JPS5853865A - Method for manufacturing amorphous silicon solar cells - Google Patents
Method for manufacturing amorphous silicon solar cellsInfo
- Publication number
- JPS5853865A JPS5853865A JP56151964A JP15196481A JPS5853865A JP S5853865 A JPS5853865 A JP S5853865A JP 56151964 A JP56151964 A JP 56151964A JP 15196481 A JP15196481 A JP 15196481A JP S5853865 A JPS5853865 A JP S5853865A
- Authority
- JP
- Japan
- Prior art keywords
- solar cell
- amorphous silicon
- silicon solar
- ring
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/10—Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material
- H10F71/103—Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material including only Group IV materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Photovoltaic Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
本発明はアモルファスシリコン(以下a−5tという)
を用iた太陽電池の製造方法に関するものである。[Detailed Description of the Invention] The present invention relates to amorphous silicon (hereinafter referred to as a-5t).
The present invention relates to a method for manufacturing a solar cell using i.
α−5i太陽電池の一般的な製造方法及びその構造につ
いて社、米国特許第4064521号明細書によって明
らかなごとく、siLをグルー放電分解し、半導体接合
を作ることによって製作されている。As disclosed in U.S. Pat. No. 4,064,521, a general method for manufacturing an α-5i solar cell and its structure, the α-5i solar cell is manufactured by glue discharge decomposition of siL to form a semiconductor junction.
従来、グリ−放電プラズマを発生さぜる方法としては、
平行平板電極を用いる春量結合法とコイル状電極を用−
る誘導結金法が主として用いられてi丸。Conventionally, methods for generating green discharge plasma include:
Spring coupling method using parallel plate electrodes and coiled electrodes
The induction metallization method is mainly used.
又、g−5i太陽電池製作時の基板温度は従来250℃
〜350℃であり5g−5i太陽電池のg−5層層の厚
さは約5ooo 7%即ちpyaは約took。Additionally, the substrate temperature during production of g-5i solar cells was conventionally 250°C.
~350°C, and the thickness of the G-5 layer of a 5g-5i solar cell is approximately 5007%, or pya is approximately took.
1層は約50004% 電層は約300 !であり、a
−5層積層用ガスのSiH,の濃度#′i−微結晶など
を作ることを目的としなi時は約1051あるいは10
0−のガスを用いることが多かった。The 1st layer is about 50004% and the electric layer is about 300%! and a
- Concentration of SiH, gas for 5-layer lamination #'i - When i is used for the purpose of making microcrystals, etc., it is approximately 1051 or 10
0- gas was often used.
これらの従来方法によって得られた単−a−5i太陽電
池素子の開放電圧は高々85011 V程度であり、光
電変換効率も最大で6%程度であった。The open-circuit voltage of single-a-5i solar cell elements obtained by these conventional methods was about 85011 V at most, and the photoelectric conversion efficiency was about 6% at most.
本発明は、従来と異ったα−5i太陽電池の製造方法に
より1これらを改善しようとするものである。The present invention attempts to improve these problems by using a method for manufacturing α-5i solar cells that is different from conventional methods.
本発明の特徴は、リング状電極を容量結合し、a−Si
積層基板を該リング状電極と離隔して設置し、グロー放
電プラズマを発生させ一−5iを積層することにある。The feature of the present invention is that ring-shaped electrodes are capacitively coupled, and a-Si
A laminated substrate is placed apart from the ring-shaped electrode, and glow discharge plasma is generated to laminate 1-5i.
この場合、他のガスで希釈したプラズマ反応炉内のSi
B、濃度を5弧以下とすること、又、基板温度を従来よ
り低い200℃以下に保持することも本発明の特徴に含
まれる0
本発明は上記の条件に依り、g−5iの全層厚が比較的
薄くて、高電圧、高変換効率の太陽電池を得ることを目
的とするものである。In this case, Si in the plasma reactor diluted with other gases
B. The features of the present invention include keeping the concentration below 5 arcs and keeping the substrate temperature below 200°C, which is lower than before.0 The present invention, based on the above conditions, The objective is to obtain a relatively thin solar cell with high voltage and high conversion efficiency.
以下に本発明を図面を用いて説明する。The present invention will be explained below using the drawings.
第1図に示すごとく、リング状電極、例えば2つのリン
グ状電極1を容量結合し、グルー放電プラズマを発生さ
せ、g−5iを積層する0この場合、該リング状電極と
α−5i積層基板2を適当な距離1離隔して設置する。As shown in FIG. 1, ring-shaped electrodes, for example, two ring-shaped electrodes 1, are capacitively coupled, glue discharge plasma is generated, and g-5i is laminated. In this case, the ring-shaped electrodes and the α-5i laminated substrate 2 at an appropriate distance apart.
□ こめ種の電極を用いることにより安走性の良い均一
なプラズマが得られた。この方法は平行平板電極を用i
る容量結合法に比べて、プラズマによるa−5i膜の衝
撃も少く、またプラズマ反応系を清浄に保ち易iなどの
利点がある。□ Uniform plasma with good stability was obtained by using a rice seed electrode. This method uses parallel plate electrodes.
Compared to the capacitive coupling method, this method has advantages such as less impact on the a-5i film by plasma and the ease of keeping the plasma reaction system clean.
次に希釈ガス、例えば水素によって希釈されたSiB、
の濃度は5%以下とする。SiB, then diluted with a diluent gas, e.g. hydrogen,
The concentration shall be 5% or less.
この仁とによって、a−5i太陽電池の充電変換効率の
向上を計ると同時に高価なSi瓦ガスの消費を大巾に削
減で自た〇
次に一α−5i積層時の、g−Si積層基板2の1度を
従来の値よりも低い200℃以下とする。This technology improves the charge conversion efficiency of the a-5i solar cell and at the same time greatly reduces the consumption of expensive Si tile gas. The temperature of the substrate 2 is set to 200° C. or less, which is lower than the conventional value.
この結果1第2図に示すごとく、特に高−開放電圧即ち
1単−a−5i太陽電池素子としては従来得られなかっ
た大暑な開放電圧Voc (May )= 945 w
h Vが得られた。尚、第2図で明らかなように、該基
板温度を250℃以上にした場合は、従来程度の低い開
放電圧しか得られなかった。As a result 1, as shown in Fig. 2, a particularly high open-circuit voltage, that is, a very high open-circuit voltage Voc (May) = 945 w, which could not be obtained conventionally for a 1-A-5i solar cell element, was obtained.
hV was obtained. Incidentally, as is clear from FIG. 2, when the substrate temperature was set to 250° C. or higher, only a low open circuit voltage comparable to the conventional one could be obtained.
第2図の横軸は基板温度’II(C)を示し、縦軸は開
放電圧Voc(mV)を示す。The horizontal axis in FIG. 2 indicates the substrate temperature 'II (C), and the vertical axis indicates the open circuit voltage Voc (mV).
又、光電変換効率本大巾に向上し、第3図に示すごとく
、照度AM−1でη−6,26% のものが得られた。In addition, the photoelectric conversion efficiency was greatly improved, and as shown in FIG. 3, η-6.26% was obtained at illuminance AM-1.
第3図の横軸は電圧−縦軸は電流を示す。尚、この場合
の開放電圧は0・q+gV、短絡電流はIt−43wh
A/cdフィルファクターH0,597−1変換効率は
6.26%であったog−5i層の全体の厚みは約25
00 iと従来のものよりかな抄薄いものであった。In FIG. 3, the horizontal axis represents voltage and the vertical axis represents current. In this case, the open circuit voltage is 0・q+gV, and the short circuit current is It-43wh.
The A/cd fill factor H0,597-1 conversion efficiency was 6.26%. The total thickness of the og-5i layer was approximately 25
00i, which was a little thinner than the conventional one.
本発明による太陽電池構造の1例を示すと、ガラス上に
インジウム・スズ酸化膜(ITO膜=(InwOa )
+−z(Snog>at −x=〜5 % e 〜1
00Ω/cd)を着け、順次P形層、各層、外形層を積
層し、最後に電極としてAIを蒸着したものである(以
下この太陽電池構造をITO/P−* −n / A
Iという)。An example of a solar cell structure according to the present invention is an indium tin oxide film (ITO film = (InwOa)) on glass.
+-z(Snog>at-x=~5% e~1
00 Ω/cd), the P-type layer, each layer, and the outer layer were sequentially laminated, and finally, AI was vapor-deposited as an electrode (hereinafter, this solar cell structure will be referred to as ITO/P-*-n/A).
(referred to as I).
以下に本発明のI実施例を説明する。Embodiment I of the present invention will be described below.
前述のごとく、第1図は本発明の装置の1実施例を示す
。ブラズ!発生用高周波には、該装置と良くマツチング
のとれた周波数の1つである8MH5を用いた。As mentioned above, FIG. 1 shows one embodiment of the apparatus of the present invention. Blaz! As the high frequency for generation, 8MH5, which is one of the frequencies that matched well with the device, was used.
高周波電源と電極との間にマツチングボックス3を入れ
マツチングをとった。A matching box 3 was placed between the high frequency power source and the electrodes to perform matching.
プラズマ発生炉には15Qssφの石英円筒4を用いた
0電極は2つのリング状電極1を容量結合した高周波の
同軸ケーブルの内線を基板から遠い側にある上部電極に
接続し、外lIl!管下部電極に接続した。なお外Sは
高周波電源のシャーシーに接続されている接地はされて
いない。接地をするか否か接地の仕方によってプラズア
の発生の仕方が変るので注意を用する。該リング状電極
1は巾2.J、、1III、厚さ0.4閣の銅板で構成
されている。又該リング状電極1の間隔は30■とした
。A quartz cylinder 4 of 15Qssφ is used for the plasma generation furnace.The 0 electrode connects the inner wire of a high frequency coaxial cable capacitively coupled two ring-shaped electrodes 1 to the upper electrode on the side far from the substrate, and the outer lIl! Connected to the electrode at the bottom of the tube. Note that the outside S is not connected to the chassis of the high frequency power supply and is not grounded. Be careful, as the way plasma is generated will change depending on whether or not it is grounded. The ring-shaped electrode 1 has a width of 2. J,,1III, made of copper plate 0.4 mm thick. Further, the interval between the ring-shaped electrodes 1 was set to 30 cm.
2つの該リング状電極1のうち、下部電極の下端と加熱
されたサセプター5上に乗せたa−Si積層用基板2と
の距離はる5■とじた。該2つのリング状電極I11′
11プラズマ発生炉の石英円筒4の外壁に巻いである。Of the two ring-shaped electrodes 1, the distance between the lower end of the lower electrode and the a-Si lamination substrate 2 placed on the heated susceptor 5 was 5 square meters. The two ring-shaped electrodes I11'
11 is wound around the outer wall of the quartz cylinder 4 of the plasma generating furnace.
該基板2にはITO付ガツガラスたはSnQ付ガツガラ
スいた。共に抵抗値は約I00Ω/cdである。Si
&はHlで希釈し・その濃度は体積噂で4幅の1のを用
いた◇
ドーパントとして\N形にはPHsを、P形にはB雪H
・を用いた。The substrate 2 contained ITO-coated goblet glass or SnQ-coated goose glass. Both have a resistance value of about I00Ω/cd. Si
& is diluted with Hl, and its concentration is rumored to be 1 in 4 widths by volume ◇ As dopants, \PHs is used for the N type, and B snow H is used for the P type.
・ was used.
a−5n積層時のプラズマ炉内のガス圧は約iトール(
Torr)であった。ガス圧により、下部電極と基板と
の間の最適距離祉変化し、ガス圧が高い程、その距離は
短くなった。α−5i積層時の基板温度は#!2図に示
す100〜200℃を用い、通常150℃で積層した。The gas pressure in the plasma furnace when stacking a-5n layers is about i Torr (
Torr). The optimal distance between the lower electrode and the substrate changed depending on the gas pressure, and the higher the gas pressure, the shorter the distance. The substrate temperature when stacking α-5i is #! Lamination was carried out at 100 to 200°C as shown in Figure 2, and usually at 150°C.
以上の条件により作製したα−5i太陽電池の構造はI
TO(Sルへ)/P−1−nlAl形で、P層は約lε
OJS各層は約2000.4.ル層は約1501であっ
た。The structure of the α-5i solar cell produced under the above conditions is I
TO(S)/P-1-nlAl type, P layer is about lε
Each OJS layer is approximately 2000.4. The number of layers was approximately 1501.
該g−5ii:@電池の特性は従来得られている値に比
べて、開放電圧Ve cが極めて大きく、イM−1で光
電変換効率41F −6,26%と大きいものが得られ
た。As for the characteristics of the g-5ii:@ battery, the open circuit voltage Vec was extremely high compared to the values obtained conventionally, and a high photoelectric conversion efficiency of 41F-6.26% was obtained for iM-1.
第4図に示すごとく、この大きな開放電圧を裏付けるよ
うに、g−5iの光学的禁止帯巾もまた通常よりO,1
gF以上大龜い龜のであった0n−5i展厚は約2so
o jと従来の約半分の厚さであり1高価なSiLガス
の濃度も5幡以下とすることにより節約することができ
た〇α−5i積層時の基板温度が200℃以下であるこ
とはエネルギー消費の点からも好ましい結果である。As shown in Figure 4, supporting this large open-circuit voltage, the optical forbidden band width of g-5i is also O,1
The thickness of 0n-5i, which was larger than gF, was about 2so.
The thickness is about half that of the conventional one, and the concentration of expensive SiL gas can be saved by keeping it below 5 meters.〇The substrate temperature when stacking α-5i is below 200℃. This is also a favorable result from the point of view of energy consumption.
以上の結果より、本発明によれけ、高電圧、高変換効率
で廉価なa−5i太陽電池を製作するのに極めて好都合
であり、有用である。From the above results, the present invention is extremely convenient and useful for producing a low-cost A-5i solar cell with high voltage, high conversion efficiency, and high conversion efficiency.
尚、ζこで用いたプラズマ発生用電極を同一反応炉内に
複数個並べ、同時に多数の6−5i太陽電池を瓢作する
ことも本発明に含まれることは明らかである。Note that it is clear that the present invention also includes arranging a plurality of the plasma generation electrodes used here in the same reactor and producing a large number of 6-5i solar cells at the same time.
#1#vlJFi本発明方決に用iる装置の構成説明図
、112図は開放電圧の基板温度依存性を示すグラフ図
であり、横軸は基板温度TS(0、縦軸は開放電圧Vo
c(tyhりを示す。113図はg−5i太陽電池の電
流−電圧特性図であり、横軸は電圧(ハ)、縦軸は電流
(mn/cd)を示す。第4図はg−5Kの光学的禁止
帯巾の基板温度依存性の説明図であり、横軸は基板温度
T # (Q 、縦軸は光学的禁止帯巾(−r)を示す
。
1・・・リング状電極、2・・・a −Si積層基−板
、3・・・マツチングボックス、4・・・石英円筒。
出願人 小松電子金属株式会社
株式会社 小 松 製 作 所
代理人 弁理士 米 原 正 章
弁理士 浜 本 志
第1図
@3図
IjJE(1/1#1#vlJFi Figure 112, which is an explanatory diagram of the configuration of the device used in the method of the present invention, is a graph showing the dependence of the open circuit voltage on the substrate temperature, where the horizontal axis is the substrate temperature TS (0, and the vertical axis is the open circuit voltage Vo).
c (tyh). Fig. 113 is a current-voltage characteristic diagram of the g-5i solar cell, where the horizontal axis shows the voltage (c) and the vertical axis shows the current (mn/cd). Fig. 4 shows the g-5i solar cell. It is an explanatory diagram of the substrate temperature dependence of the optical forbidden width of 5K, where the horizontal axis shows the substrate temperature T # (Q, and the vertical axis shows the optical forbidden width (-r). 1... Ring-shaped electrode , 2... a -Si laminated substrate, 3... matching box, 4... quartz cylinder. Applicant: Komatsu Electronic Metals Co., Ltd. Komatsu Manufacturing Co., Ltd. Representative Patent Attorney: Masaaki Yonehara Patent Attorney Shi Hamamoto Figure 1 @ Figure 3 IjJE (1/1
Claims (1)
膜を積層してアモルファスシリコン太陽電池を製造する
方法において1リング状電極lを容量結合し、g−5層
積層基板2をリング状電極Iと離隔して設置し、このa
−5層積層基板2゛上にα−5iを積層するようにした
ことを特徴とするアモルファスシリコン太陽電池の製造
方法。 (2)2つのリング状電極1を用いてなる特許請求の範
囲の記1lN(+)のアモルファスシリコン太陽電池の
製造方法。 (3) a −Si積層基板2の温度を200℃以下
とする特許請求の範囲の記載(1ンのアモルファスシリ
コン太陽電池の顎造方法。 (4) SiH,の濃度を5襲以下とする特許請求の
範囲の紀1c(+)のアモルファスシリコン太陽電池の
製造方法。[Claims] (+) α-5i using Si tiles and glue discharge
In a method of manufacturing an amorphous silicon solar cell by laminating films, one ring-shaped electrode l is capacitively coupled, a g-5 layer laminated substrate 2 is placed apart from the ring-shaped electrode I, and this a
- A method for manufacturing an amorphous silicon solar cell, characterized in that α-5i is laminated on a five-layer laminated substrate 2. (2) A method for manufacturing an amorphous silicon solar cell of 11N(+) according to the claims, which uses two ring-shaped electrodes 1. (3) A patent claim that the temperature of the a-Si laminated substrate 2 is 200° C. or less (method for making an amorphous silicon solar cell) (4) A patent that the concentration of SiH is 5 or less A method for producing an amorphous silicon solar cell according to claim 1c(+).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56151964A JPS5853865A (en) | 1981-09-28 | 1981-09-28 | Method for manufacturing amorphous silicon solar cells |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56151964A JPS5853865A (en) | 1981-09-28 | 1981-09-28 | Method for manufacturing amorphous silicon solar cells |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5853865A true JPS5853865A (en) | 1983-03-30 |
Family
ID=15530057
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56151964A Pending JPS5853865A (en) | 1981-09-28 | 1981-09-28 | Method for manufacturing amorphous silicon solar cells |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5853865A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5646050A (en) * | 1994-03-25 | 1997-07-08 | Amoco/Enron Solar | Increasing stabilized performance of amorphous silicon based devices produced by highly hydrogen diluted lower temperature plasma deposition |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55151329A (en) * | 1979-05-14 | 1980-11-25 | Shunpei Yamazaki | Fabricating method of semiconductor device |
| JPS55154781A (en) * | 1979-05-22 | 1980-12-02 | Shunpei Yamazaki | Semiconductor device |
-
1981
- 1981-09-28 JP JP56151964A patent/JPS5853865A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55151329A (en) * | 1979-05-14 | 1980-11-25 | Shunpei Yamazaki | Fabricating method of semiconductor device |
| JPS55154781A (en) * | 1979-05-22 | 1980-12-02 | Shunpei Yamazaki | Semiconductor device |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5646050A (en) * | 1994-03-25 | 1997-07-08 | Amoco/Enron Solar | Increasing stabilized performance of amorphous silicon based devices produced by highly hydrogen diluted lower temperature plasma deposition |
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