JPS58500726A - 分光分析装置のためのパルス発光安定化システム - Google Patents

分光分析装置のためのパルス発光安定化システム

Info

Publication number: JPS58500726A
Authority: JP; Japan
Prior art keywords: value; inductance; capacitor; flash; spectroscopic analysis
Prior art date: 1981-05-01
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

JP50325281A

Other languages

English (en)

Japanese (ja)

Other versions

JPH0416728B2 (fr

Inventor

バン・ア−カン・ハロルド

Original Assignee

コルモーゲン　コーポレイション

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1981-05-01

Filing date

1981-05-01

Publication date

1983-05-06

1981-05-01 Application filed by コルモーゲン　コーポレイション filed Critical コルモーゲン　コーポレイション

1983-05-06 Publication of JPS58500726A publication Critical patent/JPS58500726A/ja

1992-03-25 Publication of JPH0416728B2 publication Critical patent/JPH0416728B2/ja

Status Granted legal-status Critical Current

Links

230000006641 stabilisation Effects 0.000 title description 3
238000011105 stabilization Methods 0.000 title description 3
238000004020 luminiscence type Methods 0.000 title description 2
239000003990 capacitor Substances 0.000 claims description 26
238000005259 measurement Methods 0.000 claims description 25
229910052724 xenon Inorganic materials 0.000 claims description 23
FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 claims description 22
230000003595 spectral effect Effects 0.000 claims description 19
238000004611 spectroscopical analysis Methods 0.000 claims description 18
238000000034 method Methods 0.000 claims description 6
229910052751 metal Inorganic materials 0.000 claims description 5
239000002184 metal Substances 0.000 claims description 5
238000012937 correction Methods 0.000 claims description 4
238000012545 processing Methods 0.000 claims description 4
238000004544 sputter deposition Methods 0.000 claims description 3
230000008569 process Effects 0.000 claims description 2
239000000523 sample Substances 0.000 claims 4
238000001514 detection method Methods 0.000 claims 2
230000001678 irradiating effect Effects 0.000 claims 2
238000004458 analytical method Methods 0.000 claims 1
230000004907 flux Effects 0.000 claims 1
239000013074 reference sample Substances 0.000 claims 1
229910001220 stainless steel Inorganic materials 0.000 claims 1
239000010935 stainless steel Substances 0.000 claims 1
238000012360 testing method Methods 0.000 claims 1
210000002105 tongue Anatomy 0.000 claims 1
238000012546 transfer Methods 0.000 claims 1
230000000694 effects Effects 0.000 description 9
238000009826 distribution Methods 0.000 description 8
238000004804 winding Methods 0.000 description 7
238000013519 translation Methods 0.000 description 6
230000001788 irregular Effects 0.000 description 5
230000007423 decrease Effects 0.000 description 4
238000010586 diagram Methods 0.000 description 4
239000011521 glass Substances 0.000 description 4
238000001228 spectrum Methods 0.000 description 4
238000005286 illumination Methods 0.000 description 3
XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
230000015572 biosynthetic process Effects 0.000 description 2
239000006185 dispersion Substances 0.000 description 2
239000002923 metal particle Substances 0.000 description 2
238000012986 modification Methods 0.000 description 2
230000004048 modification Effects 0.000 description 2
238000012544 monitoring process Methods 0.000 description 2
238000010606 normalization Methods 0.000 description 2
230000003287 optical effect Effects 0.000 description 2
230000005855 radiation Effects 0.000 description 2
230000008929 regeneration Effects 0.000 description 2
238000011069 regeneration method Methods 0.000 description 2
229910052710 silicon Inorganic materials 0.000 description 2
239000010703 silicon Substances 0.000 description 2
WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
229910052721 tungsten Inorganic materials 0.000 description 2
239000010937 tungsten Substances 0.000 description 2
238000001429 visible spectrum Methods 0.000 description 2
NLZUEZXRPGMBCV-UHFFFAOYSA-N Butylhydroxytoluene Chemical compound CC1=CC(C(C)(C)C)=C(O)C(C(C)(C)C)=C1 NLZUEZXRPGMBCV-UHFFFAOYSA-N 0.000 description 1
241000257465 Echinoidea Species 0.000 description 1
241000238814 Orthoptera Species 0.000 description 1
AZDRQVAHHNSJOQ-UHFFFAOYSA-N alumane Chemical class [AlH3] AZDRQVAHHNSJOQ-UHFFFAOYSA-N 0.000 description 1
230000008901 benefit Effects 0.000 description 1
230000015556 catabolic process Effects 0.000 description 1
230000008859 change Effects 0.000 description 1
238000007600 charging Methods 0.000 description 1
239000003795 chemical substances by application Substances 0.000 description 1
239000003086 colorant Substances 0.000 description 1
230000007797 corrosion Effects 0.000 description 1
238000005260 corrosion Methods 0.000 description 1
230000006378 damage Effects 0.000 description 1
238000012217 deletion Methods 0.000 description 1
230000037430 deletion Effects 0.000 description 1
230000006866 deterioration Effects 0.000 description 1
230000002542 deteriorative effect Effects 0.000 description 1
235000013367 dietary fats Nutrition 0.000 description 1
238000009792 diffusion process Methods 0.000 description 1
238000007599 discharging Methods 0.000 description 1
238000010891 electric arc Methods 0.000 description 1
238000005516 engineering process Methods 0.000 description 1
238000011156 evaluation Methods 0.000 description 1
230000005284 excitation Effects 0.000 description 1
230000002349 favourable effect Effects 0.000 description 1
239000010520 ghee Substances 0.000 description 1
238000010438 heat treatment Methods 0.000 description 1
238000003384 imaging method Methods 0.000 description 1
239000012535 impurity Substances 0.000 description 1
PNDPGZBMCMUPRI-UHFFFAOYSA-N iodine Chemical compound II PNDPGZBMCMUPRI-UHFFFAOYSA-N 0.000 description 1
239000000463 material Substances 0.000 description 1
239000007769 metal material Substances 0.000 description 1
230000000737 periodic effect Effects 0.000 description 1
230000009467 reduction Effects 0.000 description 1
238000000926 separation method Methods 0.000 description 1
239000007787 solid Substances 0.000 description 1
238000002834 transmittance Methods 0.000 description 1
150000003736 xenon Chemical class 0.000 description 1

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/36—Investigating two or more bands of a spectrum by separate detectors
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B41/00—Circuit arrangements or apparatus for igniting or operating discharge lamps
- H05B41/14—Circuit arrangements
- H05B41/30—Circuit arrangements in which the lamp is fed by pulses, e.g. flash lamp
- H05B41/34—Circuit arrangements in which the lamp is fed by pulses, e.g. flash lamp to provide a sequence of flashes

Landscapes

Physics & Mathematics (AREA)
Spectroscopy & Molecular Physics (AREA)
General Physics & Mathematics (AREA)
Biochemistry (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Life Sciences & Earth Sciences (AREA)
General Health & Medical Sciences (AREA)
Health & Medical Sciences (AREA)
Immunology (AREA)
Pathology (AREA)
Spectrometry And Color Measurement (AREA)
Discharge-Lamp Control Circuits And Pulse- Feed Circuits (AREA)
Discharge Lamp (AREA)

JP50325281A 1981-05-01 1981-05-01 分光分析装置のためのパルス発光安定化システム Granted JPS58500726A (ja)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
PCT/US1981/000678 WO1982003913A1 (fr)	1981-05-01	1981-05-01	Stabilisation des impulsions lumineuses pour des instruments de spectro-photometrie en couleur

Publications (2)

Publication Number	Publication Date
JPS58500726A true JPS58500726A (ja)	1983-05-06
JPH0416728B2 JPH0416728B2 (fr)	1992-03-25

Family

ID=22161237

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP50325281A Granted JPS58500726A (ja)	1981-05-01	1981-05-01	分光分析装置のためのパルス発光安定化システム

Country Status (3)

Country	Link
EP (1)	EP0077776A1 (fr)
JP (1)	JPS58500726A (fr)
WO (1)	WO1982003913A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
GB2220076A (en) *	1988-06-21	1989-12-28	English Electric Valve Co Ltd	Thyratron test circuit
JP2005108435A (ja) *	1999-06-30	2005-04-21	Hamamatsu Photonics Kk	フラッシュランプ
JP4002090B2 (ja)	2001-10-31	2007-10-31	浜松ホトニクス株式会社	閃光放電管用電源回路

Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS4736111U (fr) *	1971-05-10	1972-12-21

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3532429A (en) *	1966-06-06	1970-10-06	Philips Corp	Multichannel atomic absorption spectrometer
JPS591971B2 (ja) *	1975-03-26	1984-01-14	株式会社日立製作所	ブンコウコウドケイ
US4296358A (en) *	1979-07-30	1981-10-20	Fisher Scientific Company	High-voltage spark source

1981
- 1981-05-01 JP JP50325281A patent/JPS58500726A/ja active Granted
- 1981-05-01 WO PCT/US1981/000678 patent/WO1982003913A1/fr not_active Ceased
- 1981-05-01 EP EP81902785A patent/EP0077776A1/fr not_active Withdrawn

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS4736111U (fr) *	1971-05-10	1972-12-21

Also Published As

Publication number	Publication date
EP0077776A1 (fr)	1983-05-04
WO1982003913A1 (fr)	1982-11-11
JPH0416728B2 (fr)	1992-03-25

Publication	Publication Date	Title
US4839529A (en)	1989-06-13	Arrangement for in situ determination of quantity of turbid matter aerosol and/or dust in fluid which flows through a space
Pakhomov et al.	1996	Laser-induced breakdown spectroscopy for detection of lead in concrete
US20100111820A1 (en)	2010-05-06	Method of determining laser stabilities of optical material, crystals obtained with said method, and uses of said crystals
US7381973B2 (en)	2008-06-03	Analyzer system and method incorporating excimer UV fluorescence detection
JPH07198610A (ja)	1995-08-01	アルゴン存在下でのレーザにより発生したプラズマでの光学発光分光測定法による元素分析方法
US5185265A (en)	1993-02-09	Pulse modulation of the excitation light source of flow cytometers
JPH09292281A (ja)	1997-11-11	蛍光体の量子効率測定方法および測定装置
DE4341462C2 (de)	1999-02-11	Verfahren zur Bestimmung der Materialzusammensetzung von Proben und Vorrichtung zur Durchführung des Verfahrens
EP0809799A1 (fr)	1997-12-03	Procede et dispositif pour la determination de la purete et/ou de la pression de gaz pour lampes electriques
DE29607075U1 (de)	1996-07-04	Lumineszenztaster
US7688444B2 (en)	2010-03-30	Method of determining laser stabilities of optical materials, crystals selected according to said method, and uses of said selected crystals
JPH0416728B2 (fr)	1992-03-25
JPH01321340A (ja)	1989-12-27	レーザ二段励起発光分析法及び装置
Gibbs et al.	1995	Ageing of materials under intense ultraviolet radiation
EP0134273B1 (fr)	1988-07-13	Stabilisation d'impulsion lumineuse pour instrumentation de spectrophotométrie de couleur
US6573658B1 (en)	2003-06-03	Mercury lamp of the short arc type and UV emission device
AU542300B2 (en)	1985-02-14	Pulse light stabilization for color spectrophotometric instrumentation
US4523096A (en)	1985-06-11	Liquid chromatography apparatus
Fernando et al.	1994	Continuum-source graphite-furnace atomic absorption spectrometry with photodiode array detection
JPH09178575A (ja)	1997-07-11	ファイバー温度計
Bakken et al.	1969	Carbon spectra by the beam-foil method
Irwin et al.	1992	Transverse Zeeman background correction for graphite furnace laser excited atomic fluorescence spectrometry: determination of lead and cobalt in standard reference materials
Brinkman et al.	1975	Exploding wires as an intense ultraviolet continuum excitation source with preliminary application to atomic fluorescence spectrometry
DE102019100332B4 (de)	2023-05-25	Verfahren zum automatischen Kalibrieren eines optischen Messsystems sowie optisches Messsystem
DE202023106494U1 (de)	2025-02-10	Lichtquelle für einen Gasanalysator