JPS5985572U - Image observation devices such as electron microscopes - Google Patents

Image observation devices such as electron microscopes

Info

Publication number
JPS5985572U
JPS5985572U JP18141182U JP18141182U JPS5985572U JP S5985572 U JPS5985572 U JP S5985572U JP 18141182 U JP18141182 U JP 18141182U JP 18141182 U JP18141182 U JP 18141182U JP S5985572 U JPS5985572 U JP S5985572U
Authority
JP
Japan
Prior art keywords
image
image observation
transmission
phosphor plate
electron microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18141182U
Other languages
Japanese (ja)
Inventor
北島 汪行
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP18141182U priority Critical patent/JPS5985572U/en
Publication of JPS5985572U publication Critical patent/JPS5985572U/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2区は電子顕微鏡の像観察装置の従来装置
の構成略図、第3図は本考案の一実施例装置の構成略図
、第4図は第3図のA−A’断面図、第5図は第1図に
示した一実施例装置のレバー22を90°移動した場合
の中間室20の状態を示す図である。 1:試料、2:結像系コイル、3:螢光板、4:カメラ
室、ト螢光ガラス、6:光学レンズ、7:撮像管、8:
走査電源、9.CRT、 l O:偏向コイル、11:
シンチレータ、12ニライトガイド、13:ノオトマル
、20:中間室、21:円板、22:t/パー・、23
:X線反射板、24:X線遮蔽ガラス、25:撮像管収
納容器、26. 28:切欠部、27:フードカバー、
29:L/ンズ収納筒、30:鏡筒、31:絞り、32
:観察窓。 冒+〒ト 3二こ [−奪l; δ
Figures 1 and 2 are schematic diagrams of the configuration of a conventional image observation device for an electron microscope, Figure 3 is a schematic diagram of the configuration of an embodiment of the device of the present invention, and Figure 4 is a sectional view taken along line A-A' in Figure 3. 5 is a view showing the state of the intermediate chamber 20 when the lever 22 of the embodiment shown in FIG. 1 is moved by 90 degrees. 1: Sample, 2: Imaging system coil, 3: Fluorescent plate, 4: Camera chamber, fluorescent glass, 6: Optical lens, 7: Image pickup tube, 8:
Scanning power supply, 9. CRT, l O: Deflection coil, 11:
Scintillator, 12 Nilight guide, 13: Nootomaru, 20: Intermediate chamber, 21: Disc, 22: t/par, 23
: X-ray reflecting plate, 24: X-ray shielding glass, 25: Image pickup tube storage container, 26. 28: Notch, 27: Hood cover,
29: L/lens storage tube, 30: Lens barrel, 31: Aperture, 32
: Observation window. blasphemy + 〒to32ko [-deprivationl;

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 透過走査像観察の機能を有する透過結像型電子顕微鏡に
おいて、透過電子顕微鏡を撮影するためのカメラ室の下
部に該カメラ室と連通した中間室と、該中間室内に配置
され透過走査像観察モードにおける試料透過電子線を光
に変換するシンチレータと、該中間室内に配置され透過
像観察モードにおける電子線像を光像に変換する螢光板
と、該シンチレータと螢光板とを光軸上に切換えて配置
するための切換手段と、該螢光板が光軸上に配置された
際該変換された光像がその受光面上に投影される撮像管
とを備えたことを特徴とする電子顕微鏡等の像観察装置
In a transmission imaging electron microscope having a transmission scanning image observation function, there is an intermediate chamber communicating with the camera chamber at the bottom of the camera chamber for photographing the transmission electron microscope, and a transmission scanning image observation mode arranged in the intermediate chamber. a scintillator that converts the electron beam transmitted through the sample into light; a phosphor plate disposed in the intermediate chamber that converts the electron beam image into a light image in the transmission image observation mode; and a scintillator and the phosphor plate that are switched on the optical axis. An electron microscope, etc., characterized in that it is equipped with a switching means for arranging the phosphor plate, and an image pickup tube through which the converted light image is projected onto the light receiving surface when the phosphor plate is placed on the optical axis. Image observation device.
JP18141182U 1982-11-30 1982-11-30 Image observation devices such as electron microscopes Pending JPS5985572U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18141182U JPS5985572U (en) 1982-11-30 1982-11-30 Image observation devices such as electron microscopes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18141182U JPS5985572U (en) 1982-11-30 1982-11-30 Image observation devices such as electron microscopes

Publications (1)

Publication Number Publication Date
JPS5985572U true JPS5985572U (en) 1984-06-09

Family

ID=30393114

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18141182U Pending JPS5985572U (en) 1982-11-30 1982-11-30 Image observation devices such as electron microscopes

Country Status (1)

Country Link
JP (1) JPS5985572U (en)

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