JPS5941765U - Performance board for IC tester - Google Patents
Performance board for IC testerInfo
- Publication number
- JPS5941765U JPS5941765U JP13854882U JP13854882U JPS5941765U JP S5941765 U JPS5941765 U JP S5941765U JP 13854882 U JP13854882 U JP 13854882U JP 13854882 U JP13854882 U JP 13854882U JP S5941765 U JPS5941765 U JP S5941765U
- Authority
- JP
- Japan
- Prior art keywords
- tester
- wiring pattern
- performance board
- metal layer
- selectively deposited
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は従来のICテスタ用パーフオマンスボードの製
造方法を説明するための断面図、第2区はパーフオマン
スポード上に形成された接点部分と配線パタニンの一例
を示す平面図、第3図は第2図に示すA−A線上の拡大
断面図、第4図はこの考案によるパーフオマンスポード
の製造工程中の一例を示す拡大断面図、第5図はこの考
案によるパーフオマンスポードの構造を示す拡大断面図
である。
1:絶縁基板、2:銅箔、4:メッキレジスト層、5:
貴金属層、6:接点部分、7:配線パターン、8:半田
層。FIG. 1 is a cross-sectional view for explaining a conventional method of manufacturing a perf-oman board for an IC tester, the second section is a plan view showing an example of the contact portion and wiring pattern formed on the perf-oman board, and the third The figure is an enlarged sectional view taken along the line A-A shown in Fig. 2, Fig. 4 is an enlarged sectional view showing an example of the manufacturing process of the perf-oman spode according to this invention, and Fig. 5 is the structure of the perf-oman spode according to this invention. FIG. 1: Insulating substrate, 2: Copper foil, 4: Plating resist layer, 5:
Noble metal layer, 6: Contact portion, 7: Wiring pattern, 8: Solder layer.
Claims (1)
ターンを形成する場合のエツチングレジスト層として利
用され、エツチング後に加熱溶解されて周辺が上記配線
パターンのエツチング断面に溶着された状態にある半田
層と、を具備して成るICテスタ用パーフオマンスボー
ド。[Scope of Claim for Utility Model Registration] A. A precious metal layer selectively deposited on the contact portion, and B. A noble metal layer selectively deposited on the wiring pattern and used as an etching resist layer when forming the wiring pattern. A performance board for an IC tester, comprising: a solder layer which is heated and melted after etching so that its periphery is welded to the etched cross section of the wiring pattern.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13854882U JPS5941765U (en) | 1982-09-13 | 1982-09-13 | Performance board for IC tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13854882U JPS5941765U (en) | 1982-09-13 | 1982-09-13 | Performance board for IC tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5941765U true JPS5941765U (en) | 1984-03-17 |
Family
ID=30310832
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13854882U Pending JPS5941765U (en) | 1982-09-13 | 1982-09-13 | Performance board for IC tester |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5941765U (en) |
-
1982
- 1982-09-13 JP JP13854882U patent/JPS5941765U/en active Pending
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