JPS5920879A - scintillation camera - Google Patents

scintillation camera

Info

Publication number
JPS5920879A
JPS5920879A JP13174282A JP13174282A JPS5920879A JP S5920879 A JPS5920879 A JP S5920879A JP 13174282 A JP13174282 A JP 13174282A JP 13174282 A JP13174282 A JP 13174282A JP S5920879 A JPS5920879 A JP S5920879A
Authority
JP
Japan
Prior art keywords
converter
reference voltage
energy
output
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13174282A
Other languages
Japanese (ja)
Other versions
JPH0457987B2 (en
Inventor
Yoshihiko Kumazawa
熊澤 良彦
Mitsuhiro Tanaka
三博 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP13174282A priority Critical patent/JPS5920879A/en
Publication of JPS5920879A publication Critical patent/JPS5920879A/en
Publication of JPH0457987B2 publication Critical patent/JPH0457987B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/161Applications in the field of nuclear medicine, e.g. in vivo counting
    • G01T1/164Scintigraphy
    • G01T1/1641Static instruments for imaging the distribution of radioactivity in one or two dimensions using one or several scintillating elements; Radio-isotope cameras
    • G01T1/1642Static instruments for imaging the distribution of radioactivity in one or two dimensions using one or several scintillating elements; Radio-isotope cameras using a scintillation crystal and position sensing photodetector arrays, e.g. ANGER cameras

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nuclear Medicine (AREA)

Abstract

PURPOSE:To output a digital value of the number of bit necessary for obtaining a specified spatial resolution irrelevant to energy by using a voltage corresponding to energy of radiation as reference voltage in the A/D conversion of a photoelectric conversion output. CONSTITUTION:A scintillation light detection signal through a photoelectric converter forming a photomultiplier is inputted into a corresponding sequential comparison type A/D converter 71. In the sequential comparision processing with the converter 71, a digital output of a sequential bit from MSB of a register 19 and a voltage proportional to radiation energy based on the output of the photomultiplier as reference voltage are inputted into a D/A converter 18 and converted into analog from digital with a comparison reference voltage applied to a comparator 17 varying according to the radiation energy. The number of bit of the digital data thus processed lessens as the radiation energy becomes larger and thus, a digital value of the number of bit required to obtain a specified spacial resolution is outputted. This simplifies the construction of the A/D converter/position computing circuit of a scintillation camera.

Description

【発明の詳細な説明】 1′ニー この発明は、ディジタル的〆位置演算処理を行なうタイ
プのシンチレーションカメラに関する。
DETAILED DESCRIPTION OF THE INVENTION 1' Knee This invention relates to a type of scintillation camera that performs digital end position calculation processing.

この種のシンチレーションカメラでは、多数の光電変換
器の各出力をそれぞれAD変換するだめに各々にAD変
換器を設けており、位置演算回路はディノタル的な構成
になっている。との場合画像の分解能はディジタル位置
情報のビット数に依存する。ところが光電変換器の出力
−は入射放射線のエネルギが高い程大きくなる。
This type of scintillation camera is provided with an AD converter for AD converting each output of a large number of photoelectric converters, respectively, and the position calculation circuit has a digital-like configuration. In this case, the resolution of the image depends on the number of bits of the digital position information. However, the output of the photoelectric converter increases as the energy of the incident radiation increases.

そのため高エネルギ時に必要な空間分解が得られるよう
AD変換器及び位置演算回路のピント数を定めると、低
エネルギではデータのビノト数が足り々くて必要な空間
分解能が得られないことになる。そこで従来では、高エ
ネルギに幻して妖ビット数が多過ぎて無駄になるのを承
知のうえで、低エネルギでも必9などyト数のデータが
得られるようAI)変換器及び位置演算回路のビット数
を増大させるようにしており、高価格化が避けられなか
った。
Therefore, if the number of focuses of the AD converter and position calculation circuit is determined so as to obtain the necessary spatial resolution at high energy, the number of binotos of data is insufficient at low energy, and the necessary spatial resolution cannot be obtained. Therefore, in the past, the AI) converter and position calculation circuit were designed to obtain y bits of data such as 9 even with low energy, knowing that the number of bits was too large due to high energy and wasted. The number of bits has been increased, which inevitably leads to higher prices.

この発明は、エネルギに関係なく、Iヅ(定の空間分解
能を得るのに必要なビット数でよくすることにより、A
1〕変換器及び位置演算回路のビット数を従来のものよ
り減少させて低価格化を図るようにしたシンチレーシヮ
ンカメラを提供することを目的とする。
This invention achieves A
1] An object of the present invention is to provide a scintillation camera which is designed to reduce the cost by reducing the number of bits of a converter and a position calculation circuit compared to conventional ones.

以下、この発明の一実M5例について図面を参照しなが
ら説明する。第1図においてシンチレータ1は放射線入
射に応じてンンチレーンヨンを生じるもので、たとえば
NaI (Tt)結晶などからなる。このゾンチレーン
ヨンの光はライトがイド2により多数のフォトマルチグ
ライア3に導かれ、電気信号に変換される。これらフォ
トマルチグライア3の各出力は、プリアンプ4の各々を
通り、それぞれ対応する積分回路5で積分された後、ザ
ングルボールド回路6の各各に取り込1れ、保持されて
、各A D変換器7に入力される。他力各プリアンプ4
の全ての出力d、加算回路8で加算され、その後積分回
路9によって積分され、さらにサンフ0ルホールド回路
10を経てエネルギ信号Zが得られる。このエネルギ信
号Zは波高分析器11に送られ、ウィンド設定器20で
使用核種のエネルギに応じて設定されたウィンド内にエ
ネルギ信号2が入っている場合に輝度信号UNBLAN
Kが波高分析器11から発生すする。またこのエネルギ
信号Zは増幅回路12に送られ、この増幅回路12から
エネルギ信号Zに比例しだ電圧がAI)変換器7の各々
に基準電圧VREFとして供給される。
Hereinafter, an M5 example of the present invention will be described with reference to the drawings. In FIG. 1, a scintillator 1 generates lentils in response to incident radiation, and is made of, for example, NaI (Tt) crystal. The light of this zonal beam is guided by the id 2 to a large number of photomultiglares 3, where it is converted into an electrical signal. The outputs of these photomultiglares 3 pass through each of the preamplifiers 4, are integrated by the corresponding integration circuits 5, and are then taken into each of the Zanglebold circuits 6 and held, and are input to each A.D. The signal is input to a converter 7. Each preamplifier 4
All outputs d of are added by an adder circuit 8, then integrated by an integrator circuit 9, and further passed through a sample hold circuit 10 to obtain an energy signal Z. This energy signal Z is sent to the pulse height analyzer 11, and when the energy signal 2 is within the window set according to the energy of the nuclide used by the window setting device 20, the brightness signal UNBLAN is output.
K is generated from the pulse height analyzer 11. This energy signal Z is also sent to an amplifier circuit 12, and from this amplifier circuit 12 a voltage proportional to the energy signal Z is supplied to each of the AI converters 7 as a reference voltage VREF.

各AJ)変換器7のディノタル出力はX及びYの重み付
積算回路13.14において、対応するフォトマルチグ
ライア3の座標に応じた重みを乗ぜられ、その後に加算
回路15.16でそれぞれ加算されてデイノタル位置信
号X及びYをイ↓Iる。なお、説明の簡単化のため、積
分回路、→ノングルホールド回路、AI)変換器等の各
回路のタイミング制御に関しては省略しだが、それぞれ
適当な信号でタイミング制御されているものとする。
The dinotal outputs of each AJ) converter 7 are multiplied by weights according to the coordinates of the corresponding photomultiglare 3 in X and Y weighted integration circuits 13.14, and then added together in addition circuits 15.16. Then, input the digital position signals X and Y. To simplify the explanation, the timing control of each circuit such as the integrating circuit, non-glue hold circuit, AI converter, etc. is omitted, but it is assumed that the timing of each circuit is controlled by an appropriate signal.

AI)変換器7はどのようがタイプのものでもよいが、
ここでは第2図に示す逐次比較形AI)変換器71を用
いたとして説明する。入力VINはコン・やレータ17
でI)A変換器18の出力vou’rと比較され、比較
出力が逐次比較処理レノスタ19に送られる。このレノ
スタ19は最初MSB (最大ビット)のみが「1」で
他が全て「0」の出力DINを出力し、これに応じたア
ナロク出力voUTがコンパレータ17で比較され、M
SBが決定され、次にMSBから2酢目のビ、7)につ
き同様の比較及び決定がなされ、これをL S B (
最小ビット)寸でflft’を次繰返して、M S B
からLSBまでの全てのビットが決定されてディノタル
出力1)OUTが得られる。ここでとのAD変換器71
がnピットであるとすると、J)INのコードは(bn
−1+ bn−2+ 0’ + bI T bo )と
置ける。このとき VOUT = k−VagF−(bn−1−2°+bn
−2゛2−1−1−°−、・、+b、 、2−(n−2
) +bo・2−(n−1))(但しkは比例定数) となり、AD変換終了後は VOUT ’=−VIN DOUT = DIN となる。しかるにVREF ” Zである。したがって
となって、エネルギ信号Zが大きければ基準電圧VRE
Fも大きくなるのでエネルギに関係なく常に同一ピント
数のデータを得ることができるとともに、エネルギ信号
Zによる規格化も同時に行なわれることになる。そのた
めエネルギ信号゛Zによる規格化のため従来必要刃あっ
た割算回路が不要と寿る。そしてこの基準電、圧VRT
fの変更は放射線の入射毎にその入射放射線のエネルギ
に対応して行なわれるため、多重ス4クトルや多核種の
測定の場合でも対応できる。
AI) The converter 7 may be of any type, but
Here, a description will be given assuming that a successive approximation type AI) converter 71 shown in FIG. 2 is used. Input VIN is controller 17
It is compared with the output vou'r of the I)A converter 18, and the comparison output is sent to the successive approximation processing renostator 19. This renostar 19 initially outputs an output DIN in which only the MSB (largest bit) is "1" and all others are "0", and the corresponding analog output voUT is compared by the comparator 17, and the M
The SB is determined, and then a similar comparison and determination is made for the second bit from the MSB, 7), and this is converted into L S B (
Repeat flft' with the minimum bit) size, and M S B
All bits from to LSB are determined to obtain the dinotal output 1) OUT. AD converter 71 with here
is n pits, the code of J)IN is (bn
-1+bn-2+0'+bITbo). At this time, VOUT = k-VagF-(bn-1-2°+bn
−2゛2−1−1−°−,・,+b, ,2−(n−2
) +bo・2−(n−1)) (where k is a proportionality constant), and after the AD conversion is completed, VOUT′=−VIN DOUT=DIN. However, VREF "Z. Therefore, if the energy signal Z is large, the reference voltage VRE
Since F also becomes large, it is possible to always obtain data with the same number of focus regardless of the energy, and standardization using the energy signal Z is also performed at the same time. Therefore, due to the standardization using the energy signal "Z", there is no need for the division circuit that was required in the past. And this reference voltage, voltage VRT
Since f is changed each time the radiation is incident in accordance with the energy of the incident radiation, it can be applied even to the measurement of multiplex vectors or multiple nuclides.

なお、逐次比較形以外の他の形のAD変換器(たとえば
並列比較形など)でも基準電、圧に対する関係は全く同
じなので、同様の理由で使用可能である。
It should be noted that AD converters of other types than the successive approximation type (for example, parallel comparison type) can also be used for the same reason because the relationship with respect to the reference voltage and voltage is exactly the same.

また、この第1図の回路において、プリアンプ4の各々
の出力に積分特性を持たせる構成や、積分回路5.9と
サンプルホールド回路6゜10の代りにピークホールド
回路を用いる構成、を採用することもできる。
Furthermore, in the circuit shown in FIG. 1, a configuration is adopted in which each output of the preamplifier 4 has an integral characteristic, and a configuration in which a peak hold circuit is used instead of the integral circuit 5.9 and the sample hold circuit 6.10. You can also do that.

さらに、AI)変換器7の入力より基準電圧VREFを
先に供給して計数率特性を向上させるだめ、積分回路5
の入力側または出力側に遅延回路を挿入することも重重
しい。
Furthermore, in order to improve the count rate characteristics by supplying the reference voltage VREF before the input of the AI) converter 7, the integration circuit 5
It is also burdensome to insert a delay circuit on the input or output side.

上記の実施例では放射線入射毎にAD変換器7の基準電
、圧VREFを変化させているが、ウィンド設定器20
から波高分析器11に与えられるウィンド設定信号を点
線で示すようにエネルギ信号Zの代りに増幅回路12に
与えて、基準電圧VREFを設定したウィンドに対応さ
せるようにし7てもよい。こうすると個々の放射線入射
毎のエネルギ信号Zに比例した基準電圧VREFが与え
られる訳ではないから、エネルギによる規格化のだめの
割算回路は必要となるが、AD変換器7の基準電圧VR
EFはエネルギの設定ウィンドに比例している訳である
から、高エネルギであっても低エネルギであっても常に
同じビット数のデータを得ることができて、ビット数の
多い高価なA I)変換器や位置演算回路を使う必要が
なくなる。まだこの場合、多重スペクトルや多核種の測
定も、複数の設定エネルギウィンドのうちの最も高いも
のによシ基準電圧VREFを定めるようにすれば、低工
オルギについては精度劣化するが、実行可能である。
In the above embodiment, the reference voltage and voltage VREF of the AD converter 7 are changed every time radiation is incident, but the window setting device 20
A window setting signal given to the pulse height analyzer 11 from the pulse height analyzer 11 may be given to the amplifier circuit 12 instead of the energy signal Z as shown by the dotted line, so that the reference voltage VREF corresponds to the set window. This does not mean that a reference voltage VREF proportional to the energy signal Z for each incident radiation is given, so a division circuit for standardization by energy is required, but the reference voltage VREF of the AD converter 7
Since EF is proportional to the energy setting window, it is possible to always obtain the same number of bits of data regardless of whether it is high energy or low energy, which makes it possible to obtain data with the same number of bits regardless of whether the energy is high or low. There is no need to use a converter or position calculation circuit. In this case, it is still possible to measure multiple spectra and multiple nuclides by setting the reference voltage VREF to the highest of multiple set energy windows, although the accuracy will deteriorate for low-engineering systems. be.

以上実施例について説明したように、この発明によれば
、必要な空間分解能を得るのに要する精度の範囲でビッ
ト精度をエネルギと関係なく同一にできるため、AD変
換器及び位置演算回路のビット数を減少して低価格とす
ることができる。
As described above with respect to the embodiments, according to the present invention, the bit precision can be made the same regardless of the energy within the range of precision required to obtain the necessary spatial resolution. can be reduced and the price can be lowered.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例のブロック図、第2図はA
l)変換器の構成例を示すブロック図である。 ■・・・シンチレータ   2・・・ライトがイド3・
・・フAトマルチプライア 4・・・プリアンプ    5,9・・・積分回路6.
10・・・サンプルホールド回路 7・・・A I)変換器 8 、15 、16・・・加繕回路 11・・・波高分析器   12・・・増幅回路13.
14・・・重み伺積算回路 17・・・コンノfレータ  18・・・I) A 変
換器】9・・・逐次比較処理レソスタ 20・・・ウィンド設定器 71・・・逐次比較形AD変換器
FIG. 1 is a block diagram of an embodiment of this invention, and FIG. 2 is a block diagram of an embodiment of the present invention.
l) It is a block diagram showing an example of the configuration of a converter. ■...Scintillator 2...Light is ID 3.
...Fut multiplier 4...Preamplifier 5,9...Integrator circuit 6.
10... Sample hold circuit 7... AI) Converter 8, 15, 16... Repair circuit 11... Pulse height analyzer 12... Amplifier circuit 13.
14... Weight accumulator 17... Controller 18... I) A converter] 9... Successive approximation processor 20... Window setter 71... Successive approximation type AD converter

Claims (3)

【特許請求の範囲】[Claims] (1)放射線入射に応じてシンデレージョンを生シるシ
ンチレータト、シンチレーションの光が導かれて電気信
号を生じる多数の光電変換器と、これら各光電変換器の
出力がそれぞれ入力されるAD変換器と、これらAD変
換器のディ、ゾタル出力が入力される位置演算回路とを
備えるシンチレーションカメラにおいて、放射線のエネ
ルギに比例しだ電圧を発生し、この電圧を前記AD変換
器の基準電圧として供給する基準電圧供給回路を有する
ことを特徴とするシンデレージョンカメラ。
(1) A scintillator that generates scintillation in response to incident radiation, a number of photoelectric converters to which scintillation light is guided and generates electrical signals, and an AD converter into which the output of each of these photoelectric converters is input, respectively. In the scintillation camera, the scintillation camera is equipped with a position calculation circuit that receives digital outputs of these AD converters, and generates a voltage proportional to the energy of the radiation, and supplies this voltage as a reference voltage to the AD converters. A cinderella camera characterized by having a reference voltage supply circuit.
(2)前記基準電圧供給回路は、前記多数の光電変換器
の全ての出力を加獅する加算回路と、この加9回路の出
力に比例した電圧を発生する市−圧光牛回路とにより構
成されることを特徴とする特許請求の範囲第1項記載の
シンチレーションカメラ。
(2) The reference voltage supply circuit is composed of an adder circuit that adds all the outputs of the multiple photoelectric converters, and a voltage converter circuit that generates a voltage proportional to the output of the adder circuit. A scintillation camera according to claim 1, characterized in that:
(3)前記基準電圧供給回路は、エネルギ信号を波高分
析するための波高分析器に与えるウィンド設定信号に応
じた電圧を発生する電圧発生回路により構成されること
を特徴とする特許請求の範囲第1項記載のシンチレーシ
ョンカメラ。
(3) The reference voltage supply circuit is constituted by a voltage generation circuit that generates a voltage according to a window setting signal applied to a pulse height analyzer for analyzing the pulse height of the energy signal. The scintillation camera according to item 1.
JP13174282A 1982-07-28 1982-07-28 scintillation camera Granted JPS5920879A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13174282A JPS5920879A (en) 1982-07-28 1982-07-28 scintillation camera

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13174282A JPS5920879A (en) 1982-07-28 1982-07-28 scintillation camera

Publications (2)

Publication Number Publication Date
JPS5920879A true JPS5920879A (en) 1984-02-02
JPH0457987B2 JPH0457987B2 (en) 1992-09-16

Family

ID=15065125

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13174282A Granted JPS5920879A (en) 1982-07-28 1982-07-28 scintillation camera

Country Status (1)

Country Link
JP (1) JPS5920879A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0255984A (en) * 1988-08-19 1990-02-26 Toshiba Corp Scintillation camera
JP2008173486A (en) * 1998-08-26 2008-07-31 Fujifilm Corp Radiation image detection device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0255984A (en) * 1988-08-19 1990-02-26 Toshiba Corp Scintillation camera
JP2008173486A (en) * 1998-08-26 2008-07-31 Fujifilm Corp Radiation image detection device

Also Published As

Publication number Publication date
JPH0457987B2 (en) 1992-09-16

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