JPS5992829U - Emission diffusion pattern measuring device - Google Patents

Emission diffusion pattern measuring device

Info

Publication number
JPS5992829U
JPS5992829U JP18865282U JP18865282U JPS5992829U JP S5992829 U JPS5992829 U JP S5992829U JP 18865282 U JP18865282 U JP 18865282U JP 18865282 U JP18865282 U JP 18865282U JP S5992829 U JPS5992829 U JP S5992829U
Authority
JP
Japan
Prior art keywords
light
diffusion pattern
measuring device
light emission
pattern measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18865282U
Other languages
Japanese (ja)
Inventor
斎藤 精一
雅夫 郡司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP18865282U priority Critical patent/JPS5992829U/en
Publication of JPS5992829U publication Critical patent/JPS5992829U/en
Pending legal-status Critical Current

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  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の発光拡散パターン測定器を示す側面説明
図、第2図は本考案による発光拡散パターン測定器を示
す側面説明図、第3図は補正係数の決定についての説明
図、第4図は出力補正回路を示すブロック図、第5図は
本考案の他の実施例を示す側面説明図、第6図はその補
正板を示す平面図である。 11・・・・・・発光素子、12・・・・・・拡散光、
13・・・・・・光の射出方向の中心軸、14′・・・
・・・受光素子、16・・・・・・リード線、17・・
・・・・出力補正回路、18・・・・・・凹曲面、20
・・・・・・出カケープル、21・・・・・・補正板、
22・・・・・・スリット、O・・・・・・発光点。
FIG. 1 is a side view showing a conventional light emission diffusion pattern measuring device, FIG. 2 is a side view showing a light emission diffusion pattern measuring device according to the present invention, FIG. 3 is a side view explaining the determination of a correction coefficient, 5 is a block diagram showing an output correction circuit, FIG. 5 is an explanatory side view showing another embodiment of the present invention, and FIG. 6 is a plan view showing a correction plate thereof. 11... Light emitting element, 12... Diffused light,
13... Central axis in the direction of light emission, 14'...
... Light receiving element, 16 ... Lead wire, 17 ...
... Output correction circuit, 18 ... Concave curved surface, 20
...Output cable, 21...Correction plate,
22... Slit, O... Luminous point.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 発光素子からの拡散光を受光素子で受けてその拡散のパ
ターンを測定する発光拡散パターン測定器において、上
記受光素子からの光の射出方向の中心軸と直交する面内
で平板状に多数配置し、それぞれの受光素子から出力さ
れる電気信号を上記発光素子の発光点を中心とする半球
状の凹曲面上で受光したのと同様となるように電気的又
は機械的に補正し、上記発光素子の発光拡散パターンの
全体寧を一時に測定できるようにしたことを特徴とする
発光拡散パターン測定器。
In a light emission diffusion pattern measuring device that receives diffused light from a light-emitting element with a light-receiving element and measures the diffusion pattern, a large number of light-emitting elements are arranged in a flat plate in a plane perpendicular to the central axis of the light emission direction from the light-receiving element. , electrically or mechanically correct the electrical signals output from each light-receiving element so that the light is received on a hemispherical concave curved surface centered at the light-emitting point of the light-emitting element, and the light-emitting element A light emission diffusion pattern measuring device characterized in that the entire light emission diffusion pattern of the light emission pattern can be measured at once.
JP18865282U 1982-12-14 1982-12-14 Emission diffusion pattern measuring device Pending JPS5992829U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18865282U JPS5992829U (en) 1982-12-14 1982-12-14 Emission diffusion pattern measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18865282U JPS5992829U (en) 1982-12-14 1982-12-14 Emission diffusion pattern measuring device

Publications (1)

Publication Number Publication Date
JPS5992829U true JPS5992829U (en) 1984-06-23

Family

ID=30406925

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18865282U Pending JPS5992829U (en) 1982-12-14 1982-12-14 Emission diffusion pattern measuring device

Country Status (1)

Country Link
JP (1) JPS5992829U (en)

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