JPS60145121A - Eye obstacle examination apparatus - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an apparatus for inspecting disorders of the human eye, and particularly to an apparatus for inspecting the crystalline lens of the human eye. More specifically, Mizumoto BA relates to an eye disorder testing device for observing or recording optical cross-sectional images of the human eye's crystalline lens.

(Prior art) An eyeball lens cross-section observation device that can observe an optical cross-sectional image of the crystalline lens by projecting a slit light onto the human eye lens and observing the lens from a direction oblique to the projection axis of the slit light has already been developed. It is publicly known. In this case, the imaging plane of the observation optical system is placed on a plane containing the intersection line between the slit plane containing the slit light projected onto the eyeball and the main plane of the imaging optical system in the observation optical system. It is also known that by arranging the lens, the entire O-filled surface image of the crystalline lens can be observed in a focused state. Such an optical arrangement is known as the Scheinnolf principle, and a crystalline lens cross-section observation device that utilizes this principle is disclosed in, for example, the patent application Sho Sho/g!
;// issue.

Although this known device has the advantage of being able to observe in focus the entire full-plane image of the crystalline lens formed by the slit projection light, the observation can only be performed on one cross section;
There is also the inconvenience that it is not possible to display or record which cross section is being observed.

(Object of the Invention) The present invention provides an nM W
It is an object of the present invention to provide an eye disorder testing device capable of displaying the position of an ocular defect.

(Structure of the Invention) In order to achieve the above object, an eye disorder testing device R according to the present invention
trt has the following configuration. That is, the device of the present invention:
This type has a slit projection means for projecting slit light onto the subject's eye, and a crystalline lens section observation optical system for observing or recording the optical cross section of the subject's eye lens by the slit light; Bu C child is placed;
Furthermore, an imaging lens having an optical axis substantially coaxial with the slit light projection optical axis and forming an intermediate image of the pupil image of the eye to be examined; and an imaging lens disposed on the intermediate image plane and parallel to the longitudinal direction of the slit light. a slit projection position recording optical system comprising a reticle having an index, and a relay optical system having an analyzer whose polarization direction is perpendicular to the polarizer for imprinting the intermediate image and the index image onto a recording means; The present invention is characterized in that a slit projection position observation optical system is provided for observing the intermediate image, the index image, and the corneal reflection image of the slit light. In this configuration of the present invention, when the analyzer is retracted from the optical path, the corneal reflected light of the slit projection light enters the observation optical system, so this corneal reflected light is observed together with an intermediate image of the pupil of the eye to be examined, and the apparatus alignment with respect to the eye to be examined and the slit light projection position can be confirmed. In addition, for observation and photography, if you insert an analyzer into the optical path,
(1) Due to the action of photons and the analyzer, corneal reflected light is localized, allowing observation and recording without the influence of harmful light.

In a preferred embodiment of the present invention, the slit projection position is displayed on the same recording surface as the observation optical system, which is the same recording surface as the photographic film surface.

(Effects of the Invention) According to the present invention, the position where the slit light is projected, that is, the position of the cross section of the lens to be observed and recorded, is the slit projection position v1.
．． Since the information is recorded or observed using the recording optical system and the slit projection position observation optical system, it is possible to conveniently observe eye disorders such as cataracts over time.

(Description of Embodiments) Overall configuration Referring to FIG. 1, the eye disorder testing apparatus embodying the present invention includes a slit projection optical system O, a crystalline lens cross section imaging optical system 20, and a transillumination imaging optical system 30. , an observation optical system 40,
and a density chart photographing system 45, and all of these optical systems are housed in the /S housing 100.

Slit projection optical system 10 The slit projection optical system 10 has a tungsten bulb 101 for observation and a xenon lamp f103 for photography as a light source.
A condensing lens 102 is arranged between the two. Furthermore, a condenser lens 104 is provided to guide the light beam from the light source along the projection optical path 10aK, and the projection optical path]
A diaphragm 105 and a slit diaphragm 106 are arranged along Oa. The slit diaphragm 106 passes the light flux from the light source in the form of a thin slit, and the slit light flux that has passed through the slit diaphragm 106 passes through the first objective lens
7 and is reflected at right angles by mirror 110,
It passes through the first objective lens 107 and is reflected at a right angle by the half mirror 109, and is projected onto the eye Et in the direction of the projection optical axis Oo force.

A filter 111 is arranged in the projection optical path 10a so as to be removable as required.

The condensing lens 102 condenses the filament image of the tungsten bulb 101 onto the NWi gap of the kissel lung 103, that is, the light emitting point position, and the condensing lens 104 converts the light from these light sources into a parallel beam.

The first objective lens 107 has a front focal point at the position of a slit aperture (j) 106, and converts the light beam passing through the slit aperture 106 into a parallel light beam. Second objective lens 108I′i! / A slit image S of the light flux passing through the objective lens 107 is formed on the main crystalline lens of the anterior eye EtO of the eye to be examined. Close and form an image. As is well known in general slit lamps, it is desirable that the slit diaphragm 106 be able to adjust the slit length and the slit [1] as desired, and the slit diaphragm p106
A circular aperture plate having an aperture diameter of S is arranged adjacent to the
It is important to be able to project a circular spot light of any size onto the anterior segment of the subject's eye. Furthermore, the projection optical path 10
A polarizer 112 made of a polarizing filter is inserted in a for the purpose described later.

Crystalline lens cross section photographing optical system 20 This optical system 20 has an imaging lens 201, a flip-up mirror 202, and a shadow film surface 203 (3.1). The optical axis 20a of the imaging lens 2011d forms a slit image S on the subject's eye Fat. It is arranged diagonally to the
The photographic film surface 203 is also arranged diagonally d1 with respect to the optical axis 20m. Imaging lens 201 and film surface 203
is a slit image S on the eye El to be examined. In other words, the imaging lens 2
The main surface 201m of 01 and the extension of the film surface 203 are the slit image S. are arranged so that they intersect on a plane containing

With this arrangement, almost the entire slit cross-sectional image S formed on the film surface 203 can be brought into focus.

The flip-up mirror 202 is placed in front of the photographic film surface 203, and is normally inserted into the photographic optical path as shown by the solid line in the figure, and reflects the light flux passing through the imaging lens 201 toward the observation optical system 40 in the direction of light H2ob. do. This mirror 202
is raised by a shutter (not shown) to the position shown by the pessimistic line in the figure, and the light beam from the imaging lens 201 passes through the film surface 203.

This optical system 30 has an optical axis 0.0. The object lens 301 has an objective lens 301 arranged so as to have an object lens 30, and a reticle 302 is provided to form an image of the light beam passing through the favorite lens 30.

A beam of light from the reticle 302 is reflected by a mirror 303 and directed to the tar lift mirror 202 via relay lenses 304 and 307. The light flux from the relay lens 307 is transmitted to the mirror 20 when the mirror 202 is in the raised position shown by the imaginary line in the figure during photographing.
2 toward the film surface 203, the film surface 2
03, the entire image of the crystalline lens of the eye Et to be examined is formed. An analyzer 306 made of a polarizing plate is provided between the relay lenses 304 and 307, and this analyzer 306 is arranged so that its polarization axis is perpendicular to the polarization axis of the polarizer 112, and the analyzer 306 is arranged so that the direction of its polarization axis is perpendicular to the polarization axis of the polarizer 112. Prevents reflected light from the cornea of the eye to be examined from reaching the film surface. There is a half mirror 305 behind the relay lens 3C4, which reflects a part of the light beam that has passed through the relay lens 304 toward the V detection optical system 40.

This optical system has 40 pieces, and the flap of the optical system 20 is Mi2-202.
It has a reticle 401 placed on the reflective optical axis 20b of the lens. This reticle 401 is arranged conjugately with the film plane 203, and has projection marks m401 a and 40 l b shown in m 3 Figure K for the purpose described later. When the mirror 202 is at the solid line position in the figure, the eye to be examined Et
Slit image S above. A tear slit cross-sectional image S1 is formed on this reticle 4o1. There is a mirror 402 above the optical axis 20b, and this mirror 402 reflects the light beam incident along the optical axis 20b along the observation optical axis o2. The observation optical axis 02 is coaxial with the optical axis o1 of the objective lens 301, and a relay lens 403 and a rotating reticle 404 are provided on this optical axis 02. The relay lens 403 and the rotating reticle 404 have an optical arrangement based on the Scheingruff principle with respect to the reticle 401.
The slit cross-sectional image S1 on 1 forms a slit cross-sectional image 81' on the reticle 404 by the lens 403. In order to observe the image on the rotating reticle 404, the eyepiece 4
05 is provided.

A relay lens 406 is arranged in the half mirror 3050 reflection optical path of the transillumination photography optical system 30.
The light flux passing through 06 is turned into light by mirror 407! l1llO
It can be reflected towards 2. Half mirror 40 is on optical axis 02
8 is arranged to reflect the light beam from the mirror 407 toward the rotating reticle 404, and to place the subject's eye Et on the reticle 404.
A transillumination image is formed. Further, in the reflection optical path of the half mirror 305, an analyzer 409 similar to the -analyzer 306 is arranged such that it can be moved in and out of the optical path. The observation optical system 40 is provided with a switching shutter 410 for selectively guiding either the light beam from the reticle 401 or the light beam from the half mirror 305 to the rotating reticle 404.

Indicator Projection System As shown in FIGS. 5 and 6, the reticle 302 consists of a holding frame 500 and a transparent glass plate 5 fitted into and bonded to the holding frame 500.
01, and grooves 502, 503, 504, and 505 are formed in the glass plate 501 at intervals of θ0 in the circumferential direction. Above each of the grooves 502 to 505 are semicircular tubes 530, 531, 532, 5 whose inner walls are light reflective.
33) is glued.

On the other hand, the holding frame 500 has a groove 51o along the circumferential direction.

511, 512, 513 are formed, and in these grooves,
Optical fiber 520°521.52 respectively
2.523 are respectively fitted and sheared. Output end surfaces 520a, 521a of these optical fibers,
522a and 523a are cut diagonally, and are arranged at the end of the scored groove so that the diagonally cut surfaces face upward.

The original optical fibers 520 to 523 are bundled together into a bundle 524 of fibers, wired to the projection optical system 10, and branched into two from the middle.One input end 525 connects to the xenon lamp O3, and the other input end 526 connects to the xenon lamp O3. Tungsten lamps are 1oIK vs 11T. For example, a green monochromatic filter 540 is arranged between the entrance end 526 and the tungsten lamp 101.

The light from the tungsten lamp 101 is filtered through the filter 540.
The green light is made into green light and enters the optical fiber.
Injected from the injection end. At this time, since the exit end face is cut obliquely, most of the emitted light is transmitted to the groove 50 of the glass plate 501.
The light is refracted and emitted toward the 2-505 side, further diffused by the diffusion surface of the groove wall, and then transmitted through the glass plate 501 and emitted toward the mirror 303. Further, the light beam emitted to the side opposite to the front of the scored lines is reflected by the reflective inner walls of the semicircular tubes 530 to 5330 and enters the marked groove side.

As shown in FIGS. 1 and 7, the rotating reticle 404 has an observation visual field section 404a having two horizontal black lines 404d on a transparent glass plate, and an optical or magnetic code formed along its circumferential direction. It is composed of a plate part 404b and a detection head 404c that detects the code of this code plate,
The observation field section 404a is held rotatably about the viewing optical axis, and the detection head 404c is attached to the eyepiece barrel.
has been established. The detection head 404c detects the reticle rotation value, and the detection circuit 1000 converts it into a rotation value, which is digitally displayed on the display 1100.

On the other hand, the rotation angle value from the circuit 1.000 is sent via the data imprint controller 1200 to cause the data imprint head 1300 disposed close to the film 203 to emit light to digitally photograph the rotation angle value on the film.

As shown in FIG. 1, an optical fiber 451 is arranged with one end facing the xenon lamp '103, and the other end of the optical fiber 451 is arranged with a relay lens 452, N'D
An optical system consisting of a filter 453 and a popularity chart 454 is evaluated in the direction of 'if'. The light beam following the density chart 454 is reflected by a mirror 456, passes through an imaging lens 455, is reflected by the mirror 202 in the raised state, and forms an image on the film surface 203. A density chart photographing system 45 is formed by these optical arrangements.

As mentioned above, the above-mentioned optical system is housed in the housing 100, and the housing 100 is supported by a suitable support means 5 such as a U-shaped arm, with coaxial optical axes of 0°, o,
, o, , -1 is rotatably supported. Detection spatula of eyepiece 405 and rotating reticle 404) '404
The housing 100 is fixed to a fixed portion of the holding means 5, and is configured to remain stationary even when the housing 100 rotates.

After operating the operating shack 410, opening the transillumination observation system, and retracting the analyzer 409 from the optical path, the projection optical system 10
The observation light beam 101 is turned on, and the slit light from the slit 106 is projected onto the subject's eye. The light from the light source 10 passes through a green color filter 540 and an optical fiber 52.
By illuminating the marked lines 502 to 505 of the reticle 302 through which the examiner passes through 4, the examiner can observe green crosshair images 502' to 505' within the field of view of the eyepiece, as shown in FIG. Eye to be examined and this device6. When the alignment is incomplete, as shown in FIG. 28, the centers of the pupil image P of the examinee's eye P and the image R formed by the partially reflected light of the slit light by the cornea of the examinee's eye are shifted from each other, and the crosshair images 502'-- It is also observed to be shifted from the center of the intersection of 505'. The center of the pupil image P is aligned with the center of the slit image intersection by vertical and horizontal adjustment mj of the holding means 5, so that the slit image R becomes the horizontal slit image 50:3', 505
' (Figure 2b).

Next, analyzer 310 is inserted into the optical path. The slit image R due to the slit light reflected from the cornea, whose polarization axis is perpendicular to the (1M optical axis) of the analyzer 310,
Cut by 10. On the other hand, the reflected light of the slit light from the fundus becomes an unpolarized light beam that has almost lost its polarization due to the diffusion effect of the fundus, and is illuminated by this reflected light to form a transillumination image of the eye to be examined. Therefore, analyzer 3
The examiner can observe the transillumination image created by the light beam that is not cut by the angle 10, and the observation is not affected by the corneal reflected light at all. Focusing of the retroillumination image is achieved by moving the holding means back and forth.

Next, based on the transillumination image, use the rotary reticle 404 to view the cross-section of the cataract area, for example, the opaque area indicated by C.
, and set the black line '404 d to the desired cross-sectional meridian (Fig. 10).

The analyzer 310 is retracted from the optical path again, the housing is rotated, and the corneal reflection image R of the slit light and the horizontal slit images 503' and 505' that match this become the black line 404.
d (Fig. 2d).

Next, the optical path switching shutter 410 is switched to open the optical path on the crystalline lens cross section observation optical system side. An optical cross-sectional image of the crystalline lens produced by the slit light is once formed on the scinticle 401 by the wire connecting lens 201. As shown in FIG. 3, index lines 401 a and 40 l b are formed on this reticle 401 . This index 1I1401a has a corneal cross-sectional image cS
It is checked that the front surface of lens 1 matches the index line 401b with the crystalline lens cross-sectional image -. If they match, move the housing 100 back and forth to make them match. By this operation, the transillumination imaging position can be kept constant. The cross-sectional image r-S+' on the reticle 401 is re-imaged on the rotating reticle 404 via the fi mirror 402, the relay lens 403, and the half mirror 408, and the image S1'' is observed through the eyepiece.

When photographing these observed transilluminated images and cross-sectional images, the flip-up mirror 202 is flipped up and the xenon lens 103 is turned on at the same time by operating a shutter release switch (not shown) for X-ray photography.

By flipping up the flip-up mirror 202, an optical path for photographing a cross-section of the crystalline lens is opened, and a cross-sectional image is imprinted on a film 203 as shown in FIG. At the same time, the cross-ray image of the reticle 302 and the half mirror 30
5, and after the angle 1 conversion reflection slit image is cut by the analyzer 306, the bounce is at the level of the mirror bounce t〆-
1 and is imprinted on the film 203.

Since the film 203 is rotated together with the rotation of the housing 100, a crosshair image 502 appears on the film 203.
Although the positions of ' to 505' do not change, the crystalline lens transillumination image P is imaged at a relative rotational position as the housing 100 rotates. Therefore, horizontal crosshair images 503', 50
The position 5' indicates the slit cutting plane, that is, the crystalline lens cross-sectional position.

In order to observe and record changes in cataracts over time, the cross-section of the same lens meridian is observed and recorded based on the previous photographic record, and the cross-hair rotation angle data in the film is 1500a.
First, adjust the black + Wfi 404d of the rotating reticle to the value of , while looking at the display on the display 1100, then look through the eyepiece and adjust the housing 100 so that the horizontal cross layer image is at the position of the set black line 404d. rotate it,
Set the slit projection direction.

At the same time, the density chart image 454a is reflected at the flip-up position of the mirror through the density chart photographing optical system and is imprinted on the film 203.

Furthermore, this film has a rotation angle of the black line 404d: I'
lJ,' s, i.e. slit incident angle i71.1300
A is copied as a digital value by a data printing head and is sized appropriately.

As shown in Fig. GN and Fig. GB, the grooves 502 to 502
A reflective prism 2000 is attached after the reflective prism 505, and an optical fiber 5 is attached to one surface of the reflective prism 2000.
24 and connect the light from the fiber to the prism 2000
The light may be reflected by the reflective surface and transmitted through the groove.

In addition, an image tube may be provided in place of the eyepiece, illumination for observation may be performed using infrared light, and a V 1' R device may be used in place of the projection film. may be performed using a slit light beam with a circular light beam.

[Brief explanation of drawings]

Fig. 1 is a schematic diagram of the optical system of an eye disorder testing device showing an embodiment of the present invention, Figs. A schematic diagram of the rotating reticle in the eyepiece section, Figure G is a schematic diagram showing an example of a photographed image, Figure S is a diagram of the interior of the transillumination photography optical system, and Figure 88 is a reticle of the transillumination photography optical system. FIG. GB is a partial view of the reticle shown in FIG. 10... Slit projection optical system 1.20.
...... Lens cross-section photographing optical system, 30...
...Transillumination photography optical system, 40...
Observation optical system, 45... Density chart photographing system, 106...
...... Slit aperture, 201...
...Imaging lens, 202...Mirror on the flap, 203...Photographing film surface, 30
1... Objective lens, 403...
.../J fJ lens, 405...Eyepiece, m 5 Figure 8 @6

Claims (1)

[Scope of Claims] /) An eye disorder testing device having a slit projection means for projecting a slit light onto the crystalline lens of the eye to be examined, and a crystalline lens cross section observation optical system for observing or recording the optical cross section of the crystalline lens using the slit light. a polarizer is disposed in the slit projection means; an imaging lens having an optical axis substantially coaxial with the slit light projection optical axis and forming an intermediate image of the pupil image of the eye to be examined; a reticle arranged on the intermediate image plane and having an index parallel to the longitudinal direction of the slit light; and an analyzer whose polarization direction is perpendicular to the polarizer for imprinting the intermediate image and the index image onto a recording means. A slit projection position observation optical system for observing the intermediate image, the index image, and the corneal reflection image of the slit light is provided. An eye disorder testing device characterized by: 2) The inspection apparatus according to claim 1, wherein the slit projection means and the crystalline lens cross-section observation optical system are configured to be rotatable together with the projection optical axis as a rotation axis. 3) The inspection device according to claim 1 or 2, wherein the imaging surface of the crystalline lens cross section observation optical system and the imaging surface of the slit projection position recording optical system are the same imaging surface. 11) The inspection device according to any one of claims 1 to 3, wherein the indicator is at least a book and is arranged in a cross shape. S) The indicators are arranged in a straight line in a direction perpendicular to the arrangement direction of the first indicator pairs of the seven first indicator pairs arranged on the same straight line, and each indicator of the 8P, / indicator pair The inspection device according to claim 1, characterized in that it is comprised of seven pairs of second indicators, each of which has a different length. B) The inspection device according to any one of claims 1 to 7, wherein the indicator is a luminescent indicator. 7) The inspection apparatus according to claim 6, wherein the indicator is comprised of a marked line engraved on the reticle and an illumination means for illuminating the marked line. g) The slit projection position observation optical system includes a relay optical system that relays the intermediate image and the index image to a second imaging point, and a second optical system that is arranged on the second imaging point and is rotatable about the optical axis. 8. The inspection device according to claim 1, further comprising a rotating reticle having an index.