JPS59100205U - Probe for measuring small holes - Google Patents

Probe for measuring small holes

Info

Publication number
JPS59100205U
JPS59100205U JP20167682U JP20167682U JPS59100205U JP S59100205 U JPS59100205 U JP S59100205U JP 20167682 U JP20167682 U JP 20167682U JP 20167682 U JP20167682 U JP 20167682U JP S59100205 U JPS59100205 U JP S59100205U
Authority
JP
Japan
Prior art keywords
probe
small holes
measuring small
abstract
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20167682U
Other languages
Japanese (ja)
Inventor
芝　亨
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority to JP20167682U priority Critical patent/JPS59100205U/en
Publication of JPS59100205U publication Critical patent/JPS59100205U/en
Pending legal-status Critical Current

Links

Landscapes

  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は小穴測定器の概略説明図、第２図は従来の測子
の側面図、第３図は第２図の■−■線断面図、第４図は
本考案の測子の側面図、第５図は第４図のＶ−Ｖ線断面
図、第６図は本考案の使用例側面図。 ｉｏ、１ｔ：測子、１２．　１３：傾斜した面、１４．
１５：接触子。Figure 1 is a schematic explanatory diagram of a small hole measuring device, Figure 2 is a side view of a conventional probe, Figure 3 is a sectional view taken along the line ■-■ in Figure 2, and Figure 4 is a side view of the probe of the present invention. 5 is a sectional view taken along the line V-V in FIG. 4, and FIG. 6 is a side view of an example of use of the present invention. io, 1t: measuring element, 12. 13: Slanted surface, 14.
15: Contact.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 測定しようとする直径方向Ｘに対して傾斜した面を有し
、断面かはＳ゛半円形状の測子を相対して設け、かつ測
子のＸ方向位置に接触子を設けてなる小穴測定用測子。A small hole measurement method in which probes having a surface inclined with respect to the diameter direction X to be measured and having a semicircular cross section of S are provided facing each other, and a contact is provided at the position of the probe in the X direction. Measuring head for use.
JP20167682U 1982-12-24 1982-12-24 Probe for measuring small holes Pending JPS59100205U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20167682U JPS59100205U (en) 1982-12-24 1982-12-24 Probe for measuring small holes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20167682U JPS59100205U (en) 1982-12-24 1982-12-24 Probe for measuring small holes

Publications (1)

Publication Number Publication Date
JPS59100205U true JPS59100205U (en) 1984-07-06

Family

ID=30427170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20167682U Pending JPS59100205U (en) 1982-12-24 1982-12-24 Probe for measuring small holes

Country Status (1)

Country Link
JP (1) JPS59100205U (en)

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