JPS5972040A - 電子顕微鏡観察用高分子試料の調製方法 - Google Patents
電子顕微鏡観察用高分子試料の調製方法Info
- Publication number
- JPS5972040A JPS5972040A JP57181392A JP18139282A JPS5972040A JP S5972040 A JPS5972040 A JP S5972040A JP 57181392 A JP57181392 A JP 57181392A JP 18139282 A JP18139282 A JP 18139282A JP S5972040 A JPS5972040 A JP S5972040A
- Authority
- JP
- Japan
- Prior art keywords
- ray
- radiation
- contrast
- phase
- high polymer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
- Microscoopes, Condenser (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57181392A JPS5972040A (ja) | 1982-10-18 | 1982-10-18 | 電子顕微鏡観察用高分子試料の調製方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57181392A JPS5972040A (ja) | 1982-10-18 | 1982-10-18 | 電子顕微鏡観察用高分子試料の調製方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5972040A true JPS5972040A (ja) | 1984-04-23 |
| JPH0225447B2 JPH0225447B2 (2) | 1990-06-04 |
Family
ID=16099935
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57181392A Granted JPS5972040A (ja) | 1982-10-18 | 1982-10-18 | 電子顕微鏡観察用高分子試料の調製方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5972040A (2) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1036612C (zh) * | 1994-03-08 | 1997-12-03 | 中国人民解放军第304医院 | 透射电子显微镜生物样品超薄切片染色液 |
| JP2013209647A (ja) * | 2012-03-29 | 2013-10-10 | Xerox Corp | ポリマー表面の化学的な表面安定化プロセス |
| JP2013224927A (ja) * | 2012-03-23 | 2013-10-31 | Sumika Chemical Analysis Service Ltd | 観察試料、観察試料の作製方法、及び観察方法 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3922064B2 (ja) * | 2002-03-25 | 2007-05-30 | 松下電器産業株式会社 | 電池極板中の結着剤の分散状態を評価する方法 |
-
1982
- 1982-10-18 JP JP57181392A patent/JPS5972040A/ja active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1036612C (zh) * | 1994-03-08 | 1997-12-03 | 中国人民解放军第304医院 | 透射电子显微镜生物样品超薄切片染色液 |
| JP2013224927A (ja) * | 2012-03-23 | 2013-10-31 | Sumika Chemical Analysis Service Ltd | 観察試料、観察試料の作製方法、及び観察方法 |
| JP2013209647A (ja) * | 2012-03-29 | 2013-10-10 | Xerox Corp | ポリマー表面の化学的な表面安定化プロセス |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0225447B2 (2) | 1990-06-04 |
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