JPS5984104A - 長さ測定装置における補償装置 - Google Patents
長さ測定装置における補償装置Info
- Publication number
- JPS5984104A JPS5984104A JP58180932A JP18093283A JPS5984104A JP S5984104 A JPS5984104 A JP S5984104A JP 58180932 A JP58180932 A JP 58180932A JP 18093283 A JP18093283 A JP 18093283A JP S5984104 A JPS5984104 A JP S5984104A
- Authority
- JP
- Japan
- Prior art keywords
- measuring
- auxiliary
- measurement
- mirror
- thermal expansion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 28
- 230000007613 environmental effect Effects 0.000 claims description 14
- 230000003287 optical effect Effects 0.000 claims description 7
- 238000004026 adhesive bonding Methods 0.000 claims description 2
- 238000006243 chemical reaction Methods 0.000 claims 1
- 238000006073 displacement reaction Methods 0.000 claims 1
- 238000011156 evaluation Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 230000001143 conditioned effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005305 interferometry Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0011—Arrangements for eliminating or compensation of measuring errors due to temperature or weight
- G01B5/0014—Arrangements for eliminating or compensation of measuring errors due to temperature or weight due to temperature
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DD01B/24372 | 1982-10-01 | ||
| DD24372582A DD210746A1 (de) | 1982-10-01 | 1982-10-01 | Anordnung zur kompensation von umwelteinfluessen bei laengenmessgeraeten |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5984104A true JPS5984104A (ja) | 1984-05-15 |
Family
ID=5541565
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58180932A Pending JPS5984104A (ja) | 1982-10-01 | 1983-09-30 | 長さ測定装置における補償装置 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JPS5984104A (de) |
| DD (1) | DD210746A1 (de) |
| DE (1) | DE3326867A1 (de) |
| GB (1) | GB2127969A (de) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4436922C2 (de) * | 1994-10-15 | 1997-07-31 | Jenoptik Technologie Gmbh | Interferometeranordnung zur frequenz- und umweltunabhängigen Längenmessung |
-
1982
- 1982-10-01 DD DD24372582A patent/DD210746A1/de not_active IP Right Cessation
-
1983
- 1983-07-26 DE DE19833326867 patent/DE3326867A1/de not_active Withdrawn
- 1983-09-30 JP JP58180932A patent/JPS5984104A/ja active Pending
- 1983-09-30 GB GB8326199A patent/GB2127969A/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| GB2127969A (en) | 1984-04-18 |
| GB8326199D0 (en) | 1983-11-02 |
| DD210746A1 (de) | 1984-06-20 |
| DE3326867A1 (de) | 1984-04-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0646767A2 (de) | Interferometrisches Entfernungsmessgerät | |
| JPH01502296A (ja) | 干渉計方式で長さを測定するレーザ干渉測距計 | |
| JP2561861B2 (ja) | 組合わされたスケールと干渉計 | |
| EP0623801A3 (de) | Interferometrisches Messverfahren für Absolutmessungen sowie dafür geeignete Laserinterferometeranordnung. | |
| JP2001108408A (ja) | レーザ干渉装置 | |
| Pugh et al. | Automatic gauge block measurement using multiple wavelength interferometry | |
| RU155509U1 (ru) | Лазерно-интерференционный гидрофон с системой термостабилизации | |
| CN214541271U (zh) | 一种光纤法布里-珀罗传感教学实验装置 | |
| GB991907A (en) | Apparatus for detecting and indicating the extent of relative movement | |
| JPS5984104A (ja) | 長さ測定装置における補償装置 | |
| CN101245984A (zh) | 激光干涉对比测校装置 | |
| US3916528A (en) | Apparatus for compensation of dimensional position changes | |
| RU81323U1 (ru) | Совмещенный волоконно-оптический датчик давления и температуры | |
| RU45528U1 (ru) | Оптический измеритель давления | |
| CN223940215U (zh) | 一种光强补偿式位移传感器 | |
| CN110044271B (zh) | 一种光电测距仪周期误差测量方法 | |
| RU216337U1 (ru) | Измеритель отклонений от прямолинейности | |
| 瀬田勝男 et al. | Establishment of a High Accuracy Baseline for EDM Calibration in the NRLM Tunnel. | |
| SU376653A1 (ru) | Устройство для измерения перемещения объекта | |
| SU1397719A1 (ru) | Интерферометрический способ измерени линейных перемещений объектов | |
| SU696283A1 (ru) | Способ измерени угла поворота издели | |
| Titov et al. | Primary level gauge block interferometers for realization of the SI length unit | |
| SU853381A1 (ru) | Устройство дл измерени углов поворотаОб'ЕКТА | |
| SU1679301A1 (ru) | Устройство дл измерени показател преломлени прозрачных сред | |
| JPH05272913A (ja) | 高精度干渉測長計 |