J1/26—Supports for the emissive material
Landscapes
- Electrodes For Cathode-Ray Tubes (AREA)
- Solid Thermionic Cathode (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は゛電子管用陰極検体、特にカラーブラウン管等
の陰極線管に使用して好適な酸化物1裟極構体に関する
。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a single oxide electrode structure suitable for use in cathode specimens for electron tubes, particularly cathode ray tubes such as color cathode ray tubes.
一般の酸化物陰極では、バリウム、ストロンチウム、カ
ルシウム等のアルカリ土類金属の炭眩塩を還元剤が微敏
体加されたニッケル基合金からなる陰極基体上に塗布し
、これを與伊中で加熱することにより酸化物(二分解転
化したものを゛電子放出物質として使用している。還元
剤としては、ケイ索、マグネシウム、ジルコニウム、タ
ングステン。In a typical oxide cathode, carbonate salts of alkaline earth metals such as barium, strontium, and calcium are coated on a cathode substrate made of a nickel-based alloy to which a reducing agent has been added, and this is heated in a By heating, oxides (dicomposed and converted) are used as electron-emitting substances.Reducing agents include silicone, magnesium, zirconium, and tungsten.
アルミニウム、チタニウム等が広く使用されている。こ
れら並元剤は電子放出物質を活性化させ、良好な′電子
放出特性を実現させるために電子骨動イ乍中にイ11費
される。Aluminum, titanium, etc. are widely used. These balancing agents are used during the electron beam movement in order to activate the electron emitting material and achieve good electron emitting properties.
同時にまた、これら還元剤は′電子放出物質と反応し、
nT副「1月ij1層と呼ばれる′電子放出に悪影響を
及ばず高抵抗層形成の成因となる。At the same time, these reducing agents also react with electron-emitting substances,
It is called the nT sublayer and is the cause of the formation of a high-resistance layer without having a negative effect on electron emission.
第1図は従来の酸化物陰極構体の製部断面図で中間鳩(
14は゛也子放出吻)XIと陰極基体α段との間に形成
されるものと考えられている。Figure 1 is a cross-sectional view of the conventional oxide cathode structure, showing the middle part (
It is believed that 14 is formed between the XI and the cathode substrate α stage.
中間j4は一般に尚抵抗を肩し電子放出能力な引下ける
効果を示すと同時にまた゛電子放出vIJ*の陰極基体
からの剥離の原因ともなり肖る。Intermediate j4 generally has the effect of increasing the resistance and lowering the electron emission ability, and at the same time, it also causes the separation of electron emission vIJ* from the cathode substrate.
甲同j−生成の8度は還元剤の柚知とその含有量に依存
する。一般的に中間層生成の程涙は還元剤の量が多い程
著しい。The degree of production depends on the strength of the reducing agent and its content. Generally, as the amount of reducing agent increases, the degree of tearing becomes more pronounced as the intermediate layer is formed.
したがって、カラーブラウン管用陰惨基体の場合、還元
ハ11としてマグネシウム及びケイ糸とを複合離別の場
合、%還元剤は約0.1重量%以下に、またタングステ
ンを添加する場合は4℃IJ以下に抑えられて使用され
るのが一般的である。Therefore, in the case of a gruesome substrate for color cathode ray tubes, when magnesium and silicone are combined and separated as reduction agent 11, the reducing agent should be kept at about 0.1% by weight or less, and when tungsten is added, the reducing agent should be kept at 4°C IJ or less. It is generally used in a controlled manner.
中間層生成及び成長の機構は以下のように3段階に別り
゛て考えることができる。即ち(1)電子放出物質のア
ルカリ土類金属炭酸塩から酸化物への分解時における二
ば化炭素ガス発生に伴なう陰極基体表面での還元剤の酸
化及び電子放出物質との複合酸化物の形成。The mechanism of intermediate layer generation and growth can be considered in three stages as follows. That is, (1) oxidation of the reducing agent on the surface of the cathode substrate due to the generation of carbon dioxide gas during the decomposition of the electron-emitting substance from the alkaline earth metal carbonate to the oxide, and the formation of a composite oxide with the electron-emitting substance. formation.
(II)動作時における電子放出物質の還元に伴なう還
元剤の酸化及び電子放出物質との複合酸化物の形成。(II) Oxidation of the reducing agent and formation of a composite oxide with the electron-emitting substance during the reduction of the electron-emitting substance during operation.
(1)動作時における真空度劣化(特に酸素圧上昇)に
伴なう還元剤の酸化及び″16子放出物質との複合酸化
物の形成。(1) Oxidation of the reducing agent and formation of a composite oxide with the ``16-element emitting substance'' due to deterioration of the vacuum level (particularly increase in oxygen pressure) during operation.
である。It is.
上記のうち還元剤にとって最も苛酷な陰極基体表面での
中間層生成条件は(1)である。〔11)は例えば酸化
バリウムの化学量論的組成からの僅かのずれを生じさせ
るための還元剤の鉦がノJ命期間中に亘り徐々にY(j
費されるだけであり〔曹〕は通常の場合、電子管内(ニ
ゲツタ装置が組み込まれ、ゲッタ機能を発揮している限
り、殆んど問題となら外いからである。Among the above conditions, the most severe condition for forming an intermediate layer on the surface of the cathode substrate for the reducing agent is (1). [11] For example, when a reducing agent is used to cause a slight deviation from the stoichiometric composition of barium oxide, Y(j
This is because in normal cases, as long as the getter device is installed in the electron tube and performs the getter function, there is hardly any problem.
本発明は、アルカリ土類金属の炭酸塩の酸化物への分解
時における二酸化炭素カス元止(二伴なう還元剤の陰極
基体表面での酸化物層形成を防止することにより、電子
放出特性を損う中間層形成を防止し、電子放出特性の優
れた、かつ長寿命な酸化物陰4m =’4を体をイ4す
ることケ目的とする。The present invention improves the electron emission properties by preventing the formation of an oxide layer on the surface of the cathode substrate of the reducing agent that is accompanied by carbon dioxide residue during the decomposition of alkaline earth metal carbonate into oxides. The purpose is to prevent the formation of an intermediate layer that impairs the energy efficiency, and to provide an oxide layer with excellent electron emission characteristics and a long life.
即ち、不発明は少なくともアルカリ土類金属の炭酸塩の
酸化物への分解時に、アルカリ土類金属の炭酸塩が被虐
されている陰極基体表面及び次面近傍の内部に活性な還
元剤を実質的に含有しないようにすることにより、炭酸
塩分解(二より発生1−る二酸化炭素と還元剤との反応
による陰極基体表面における中間層の生成を防止する。That is, at least when the alkaline earth metal carbonate is decomposed into an oxide, an active reducing agent is substantially added to the inside of the cathode substrate surface and the vicinity of the next surface where the alkaline earth metal carbonate is attacked. This prevents the formation of an intermediate layer on the surface of the cathode substrate due to carbonate decomposition (reaction between carbon dioxide generated from two processes and the reducing agent).
その結果炭酸塩分解後は、陰極基体内部の還元剤は電子
放出物質中における過剰バリウム生成のための活性化の
ために効率よく供給されることとなり、電子放出特性の
俊J’した、かつ長寿命の酸化物陰極構体が実現可能と
なるものである。As a result, after carbonate decomposition, the reducing agent inside the cathode substrate is efficiently supplied for activation to produce excess barium in the electron-emitting material, resulting in a short and long electron-emitting property. A long-life oxide cathode structure is now possible.
本発明(′−係る1嶋極基体を作製する手段としては(
1)加熱による表面近傍層からの還元剤の自由蒸発法、
(11)純ニッケル層をクラッドあるいはメッキなどに
より形成する純ニック°ル被覆法、
(iiD表面近傍層中の還元剤を内部で酸化物トI子と
してll811定する内部酸化法、
等が考えられる。しかしながら(1)及び(11)の方
法は次に示すような理由から不発明の陰極構体を実現す
る上で十分な効果を発揮することができない。The present invention ('-) As a means for producing such a one-shima polar substrate, (
1) Free evaporation of the reducing agent from the layer near the surface by heating, (11) Pure nickel coating method in which a pure nickel layer is formed by cladding or plating, (ii) The reducing agent in the layer near the surface is oxidized internally. An internal oxidation method, etc. that can be considered as a physical property is considered.However, methods (1) and (11) are sufficiently effective in realizing an uninvented cathode structure for the following reasons. Can not do it.
即ち、(1)の方法に依れば、表面からの還元剤のIl
は
で表現できる(W、 Jostの著; Diffusi
on AcademicPress + 1960 )
分布を有す。That is, according to method (1), Il of the reducing agent from the surface
(written by W. Jost; Diffusi
on Academic Press + 1960)
It has a distribution.
ここで、 Xは陰極基体く厚さh)の表面からの距離π 円周率 co 還元剤の初ル[濃度 ■) 拡散係数 t 加熱時間 である。here, X is the distance π from the surface of the cathode substrate (thickness h); pi co Reducing agent first [concentration] ■) Diffusion coefficient t Heating time It is.
この式からもわかることであるが後の実施例でも刀く1
−よう(1、この方法では表面近傍で還元剤が実質的に
イfla、シない層を作ることはできない。即ち最表面
で還元剤が零となり、中心部へ向って単調増加するよう
な旋回分布が存在する。したがって、電子放出物質の炭
酸塩の分解時には、表面への還元剤の拡散が容易であり
、結果として表面あるいは、極めて表面(=近い場所に
中間層の生成を見ることになり、目的を達成することが
できない。As can be seen from this formula, it is also possible to use 1 in the later examples.
- (1) With this method, it is not possible to create a layer in which the reducing agent is not substantially flat near the surface.In other words, the reducing agent becomes zero at the outermost surface and monotonically increases toward the center. Therefore, when carbonate, an electron-emitting substance, is decomposed, the reducing agent easily diffuses to the surface, resulting in the formation of an intermediate layer on the surface or very close to the surface. , unable to achieve the goal.
また(11)の方法のクラッド、メッキ等;ユよる場合
、加工■lの除去あるいは表面の清浄化及び接合界面か
らのガス抜きのために水素中あるいは不活性雰囲気中で
の加熱が陰極構体な使用するに前だって要求される。In addition, in the case of cladding, plating, etc. in method (11), heating in hydrogen or an inert atmosphere may be used to remove processing materials, clean the surface, and degas from the bonding interface. It is required even before use.
その際、内部の還元剤が表面被覆材(二拡散し、もげ、
や純ニツケル材料とは見做し侍なくなる。逆(二拡散が
実質的に起らないような温度の熱処理では十分な加工歪
の除去あるいは表向の7メを浄化等の効果が得られず、
とのにうな材料を陰極構付の一部として使用することは
不ノ直当である。At that time, the internal reducing agent diffuses into the surface coating material (diffuses, peels off,
Samurai would no longer consider it to be pure nickel material. Conversely, heat treatment at a temperature at which secondary diffusion does not substantially occur cannot achieve sufficient effects such as removing processing strain or purifying the surface layer.
It is unreasonable to use such materials as part of the cathode structure.
これに対しくii+)の方法は酸素分圧を適当に1Il
lI何1した雰囲気中で、還元剤を官有した1裏極基体
を熱処理することにより還元剤を基体内部で酸化させ、
酸化物粒子として分散させる方法であり、これによれば
酵素分圧、加熱温度、陰極基体材料の加工歪等を適切に
選定することによりr鋏化物粒子の分散の深さを容易に
ttilJ御することができる。On the other hand, method ii+) sets the oxygen partial pressure to 1Il.
A back electrode substrate containing a reducing agent is heat-treated in a moderate atmosphere to oxidize the reducing agent inside the substrate,
This is a method of dispersing oxidized particles as oxide particles. According to this method, the depth of dispersion of oxidized particles can be easily controlled by appropriately selecting the enzyme partial pressure, heating temperature, processing strain of the cathode substrate material, etc. be able to.
このようにして得られるfi +mi近傍の還元剤が酸
化された陰極基体は、炭酸塩の分解時にはもはや二酸化
炭素によって酸化される表面近傍の還元剤は存在しない
ので、@極基体衣面での還元剤のt俊化さらには′題子
放射物質との複合酸化物の形成、つまり中間層の形成は
起こり得ない。その舶来本発明の酸化物陰極構体な使用
した′電子′Uはエミッション特性の優れた長寿命のも
のとなる。In the cathode substrate obtained in this way, in which the reducing agent near fi + mi has been oxidized, there is no longer a reducing agent near the surface that is oxidized by carbon dioxide when the carbonate is decomposed, so that reduction on the surface of the electrode substrate is possible. In addition, the formation of a composite oxide with the material that emits radiation, that is, the formation of an intermediate layer, cannot occur. The ``electron'' U used in the oxide cathode structure of the present invention has excellent emission characteristics and a long life.
以下実施例により本発明の詳細な説明する。The present invention will be explained in detail below with reference to Examples.
実施例1)
0.03 MLi % ノマグネシウムと0.03 ]
< fiのケイ素とを含むニッケル合金圧延板からプレ
スにより厚さQ、l lll1t 、直径1.4 mm
の円板を1’J抜き、トリクレン及び温水で洗浄俊、乾
燥水素中で700゛0.10分間の焼鈍を施した。次に
−ば化炭素と做
二酸化炭素の混合気体(答損比1:5)qJ泥流中、1
000°C11時間の熱処理を行ない、第2図に示すよ
うに円板の両表面から約8μmの深さまで還元層を内部
酸化した。このように内一部酸化物粒子曽を分散した円
板を第2図に示すようにスリーブ(2つに溶接した傍熱
型の陰極基本いとじ仁、表向に電子放出物質121)を
塗布した後カラーブラウン管の電子銃に組み込み、排気
、ライティング(゛電子放出物質の炭酸塩からe化物へ
の分M I 7(W ) 、ゲッターフラッシュ、エー
ジング等の通常の方法でカラーブラウン管を作製した。Example 1) 0.03 MLi% magnesium and 0.03]
A nickel alloy rolled plate containing <fi silicon is pressed to a thickness Q, lll1t, and a diameter of 1.4 mm.
The disk was extracted by 1'J, washed with trichlorethylene and warm water, and annealed at 700° for 0.10 minutes in dry hydrogen. Next, a mixed gas of carbon dioxide and carbon dioxide (response/loss ratio 1:5) qJ in the mudflow, 1
Heat treatment was performed at 000° C. for 11 hours to internally oxidize the reduced layer from both surfaces of the disk to a depth of approximately 8 μm, as shown in FIG. As shown in Fig. 2, the disk in which the oxide particles are partially dispersed is coated with a sleeve (two pieces of indirectly heated cathode base material welded together, and an electron-emitting material 121 on the surface). After that, it was assembled into an electron gun of a color cathode ray tube, and a color cathode ray tube was produced by conventional methods such as evacuation, lighting (separation of electron-emitting substance from carbonate to e-oxide M I 7 (W), getter flash, aging, etc.).
内部酸化処理を施こされていない従来の陰極基体を用い
たカラーブラウン管も同様に作製し強Mill寿命試験
を行ない寿命特性を比較した。A color cathode ray tube using a conventional cathode substrate that had not been subjected to internal oxidation treatment was similarly prepared and subjected to a strong Mill life test to compare the life characteristics.
これらの寿命曲線を第3図に示す。第21図においてA
は従来の陰極基体、Bは本発明による陰極基体を使用し
た場合の寿命曲線であり、本発明の優位性が示されてい
る。These life curves are shown in FIG. In Figure 21, A
B is a life curve when a conventional cathode substrate is used, and B is a life curve when a cathode substrate according to the present invention is used, which shows the superiority of the present invention.
実施例2)
0.06重t%のマグネシウムと0.06 i M%の
ケイ素とを含むニッケル合金圧延板から厚さ1o。Example 2) A nickel alloy rolled plate containing 0.06 wt % magnesium and 0.06 i M % silicon with a thickness of 1 o.
μm、直径1.4 mTLの円板を打抜き、実施例1)
と同じ方法で傍熱型陰極基体として電子銃に組込みカラ
ーブラウン管を作製した。本実施例の場合陰極基板表面
から約5μmの頭載で内部酸化され、還元剤の酸化物粒
子が分散して認められるものである。Example 1) A disk with a diameter of 1.4 mTL was punched out.
Using the same method as above, a color cathode ray tube was fabricated by incorporating it into an electron gun as an indirectly heated cathode substrate. In this example, internal oxidation occurs at a depth of approximately 5 μm from the surface of the cathode substrate, and oxide particles of the reducing agent are observed as being dispersed.
また、内部教化処理を施こされていない従来の陰極基体
を用いたカラーブラウン管モ同様に作製し、強制寿命試
験を行ない寿命特性を比較した。これらの寿命曲線を第
4図に示す。第4図においてCは従来の陰極基体、D)
ま本発明(ユよる陰極基体を使用した場合の寿命曲線で
ある。In addition, a color cathode ray tube was fabricated using a conventional cathode substrate that had not been subjected to internal indoctrination treatment, and a forced life test was conducted to compare the life characteristics. These life curves are shown in FIG. In Figure 4, C is the conventional cathode substrate, D)
This is a life curve when the cathode substrate according to the present invention is used.
実施例1)の場合と同様、本発明の後位性が示されてい
る。As in Example 1), the backward nature of the present invention is demonstrated.
実施例1)及び2)では−酸化炭系と二眩化炭尤の混合
比が1:5で1ooo″0.60分の内部酸化処理を施
こした結果だけを示したが、混合比、温度。In Examples 1) and 2), only the results were shown where the mixing ratio of oxidized carbon and dillidized carbon was 1:5 and internal oxidation treatment was performed for 100''0.60 minutes, but the mixing ratio, temperature.
時間を少しづつ変化させ、%棹凍さの内部重化処理を行
なった。その結果、表向から10μm以内、少なくとも
3μm以内の領域を内部rし化処理した陰極基体が従来
と比較し、顕者に埒命を長はすことが1gめられた。Internal weighting of % freshness was performed by changing the time little by little. As a result, it was found that a cathode substrate in which an area within 10 μm or at least 3 μm from the surface was internally treated had a longer lifespan than a conventional cathode substrate.
なおこれらの内部液化処理は陰憾基体の断面を研摩、エ
ツチング後光学顕#鋭、あるいは走丘型電子顕微鋭によ
り確認できるものである。These internal liquefaction treatments can be confirmed by polishing or etching the cross section of the negative substrate and then using an optical microscope or a scanning electron microscope.
第1図は従来の酸化物陰極構体の安郡断面図、第2図は
本発明のr粒化′i/I陰他構体の挟部断面図、第3図
及び第4図は不発明の酸化物陰極構体を使用したカラー
ブラウン管の強制寿命試験の結果を示す図でるる。
If、21・・・電子放出物質
12・・・中間層
13.23・・・陰極基体
22・・・内部酸化物粒子
(7317)代理人 ヅP理士 則 近 應 侑輸か1
名)第 1 図
第2図FIG. 1 is a cross-sectional view of a conventional oxide cathode structure, FIG. 2 is a cross-sectional view of the nip part of the r-grained cathode structure of the present invention, and FIGS. This figure shows the results of a forced life test of a color cathode ray tube using an oxide cathode structure. If, 21... Electron emitting material 12... Intermediate layer 13.23... Cathode substrate 22... Internal oxide particle (7317) Agent ㅅP Physician Nori Kon O Yuuka 1
Name) Figure 1 Figure 2
Claims (1)
、前記陰極基体上(二形成された電子放射物質とをゼす
る酸化物陰極構体において、前記電子放射物質が塗布さ
れている削B己比夫極品体の表面から10μm以内、少
なくとも3μm以内の領域(二剤W;e、R元剤の内7
xl+ 11化物粒子が分散されていることを特徴とす
る酸化物M極栴体。In an oxide cathode structure comprising a cathode substrate made of a Ni-based alloy containing a small amount of a reducing agent, and an electron emitting material formed on the cathode substrate, the electron emitting material is coated on the substrate. A region within 10 μm, at least 3 μm from the surface of the self-propelled product (two agents W; e, R, 7 of the original agents)
An oxide M polar body characterized in that xl+ 11-oxide particles are dispersed therein.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56135430A JPS5838435A (en) | 1981-08-31 | 1981-08-31 | Oxide cathode structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56135430A JPS5838435A (en) | 1981-08-31 | 1981-08-31 | Oxide cathode structure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5838435A true JPS5838435A (en) | 1983-03-05 |
| JPS648891B2 JPS648891B2 (en) | 1989-02-15 |
Family
ID=15151536
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56135430A Granted JPS5838435A (en) | 1981-08-31 | 1981-08-31 | Oxide cathode structure |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5838435A (en) |
-
1981
- 1981-08-31 JP JP56135430A patent/JPS5838435A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS648891B2 (en) | 1989-02-15 |
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