JPS595911A - Device for measuring distance and angle - Google Patents

Device for measuring distance and angle

Info

Publication number
JPS595911A
JPS595911A JP11248782A JP11248782A JPS595911A JP S595911 A JPS595911 A JP S595911A JP 11248782 A JP11248782 A JP 11248782A JP 11248782 A JP11248782 A JP 11248782A JP S595911 A JPS595911 A JP S595911A
Authority
JP
Japan
Prior art keywords
light
angle
measured
distance
waveguide layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11248782A
Other languages
Japanese (ja)
Inventor
Masaharu Matano
俣野 正治
Naohisa Inoue
直久 井上
Maki Yamashita
山下 牧
Kazuhiko Mori
和彦 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Tateisi Electronics Co
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tateisi Electronics Co, Omron Tateisi Electronics Co filed Critical Tateisi Electronics Co
Priority to JP11248782A priority Critical patent/JPS595911A/en
Publication of JPS595911A publication Critical patent/JPS595911A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00Measuring distances in line of sight; Optical rangefinders
    • G01C3/02Details
    • G01C3/06Use of electric means to obtain final indication
    • G01C3/08Use of electric radiation detectors

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Abstract

PURPOSE:To decrease cost in the manufacture, by simultaneously measuring the distance to a surface to be measured and the angle formed by the surface based on a deflection angle, when light from one light source passes a light deflecting means and is reflected by the surface to be measured, and outputs are generated from two light detectors. CONSTITUTION:An optical waveguide layer 32 is formed on a single crystal substrate 31 having an electrooptic effect. A light deflecting means is constituted by providing a crossed finger electrode 33 on the optical waveguide layer 32. Light from a semiconductor laser 30 is inputted to one end of the waveguide layer 32 and outputted from the other end. The light is inputted to the surface to be measured 34. Light detectors 35 and 36 are arranged at the output end surface. An electric field from a high frequency power source 39, whose frequency can be changed, is made to be applied to the electrode 33. Elastic surface waves are generated on the layer 32 in this way, and the transmitted light is deflected. The deflection angle is changed by changing the frequency of the power source, and the angle is detected by the detectors 35 and 36. The distance from the laser 30 to the surface 34 and the angle formed by the layer 32 and the surface 34 can be obtained by computation.

Description

【発明の詳細な説明】 (発明の分野) 本発明は、光源からの光を偏向する手段と2個の光検出
手段とを備えることにより、測定対象面までの距離とそ
の面のなす角度を同時に測定できるようにした距離・角
度測定装置に関する。
Detailed Description of the Invention (Field of the Invention) The present invention is capable of determining the distance to a surface to be measured and the angle formed by the surface by comprising means for deflecting light from a light source and two light detection means. This invention relates to a distance/angle measuring device that can measure simultaneously.

(発明の背景) 従来、基準点等からある面までの距離および基準面等と
その面のなす角度とを同時に測定する方法としては第1
図に示すような方法があった。この方法は、同図に示す
ように、2個のレーザ光源11および12から測定対象
面13に向けて光線11’および12′を出射し、測定
対象面13で反射された光線11″および12“を基準
面15上に配置された光検出器アレイ14で受光する。
(Background of the Invention) Conventionally, the first method of simultaneously measuring the distance from a reference point etc. to a certain surface and the angle formed between the reference surface etc. and that surface is
There was a method as shown in the figure. As shown in the figure, in this method, two laser light sources 11 and 12 emit light rays 11' and 12' toward a measurement target surface 13, and the light rays 11'' and 12' are reflected by the measurement target surface 13. " is received by the photodetector array 14 arranged on the reference plane 15.

この場合、光検出器アレイ14の各画素のうち光出力を
生じる2個の画素の位置から測定対象面13と基準面の
距離および角度を測定することができだ。
In this case, the distance and angle between the measurement target surface 13 and the reference surface can be measured from the positions of two pixels that produce light output among each pixel of the photodetector array 14.

しかしながら、前記従来形においては、2個のレーザ装
置およびアレイ状の光検出器を必要とするため、測定装
置の価格が高くなるという不都合があった。
However, the conventional type requires two laser devices and an array of photodetectors, which has the disadvantage of increasing the price of the measuring device.

(発明の目的) 本発明の目的は゛、前述の従来形における問題点に鑑み
、距離・角度測定装置において、1個の光源からの光を
偏向手段を介して測定対象面に入射゛し、測定対象面か
らの反射光を2個の光検出器で検出するという構想に基
づき、低価格でかつ高精度の距離・角度測定装置を提供
することにある。
(Object of the Invention) The object of the present invention is to ``in view of the problems of the conventional type described above, in a distance/angle measuring device, light from a single light source is incident on a surface to be measured via a deflecting means, and measurement is performed. The object of the present invention is to provide a low-cost and highly accurate distance/angle measuring device based on the concept of detecting reflected light from a target surface using two photodetectors.

(発明の構成) 本発明は、1個の光源と、その光源からの光を偏向する
手段と、2個の光検出器とを備え、光源から光偏向手段
を通って出射した光が測定対象面で反射されて2個の光
検出器にそれぞれ光出力を生じる時の2つの光偏向手段
における光の偏向角度から測定対象面までの距離と基準
面に対する測定対象面のなす角度とを同時に測定するこ
とを特徴とする。
(Structure of the Invention) The present invention includes one light source, a means for deflecting light from the light source, and two photodetectors, and the light emitted from the light source through the light deflecting means is detected as an object to be measured. Simultaneous measurement of the distance from the deflection angle of the light in the two light deflecting means to the measurement target surface and the angle formed by the measurement target surface with respect to the reference plane when the light is reflected by the surface and generates optical output to the two photodetectors. It is characterized by

(発明の効果) 本発明によれば、1個の光源とその光源からの光を偏向
する可変偏向手段と2個の光検出器とを用いることによ
って、所定位置から測定対象面までの距離と所定面また
は線と測定対象面とのなす角度を同時に測定することが
可能となり、従来形に比し低価格かつ高精度の装置を実
現することができる。
(Effects of the Invention) According to the present invention, by using one light source, a variable deflection means for deflecting light from the light source, and two photodetectors, it is possible to determine the distance from a predetermined position to a surface to be measured. It becomes possible to simultaneously measure the angle formed by a predetermined surface or line and the surface to be measured, and it is possible to realize a device with lower cost and higher accuracy than conventional types.

(実施例の説明) 以下図面を用いて本発明の詳細な説明する。(Explanation of Examples) The present invention will be described in detail below using the drawings.

第2図は、本発明の測定装置における距離および角度の
測定原理を示すグラフである。第2図において、光源2
0を原点にとり、光検出器21.22をX軸上の2点(
Xl、0)、(X2.O)に設ける。
FIG. 2 is a graph showing the principle of distance and angle measurement in the measuring device of the present invention. In Figure 2, light source 2
0 as the origin, and the photodetectors 21 and 22 are placed at two points on the X axis (
Xl, 0), (X2.O).

測定対象面がy軸と交わる位置を(o、d)、その而が
X軸となす角をψとする。光源からの光が測定対象面で
反射され、光検出器21に光出力を生じている時の、光
源からの光がX軸となす角を01、測定対象面への入射
角をαとする。反射面を表わす方程式は y=d+xtanψ          −(1)であ
り、光源からの光は y = x論θ1            ・・・(2
)で与えられる。測定対象面上の光の入射点23の座標
は、(1)、(2)より となる。また、入射角は α=90°−(θ1−ψ)      ・・・(4)で
あるから、反射面からの反射光がX軸となす角φは φ−90°−(α十ψ)−2ψ−θ、  ・・・(5)
となる。しだがって、反射光は(3L (5)からで表
わされ、このX細切片が(Xl、0)であるから、(6
)より となる。同様にして、光源からの光がX軸と角θ2をな
す時に光検出器22に光出力が表われると、となる。し
だがって、Xl、X2は既知であるから、θ1.θ2が
わかれば(7)、(8)からdとψとが求まる。
The position where the surface to be measured intersects with the y-axis is (o, d), and the angle it makes with the X-axis is ψ. When the light from the light source is reflected by the surface to be measured and produces a light output to the photodetector 21, the angle that the light from the light source makes with the X axis is 01, and the angle of incidence on the surface to be measured is α. . The equation expressing the reflective surface is y=d+xtanψ-(1), and the light from the light source is y=x theory θ1...(2
) is given by The coordinates of the light incident point 23 on the surface to be measured are given by (1) and (2). Also, since the incident angle is α = 90° - (θ1 - ψ) (4), the angle φ that the reflected light from the reflective surface makes with the X axis is φ - 90° - (α + ψ) - 2ψ−θ, ...(5)
becomes. Therefore, the reflected light is expressed as (3L from (5)), and since this X thin section is (Xl, 0), (6
). Similarly, when the light output from the light source forms an angle θ2 with the X axis, the optical output appears on the photodetector 22. Therefore, since Xl and X2 are known, θ1. If θ2 is known, d and ψ can be found from (7) and (8).

第3図は、上述の原理を用いた本発明の1実施例に係わ
る距離・角度測定装置を示す。同図の装置は、光源とし
ての半導体レーザ30、光偏向手段としてニオブ酸すチ
ュウム(LiNb05)等の電気光学効果を有する単結
晶の基板31上に光導波路層32を形成し、該光導波路
層32上に交差摺電(5) 極(IDT) 33を形成した装置を具備する。また、
光検出器として2個のシリコンフォトダイオード35お
よび36が電気的光偏向手段の光出射側端面に所定間隔
をおいて配置されている。第3図の測定装置はさらに、
処理回路37、ディスプレイ38および周波数を可変で
きる高周波電源39を具備する。
FIG. 3 shows a distance/angle measuring device according to an embodiment of the present invention using the above-described principle. In the device shown in the figure, an optical waveguide layer 32 is formed on a semiconductor laser 30 as a light source and a single crystal substrate 31 having an electro-optic effect such as niobium oxide (LiNb05) as an optical deflection means. A device is provided on which cross-sliding electrodes (5) (IDT) 33 are formed. Also,
Two silicon photodiodes 35 and 36 as photodetectors are arranged at a predetermined interval on the light output side end face of the electric light deflection means. The measuring device shown in FIG.
It is equipped with a processing circuit 37, a display 38, and a high frequency power source 39 whose frequency can be varied.

第3図の装置において、半導体レーザ30からの光は電
気光学結晶基板31上の光導波路32の一方の端面から
入射し、該光導波路層32を透過して他方の端面から出
射し測定対象面34に入射される。この場合、光導波路
層32上の交差指電極33には高周波電源39から高周
波電界が印加されており、光導波路層32上に弾性表面
波(SAW)を発生する。光導波路層32を透過する光
は弾性表面波と相互作用し偏向されて光導波路層32の
他方の端面から出射する。測定対象面34で反射された
光はフォトダイオード35または36で検出される。ま
た、半導体レーザ30からの光の偏向角は交差指電極3
3に印加する高周波電圧の周(6) 波数によって可変できるから、フォトダイオード35お
よび36にそれぞれ出力が生じた時の周波数から光の偏
向角が求められる。従って、前式(7)および(8)を
用いて距離dと角度ψが計算できる。
In the apparatus shown in FIG. 3, light from a semiconductor laser 30 enters from one end face of an optical waveguide 32 on an electro-optic crystal substrate 31, passes through the optical waveguide layer 32, and exits from the other end face, and is directed to the surface to be measured. 34. In this case, a high frequency electric field is applied to the interdigital electrodes 33 on the optical waveguide layer 32 from a high frequency power source 39, and a surface acoustic wave (SAW) is generated on the optical waveguide layer 32. The light transmitted through the optical waveguide layer 32 interacts with the surface acoustic wave, is deflected, and exits from the other end face of the optical waveguide layer 32 . The light reflected by the measurement target surface 34 is detected by a photodiode 35 or 36. Furthermore, the deflection angle of the light from the semiconductor laser 30 is determined by the interdigital electrode 3.
Since the frequency (6) of the high frequency voltage applied to the photodiodes 35 and 36 can be varied depending on the wave number, the deflection angle of the light can be determined from the frequency at which the output is generated in the photodiodes 35 and 36, respectively. Therefore, distance d and angle ψ can be calculated using equations (7) and (8).

実際には、第3図に示すように、処理回路37によって
高周波電源39の周波数を変化し、各フォトダイオード
35および36からの出力を処理回路37で監視するこ
とにより、処理回路37において各フォトダイオード3
5および36に出力を生じたときの周波数を知ることが
でき、これらの情報に基づいて処理回路37において演
算処理を行なうことにより前記距離および角度を計算し
、計算結果をディスプレイ38に表示する。
In reality, as shown in FIG. 3, the processing circuit 37 changes the frequency of the high frequency power supply 39 and monitors the output from each photodiode 35 and 36. diode 3
5 and 36 can be known, and based on this information, the processing circuit 37 performs arithmetic processing to calculate the distance and angle, and the calculation results are displayed on the display 38.

第4図は、本発明の他の実施例に係わる距離・角度測定
装置の構成を示す。同図の装置は、光源として例えばヘ
リュウムネオン(He −Ne )レーザ40を用い、
光偏向手段としてガルバノミラ−41が用いられている
。なお、同図において43および44はそれぞれフォト
ダイオード、45は処理回路そして46はディスプレイ
である。
FIG. 4 shows the configuration of a distance/angle measuring device according to another embodiment of the present invention. The device in the figure uses, for example, a helium neon (He-Ne) laser 40 as a light source,
A galvanometer mirror 41 is used as a light deflection means. In the figure, 43 and 44 are photodiodes, 45 is a processing circuit, and 46 is a display.

第4図の装置においては、光源40からの光かガル・ぐ
フミン−41で偏向され測定対象面42で反射された後
、フォトダイオード43または44で検出される。ガル
バノミラ−41は処理回路42からの電気信号によって
駆動制御され、各フォトダイオード43および44から
の出力は処理回路45に入力される。処理回路45はガ
ル・ぐフミン=41を駆動する電気信号の大きさから光
の偏向角を知ることができ、各フォトダイオード43お
よび44からの出力が生じた時の偏向角によって前記(
7)および(8)式を用いて同様に距離dおよび角度ψ
を計算し演算結果をディスプレイ45に表示する。
In the apparatus shown in FIG. 4, light from a light source 40 is deflected by a gal-guffin-41, reflected by a surface to be measured 42, and then detected by a photodiode 43 or 44. The galvanometer mirror 41 is driven and controlled by an electric signal from a processing circuit 42, and the output from each photodiode 43 and 44 is input to a processing circuit 45. The processing circuit 45 can determine the deflection angle of the light from the magnitude of the electric signal that drives the gal/guhumin=41, and the deflection angle when the output from each photodiode 43 and 44 is generated determines the above (
Similarly, using equations 7) and (8), distance d and angle ψ
is calculated and the calculation result is displayed on the display 45.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来形の距離・角度測定装置を示す模式図、第
2図は本発明の詳細な説明するためのグラフ、そして第
3図および第4図は本発明の実施例に係わる距離・角度
測定装置を示す概略図である。 11.12,30.40・・レーザ光源、13゜34.
42・・・測定対象面、14・・・光検出器アレイ、3
1・・・電気光学結晶基板、32・・・光導波路層、3
3・・・交差指電極、35,36,43.44・・・フ
ォトダイオード、37,45・・・処理回路、38゜4
6・・・ディスプレイ、39・・・高周波電源、41・
・・ガルバノミラ−6 特許出願人 立石電機株式会社 代理人 弁理士伊東辰雄 〃   〃 伊東哲也 (9)
FIG. 1 is a schematic diagram showing a conventional distance/angle measuring device, FIG. 2 is a graph for explaining the present invention in detail, and FIGS. 3 and 4 are distance/angle measuring devices according to embodiments of the present invention. It is a schematic diagram showing an angle measuring device. 11.12, 30.40...Laser light source, 13°34.
42... Measurement target surface, 14... Photodetector array, 3
1... Electro-optic crystal substrate, 32... Optical waveguide layer, 3
3... Interdigital electrode, 35, 36, 43. 44... Photodiode, 37, 45... Processing circuit, 38°4
6...Display, 39...High frequency power supply, 41.
...Galvano mirror 6 Patent applicant Tateishi Electric Co., Ltd. Agent Patent attorney Tatsuo Ito 〃 Tetsuya Ito (9)

Claims (1)

【特許請求の範囲】[Claims] 1個の光源と、その光源からの光を偏向する手段と、2
個の光検出器とを備え、光源から光偏向手段を通って出
射した光が測定対象面で反射されて2個の光検出器にそ
れぞれ光出力を生じる時の2つの光偏向手段における光
の偏向角度から測定対象面までの距離と基準面に対する
測定対象面のなす角度とを同時に測定することを特徴と
する距離・角度測定装置。
a light source and means for deflecting light from the light source; 2.
When the light emitted from the light source through the light deflection means is reflected on the measurement target surface and generates light output to the two photodetectors, the light in the two light deflection means is A distance/angle measuring device characterized by simultaneously measuring the distance from a deflection angle to a surface to be measured and the angle formed by the surface to be measured with respect to a reference surface.
JP11248782A 1982-07-01 1982-07-01 Device for measuring distance and angle Pending JPS595911A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11248782A JPS595911A (en) 1982-07-01 1982-07-01 Device for measuring distance and angle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11248782A JPS595911A (en) 1982-07-01 1982-07-01 Device for measuring distance and angle

Publications (1)

Publication Number Publication Date
JPS595911A true JPS595911A (en) 1984-01-12

Family

ID=14587868

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11248782A Pending JPS595911A (en) 1982-07-01 1982-07-01 Device for measuring distance and angle

Country Status (1)

Country Link
JP (1) JPS595911A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61120013A (en) * 1984-11-16 1986-06-07 Kawasaki Heavy Ind Ltd Measuring method of angular displacement of rotary displacement type bellows joint
WO2006022570A1 (en) * 2004-08-04 2006-03-02 Gennady Mikhailovich Mikheev Optoelectronic angle sensor
JP2016050781A (en) * 2014-08-28 2016-04-11 株式会社デンソー Liquid level detector

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5140169A (en) * 1974-10-01 1976-04-03 Mitsubishi Electric Corp SOKUKYOSOCHI
JPS53132371A (en) * 1977-04-25 1978-11-18 Iwatsu Electric Co Ltd Distance measuring device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5140169A (en) * 1974-10-01 1976-04-03 Mitsubishi Electric Corp SOKUKYOSOCHI
JPS53132371A (en) * 1977-04-25 1978-11-18 Iwatsu Electric Co Ltd Distance measuring device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61120013A (en) * 1984-11-16 1986-06-07 Kawasaki Heavy Ind Ltd Measuring method of angular displacement of rotary displacement type bellows joint
WO2006022570A1 (en) * 2004-08-04 2006-03-02 Gennady Mikhailovich Mikheev Optoelectronic angle sensor
JP2016050781A (en) * 2014-08-28 2016-04-11 株式会社デンソー Liquid level detector

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