JPS5940295B2 - 電流増幅器 - Google Patents
電流増幅器Info
- Publication number
- JPS5940295B2 JPS5940295B2 JP54000570A JP57079A JPS5940295B2 JP S5940295 B2 JPS5940295 B2 JP S5940295B2 JP 54000570 A JP54000570 A JP 54000570A JP 57079 A JP57079 A JP 57079A JP S5940295 B2 JPS5940295 B2 JP S5940295B2
- Authority
- JP
- Japan
- Prior art keywords
- drain
- region
- impurity
- current
- transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/83125—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET] the IGFETs characterised by having shared source or drain regions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/836—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET] comprising EDMOS
Landscapes
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Amplifiers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB000000659/78 | 1978-01-09 | ||
| GB65978 | 1978-01-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5498165A JPS5498165A (en) | 1979-08-02 |
| JPS5940295B2 true JPS5940295B2 (ja) | 1984-09-29 |
Family
ID=9708247
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP54000570A Expired JPS5940295B2 (ja) | 1978-01-09 | 1979-01-05 | 電流増幅器 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPS5940295B2 (it) |
| DE (1) | DE2900639C3 (it) |
| IT (1) | IT1099381B (it) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4477782A (en) * | 1983-05-13 | 1984-10-16 | At&T Bell Laboratories | Compound current mirror |
| NL8302731A (nl) * | 1983-08-02 | 1985-03-01 | Philips Nv | Halfgeleiderinrichting. |
| JP2014067912A (ja) * | 2012-09-26 | 2014-04-17 | Seiko Instruments Inc | カレントミラー回路 |
| JP6058960B2 (ja) * | 2012-09-27 | 2017-01-11 | エスアイアイ・セミコンダクタ株式会社 | カレントミラー回路 |
-
1978
- 1978-10-11 IT IT28651/78A patent/IT1099381B/it active
-
1979
- 1979-01-05 JP JP54000570A patent/JPS5940295B2/ja not_active Expired
- 1979-01-09 DE DE2900639A patent/DE2900639C3/de not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE2900639A1 (de) | 1979-07-12 |
| DE2900639C3 (de) | 1980-12-04 |
| DE2900639B2 (de) | 1980-03-20 |
| JPS5498165A (en) | 1979-08-02 |
| IT1099381B (it) | 1985-09-18 |
| IT7828651A0 (it) | 1978-10-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US3339128A (en) | Insulated offset gate field effect transistor | |
| US4451744A (en) | Monolithic integrated reference voltage source | |
| US3786319A (en) | Insulated-gate field-effect transistor | |
| US3855610A (en) | Semiconductor device | |
| EP0115652A1 (en) | Insulated gate field effect transistor and method of manufacturing the same | |
| JPS59193066A (ja) | Mos型半導体装置 | |
| US4053915A (en) | Temperature compensated constant current source device | |
| US3374407A (en) | Field-effect transistor with gate-insulator variations to achieve remote cutoff characteristic | |
| US5293058A (en) | Linear voltage-controlled resistance element | |
| US4199733A (en) | Extended-drain MOS mirrors | |
| US3333168A (en) | Unipolar transistor having plurality of insulated gate-electrodes on same side | |
| US3436621A (en) | Linear amplifier utilizing a pair of field effect transistors | |
| US4665423A (en) | MIS variable resistor | |
| US3056100A (en) | Temperature compensated field effect resistor | |
| JPS5940295B2 (ja) | 電流増幅器 | |
| JPH10209174A (ja) | 接合型電界効果トランジスタ | |
| US3296508A (en) | Field-effect transistor with reduced capacitance between gate and channel | |
| JPH031571A (ja) | 半導体装置 | |
| JPS5846874B2 (ja) | 接合型電界効果トランジスタ | |
| Latham et al. | Low-frequency operation of four-terminal field-effect transistors | |
| Niclas et al. | A 12-18 GHz medium-power GaAs MESFET amplifier | |
| JPS60175459A (ja) | 半導体装置 | |
| JPH0329326A (ja) | 接合型電界効果型トランジスタ | |
| Ronen et al. | High-voltage SOS/MOS devices and circuit elements: Design, fabrication, and performance | |
| US3895978A (en) | Method of manufacturing transistors |