JPS5859595A - Artificial light source - Google Patents

Artificial light source

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Publication number
JPS5859595A
JPS5859595A JP15616781A JP15616781A JPS5859595A JP S5859595 A JPS5859595 A JP S5859595A JP 15616781 A JP15616781 A JP 15616781A JP 15616781 A JP15616781 A JP 15616781A JP S5859595 A JPS5859595 A JP S5859595A
Authority
JP
Japan
Prior art keywords
light
light source
artificial
irradiated surface
artificial light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15616781A
Other languages
Japanese (ja)
Other versions
JPH0231475B2 (en
Inventor
昌樹 楠原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hakko Co Ltd
Original Assignee
Hakko Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hakko Co Ltd filed Critical Hakko Co Ltd
Priority to JP15616781A priority Critical patent/JPH0231475B2/en
Publication of JPS5859595A publication Critical patent/JPS5859595A/en
Publication of JPH0231475B2 publication Critical patent/JPH0231475B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Microscoopes, Condenser (AREA)
  • Control Of Exposure In Printing And Copying (AREA)
  • Control Of Non-Electrical Variables (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 本発明は人工光源装置に関し、特に、被照射面における
光強度を常に予定値に保持することのできる人工光源装
置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an artificial light source device, and more particularly to an artificial light source device that can always maintain the light intensity on a surface to be illuminated at a predetermined value.

人工光S装置は、ソーラシュミレータや焼付用光源とし
て最近広く実用されるようKなったが、これに!!求さ
れる重畳な特性として、被照射面の光強度を常に予定値
に保持できることがあげられる。
Artificial light S devices have recently come into widespread use as solar simulators and light sources for printing, but this! ! One of the required superimposed characteristics is that the light intensity on the irradiated surface can always be maintained at a predetermined value.

このような光強度制御手段を備えた従来の人工光源装置
の一例を.lgl図κ示す。図において、1はキセノン
ランプ等の人工光源、2はその背稜κ設けられた集光ミ
ラー(例えば惰円反射鏡)、3は、前記人工光源1から
の光を反射して光路を折り曲げる反射鏡である。
Here is an example of a conventional artificial light source device equipped with such a light intensity control means. lgl diagram κ is shown. In the figure, 1 is an artificial light source such as a xenon lamp, 2 is a condensing mirror (for example, an inertial reflector) provided on the back edge of the artificial light source 1, and 3 is a reflector that reflects the light from the artificial light source 1 and bends the optical path. It's a mirror.

4け、反射−3からの反射光を、被照射面5上に指向さ
せ、投射するための積分光学系、6Fi積分光学糸4か
ら投射される光を平行光線化するためのコリメータレン
ズ,61はコリメータレンズ6の外周に設けられた透光
板である。
4, an integrating optical system for directing and projecting the reflected light from the reflection-3 onto the irradiated surface 5; a collimator lens 61 for collimating the light projected from the 6Fi integrating optical thread 4; is a transparent plate provided around the outer periphery of the collimator lens 6.

また、7fl反射鏡3と積分光学系4との間に配置され
たズームレンズ系、8F′i積分光学系4の入射lli
[lVC配置されたアパーチ丁である。なお、アパーチ
−f8の、%に光入射側の面は無反射性とするのがc4
−*Lい。
In addition, a zoom lens system disposed between the 7fl reflecting mirror 3 and the integrating optical system 4, and an 8F'i incident lli of the integrating optical system 4
[This is an aperture with IVC arrangement. In addition, the surface on the light incident side of aperture f8 is made non-reflective.
-*L.

1014、集光ミラー2の範囲外へ放射される人工光源
1からの光一すなわち,人工光源としては、有効に利用
されない光−を検出する一yt,!lI出器、11はそ
のリード−である。
1014, detecting the light from the artificial light source 1 that is emitted outside the range of the condensing mirror 2, that is, the light that is not effectively used as an artificial light source. 11 is its lead.

キセノンランプ等の人工光源1から発せられた光は、集
光ミラー2および反射鏡3によって反射され、ズームレ
ンズ系7の入射面に光源lの実像を形成する。ズームレ
ンズ系7は、さらに積分光学系4の入射面に、人工光源
1の縮少/拡大像を結ばせる。前記入射面上の儂は、従
来技術rおけると同様に、積分光学系4によって被照射
ilki5に投射される。
Light emitted from an artificial light source 1 such as a xenon lamp is reflected by a condensing mirror 2 and a reflecting mirror 3 to form a real image of the light source 1 on an incident surface of a zoom lens system 7. The zoom lens system 7 further forms a reduced/enlarged image of the artificial light source 1 on the entrance surface of the integrating optical system 4. The light on the incident surface is projected onto the irradiated ilki 5 by the integrating optical system 4, as in the prior art.

ズームレンズ系7の焦点距離を、公知の過当な手段によ
って調整すると、倍率が変化し、積分光学系4の入射面
に形成される人工光源lの像の大きさが変化する。儂の
大きさが大きくなった場合、前記入射11Ktj一定の
大きさのアパーチ−r8が設けられているので、積分光
学系4Klj際に入射する光強度が減少する。これκよ
って、被照射ths上における光強度が減少す−る。
If the focal length of the zoom lens system 7 is adjusted by known unreasonable means, the magnification will change and the size of the image of the artificial light source l formed on the entrance surface of the integrating optical system 4 will change. When the size of the optical system 4Klj increases, the intensity of the light incident on the integrating optical system 4Klj decreases because the aperture r8 of a constant size is provided for the incident light 11Ktj. As a result of this κ, the light intensity on the irradiated ths decreases.

ここで、人工光源lの発光強度が変化した場合は、光検
出器10の検出出力が変化する。
Here, when the emission intensity of the artificial light source 1 changes, the detection output of the photodetector 10 changes.

したがって、光検出8110の検出出力を、人工光源1
の一電源装置(図示せず)、またはズームレンズ系7の
駆動装置(図示せず)KjLM遺し、前記電源装置から
人工光源IK供給される電fIL%,ま九はズーム′レ
ン・ズ系〜7の焦点距離tell御するようにすれば,
人工光源lの発−光強度・を、一定ド保持、することが
できる。 、一゛) なお、ズームレンズ系7tl必ずしも必要ではなく、省
略することができるものであることは明らかであろう。
Therefore, the detection output of the light detector 8110 is
a power supply device (not shown) or a drive device (not shown) for the zoom lens system 7; If you control the focal length of 7 by tell,
The light emission intensity of the artificial light source can be kept constant. , 1) Note that it is clear that the zoom lens system 7tl is not necessarily necessary and can be omitted.

しかしながら、人工光源として放電灯を用いる場合Eお
いてに、たとえその放電電流を一定に制御していても、
放電路の周辺では放電が不安定となり、いわ、ゆ泊「ゆ
らぎ」現象を生ずることが多い。′!牟、実質上の光源
とみなされる放電灯の輝点が電極にそって移動す号現象
もある。
However, when using a discharge lamp as an artificial light source, even if the discharge current is controlled to be constant,
The discharge becomes unstable in the vicinity of the discharge path, often causing the so-called ``fluctuation'' phenomenon. ′! There is also a phenomenon in which the bright spot of a discharge lamp, which is considered a virtual light source, moves along the electrode.

くれ、らの現象が発生すると、被照射面5上の照度ニ変
動する。しかし、この場合は、放電電流が一定に保持−
されており、放電灯から放出される光の1緻にほとんど
変化1ないので、光轡出器10の恢、出出力はほとんど
変動しない。
When such phenomena occur, the illuminance on the irradiated surface 5 fluctuates. However, in this case, the discharge current remains constant -
Since there is almost no change in the light emitted from the discharge lamp, the output power of the light output device 10 hardly changes.

以上のことから明らかなようk、前述のような1ゆらぎ
」や輝点の移動現象を生じた場合Kに。
As is clear from the above, when the above-mentioned ``1 fluctuation'' or the movement of the bright spot occurs, the value becomes K.

弟1図&C示した従来装置では,光検出器、19の出力
と被照引戸5上の輝度とが正確に対%.L,ないと、と
 j( !x  る0               
     ・    “ ・ 4・   、    J
一5それ故に,、一照射,面5上の黒率が変化、してい
るにもかかわらず、光検出器10の出力は変化せず、こ
のために、放電電流やズームレンズ焦点距離が適正に制
御されず、被照射面5上の照度が設定値から外れるとい
り欠点を生ずる。
In the conventional device shown in Figures 1 & C, the output of the photodetector 19 and the brightness on the illuminated sliding door 5 are accurately %. L, without it, j(!xru0
・ “ ・ 4・ , J
15 Therefore, even though the black rate on the surface 5 changes during one irradiation, the output of the photodetector 10 does not change, and for this reason, the discharge current and zoom lens focal length are appropriate. Therefore, the illuminance on the irradiated surface 5 deviates from the set value, resulting in a drawback.

前述の欠点を改善し、被照射面s上の照度変化を正しく
検出するために、第2図および第3図に示すように、光
検出器を被照射面上に配置することが考えられる。
In order to improve the above-mentioned drawbacks and correctly detect changes in illuminance on the illuminated surface s, it is conceivable to arrange a photodetector on the illuminated surface as shown in FIGS. 2 and 3.

第2図および第3図において、第1図と同一の符号は同
一部分をあられしている、IOAは被照射面5上に配置
された光検出器である。なお、第3図は第2図の1−1
gKそう被照射面5の平面図である。
In FIGS. 2 and 3, the same reference numerals as in FIG. 1 represent the same parts, and IOA is a photodetector placed on the irradiated surface 5. In FIGS. Note that Figure 3 shows 1-1 in Figure 2.
gK is a plan view of the irradiated surface 5.

このような構成および配置にすれば、光検出器10AK
よって・被照射面5上の照度を正しく検出することがで
きる。したがって、放電灯(人工光源)1から放射され
る光強度が変動した場合はもちろんのこと、前述の「ゆ
らぎ」や輝点移動の現像が発生した場合にも、被照射面
5上の照[を設定値に確実に保持することができる。
With such a configuration and arrangement, the photodetector 10AK
Therefore, the illuminance on the irradiated surface 5 can be detected correctly. Therefore, not only when the light intensity emitted from the discharge lamp (artificial light source) 1 fluctuates, but also when the above-mentioned "fluctuation" or luminescent spot movement occurs, the illumination on the irradiated surface 5 [ can be reliably held at the set value.

しかし、この場合は、 (1)被照射面の有効面積が減少する。However, in this case, (1) The effective area of the irradiated surface is reduced.

(2)  試料を被照射面に載置する際に、光検出器を
債わないように注意する必要があり、作業性が低下する
(2) When placing the sample on the irradiated surface, care must be taken not to damage the photodetector, which reduces work efficiency.

などの別の欠点を生ずる。This results in other drawbacks such as:

本発明の目的は、前述の欠点をすべて解消し、被照射面
の有効面積減少や作業性低下などを伴なうことなしに、
被照射面の照fILを正確K Ijlll定することの
できる光検出器を備えた人工光源装置を提供することば
ある。
The purpose of the present invention is to eliminate all of the above-mentioned drawbacks, and to achieve the same without reducing the effective area of the irradiated surface or reducing workability.
There is provided an artificial light source device equipped with a photodetector that can accurately determine the illumination fIL of an irradiated surface.

前記の目的を達成するために、本発明においては、積分
光学系から投射される光のうち、被照射面に至る光路外
のものを受光する位置に、光検出器を配置するようにし
ている。
In order to achieve the above object, in the present invention, a photodetector is arranged at a position that receives light projected from the integrating optical system that is outside the optical path leading to the irradiated surface. .

以下に、図面を参照して本発明の詳細な説明するO 第4図は本発明の一実施例の概略構成図である。Hereinafter, a detailed explanation of the present invention will be given with reference to the drawings. FIG. 4 is a schematic diagram of an embodiment of the present invention.

図において、wJl、第2図と同一の符号は同一または
同等部分をあられす。IOBは、積分光学系4から被照
射面5へ投射される光束外の光を受光できる位置に配置
された光検出器、IIBはその出力リード線である。
In the figure, wJl, the same reference numerals as in Fig. 2 represent the same or equivalent parts. IOB is a photodetector placed at a position where it can receive light outside the beam projected from the integrating optical system 4 onto the irradiated surface 5, and IIB is its output lead wire.

積分光学系4#′i、良く知られているように、多数の
エレメントレンズの集合体として構成されている。そし
て、実際上、積分光学系の各エレメントレンズに入射さ
れた光のうちKは、その両端面で、複数回の反射をくり
返してから、放出されるものが存在する。
As is well known, the integrating optical system 4#'i is constructed as an assembly of a large number of element lenses. In reality, some of the light K incident on each element lens of the integrating optical system is reflected a plurality of times at both end surfaces before being emitted.

それ故に、帥記光検出器10Bを、積分光学系4から投
射される光が被照射面に到達する光路の外側−換言すれ
ば、積分光学系4から普照射th5へ投射される光束の
外側近くに配置しておけば、この光検出lB10Bは、
積分光学f4の事実上すべてのエレメントレンズからの
放出光を受光することができる◎ すなわち、前記のような構成および配置にしておけば、
被照−射面5上における光強度の変化と全く同じように
、その強度が変化する光を、前記光検出器10Bは受光
することができる。
Therefore, the photodetector 10B is placed outside the optical path where the light projected from the integrating optical system 4 reaches the irradiated surface, in other words, near the outside of the light beam projected from the integrating optical system 4 to the general illumination th5. Once placed, this photodetector IB10B will
It is possible to receive the light emitted from virtually all the element lenses of the integrating optical f4. In other words, with the above configuration and arrangement,
The photodetector 10B can receive light whose intensity changes in exactly the same way as the light intensity changes on the irradiated surface 5.

したがって、この光検出1610Bの検出出力を用いて
、第1図に関して前述したようK、放電灯(人−L光源
)1の電源装置(図示せず)、tたはズームレンズ系7
の駆動装置(図示せず)を制御し、放電灯1への供給電
流またはズームレンズ系7の焦点距離を調節すれば、被
照射面5上における照F#Lを常に設定値に正しく保持
することができるようKなる。
Therefore, using the detection output of this light detection 1610B, as described above with reference to FIG.
By controlling the drive device (not shown) and adjusting the current supplied to the discharge lamp 1 or the focal length of the zoom lens system 7, the illumination F#L on the irradiated surface 5 can always be maintained correctly at the set value. I will be able to do it.

また、良く知られているように、光学レンズの表(3)
においては、幾分かの光反射が必ず存在するものである
。したがって、積分光学系4から放出されてコリメータ
レンズ6に向う光線も、その表thにおいて、反射光を
生じている。この反射光の・iさけ、被照射面5におけ
る光強度に比例していることは明らかである。
Also, as is well known, the optical lens table (3)
There is always some light reflection. Therefore, the light beam emitted from the integrating optical system 4 and directed toward the collimator lens 6 also generates reflected light at its surface th. It is clear that the amount of this reflected light is proportional to the light intensity on the irradiated surface 5.

それ故に、第4図に1点線10Cで示したように、前記
コリメータレンズ6の入射光側表面で反射された光を受
光できる位置に、光検出器を配置すれは、前述と全く同
様の、光検出および被照射面上の照度の一定値制御力積
埃できる。
Therefore, as shown by the one-dot line 10C in FIG. 4, if the photodetector is placed at a position where it can receive the light reflected by the surface of the collimator lens 6 on the incident light side, it is possible to do exactly the same as described above. Light detection and constant value control of illuminance on the irradiated surface can be applied to the dust.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の人工光源装置の一例を示す概略構成図、
第2図は従来の人工光源装置の他の例の要部を示す概略
構成図、第3図に!2図のI−1線にそう平面図、第4
図は本発明の一実施例の概略構成図である。 1・・・人工光源(放電灯)、  2・・・集光ミラー
、3・・・反射鏡、  4・・・積分光学系、  51
1.被照射面、  6・・・コリメータレンズ、  7
・・・ズームレンズ系、   10.IOB・・・光検
出器。 代理人弁珊士 平 木 道 人 外1名 才 1111! 1・′ 22 図 ■ 23 関 才 4 閃
FIG. 1 is a schematic configuration diagram showing an example of a conventional artificial light source device,
Figure 2 is a schematic configuration diagram showing the main parts of another example of a conventional artificial light source device, and Figure 3 is! Plan view along line I-1 in Figure 2, No. 4
The figure is a schematic configuration diagram of an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Artificial light source (discharge lamp), 2... Condensing mirror, 3... Reflecting mirror, 4... Integrating optical system, 51
1. Irradiated surface, 6... Collimator lens, 7
...Zoom lens system, 10. IOB...Photodetector. Agent attorney Michi Hiraki, one of the most talented 1111! 1・' 22 Figure ■ 23 Kansai 4 Sensation

Claims (1)

【特許請求の範囲】 (1)人工光源と、IIJ記−人工光源の背後に配置さ
れた集光ミラーと−,#1e集光ミラーで収れんされ大
光を入射され、は讐均質の光を被照射IIり投射する積
分光学系と、被照射1iKシける光強IIL會刺御する
手段と、積分光学系ネら投射される党Φうち。 被照射面に至る光路外へ投射され光光を受光する位置に
配置さ、tした光検出器と、驚頼出Iの出力を。 前記被、照射面にお叶る光強度制御手段に負sitする
手段−2−を具備し、被照射面にお社る黒度を設定値に
保持するように制御することを崎重乏する人工t、g*
置。 (り 普照射1iK)轄る光411変制御手域が1人工
光源への供*’t*を制御す1手段であることを特徴と
する前記特許請求の範囲第1項(載の人工光源−装置。 ti  *照射向における光強度制御手段が、集光ミラ
ーと積分光学系との間に配置されたズームレンズ系の1
動装置であることtIfII像とする特許請求の範囲第
1項記載の人工光源装置。 。 (41人工光源と、前記人工光源の背後に配置された集
光ミラーと、前記集光ミラーで収れんされた光を入射さ
れ、はソ均質の光を被照射面に投射する積分光学系と、
被照射面における光強度を制御する手段と、積分−光学
系から投射された光を平行光線化するコリメータシンズ
之、コリメータレンズの光入射thi@yおける反射光
を受光する位置に配mされた光検担器と、光検出器の出
力を、前記被照射面における光強度制御手段に負−帰還
する手IR乏を具備し、11照射面式おけろ照度1散定
値に係持するよう式制御することtIk黴とする人工光
wIA懐置装 (5)1照射1における光強度制御手段か1人工光線へ
の哄普電aを制御す−る手段であること一1w黴とする
前記特許請求の範S纂4項記゛載の人工光源装置。 (6)被照射面における光強度制御手段が、集光ミラー
と積分光学系との間に配置されたズームレンズ系の駆動
装置であることを特徴とする特許請求の範囲第4項記載
の人工光源装置。
[Scope of Claims] (1) An artificial light source, and a large amount of light that is converged by the #1e condensing mirror, which produces homogeneous light. An integral optical system for projecting an image onto the irradiated object, a means for controlling a light intensity IIL system for irradiating the irradiated object, and an integral optical system for projecting an image onto the irradiated object. A photodetector is placed at a position to receive the light projected outside the optical path leading to the irradiated surface, and the output of the light source I is placed. The light intensity control means applied to the irradiated surface is provided with means-2- for applying a negative intensity, and control is performed to maintain the degree of blackness on the irradiated surface at a set value. Artificial t, g*
Place. The artificial light source according to claim 1 (referring to claim 1), characterized in that the light 411 variable control area under the control of the general irradiation 1iK is one means for controlling the supply *'t* to one artificial light source. - Apparatus. ti *The light intensity control means in the irradiation direction is one of the zoom lens systems arranged between the condensing mirror and the integrating optical system.
The artificial light source device according to claim 1, wherein the artificial light source device is a dynamic device and produces a tIfII image. . (41) an artificial light source, a condensing mirror disposed behind the artificial light source, and an integrating optical system that receives the light converged by the condensing mirror and projects the homogeneous light onto the irradiated surface;
A means for controlling the light intensity on the irradiated surface, a collimator lens for collimating the light projected from the integral optical system, and a collimator lens arranged at a position to receive the reflected light at the light incidence of the collimator lens. It is equipped with an optical detector and a hand IR detector that negatively feeds back the output of the photodetector to the light intensity control means on the irradiated surface, and has a formula for controlling the illuminance of the 11 irradiated surface type to a fixed value of 1. Artificial light WIA device for controlling (5) The above-mentioned patent, which is a means for controlling light intensity in 1 irradiation 1 or a means for controlling a general electric field a to artificial light rays. The artificial light source device according to claim S4. (6) The artificial light according to claim 4, wherein the light intensity control means on the irradiated surface is a drive device for a zoom lens system disposed between the condensing mirror and the integrating optical system. Light source device.
JP15616781A 1981-10-02 1981-10-02 JINKOKOGENSOCHI Expired - Lifetime JPH0231475B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15616781A JPH0231475B2 (en) 1981-10-02 1981-10-02 JINKOKOGENSOCHI

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Application Number Priority Date Filing Date Title
JP15616781A JPH0231475B2 (en) 1981-10-02 1981-10-02 JINKOKOGENSOCHI

Publications (2)

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JPS5859595A true JPS5859595A (en) 1983-04-08
JPH0231475B2 JPH0231475B2 (en) 1990-07-13

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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6169132A (en) * 1984-09-13 1986-04-09 Nippon Kogaku Kk <Nikon> Exposing device
JPS6172219A (en) * 1984-09-15 1986-04-14 Canon Inc Exposure device
JPS63110595A (en) * 1986-10-27 1988-05-16 ウシオ電機株式会社 Output control system for light radiator
JPH02259635A (en) * 1988-12-05 1990-10-22 Eastman Kodak Co Light source apparatus with fixed color temperature and irradiation intensity
JPH02262635A (en) * 1988-12-05 1990-10-25 Eastman Kodak Co Variable brightness light emitter
JP2005134391A (en) * 2003-10-28 2005-05-26 Agilent Technol Inc Reflective image encoding device
JP2006222344A (en) * 2005-02-14 2006-08-24 Nikon Corp Exposure apparatus and microdevice manufacturing method
WO2008059733A1 (en) * 2006-11-15 2008-05-22 National Institute Of Advanced Industrial Science And Technology Solar simulator

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6169132A (en) * 1984-09-13 1986-04-09 Nippon Kogaku Kk <Nikon> Exposing device
JPS6172219A (en) * 1984-09-15 1986-04-14 Canon Inc Exposure device
JPS63110595A (en) * 1986-10-27 1988-05-16 ウシオ電機株式会社 Output control system for light radiator
JPH02259635A (en) * 1988-12-05 1990-10-22 Eastman Kodak Co Light source apparatus with fixed color temperature and irradiation intensity
JPH02262635A (en) * 1988-12-05 1990-10-25 Eastman Kodak Co Variable brightness light emitter
JP2005134391A (en) * 2003-10-28 2005-05-26 Agilent Technol Inc Reflective image encoding device
JP2006222344A (en) * 2005-02-14 2006-08-24 Nikon Corp Exposure apparatus and microdevice manufacturing method
WO2008059733A1 (en) * 2006-11-15 2008-05-22 National Institute Of Advanced Industrial Science And Technology Solar simulator
JP2008123951A (en) * 2006-11-15 2008-05-29 National Institute Of Advanced Industrial & Technology Solar simulator
US8016439B2 (en) 2006-11-15 2011-09-13 National Institute Of Advanced Industrial Science And Technology Solar simulator

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Publication number Publication date
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