JPS5893873A - Electric discharge device - Google Patents

Electric discharge device

Info

Publication number
JPS5893873A
JPS5893873A JP19236181A JP19236181A JPS5893873A JP S5893873 A JPS5893873 A JP S5893873A JP 19236181 A JP19236181 A JP 19236181A JP 19236181 A JP19236181 A JP 19236181A JP S5893873 A JPS5893873 A JP S5893873A
Authority
JP
Japan
Prior art keywords
discharge
pressure
gas
chamber
vacuum chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19236181A
Other languages
Japanese (ja)
Inventor
Toshiyuki Suzuki
鈴木 利之
Kazuo Nakamura
一雄 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Anelva Corp
Original Assignee
Anelva Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anelva Corp filed Critical Anelva Corp
Priority to JP19236181A priority Critical patent/JPS5893873A/en
Publication of JPS5893873A publication Critical patent/JPS5893873A/en
Pending legal-status Critical Current

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Classifications

    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34—Sputtering

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To permit easy start and maintenance of electric discharge in an electric discharge device by providing mechanisms for maintaining discharge and for introducing a gas for starting of discharge separately. CONSTITUTION:A flow rate control valve 2 for sputtering gas and a main valve 4 are set at prescribed openings, and a vacuum pump 3 is operated to maintain the inside of a vacuum chamber 1 at pressure for maintaining discharge. In order to start discharge, a solenoid valve 12 is opened to introduce the sputtering gas in a room 11 contg. gas into the chamber 1. The valve 12 is closed thereafter to be ready for the next start of discharge, and the gas is beforehand filled in the chamber 11 by opening a solenoid valve 13. When the gas in the chamber 11 is introduced into the chamber 1, the pressure in the chamber 1 rises by about one digit instantaneously and the discharge is started. Thereafter, while the discharge is maintained, the pressure in the chamber 1 lowers to the pressure for maintaining discharge, and when a shutter 8 is opened and vapor depositing films are formed on the substrate on a holder 6 by a target electrode 5.

Description

【発明の詳細な説明】 本発明は真空中における放電を行うための装置に関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for performing electric discharge in vacuum.

いま放電装置としてスノクツタ装置を例にとると。Let's take the Snokutsuta device as an example of a discharge device.

このス・母ツタ装置では真空室容器内を10 〜1O−
1Torr程度の範囲の特定の圧力に保ち、この内部に
設けられた陰極と陽極の間に電圧を印加して放電が行わ
れる。この結果生じた陽イオンが陰極表面を形成するタ
ーゲットを衝撃しス・ぐツタ−が起こシ、ターゲットか
ら飛び出した原子が基板上に付着して薄膜が形成される
。従って一般のス/’P ツタ−装置では真空中で安定
な放電を行うことが是非必要とされる。しかしながら一
般に放電を開始する条件と放電を維持する条件とは異る
ので、ス・ぐツタ−装置を操作する上ではそれらを制御
するためにかなりな努力と工夫が必要とされる。
In this su/mother ivy device, the inside of the vacuum chamber container is 10 to 1O-
Discharge is performed by maintaining a specific pressure in the range of about 1 Torr and applying a voltage between the cathode and anode provided inside. The resulting positive ions bombard the target forming the cathode surface, causing dust, and the atoms ejected from the target adhere to the substrate, forming a thin film. Therefore, it is absolutely necessary for a general spacecraft to perform stable discharge in a vacuum. However, since the conditions for starting a discharge and the conditions for maintaining a discharge are generally different, considerable effort and ingenuity are required to control them when operating a spark generator.

ス・やツタ−装置における放電状態は電極の幾伺学的形
状、ガス分子の種類、圧力、電圧等によつしても必ずし
も放電が開始するとは限らない。これは放電開始の方が
放電維持よりもむつかしいからである。
The state of discharge in a gas or tube device does not necessarily mean that discharge will start depending on the geometrical shape of the electrodes, the type of gas molecules, pressure, voltage, etc. This is because starting a discharge is more difficult than maintaining a discharge.

真空中の放電開始電圧と電極間隔及び圧力の相関性につ
いては・クツジエンの法則がよく知られている。通常の
ス)4? 51夕装置ではノクツシェンの法則によれば
放電開始電圧は圧力を高くするほど低くなり、また電極
間隔を拡大するほど低くなることが説明される。従来の
スノッター装置では、この法則の教えるところは従って
、圧力を一定にしておいて放電開始の際にはターゲット
電極を動かし−電極間隔をひろげ、開始後に再、び所定
の間隔に戻すという方法か、あるいは電極間隔を一定に
しておいて一度所定の圧力よシも高い圧力にして放電を
開始し、開始後に再び所定の圧力に戻す方法かが用い←
れていた。またこのほかに例えばターゲット電極の近く
に補助電極を設けて高電圧をかけたり、ターゲット電極
の近くに熱電子放出機構を設けて放電を開始する方法も
用いられていた。しかし電極間の距離を加減する方法は
ターゲット電極の上下機構が必要である上操作に時間を
要し。
Kutsien's law is well known regarding the correlation between discharge starting voltage, electrode spacing, and pressure in vacuum. Normal S)4? In the case of a 51-meter device, according to Nokschen's law, it is explained that the higher the pressure, the lower the discharge starting voltage, and the wider the electrode spacing, the lower the discharge starting voltage. In conventional snotter devices, this law teaches that the pressure is kept constant, the target electrode is moved when the discharge starts, the electrode spacing is widened, and then the electrode spacing is returned to the predetermined spacing again after the discharge starts. Alternatively, a method is used in which the electrode spacing is kept constant, the discharge is started at a pressure higher than the predetermined pressure, and then the pressure is returned to the predetermined pressure after the discharge has started.
It was Other methods have also been used, such as providing an auxiliary electrode near the target electrode and applying a high voltage, or providing a thermionic emission mechanism near the target electrode to start discharge. However, the method of adjusting the distance between the electrodes requires a mechanism to raise and lower the target electrode, and the operation takes time.

而も効果も薄い欠点がある。補助電極に高電圧をかける
方法では補助電極をターゲット電極に近づける必要があ
シ、電極設計上の制約を伴うとともに補助電極専用の高
電圧電源を必要とする欠点がある。また熱電子を利用す
る方法においても、熱電子用フ“イラメントをターゲッ
ト電極に近づけ且つ専用の電源を用意することは、補助
電極の場合と同様の欠点を有するものである。
However, it has the drawback of being ineffective. The method of applying a high voltage to the auxiliary electrode requires the auxiliary electrode to be close to the target electrode, which is accompanied by restrictions on electrode design and has the disadvantage of requiring a high voltage power source exclusively for the auxiliary electrode. Also, in the method using thermionic electrons, the need to bring the filament for thermionic electrons close to the target electrode and to prepare a dedicated power source has the same drawbacks as in the case of the auxiliary electrode.

真空室の圧力を加減する方法は従来の放電開始方法の中
では最も効果のある方法である。それは一般に放電開始
圧力が放電維持圧力より1桁以上高く、放電開始後は圧
力を下げても放電は持続するからである。しかし、従来
のスノ母ツタ装置における放電開始時の真空室圧力調整
は、ス・千ツタ気体導入用の流量制御弁を調節して気体
流入量を変化させるか、あるいは排気系のメインバルブ
等を調節して実効排気速度を加減するかしており、操作
が比較的面倒であると共に相当の時間も要するという欠
点があった。またス・母ッタ一工程の自動化を進める上
では放電開始時のこの種の圧力調整は大きな障害となっ
ている。
The method of adjusting the pressure in the vacuum chamber is the most effective method among the conventional discharge starting methods. This is because the discharge starting pressure is generally one order of magnitude higher than the discharge sustaining pressure, and after the discharge starts, the discharge continues even if the pressure is lowered. However, in order to adjust the pressure in the vacuum chamber at the start of discharge in conventional Sunobutsuta devices, it is necessary to adjust the flow rate control valve for Sunomotsuta gas introduction to change the amount of gas inflow, or to adjust the main valve of the exhaust system. The effective pumping speed is increased or decreased by adjustment, which has the drawback of being relatively troublesome to operate and requiring a considerable amount of time. In addition, this type of pressure adjustment at the start of discharge is a major obstacle in advancing the automation of the main process.

したがって本発明の目的は放電の開始と維持を容易に行
える放電装置を得ようとするものである。
Therefore, an object of the present invention is to provide a discharge device that can easily start and maintain discharge.

本発明の他の目的は放電の開始と維持を自動制御するの
に適した放電装置を得ようとするものである。
Another object of the present invention is to provide a discharge device suitable for automatically controlling the initiation and maintenance of discharge.

本発明は上記の目的を達成するために、放電装置に所定
の圧力を維持するための気体導入機構のほかに、真空室
の圧力を上げて放電を開始しそのあと圧力を下げて放電
が維持されるような独立した放電開始専用の気体導入機
構を備えるようにしたものである。そしてこの放電開始
専用の気体導入機構としては、気体収容室およびその両
側の停止弁で構成するものと、小さな空間を挾んだ停止
弁と流量制御弁で構成するものとの2つの方法を採用し
ている。
In order to achieve the above object, the present invention includes a gas introduction mechanism for maintaining a predetermined pressure in the discharge device, as well as a mechanism for increasing the pressure in the vacuum chamber to start discharge, and then lowering the pressure to maintain the discharge. The device is equipped with an independent gas introduction mechanism dedicated to starting discharge. Two methods have been adopted for the gas introduction mechanism dedicated to starting this discharge: one consisting of a gas storage chamber and stop valves on both sides, and the other consisting of a stop valve and a flow control valve sandwiching a small space. are doing.

上記のような構成によシ、短時間に適切な気体量を真空
室に導入して真空室圧力を放電開始できる最低圧力まで
上昇させ、そのおと速やかに尤の圧力まで戻して所定の
圧力を維持するようにしたものである。
With the above configuration, an appropriate amount of gas is introduced into the vacuum chamber in a short period of time to increase the vacuum chamber pressure to the minimum pressure at which discharge can start, and then the pressure is quickly returned to the normal pressure to maintain the predetermined pressure. It was designed to maintain the

次に図面を参照して詳細に説明する。はじめに従来の装
置について説明するが、先に述べたいくつかの例のうち
、最も効果的ではあるが操作が比較的面倒な真空室圧力
を加減する方式を例にとることとする。なおこの方式を
例にとったのは、ひとつに本発明の装置に最も近いと思
われるからである。
Next, a detailed explanation will be given with reference to the drawings. First, a conventional device will be described. Among the several examples mentioned above, a method for adjusting the vacuum chamber pressure, which is the most effective but relatively troublesome to operate, will be taken as an example. The reason why this method is taken as an example is that it is considered to be the closest to the device of the present invention.

第1図は上記の従来のス・ぐツタ装置の構成を示した図
である。真空室1に流量制御弁2全通して気体が導入さ
れ、一方では真空ポンプ3によシ排気が行われる。真空
室内の圧力は導入する気体の量とポンプの実行排気速度
によって決められる。
FIG. 1 is a diagram showing the configuration of the above-mentioned conventional suction device. Gas is introduced into the vacuum chamber 1 through the flow control valve 2, and on the other hand, exhaust is performed by the vacuum pump 3. The pressure inside the vacuum chamber is determined by the amount of gas introduced and the pumping speed.

更に具体的には流量制御弁2のコンダクタンスとメイン
バルブ4のコンダクタンスを制御することによシ所定圧
力が定常的に得られる。ターゲット電極5と基板ホルダ
ー6を含むアース電極の間にス・フッタ電源7から電圧
を印加する。一般に所定の圧力では放電が開始しないの
で、シャッター8で基板ホルダー6を覆った状態で流量
制御弁2をよりコンダクタンスが大きくなるようにひろ
げるか、あるいはメインパルプ4をよシ実行排気速度が
小さくするようにしぼるがすることにょシ、真空室の圧
力を一度高い圧力にまであげて放電を開始せしめる。し
かる後流量制御弁2のコンダクタンスあるいはメインパ
ルプ4のコンダクタンスを元の状態に戻すことによって
真空室1の圧力を所めて確実に動作はするが、先に述べ
たように操作が面倒で時間が掛る欠点があったのである
。
More specifically, by controlling the conductance of the flow control valve 2 and the conductance of the main valve 4, a predetermined pressure can be steadily obtained. A voltage is applied from a footer power source 7 between the target electrode 5 and the ground electrode including the substrate holder 6. Generally, discharge does not start at a predetermined pressure, so either expand the flow control valve 2 to increase the conductance while covering the substrate holder 6 with the shutter 8, or move the main pulp 4 and reduce the exhaust speed. As the pressure is reduced, the pressure in the vacuum chamber is raised to a high level and the discharge begins. After that, by returning the conductance of the flow rate control valve 2 or the conductance of the main pulp 4 to the original state, the pressure in the vacuum chamber 1 can be maintained and operation can be ensured, but as mentioned earlier, the operation is cumbersome and time consuming. It did have some drawbacks.

他の従来の装置の例として高電圧を印加するための補助
電極を設ける装置のあることは先に説明したとおりであ
るが、この補助電極は第1図に鎖線で参照数字9を付し
て示しである。又熱電子放射体を用いる場合も11!ぼ
同じ位置に設置することになる。但しいずれの場合も流
量!ItfJ弁2とメインパルプ4は一旦定常値にセッ
トすればあとは面倒な調節を行う必要はない。しかしい
ずれも何らかの欠点を有している。
As explained above, there is another example of a conventional device that is provided with an auxiliary electrode for applying a high voltage. This is an indication. Also, 11 when using a thermionic emitter! They will be installed in approximately the same location. However, in both cases, the flow rate! Once the ItfJ valve 2 and the main pulp 4 are set to steady values, there is no need to make any troublesome adjustments. However, all have some drawbacks.

第2図は本発明によるスパッタ装置の一実施例の構成を
示した図である。第2図においては、第1図におけると
同じ構成要素には同じ参照数字をツタ気体用の流量制御
弁2のほかに、気体収容室11およびその両側の電磁弁
12.13から成る放電開始専用の気体導入機構を配置
したものである。放電を開始させるときにはまず電磁弁
13を開いてアルゴンガスを気体収容室11に満たす。
FIG. 2 is a diagram showing the configuration of an embodiment of a sputtering apparatus according to the present invention. In FIG. 2, the same reference numerals are given to the same components as in FIG. This system is equipped with a gas introduction mechanism. When starting discharge, first, the electromagnetic valve 13 is opened to fill the gas storage chamber 11 with argon gas.

アルゴンガスの圧力はI Kyf/cIrL2ゲージ圧
である。
The pressure of argon gas is IKyf/cIrL2 gauge pressure.

次に電磁弁12を開くと、真空室1の圧力は瞬間的に上
昇して放電を開始する。圧力の代表的な値を示すと、ス
・ぐツタ圧力が5 X 1O−3Torr +放電開始
時が5 X 10  Torrである。電磁弁12は気
体収容室11の内部のアルゴンガスが真空室1に導入さ
れたあとは閉じておき2次の放電開始に備えるために電
磁弁13を開いて気体収容室11にアルコ8ンガスを満
たしておく。ここで気体収容室11の容積をvl 、そ
の圧力をPI  I真空室1の容積をV、放電開始圧力
をpo  lス・母ツタ圧力は放電開始圧PGに対して
無視できる程度(およそ10分の1)とすると、vl=
v−Po/P1の大きさにとっである。ここで更に真空
室1からみた排気系の実効排気速度をSとすると、真空
室1の側の電磁弁12を開いた瞬間に真空室1の圧力は
PG となって放電を開始し、そのあとの真空室圧力P
は時定数τ=v/Sで減衰する。減衰の時定数の一例を
示すと、真空室1の容積V=2007で実行排気速度S
 4100 Z/ sのとき1時定数τ=2秒である。
Next, when the electromagnetic valve 12 is opened, the pressure in the vacuum chamber 1 rises instantaneously and discharge starts. Typical pressure values are 5 x 10-3 Torr for suction pressure and 5 x 10 Torr at the start of discharge. The solenoid valve 12 is closed after the argon gas inside the gas storage chamber 11 is introduced into the vacuum chamber 1, and the solenoid valve 13 is opened to prepare for the start of the secondary discharge to introduce argon gas into the gas storage chamber 11. Keep it filled. Here, the volume of the gas storage chamber 11 is vl, its pressure is PI, the volume of the vacuum chamber 1 is V, and the discharge starting pressure is pol. 1), then vl=
It depends on the size of v-Po/P1. Furthermore, if the effective pumping speed of the pumping system seen from the vacuum chamber 1 is S, then the moment the solenoid valve 12 on the vacuum chamber 1 side is opened, the pressure in the vacuum chamber 1 becomes PG and discharge starts, and then vacuum chamber pressure P
decays with a time constant τ=v/S. To give an example of the time constant of the decay, when the volume of the vacuum chamber 1 is V=2007, the effective pumping speed S is
When the speed is 4100 Z/s, the time constant τ=2 seconds.

また放電開始時の圧力Po=5×10TOrrのとき。Also, when the pressure Po at the start of discharge is 5×10 TOrr.

これを得るためには気体収容室11の容積v1はで放電
を開始したときの真空室圧力の変化を示す図である。
In order to obtain this, the volume v1 of the gas storage chamber 11 is a figure showing the change in vacuum chamber pressure when discharge is started.

第2図の実施例においては、気体収容室11内の圧力が
一定の場合には気体収容室の容積を今迄述べてきたVl
 = %’P6/ PHの等式によりスフ9ツタ装置の
真空室容積に対応して決めてやるが、実用的には、5i
乃至500(lの容積の真空室をもつス・母ツタ装置に
対して必要とされる気体収容室の容積は0.1乃至10
0CC程度である。
In the embodiment shown in FIG. 2, when the pressure inside the gas storage chamber 11 is constant, the volume of the gas storage chamber is expressed as Vl.
= %'P6/PH is determined according to the vacuum chamber volume of the Sufu9 ivy device, but in practical terms, 5i
The volume of the gas storage chamber required for a vacuum chamber with a volume of 0.1 to 10
It is about 0CC.

第4図は本発明の第2の実施例の構成図である。FIG. 4 is a block diagram of a second embodiment of the present invention.

この装置は放電開始専用の気体導入機構として。This device is used as a gas introduction mechanism exclusively for starting discharge.

気体の流入と遮断を行う電磁弁21と通常流しているス
・ぐツタ気体の流量よシは1桁以上大きい流量を流すこ
とができるようなコンダクタンスを持つ流量制御弁22
を有しておシ、かつ電磁弁21と流量制御弁22の間の
死空間が極めて小さいことを特徴とするスパッタ装置で
ある。放電を開始させるときは電磁弁21を開き、流量
制御弁22のコンダクタンスに対応した相当大量のアル
ゴンガスを真空室1に導入して真空室圧力を相当早く上
昇させる。真空室圧力が放電開始圧力に達して放電を開
始したところで電磁弁21を閉じて放電開始用の気体の
導入を止め、このあとは第2図の第1の実施例における
と同じように真空室圧力をもとのスA?ツタ圧力に戻す
。この装置における具体的数値例を示すと、真空室容積
V=200# 、実効排気速度5=100A/a、アル
ゴン供給圧力P s = I V4f 7cm2ゲージ
圧、ス・母ツタ圧力5 Xl0−3Torr+放電開始
圧力P6 = 5 X 10  Torrのとき、流量
制御弁22のコンダクタンスC= 4.9 X 10 
 A/ sに選んであシ、真空室圧力Pが5 X 1O
−2Torr(Po)に達するまでの時間は2秒である
。
A solenoid valve 21 for inflowing and shutting off gas, and a flow control valve 22 having a conductance that can flow an order of magnitude higher than the flow rate of the normally flowing suction gas.
This sputtering apparatus is characterized in that the dead space between the electromagnetic valve 21 and the flow rate control valve 22 is extremely small. When starting discharge, the solenoid valve 21 is opened, and a considerable amount of argon gas corresponding to the conductance of the flow rate control valve 22 is introduced into the vacuum chamber 1, thereby raising the vacuum chamber pressure fairly quickly. When the vacuum chamber pressure reaches the discharge starting pressure and discharge starts, the electromagnetic valve 21 is closed to stop the introduction of gas for starting discharge, and after this, the vacuum chamber is closed in the same way as in the first embodiment shown in FIG. The pressure is based on SuA? Return to ivy pressure. Specific numerical examples for this device are as follows: vacuum chamber volume V = 200 #, effective pumping speed 5 = 100 A/a, argon supply pressure P s = I V4f 7 cm2 gauge pressure, main ivy pressure 5 Xl0-3 Torr + discharge When the starting pressure P6 = 5 x 10 Torr, the conductance C of the flow control valve 22 = 4.9 x 10
A/s is selected, vacuum chamber pressure P is 5 x 1O
The time it takes to reach -2Torr (Po) is 2 seconds.

第5図は第4図のス・フッタ装置で放電を開始するとき
の真空室圧力Pの変化を示す図である。流量制御弁22
のコンダクタンスをもっと大きな値にすれば5 X 1
O−2Torrに達するまでの時間は更に短くなるが、
圧力上昇が急激になるので電磁弁22を閉じたときの真
空室圧力の値は、電磁弁22を閉じるまでの時間の精度
に影響される。したがって5 X 1O−2Torrに
達するまでの時間が1〜2秒になるように流量制御弁2
2のコンダクタンスを調節するのが適切である。電磁弁
21と流量制御弁22の間の死空間には気体が常に存在
するために電磁弁21を開いた瞬間にここの容積と圧力
とで決められる気体も真空室に流入し圧力上昇に寄与す
る。従って精度よく放電開始圧力を制御するためには死
空間の容積が小さいほど好ましい。死空間の容積が無視
できない場合には、この方式は死空間のない理想的な状
態における実施例と死空間の容積に等しい気体収容室を
設えた第1の実施例との組みあわせと考えることができ
る。
FIG. 5 is a diagram showing changes in the vacuum chamber pressure P when starting discharge in the screen footer device shown in FIG. 4. Flow control valve 22
If the conductance of is made larger, 5 x 1
Although the time it takes to reach O-2 Torr is even shorter,
Since the pressure rises rapidly, the value of the vacuum chamber pressure when the solenoid valve 22 is closed is affected by the accuracy of the time until the solenoid valve 22 is closed. Therefore, the flow control valve 2 should be adjusted so that the time required to reach 5 x 1O-2Torr is 1 to 2 seconds.
It is appropriate to adjust the conductance of 2. Since gas always exists in the dead space between the solenoid valve 21 and the flow control valve 22, the moment the solenoid valve 21 is opened, the gas determined by the volume and pressure here also flows into the vacuum chamber and contributes to the pressure rise. do. Therefore, in order to accurately control the discharge starting pressure, it is preferable that the dead space has a smaller volume. If the volume of the dead space cannot be ignored, this method can be considered as a combination of the embodiment in an ideal state with no dead space and the first embodiment in which a gas storage chamber equal to the volume of the dead space is provided. I can do it.

第2の実施例の場合においては、流量制御弁22のコン
ダクタンスによって実用的な放電開始圧力を設定できる
ようにするためには、死空間の容積が0.5cc以下で
あることが望ましい。当然なことであるが、真空室1の
容積が大きくなるほど許される死空間の容積も大きくな
る。また第2の実施例においては、真空室1の圧力の上
昇の制御は。
In the case of the second embodiment, in order to be able to set a practical discharge starting pressure by the conductance of the flow control valve 22, it is desirable that the volume of the dead space is 0.5 cc or less. Naturally, the larger the volume of the vacuum chamber 1, the larger the volume of dead space allowed. Furthermore, in the second embodiment, the increase in pressure in the vacuum chamber 1 is controlled.

単に流量制御弁22のコンダクタンスの調節だけではな
く、電磁弁21の開時間の調節によっても可能である。
This is possible not only by simply adjusting the conductance of the flow control valve 22, but also by adjusting the opening time of the solenoid valve 21.

従ってス・母ツタ条件が異なシ放電開始圧力P、が変化
しても、これに対する細かい対応が可能である。すなわ
ち、真空室及び実効排気速度の異る組み合わせの多くの
ス・フッタ装置において、各種ス・ぐツタ条件で放電を
開始させることが可能となる。
Therefore, even if the discharge starting pressure P changes under different conditions, detailed measures can be taken. That is, in many suction devices with different combinations of vacuum chambers and effective pumping speeds, discharge can be started under various suction conditions.

更に第4図の装置を全自動スパッタ装置に適用した場合
高い信頼性で自動的に放電開始ができる。
Furthermore, when the apparatus shown in FIG. 4 is applied to a fully automatic sputtering apparatus, discharge can be started automatically with high reliability.

この場合、電磁弁21を閉じる時間を設定しておく代わ
りに図示してない放電検出機構、たとえば放電電流回路
に設けた抵抗体の両端に生じた電圧の急変を検出する機
構からの信号で電磁弁21を閉じることによシ、常に最
小の圧力上昇で放電開始ができ、排気系の負担を軽減す
るとともに放電開始の信頼性がより向上する。
In this case, instead of setting the time to close the solenoid valve 21, a signal from a discharge detection mechanism (not shown), for example, a mechanism that detects a sudden change in voltage generated across a resistor provided in a discharge current circuit, is used to generate an electromagnetic valve. By closing the valve 21, discharge can always be started with a minimum pressure increase, which reduces the burden on the exhaust system and further improves the reliability of discharge initiation.

以上説明したように、第1および第2の巣施例によれば
、ス・母ツタ条件を最適にしたままで、簡便に短時間で
効果的な放電開始が実現できる。またスパッタ装置の電
極構造や放電開始機構に物理的制約がなく、特殊な電源
も必要としていない。
As explained above, according to the first and second hive embodiments, it is possible to easily and effectively start a discharge in a short period of time while keeping the soil and mother ivy conditions optimal. Furthermore, there are no physical restrictions on the electrode structure or discharge initiation mechanism of the sputtering device, and no special power source is required.

そして特に第2の実施例を全自動ス・ぐツタ装置に適用
することにより、自動的な放電開始を高い信頼性で行う
ことができる。
In particular, by applying the second embodiment to a fully automatic spark plug device, automatic discharge can be started with high reliability.

以上の放電開始用気体導入機構の説明はスパッタ装置に
ついて行ってきたが9本発明は真空中における放電を利
用するほかの装置に応用することができる。例えば薄膜
形成のためのプラズマCVD装置やプラズマ重合装置に
使うことができる。また真空中でプラズマを発生させて
薄膜の蝕刻加工を行うゾラズマエッチング装置、リアク
ティブイオンエツチング装置、スノ’P ツタエツチン
グ装置等に応用することができる。
Although the above description of the gas introduction mechanism for starting discharge has been made with respect to a sputtering apparatus,9 the present invention can be applied to other apparatuses that utilize discharge in a vacuum. For example, it can be used in a plasma CVD device or a plasma polymerization device for forming a thin film. Further, the present invention can be applied to a Zolazma etching device, a reactive ion etching device, a Suno'P ivy etching device, etc., which perform etching of thin films by generating plasma in a vacuum.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のス・母ツタ装置の構成の一例を示した図
、第2図は本発明によるス・ぞツタ装置の一実施例の構
成図、第3図は第2図に示したス・母ツタ装置における
放電開始時の真空室圧力の変化をあられした図、第4図
は本発明によるスパッタ装置の第2の実施例の構成図、
第5図は第4図に示したス・母ツタ装置における放電開
始の真空室圧力変化図である。 記号の説明=1は真空室、2は流量制御弁、3は真空ポ
ンプ、4はメインバルブ、5はターゲット電極、6は基
板ホルダー、7はスパッタ電源。 8はシャッタ、9は補助電極、1′1は気体収容室。 12.13.21は電磁弁 22は流量制御弁をそれぞれあられしている。 第1図 第2図 時間 第3図 時間 序5図
FIG. 1 is a diagram showing an example of the configuration of a conventional suction ivy device, FIG. 2 is a configuration diagram of an embodiment of the suction ivy device according to the present invention, and FIG. 3 is a diagram showing an example of the configuration of a suction ivy device according to the present invention. Figure 4 is a diagram showing the change in vacuum chamber pressure at the start of discharge in the sputtering apparatus, and FIG. 4 is a configuration diagram of a second embodiment of the sputtering apparatus according to the present invention.
FIG. 5 is a diagram of the pressure change in the vacuum chamber at the start of discharge in the suction/main ivy device shown in FIG. 4. Explanation of symbols = 1 is the vacuum chamber, 2 is the flow control valve, 3 is the vacuum pump, 4 is the main valve, 5 is the target electrode, 6 is the substrate holder, and 7 is the sputtering power source. 8 is a shutter, 9 is an auxiliary electrode, and 1'1 is a gas storage chamber. 12, 13, and 21, the electromagnetic valve 22 is a flow control valve, respectively. Figure 1 Figure 2 Time Figure 3 Time order Figure 5

Claims (3)

【特許請求の範囲】[Claims] (1)  真空室に気体を導入して放電を行うようにし
た放電装置において、前記気体を前記真空室に導入する
手段が、前記気体の圧力を前記放電が所望の強さで維持
されるような所定の圧力に維持するための放電維持用の
気体導入機構と、前記気体の圧力を前記放電を開始する
のに必要な圧力まで一時的に高めるための放電開始用の
気体導入機構とを別々に有していることを特徴とする放
電装置。
(1) In a discharge device that performs discharge by introducing gas into a vacuum chamber, the means for introducing the gas into the vacuum chamber controls the pressure of the gas so that the discharge is maintained at a desired intensity. A gas introduction mechanism for maintaining the discharge to maintain a predetermined pressure, and a gas introduction mechanism for starting the discharge to temporarily increase the pressure of the gas to the pressure necessary to start the discharge, are provided separately. A discharge device comprising:
(2)放電開始用の気体導入機構が気体収容室とその両
側の各1個の停止弁とを有することを特徴とする特許請
求の範囲(1)項記載の放電装置。
(2) The discharge device according to claim (1), wherein the gas introduction mechanism for starting discharge has a gas storage chamber and one stop valve on each side of the gas storage chamber.
(3)放電開始用の気体導入機構が停止弁とこの停止弁
との間の死空間を充分小さくした流量制御弁とを有する
ことを特徴とする特許請求の範囲(1)項記載の放電装
置。
(3) The discharge device according to claim (1), wherein the gas introduction mechanism for starting discharge includes a stop valve and a flow rate control valve with a sufficiently small dead space between the stop valve. .
JP19236181A 1981-11-30 1981-11-30 Electric discharge device Pending JPS5893873A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19236181A JPS5893873A (en) 1981-11-30 1981-11-30 Electric discharge device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19236181A JPS5893873A (en) 1981-11-30 1981-11-30 Electric discharge device

Publications (1)

Publication Number Publication Date
JPS5893873A true JPS5893873A (en) 1983-06-03

Family

ID=16289996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19236181A Pending JPS5893873A (en) 1981-11-30 1981-11-30 Electric discharge device

Country Status (1)

Country Link
JP (1) JPS5893873A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07176519A (en) * 1993-12-17 1995-07-14 Shibaura Eng Works Co Ltd Discharge treatment device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56152973A (en) * 1980-04-30 1981-11-26 Tokuda Seisakusho Ltd Sputter etching device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56152973A (en) * 1980-04-30 1981-11-26 Tokuda Seisakusho Ltd Sputter etching device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07176519A (en) * 1993-12-17 1995-07-14 Shibaura Eng Works Co Ltd Discharge treatment device

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