JPS5892964A - Apparatus for measuring amplitude frequency characteristic of waveform - Google Patents

Apparatus for measuring amplitude frequency characteristic of waveform

Info

Publication number
JPS5892964A
JPS5892964A JP19055781A JP19055781A JPS5892964A JP S5892964 A JPS5892964 A JP S5892964A JP 19055781 A JP19055781 A JP 19055781A JP 19055781 A JP19055781 A JP 19055781A JP S5892964 A JPS5892964 A JP S5892964A
Authority
JP
Japan
Prior art keywords
waveform
amplitude
converter
full
wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19055781A
Other languages
Japanese (ja)
Other versions
JPH0343590B2 (en
Inventor
Eiichi Iizuka
栄一 飯塚
Shin Ebine
海老根 伸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP19055781A priority Critical patent/JPS5892964A/en
Publication of JPS5892964A publication Critical patent/JPS5892964A/en
Publication of JPH0343590B2 publication Critical patent/JPH0343590B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

PURPOSE:To reduce the measuring time with a simple circuitry by enabling the reading out of a relative frequency deviation at a high accuracy in the combination of a waveform converter and a detector. CONSTITUTION:A waveform converter 1 which converts into individual full- waveforms a waveform to be measured made by amplitude modulation of six different frequencies separately, for example, a multi-burst waveform is composed of waveform separators 1a and 1b and a waveform synthesizer 1c. The waveform separator 1a and 1b are composed of a first clip circuit for detecting the waveform of positive polarity from the muli-burst waveform and a second clip circuit for detecting the waveform of negative polarity from the multi-burst waveform. The waveform synthesizer 1c comprising a differential amplifier receiving and synthesizes a half-waveform separated positive and negative in the polarity with the waveform separators 1a and 1b and outputs full-waveforms each having a frequency component double in the frequency thereof. A detector 2 comprising a low pass filter detects (n) average components proportional to the amplitude of the respective full waves from output waveforms of the waveform synthesizers 1a and 1b.

Description

【発明の詳細な説明】 この発明は、たとえばマルチバースト波形のようなn個
の異なった周波数がそれぞれ振幅変調され圧波形を使っ
てテレビジ冒ン回線などにおける振幅周波数特性を測定
する波形の振幅周波数特性測定装置に関するものである
DETAILED DESCRIPTION OF THE INVENTION This invention provides a method for measuring the amplitude-frequency characteristics of a television broadcast line using a pressure waveform in which n different frequencies, such as a multi-burst waveform, are amplitude-modulated. This invention relates to a characteristic measuring device.

従来、たとえば第2図(a)に示すマルチバースト波形
のようなn個の異なった周波数がそれぞれ振幅flll
された波形によってテレビジ嘗ン回線などにおける振幅
周波数特性を測定する場合は、マルチバースト波形をオ
シロスコープで直視観測し振幅の相対比較により周波数
特性を求めていた。
Conventionally, for example, n different frequencies, such as the multiburst waveform shown in FIG. 2(a), each have an amplitude of
When measuring the amplitude-frequency characteristics of a television line or the like using the generated waveform, the multi-burst waveform was directly observed with an oscilloscope and the frequency characteristics were determined by relative comparison of the amplitudes.

また、さらに測定精度を高めるために社マルチバースト
波形を拡大してそれぞれの周波数の波形の上またL下の
ピークを相対比較してい友。
In addition, to further improve measurement accuracy, we expanded the multiburst waveform and compared the peaks at the top and bottom of each frequency waveform.

しかしながら、テレビジ璽ン回線等を経由したマルチバ
ースト波形は回線等の非直線ひずみの影響によシ、該マ
ルチバースト波形の重畳正弦波の平均値に変動が生じ、
正規の重畳正弦波の平均値に対して波形の振幅は非対象
になることが多く、特にその数MHz以上の高域におい
て顕著である。
However, the multi-burst waveform transmitted via a television line etc. is affected by non-linear distortion of the line etc., and the average value of the superimposed sine wave of the multi-burst waveform fluctuates.
The amplitude of the waveform is often asymmetrical with respect to the average value of the regular superimposed sine wave, especially in the high range of several MHz or more.

このような場合、測定精度を高めるために波形を拡大し
てそれぞれの波形のピークを相対比較する方法では実際
の伝送路の振幅周波数特性を商い測定精度で測定するこ
とができなかった。
In such cases, the method of enlarging the waveforms and relatively comparing the peaks of each waveform in order to improve measurement accuracy has not been able to measure the amplitude frequency characteristics of the actual transmission line with high measurement accuracy.

したがって、このようなマルチバースト波形をオシロス
コープで観測する場合は波形の全振幅の相対比較を行わ
なければならず高*[の?tl11足は国難であった。
Therefore, when observing such a multiburst waveform with an oscilloscope, a relative comparison of the total amplitude of the waveform must be performed. TL11 was a national disaster.

また、直視観測によらず自動的に測定する場合には、各
周波数ごとに包絡線検波を行いA−D変換してディジタ
ル処理する方法があるが、各周波数ごとに検波時定数が
異なる検波器を必要とするので回路構成が大規模になる
。・また検波器に能動素子を使用するため温度変化の影
響を受けやすいなどの問題があった。
In addition, when measuring automatically without direct observation, there is a method of envelope detection for each frequency, A-D conversion, and digital processing, but a detector with a different detection time constant for each frequency is used. , the circuit configuration becomes large-scale.・Also, since the detector uses an active element, there are problems such as being easily affected by temperature changes.

この発明は以上の問題にかんがみてなされたもので、n
個の異なった周波数がそれぞれ振幅fMされた被測定波
形管それぞれ全波の波形に変換し、それぞれの全波の振
幅に比例したn個の平均値成分を検出し、該n個の平均
値成分のレベルから前記被測定波形の振幅周波数特性を
検知するようにした波形の振幅周波数特性測定装置を提
供するものである。
This invention was made in view of the above problems, and
Convert the measured waveform tube into a full-wave waveform in which each of the different frequencies has an amplitude fM, detect n average value components proportional to the amplitude of each full wave, and detect the n average value components proportional to the amplitude of each full wave. The present invention provides a waveform amplitude frequency characteristic measuring device that detects the amplitude frequency characteristic of the waveform to be measured from the level of the waveform.

以下、この発明について説明する。第1図はこの発明の
第1実施例のブロック桐成図を示す。この図において、
波形変換器1は6個の異なった周波数がそれぞれ振幅変
調された被測定波形、たとえばマルチバースト波形をそ
れぞれ全波の波形に変換するもので、波形分離器1a、
lbおよび波形合成器1cで構成されている。
This invention will be explained below. FIG. 1 shows a block diagram of a first embodiment of the present invention. In this diagram,
The waveform converter 1 converts a measured waveform whose amplitude is modulated at six different frequencies, such as a multi-burst waveform, into a full-wave waveform, and includes a waveform separator 1a,
lb and a waveform synthesizer 1c.

波形分離器1a、lb u前記マルチバースト波形から
正極性の波形を検出する第1のクリップ回路と前記マル
チ−バースト波形から負極性の波形を検出する第2のク
リップ回路とから構成されている。
The waveform separator 1a, lb u consists of a first clipping circuit that detects a positive polarity waveform from the multi-burst waveform and a second clipping circuit that detects a negative polarity waveform from the multi-burst waveform.

波形合成器1cは差動増幅器などで構成されており、波
形分離器1a、lbで正負に分離された半波の波形を受
領して合成し、前記周波数の2倍の周波数成分をそれぞ
れ有する全波の波形を出力する。
The waveform synthesizer 1c is composed of a differential amplifier, etc., and receives and synthesizes the half-wave waveforms separated into positive and negative by the waveform separators 1a and lb, and synthesizes the half-wave waveforms, each having a frequency component twice the frequency. Output the waveform of the wave.

検出器2はローパスフィルタ々どで構成されており、波
形合成器1a、lbの出力波形からそれぞれの全波の振
幅に比例したn個の平均値成分を検出する。標本化保持
器3は検出器2から出力されるn個の平均値成分のレベ
ルをそれぞれ標本化保持する。
The detector 2 is composed of low-pass filters and detects n average value components proportional to the amplitudes of the respective full waves from the output waveforms of the waveform synthesizers 1a and lb. The sampling holder 3 samples and holds the levels of the n average value components output from the detector 2, respectively.

A−D変換器4は標本化保持器3で保持された信号をデ
ィジタル信号に変換する。演算装置5はA−D変換器4
・の出力を受領して前記マルチバースト波形のそれぞれ
の振幅の値を演算する。表示器6は演算装置5で演算さ
れた振幅の値をディジタル表示する。
The A/D converter 4 converts the signal held by the sampling holder 3 into a digital signal. The arithmetic device 5 is an A-D converter 4
. . , and calculates the amplitude value of each of the multi-burst waveforms. The display 6 digitally displays the amplitude value calculated by the calculation device 5.

次にその動作について説明する。Next, its operation will be explained.

入力端子7には□被測定系から第2図(a)に示すよう
なマルチバースト波形が加えられる。マルチバースト波
形#−j:6個の異なった周波数を有し、それぞれが第
2図(b)に示すように振幅変調されている。
A multi-burst waveform as shown in FIG. 2(a) is applied to the input terminal 7 from the system under test. Multiburst waveform #-j: has six different frequencies, each of which is amplitude modulated as shown in FIG. 2(b).

このマルチバースト波形を波形分離器1a、lbに加え
、mlのクリップ回路1aおよび第2のクリップ回路1
bによシ平均値Aを基準として正極性(第2図(C))
と負極性(第2図(・))とに分離する。第2図(d)
は分離された1つの周波数の正極性の半波の波形を示し
、第2図<t>ta負極性の半波の波形を示す。波形分
離器1a、lbで正負に分離された半波の波形(第2図
(e) 、 (a) )は波形合成器1cで合成され、
前記周波数の2倍の周波数成分をそれぞれ有する第2図
(g)に示す全波の波形が出力される。第2図(h)は
低域周波数の全波の波形を示し、点線は平均値成分であ
る。また第2図U)は回線等の非直線ひずみの影響によ
シ第2図(&)に示す高域周波数の波形4秦幅0)が非
対揶になったときの全波の波形を示す。
This multi-burst waveform is added to the waveform separators 1a and lb, and the ml clip circuit 1a and the second clip circuit 1
Positive polarity based on the average value A (Fig. 2 (C))
and negative polarity (Fig. 2 (・)). Figure 2(d)
shows the waveform of a positive polarity half wave of one separated frequency, and FIG. 2 <t>ta shows the waveform of a negative polarity half wave. The half-wave waveforms separated into positive and negative waves by the waveform separators 1a and lb (Fig. 2(e) and (a)) are synthesized by the waveform synthesizer 1c,
A full-wave waveform shown in FIG. 2(g), each having frequency components twice the frequency described above, is output. FIG. 2(h) shows the waveform of the full wave at low frequencies, and the dotted line is the average value component. Also, Figure 2 U) shows the waveform of the full wave when the high frequency waveform 4 (width 0) shown in Figure 2 (&) becomes unpaired due to the influence of non-linear distortion in the line, etc. show.

波形合成器1cから出力される全波の波形(第2図−)
)はローパスフィルタで構成された検出器2で、第2図
軸)に示すようにそれぞれの全波の振幅に比例した6個
の平均値成分を検出する。すなわち、第3図のように非
直線ひずみの影響を受けないときの低域周波数の全波に
ついて考えてみるならば、この波形の展開式は である。したがって、2ωtをカットとするローパスフ
ィルタに通すと−の成分のみが残り、ロームπ スフィルタの出力信号はe(ωt)=−Eとなる。これ
に は正弦波の平均を示しておシ、したがってローパスフィ
ルタは最低周波数の2ωtの成分を除去できるものであ
ればよい。また高域における非対称の全波の波形の場合
も同じである。こうして、検出器2で検出された6個の
平均値成分のピーク値は被測定波形の振幅周波数特性を
忠実に埃している。
Full wave waveform output from waveform synthesizer 1c (Figure 2-)
) is a detector 2 composed of a low-pass filter, which detects six average value components proportional to the amplitude of each full wave, as shown in FIG. 2 (axis). That is, if we consider the full wave of low frequency when it is not affected by non-linear distortion as shown in FIG. 3, the expansion equation of this waveform is as follows. Therefore, when the signal is passed through a low-pass filter with a cut of 2ωt, only the negative component remains, and the output signal of the Rohm π-s filter becomes e(ωt)=−E. This indicates the average of the sine wave, so the low-pass filter may be any filter that can remove the lowest frequency 2ωt component. The same holds true for asymmetric full-wave waveforms in the high range. In this way, the peak values of the six average value components detected by the detector 2 faithfully reflect the amplitude frequency characteristics of the measured waveform.

検出器2で検出された6個の平均値成分のレベルは標本
化保持器31人−り変換器4および演算装置5でディジ
タル処理される。ディジタル処理された前記マルチバー
スト彼のそれぞ、れの振幅の値は表示器6でディジタル
表示される。
The levels of the six average value components detected by the detector 2 are digitally processed by a sampling holder 31, a digital converter 4, and an arithmetic unit 5. The amplitude values of each of the digitally processed multi-bursts are digitally displayed on a display 6.

第4図はこの発明の第2実施例のブロックm成図を示し
、1.’2 : 7は第1図と同一である。
FIG. 4 shows a block diagram of a second embodiment of the present invention.1. '2:7 is the same as in FIG.

検出器2f検出さh 些、、 6個0平均値成分(第2
゛図(k) )の・レベルを直接、オシロスコープなど
の直視観測装着8に加えて直視観測し、相対的な偏差な
どを測定する。
Detector 2f detects 6 zero average value components (second
The level in Figure (k) is directly observed using a direct observation device 8 such as an oscilloscope, and relative deviations are measured.

以上説明したようにこの発明は、n個の異なった周波数
がそれぞれ振幅変調された被測定波形をそれぞれ全波の
波形に変換するための波形変換器と#変換器の出力波形
からそれぞれの全波の振幅に比例したn個の平均値成分
を検出するための検出器とを備えるようにしたので、オ
シロスコープなどによる直視数測でも拡大することによ
りたとえば相対的な周波数偏差を高精度で絖み取ること
ができる。また、ディジタル処理により自動測定する場
合は各周波数につきそれぞれ一つのサンプリングデータ
を取り込むだけでよいので回路構成が簡単になる。さら
にサンプリング点が少ないので測定の時間が短いなどの
効果を有する。
As explained above, the present invention is capable of converting a waveform to be measured in which n different frequencies are amplitude-modulated into a full-wave waveform, respectively, from the output waveform of a waveform converter and a # converter. Since it is equipped with a detector for detecting n average value components proportional to the amplitude of be able to. Furthermore, when automatically measuring by digital processing, it is only necessary to take in one sampling data for each frequency, which simplifies the circuit configuration. Furthermore, since there are fewer sampling points, it has the advantage of shortening the measurement time.

なお、波形変換器および検出器は前述の実施例に限鷲さ
れるものではなく、要旨を変更しない範囲で樺々変形し
て実施することができる。
Note that the waveform converter and the detector are not limited to the embodiments described above, and can be modified and implemented without changing the gist.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の第1実施例、第2図はこの発明の詳
細な説明するための波形図、第3図は全波の波形図、第
4図はこの発明の第2実施例である。 1は波形変換器、2は検出器、3は標本化保持器、4は
A−D変換器、5は演算装置、6は表示器でめる。 特許用願人 安立電気株式会社
Fig. 1 shows a first embodiment of the invention, Fig. 2 shows a waveform diagram for explaining the invention in detail, Fig. 3 shows a waveform diagram of all waves, and Fig. 4 shows a second embodiment of the invention. be. 1 is a waveform converter, 2 is a detector, 3 is a sampling holder, 4 is an A-D converter, 5 is an arithmetic unit, and 6 is a display. Patent applicant Anritsu Electric Co., Ltd.

Claims (4)

【特許請求の範囲】[Claims] (1)  n個の異なった周波数がそれぞれ振幅変調さ
れた被測定波形をそれぞれ全波の波形に変換するための
波形変換器と;該波形変換器の出力波形からそれぞれの
全波の振幅に比例したn個の平均値成分を検出するため
の検出器とを備え、該n個の平均値成分のレベルから前
記被測定波形の振幅周波数特性を検知するようにしたこ
とを特徴とする波形の振幅周波数骨性装置。
(1) A waveform converter for converting the waveform to be measured whose amplitude is modulated at n different frequencies into a full-wave waveform; a detector for detecting n average value components, and detecting the amplitude frequency characteristic of the waveform to be measured from the level of the n average value components. Frequency bony device.
(2)前記波形変換器は前記被測定波形の振幅を正極性
と負極性に分離するための波形分離器と、該波形分離器
で正負に分離された半波の波形を受惟して合成し全波の
波形を出力するための波形合成器とを備えてなる特許請
求の範囲第1項記載の波形の振幅周波数特性装置。
(2) The waveform converter includes a waveform separator for separating the amplitude of the measured waveform into positive and negative polarities, and receives and synthesizes the half-wave waveforms separated into positive and negative polarities by the waveform separator. 2. A waveform amplitude frequency characteristic device according to claim 1, further comprising a waveform synthesizer for outputting a full-wave waveform.
(3)n個の異なった周波数がそれぞれ振幅変調された
被測定波形をそれぞれ全波の波形に変換するための波形
変換器と;該波形変換器の出力波形からそれぞれの全波
の振幅に比例したn個の平均値成分を検出するための検
出器と;該検出器から出力されるn個の平均値成分のレ
ベルをそれぞれ標本化保持するための標本化保持器と;
該保持器に保持された信号をディジタル信号に変換する
A−Df換器と;該A−D変換器の出力を受領して前記
被測定波形のそれぞれの珈幅の値を演算するための演算
装置とを備えた波形の振幅周波数特性測定装置。
(3) a waveform converter for converting the waveform under measurement whose n different frequencies are amplitude-modulated into full-wave waveforms; the output waveform of the waveform converter is proportional to the amplitude of each full-wave; a detector for detecting the n average value components; a sampling holder for sampling and holding the levels of the n average value components output from the detector;
an A-Df converter for converting the signal held in the holder into a digital signal; and an operation for receiving the output of the A-D converter and calculating the value of the amplitude of each of the waveforms to be measured. A waveform amplitude frequency characteristic measuring device comprising:
(4)前記波形変換器は前記被測定波形の振幅を正極性
と負極性に分離するための波形分離器と、該波形分離器
で正負に分離された半波の波形を受領して合成し全波の
波形を出力するための波形合成器とを備えてなる特許請
求の範囲第3項記載の波形の振幅周波・数特性装置。
(4) The waveform converter includes a waveform separator for separating the amplitude of the measured waveform into positive and negative polarities, and receives and synthesizes the half-wave waveforms separated into positive and negative polarities by the waveform separator. 4. A waveform amplitude frequency/number characteristic device according to claim 3, further comprising a waveform synthesizer for outputting a full-wave waveform.
JP19055781A 1981-11-30 1981-11-30 Apparatus for measuring amplitude frequency characteristic of waveform Granted JPS5892964A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19055781A JPS5892964A (en) 1981-11-30 1981-11-30 Apparatus for measuring amplitude frequency characteristic of waveform

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19055781A JPS5892964A (en) 1981-11-30 1981-11-30 Apparatus for measuring amplitude frequency characteristic of waveform

Publications (2)

Publication Number Publication Date
JPS5892964A true JPS5892964A (en) 1983-06-02
JPH0343590B2 JPH0343590B2 (en) 1991-07-03

Family

ID=16260048

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19055781A Granted JPS5892964A (en) 1981-11-30 1981-11-30 Apparatus for measuring amplitude frequency characteristic of waveform

Country Status (1)

Country Link
JP (1) JPS5892964A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2473919C1 (en) * 2011-09-27 2013-01-27 Российская Федерация, От Имени Которой Выступает Министерство Промышленности И Торговли Российской Федерации Device to convert resistance variation into voltage

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2473919C1 (en) * 2011-09-27 2013-01-27 Российская Федерация, От Имени Которой Выступает Министерство Промышленности И Торговли Российской Федерации Device to convert resistance variation into voltage

Also Published As

Publication number Publication date
JPH0343590B2 (en) 1991-07-03

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