JPS601529A - Surface-temperature measuring method - Google Patents
Surface-temperature measuring methodInfo
- Publication number
- JPS601529A JPS601529A JP58107964A JP10796483A JPS601529A JP S601529 A JPS601529 A JP S601529A JP 58107964 A JP58107964 A JP 58107964A JP 10796483 A JP10796483 A JP 10796483A JP S601529 A JPS601529 A JP S601529A
- Authority
- JP
- Japan
- Prior art keywords
- measured
- cover
- artificial
- emissivity
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0831—Masks; Aperture plates; Spatial light modulators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0815—Light concentrators, collectors or condensers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0887—Integrating cavities mimicking black bodies, wherein the heat propagation between the black body and the measuring element does not occur within a solid; Use of bodies placed inside the fluid stream for measurement of the temperature of gases; Use of the reemission from a surface, e.g. reflective surface; Emissivity enhancement by multiple reflections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
- G01J5/802—Calibration by correcting for emissivity
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
〔発明の利用分野〕
本発明は、放射温度計を用いる表面温度測定方法に係シ
、特に被測定物体個有の放射率をめる必要なく測温し得
るように改良した表面温度測定方法に関するものである
。[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to a surface temperature measurement method using a radiation thermometer, and in particular, to a surface temperature measurement method using a radiation thermometer. This invention relates to an improved surface temperature measurement method.
例えば工業用の連続加熱炉によって加熱されている物体
の温度を、該連続加熱炉を操業しつつ測定するには放射
温度計が好都合であシ、現に工業用炉その他において放
射温度計を用いた温度測定カ広く行ワしている。この放
射温度計の作動原理は次の如くである。For example, a radiation thermometer is convenient for measuring the temperature of an object being heated in an industrial continuous heating furnace while the continuous heating furnace is in operation. Temperature measurement is widely used. The operating principle of this radiation thermometer is as follows.
放射温度計の検出子に入射する放射エネルギーEは、(
1)式で近似される。The radiant energy E incident on the detector of the radiation thermometer is (
1) It is approximated by Eq.
E=εKT” ・・・川、・旧・・(1)ここで、εは
被測温物体の放射率、には定数。E=εKT" ... River, Old ... (1) Here, ε is the emissivity of the object whose temperature is being measured, and is a constant.
Tは被測温物体の絶対温度、nは放射定数C1測定波長
λを用いて、n−=c/λTと表わされる通常n値と呼
ばれるものである。放射温度計は、(1)式において、
放射エネルギーEを測定するものである。したがって放
射温度計にょシ被測温物体の温度Tを決定するためには
、(1)式がら明らがなように被測温物体の放射率εを
知らなければならない。T is the absolute temperature of the object to be measured, and n is the radiation constant C1 using the measurement wavelength λ, which is usually called the n value expressed as n-=c/λT. In the radiation thermometer, in equation (1),
It measures the radiant energy E. Therefore, in order to determine the temperature T of the temperature-measuring object using a radiation thermometer, the emissivity ε of the temperature-measuring object must be known, as is clear from equation (1).
かかる問題に対して、これまで、第1図に示すごとく放
射率と表面温度を同時に測定する方法が公知である。こ
の従来法によれば、まず第1図(a)に示すように被測
温物体1の上に間隔を置いて、内面を高反射率の鏡面と
した両端開放の円筒状キャビティ2を置き、放射温度計
3で、物体表面からの放射エネルギーE1を測定する。To solve this problem, a method of measuring emissivity and surface temperature simultaneously, as shown in FIG. 1, has been known. According to this conventional method, first, as shown in FIG. 1(a), a cylindrical cavity 2 with both ends open and whose inner surface is a mirror surface with high reflectance is placed at a distance above the temperature-measuring object 1. The radiation thermometer 3 measures the radiation energy E1 from the object surface.
次にキャピテイ2の上を同様に高反射率の鏡面を有する
ツク4で覆ってキャビティ5を形成し、物体表面からの
放射エネルギーE2を測定する。第1図(a)の場合は
、放射温度計3に入射する放射エネルギーElは物体1
から直接到達した放射エネルギーのみであって、キャビ
ティ2の影響を受けない。一方、第1図(b)の場合、
物体1からの熱輻射線は、キャビティ5で多重反射し、
この多重反射した熱輻射線の一部が小孔6を通って放射
温度計3に入射する。したがって、放射温度計3に入射
する放射エネルギーE2は、第1図(a)の場合の放射
エネルギーElよシも犬きくなシ、見掛は上、物体1の
放射率が増大する。この見掛けの放射率を請求める物体
1の放射率をε、物体1と等しい温度の黒体の放射エネ
ルギーをEbとすると、次の間係式が成立する。Next, a cavity 5 is formed by covering the cavity 2 with a mirror 4 having a high reflectance, and the radiant energy E2 from the object surface is measured. In the case of Fig. 1(a), the radiant energy El incident on the radiation thermometer 3 is
It is only the radiant energy that reaches directly from the cavity 2 and is not affected by the cavity 2. On the other hand, in the case of Fig. 1(b),
Thermal radiation from the object 1 is reflected multiple times in the cavity 5,
A portion of this multiple reflected thermal radiation passes through the small hole 6 and enters the radiation thermometer 3. Therefore, the radiant energy E2 incident on the radiation thermometer 3 is much stronger than the radiant energy El in the case of FIG. 1(a), and the emissivity of the object 1 increases. If the emissivity of the object 1 whose apparent emissivity can be determined is ε, and the radiant energy of a black body having the same temperature as the object 1 is Eb, then the following equation holds true.
Et =εEb ・・・・1川・・(2)E*=gEb
・・・・旧・・川(3)したがって、第1図(a)、
(b)に示した測定法によって測定した放射エネルギ
ーEl、E2の比をGととすると、次式を得る。Et = εEb...1 river...(2) E*=gEb
...Old...river (3) Therefore, Figure 1 (a),
Letting G be the ratio of the radiant energies El and E2 measured by the measurement method shown in (b), the following equation is obtained.
G=E2/E1=g/ε ・・印・川(4)見掛けの放
射率gは、キャビティ5がら物体1への実効的な反射率
γと物体1の表面粗さθの両者に依存するパラメータα
を用いて、次式で示される。G=E2/E1=g/ε...Mark/Kawa (4) The apparent emissivity g depends on both the effective reflectance γ from the cavity 5 to the object 1 and the surface roughness θ of the object 1. Parameter α
It is shown by the following formula using .
(α+1)ε 6+ケ °°“°゛°°°°旧− (4)、 (51式よシ次式を得る。(α+1)ε 6+ke °°“°゛°°°°old- (4), (51 formula yields the following formula.
α+1−αG
。 −°−°−°−°−−−−(6)
ここで、パラメータαと表面粗さθとの相関を実験によ
シ予めめている。したがって、第1図において、表面粗
さ測定器(粗度計)を、放射温度計3に付設し、まず表
面粗さθを測定し、予めめであるθ−α相関図によシα
をめ、次に放射温度計3によシ上述のととくGをめれば
、(6)式よシ物体1の放射率εがまる。Elとεがま
ると(1)式よシ物体1の表面温度Tがまる。ここで、
見掛けの放射率gが表面粗さθに依存する理由を次に述
べる。α+1−αG. −°−°−°−°−−−−(6) Here, the correlation between the parameter α and the surface roughness θ is determined in advance by experiment. Therefore, in FIG. 1, a surface roughness measuring device (roughness meter) is attached to the radiation thermometer 3, and the surface roughness θ is first measured, and α is calculated based on the θ-α correlation diagram in advance.
Then, by taking the above-mentioned G into the radiation thermometer 3, the emissivity ε of the object 1 can be calculated according to equation (6). When El and ε are equalized, the surface temperature T of the object 1 is equalized according to equation (1). here,
The reason why the apparent emissivity g depends on the surface roughness θ will be described below.
物体1から放射された熱輻射線がキャビティ5と物体1
の間を反射し往復している間に系外に漏れ出てしまう割
合が、表面粗さθに依存するためである。すなわち、第
2図に示すごとく、キャビティ5から物体1に反射され
た熱輻射線は、物体10表面で一部吸収され残りは再び
反射される。Thermal radiation emitted from object 1 connects cavity 5 and object 1.
This is because the rate at which the light leaks out of the system while reflecting and reciprocating between the two depends on the surface roughness θ. That is, as shown in FIG. 2, part of the thermal radiation reflected from the cavity 5 to the object 1 is absorbed by the surface of the object 10, and the rest is reflected again.
この時、反射された熱輻射線の一部は、キャビティ5と
物体1の間のギャップ7がら系外に漏れる。At this time, a part of the reflected thermal radiation leaks out of the system through the gap 7 between the cavity 5 and the object 1.
この漏れる割合が、物体1の表面での熱輻射線の散乱状
況、すなわち、表面状態に依存する。こうした理由にょ
シ、既述のごとく見掛けの放射率gが表面粗さθに依存
する。This leakage rate depends on the state of scattering of thermal radiation on the surface of the object 1, that is, the surface condition. For this reason, the apparent emissivity g depends on the surface roughness θ, as described above.
従って従来の放射温度計を用いた温度測定方法において
は、放射温度計と粗度計とを併用して放耐重をめ、この
放射率に基づいて被測定物体の表面温度を算定するとい
う煩雑な手順を用いなければならなかった。また上述し
た方法以外にも、放射温度計を用いた表面温度測定法に
関する提案は、いくつかあるがいずれも被測温物体の放
射率を測定することが必要という問題点があった。さら
に、これらの方法では、被測温物体の表面状態が酸化や
不純物の付着等により、時々刻々変化し、−それに伴っ
て放射率が変化する場合、連続的に、表面温度を測定で
きないという問題点があった。Therefore, in the conventional temperature measurement method using a radiation thermometer, a radiation thermometer and a roughness meter are used together to determine the radiation resistance, and the surface temperature of the object to be measured is calculated based on this emissivity. procedure had to be used. In addition to the above-mentioned methods, there are several proposals regarding surface temperature measurement methods using radiation thermometers, but all of them have the problem of requiring the emissivity of the temperature-measuring object to be measured. Furthermore, these methods have the problem of not being able to measure the surface temperature continuously if the surface condition of the temperature-measuring object changes from time to time due to oxidation or adhesion of impurities, and the emissivity changes accordingly. There was a point.
本発明は上述の事情に鑑みて為され、放射温度計を用い
る表面温度測定方法において、被測定物個有の放射率と
無関係に表面温度を測定し得る方法を提供することを目
的とする。The present invention has been made in view of the above-mentioned circumstances, and an object of the present invention is to provide a surface temperature measuring method using a radiation thermometer that can measure the surface temperature regardless of the emissivity unique to the object to be measured.
上記の目的を達成するため、本発明の測定方法は、被測
定物体の茨面上に人工黒体カバーを配置し1この人工黒
体カバーの下縁を被測定物にほぼ接触せしめて、該被測
定物体に個有の放射率に拘らずその見掛けの放射率を実
用上の精度範囲内で一定値ならしめ、この見掛けの放射
率に基づいて被測定物体の表面温度を算出することを特
徴とする。In order to achieve the above object, the measuring method of the present invention involves placing an artificial black body cover on the thorny surface of the object to be measured, and (1) bringing the lower edge of the artificial black body cover into almost contact with the object to be measured. The feature is that the apparent emissivity of the object to be measured is set to a constant value within a practical accuracy range, regardless of the emissivity specific to the object to be measured, and the surface temperature of the object to be measured is calculated based on this apparent emissivity. shall be.
以下、本発明の一芙施例を第3図により説明する。人工
黒体カバー8は、高反射率(低放射率)の内面を有する
片側端開放の円筒形のキャビティ9と同じく高反射率を
有する両端開放の円筒形をした対物補助カバー10を備
えている。キャピテイ9の放射温度計3に対向する頂面
には小孔12が穿孔されてお)、この小孔14を通して
被測温物体1からの熱輻射線が放射温度計3に入射する
。Hereinafter, one embodiment of the present invention will be explained with reference to FIG. The artificial black body cover 8 includes a cylindrical cavity 9 with one end open and an inner surface with high reflectance (low emissivity), and an objective auxiliary cover 10 with a cylindrical shape with both ends open and also with high reflectance. . A small hole 12 is bored in the top surface of the cavity 9 facing the radiation thermometer 3), and thermal radiation from the object to be measured 1 enters the radiation thermometer 3 through the small hole 14.
対物補助カバー10の側面に取シ付けられた突起11が
、キャビティ9の内面に図中上下方向につけられた溝1
2にほめこ捷れ、同時に弱いスプリングエ3が、対物補
助カバー10を軽く下方に押しやる構造になっている。A protrusion 11 attached to the side surface of the objective auxiliary cover 10 forms a groove 1 formed on the inner surface of the cavity 9 in the vertical direction in the figure.
At the same time, the weak spring 3 is structured to lightly push the objective auxiliary cover 10 downward.
この構造により、対物補助カバー10は、スムーズな上
下運動が可能であシ、人工黒体カバー8と被測定物体1
とは、小孔14を除いては密閉された(あるいは、隙間
を無視しうる)空洞15を形成している。また対物補助
カバー10は、断熱材で作られており、被測定物体1か
らの熱を遮蔽している。With this structure, the objective auxiliary cover 10 can move up and down smoothly, and the artificial black body cover 8 and the object to be measured 1 can move smoothly up and down.
This forms a cavity 15 that is sealed except for the small hole 14 (or the gap can be ignored). Further, the objective auxiliary cover 10 is made of a heat insulating material and blocks heat from the object 1 to be measured.
以上のように構成し/ζ人工黒体カバーを用いて表面温
度を測定する方法は、厳密な意味では非接触法とは言い
難い。The method of measuring the surface temperature using the artificial blackbody cover configured as described above cannot be called a non-contact method in the strict sense.
しかし、上記の補助カバー10は被測定物体1の表面に
軽く接触しているのみであるから、該被測定物体1の水
平方向移動を拘束しない。その上、被測定物体1の水平
方向移動に対して追従してフィツトし、後述のごとくそ
の機能を果たすので、実用上の機能に関しては非接触法
に等しい。However, since the above-mentioned auxiliary cover 10 only lightly contacts the surface of the object to be measured 1, it does not restrict the movement of the object to be measured 1 in the horizontal direction. Moreover, it follows and fits the horizontal movement of the object to be measured 1 and performs its function as described later, so that it is equivalent to a non-contact method in terms of practical function.
本発明の表面温度測定法の原理について以下に述べる。The principle of the surface temperature measurement method of the present invention will be described below.
最初、第3図で示された人工黒体カバー8の内面の反射
率γが1.0(完全反射)で小孔が無視でき、密閉した
空洞15が形成されている理想的な場合を考えると、第
4図を用いて後述する原理から被測定物体10見掛けの
放射率εfは、被測温物体1自体の放射率εに無関係に
1.0となる。したがって、放射温度計3によシ放射エ
ネルE+を測定することにより、次式から被測温物体1
の温度Tがまる。First, consider an ideal case where the reflectance γ of the inner surface of the artificial blackbody cover 8 shown in FIG. 3 is 1.0 (complete reflection), small holes can be ignored, and a sealed cavity 15 is formed. According to the principle described later with reference to FIG. 4, the apparent emissivity εf of the object to be measured 10 is 1.0 regardless of the emissivity ε of the object to be measured 1 itself. Therefore, by measuring the radiation energy E+ with the radiation thermometer 3, the temperature of the object to be measured 1 is
The temperature T of .
E+=εt KT”=KT r′ ・・・・・・・・・
・・・(力実際の場合、人工黒体カバー8の内面による
熱輻射線の吸収および小孔14からの熱輻射線の漏れが
あシ、見掛けの放射率εは1.0にならない。E+=εt KT"=KT r' ・・・・・・・・・
(In the actual case, there is absorption of thermal radiation by the inner surface of the artificial black body cover 8 and leakage of thermal radiation from the small holes 14, so that the apparent emissivity ε does not reach 1.0.
しかし、後に第5図、第6図を用いて説明するように、
許容測温誤差範囲内では、被測温物体1の見掛けの放射
率εfが、被測温物体11体の放射率εに依存せず人工
黒体カバー8と被測温物体1の間の空間形状にのみに依
存する一定値と見做し得る。したがって、予め一度、見
掛けの放射率ε!を測定しておけば、被測温物体1の放
射率εによらず(被測温物体ごとの放射率を知る必要が
ない。)、また測定中、被測温物体10表面状態が変化
し放射率εが変化しても、次式によシ被測温物体1の温
度をめることができる。However, as will be explained later using FIGS. 5 and 6,
Within the allowable temperature measurement error range, the apparent emissivity εf of the temperature-measuring object 1 does not depend on the emissivity ε of the temperature-measuring object 11, and the space between the artificial blackbody cover 8 and the temperature-measuring object 1 It can be regarded as a constant value that depends only on the shape. Therefore, once in advance, the apparent emissivity ε! By measuring , it does not depend on the emissivity ε of the temperature-measuring object 1 (there is no need to know the emissivity of each temperature-measuring object), and the surface condition of the temperature-measuring object 10 changes during the measurement. Even if the emissivity ε changes, the temperature of the temperature-measuring object 1 can be determined by the following equation.
El−εaKT11 ・・・・・・・・・・・・(8)
ここで、Etは、放射温度計3で測定した放射エネルギ
ーである。El-εaKT11 ・・・・・・・・・・・・(8)
Here, Et is the radiant energy measured by the radiation thermometer 3.
第4図に人工黒体カバーが理想的な場合、すなわち第3
図の空洞15が完全に密閉されておシかつ人工黒体カバ
ー内面の反射率γが1,0の場合、被測温物体1の見掛
けの放射率εfが1.0となる原理説明図を示す。第4
図(a)に示すごとく小穴を有した空洞15は、入射し
た光(熱輻射線)を、その内壁面で繰シ返し反射させ、
再び小穴から光が外界に出る機会を与えずすべて内壁面
で吸収してしまう。したがって内壁面は見掛は上、黒体
となっている。言いかえると、内壁面の放射率は内壁面
自体の放射率に無関係に見掛は上1.0になっている。Figure 4 shows the case where the artificial blackbody cover is ideal, that is, the third
When the cavity 15 shown in the figure is completely sealed and the reflectance γ of the inner surface of the artificial black body cover is 1.0, the apparent emissivity εf of the object to be measured 1 is 1.0. show. Fourth
As shown in Figure (a), the cavity 15 having small holes repeatedly reflects incident light (thermal radiation) on its inner wall surface.
Again, the light is not given a chance to escape from the small hole to the outside world, and all of it is absorbed by the inner wall surface. Therefore, the inner wall surface appears to be a black body. In other words, the emissivity of the inner wall surface appears to be 1.0 above, regardless of the emissivity of the inner wall surface itself.
もちろん内壁面で放射された熱輻射線も同様に内壁面で
吸収される。このような空洞15を通常人工黒体と呼ん
でいる。第4図(b)は第4図(a)に示した人工黒体
の原理を応用した本発明の人工黒体カバーの原理を示す
。第4図(a)と第4図(b)の根本的な構造上の差異
は、第4図(b)の空洞15を形成する人工黒体カバー
16の反射率が1.0(完全反射)であシ、この面では
、熱輻射線の吸収が起らないことである。したがって、
例えば1第4図(b)の示すように被測温物体1のA点
で放射された熱輻射線は人工黒体カバー16と被測温物
体1の間を何回か反射をくり返えし、最終的には必ず被
測温物体1で吸収される(今の場合、B点)。Of course, thermal radiation emitted by the inner wall surface is also absorbed by the inner wall surface. Such a cavity 15 is usually called an artificial blackbody. FIG. 4(b) shows the principle of the artificial black body cover of the present invention, which is an application of the principle of the artificial black body shown in FIG. 4(a). The fundamental structural difference between FIG. 4(a) and FIG. 4(b) is that the reflectance of the artificial black body cover 16 forming the cavity 15 in FIG. 4(b) is 1.0 (complete reflection). ) The advantage is that no absorption of thermal radiation occurs on this surface. therefore,
For example, as shown in Fig. 4(b), the thermal radiation emitted at point A of the temperature-measuring object 1 is reflected several times between the artificial blackbody cover 16 and the temperature-measuring object 1. However, it is eventually absorbed by the object to be measured 1 (in this case, point B).
したがって、第4図(b)においても被測温物体1の面
は見掛は上、黒体(放射率1.0)となる。すなわち、
平面状の被測温物体1上に人工黒体カバーを設けること
により、被測温物体1のみで閉じた空洞を作シ人工黒体
を作り出したのと等価な効果をもたせることができるこ
とがわかる。本発明において人工黒体カバーとは上記第
4図(b)に例示した部材16のごとく頂面に小孔14
を設けた不透明体のカバーを言う。Therefore, also in FIG. 4(b), the surface of the object to be measured 1 appears to be a black body (emissivity 1.0). That is,
It can be seen that by providing an artificial blackbody cover on the flat temperature-measuring object 1, it is possible to create an effect equivalent to creating an artificial blackbody by creating a closed cavity with only the temperature-measuring object 1. . In the present invention, an artificial black body cover is defined by a small hole 14 on the top surface as in the member 16 illustrated in FIG. 4(b) above.
Refers to an opaque cover with a
次に熱輻射線の人工黒体カバーにおける吸収および空洞
外への漏れを考慮した実際の場合を考える。第3図に基
づいて説明する。Next, consider an actual case in which absorption of thermal radiation in the artificial blackbody cover and leakage to the outside of the cavity are considered. This will be explained based on FIG.
人工黒体カバー8側から被測温物体1への実効的な反射
率をγl<1)とし、被測温物体1の放射率をε、温度
をTとすると、最初、被測温物体1から放射された熱輻
射線の放射エネルギーεKT″のうちγ、(εKT″)
だけ人工黒体カバー8側から被測温物体1に反射されて
戻ってくる。そして被測温物体1でεγ、(εKT ”
)だけ吸収が−起こり、残シのγ、(1−ε)(εK
T”)が再び人工黒体カバー8側へ放射される。したが
って、最終的に放射温度計3に入射する放射エネルギー
E、fは次のような級数で表わされる。Assuming that the effective reflectance from the artificial blackbody cover 8 side to the temperature-measuring object 1 is γl<1), the emissivity of the temperature-measuring object 1 is ε, and the temperature is T, initially, the temperature-measuring object 1 γ, (εKT″) of the radiant energy εKT″ of thermal radiation emitted from
is reflected from the artificial black body cover 8 side to the object to be measured 1 and returns. Then, εγ, (εKT ”
) absorption occurs, and the remaining γ, (1-ε) (εK
T") is again radiated to the artificial black body cover 8 side. Therefore, the radiant energies E and f that finally enter the radiation thermometer 3 are expressed by the following series.
Bat−εKT”(1+r−(1’) +r、”(1’
)2+γ:(1−ε)3+・山・・) ・旧・・・・・
(9)(9)式は、公比γ、(1−ε)の等比級数であ
りr、(1−ε)く1であるので次式を得る。Bat-εKT"(1+r-(1') +r,"(1'
)2+γ:(1-ε)3+・Mountain・・)・Old・・・・
(9) Equation (9) is a geometric series with common ratios γ and (1-ε), and since r and (1-ε) are multiplied by 1, the following expression is obtained.
・・・・・・・・・(10)
見掛けの放射率をε!とすると、(10)式よシ・・−
□−7,(□−6) ・・・・・・・・・(11)変形
して
ここで実効的な反射率γ6は、人工黒体カバーの材質の
反射率に依存する項(γ)と小孔14から漏れずに生き
残る確率Pの項から成り、次式で近似できる。・・・・・・・・・(10) Apparent emissivity is ε! Then, the formula (10) is...
□-7, (□-6) (11) The effective reflectance γ6 after deformation is a term (γ) that depends on the reflectance of the material of the artificial black body cover. and the probability P of surviving without leaking from the small hole 14, and can be approximated by the following equation.
γ、=γP ・・・・・・・・・・・・(13)小孔1
4に到達する熱輻射線は人工黒体カバー8の内面で多重
散乱されたものであり、第2図を用いて説明したような
被測温物体1の表面粗さの影響は、無視しうる。このこ
とから、γ、は、人工黒体カバーの材質、形状にのみに
依存する。したがって、(12)式において
1−γ。γ, = γP ・・・・・・・・・・・・(13) Small hole 1
The thermal radiation reaching 4 is multiple scattered on the inner surface of the artificial black body cover 8, and the influence of the surface roughness of the temperature-measuring object 1 as explained using FIG. 2 can be ignored. . From this, γ depends only on the material and shape of the artificial blackbody cover. Therefore, 1-γ in equation (12).
γ、 > (−) ・・・・・・・・・・・・(14)
が成立すれば、見掛けの放射率εfは、被測温物体1は
放射率εに無関係となることがわかる。また放射率εに
εfが依存し、放射率εの変動(被測温物体の種類の変
化や表面状態変化に起因)によりεfの変化しても、そ
のεfの変化による測定温度の誤差が許容範囲であれば
、放射率εの変動は無視でき、この間、見掛けの放射率
εfは一定値とすることができる。このように測温許容
誤差の観点から、見掛けの放射率εfが一定と見なせる
とき、見掛けの放射率εfは実質上、一定値であると呼
ぶ。ε1を一定と見なしたことによる誤差Δεfとこの
Δεfに起因する測定温度Tの誤差ΔTとの関係は、(
8)式より、次式で近似される。γ, > (-) ・・・・・・・・・・・・(14)
If this holds true, it can be seen that the apparent emissivity εf of the object to be measured 1 has no relation to the emissivity ε. In addition, εf depends on the emissivity ε, and even if εf changes due to a change in the emissivity ε (due to a change in the type of object to be measured or a change in the surface condition), an error in the measured temperature due to the change in εf is acceptable. Within this range, fluctuations in the emissivity ε can be ignored, and the apparent emissivity εf can be kept at a constant value during this period. In this way, when the apparent emissivity εf can be considered constant from the viewpoint of temperature measurement tolerance, the apparent emissivity εf is said to be a substantially constant value. The relationship between the error Δεf caused by assuming that ε1 is constant and the error ΔT in the measured temperature T caused by this Δεf is (
From equation 8), it is approximated by the following equation.
1ΔT/TI=−1Δεf/ε11 ・・・・・・・・
・(15)(15)式より、例えばΔT/T<1%の誤
差が許されるとすると、概算としてΔεt / t t
(n%の誤差が許されることがわかる。1ΔT/TI=-1Δεf/ε11 ・・・・・・・・・
・(15) From equation (15), if an error of ΔT/T<1% is allowed, then approximately Δεt / t t
(It can be seen that an error of n% is allowed.
次に被測温物体1の放射率εがε=ε閲がらε=1.0
まで変動した時のΔεf/εfの値ηをめる。Next, the emissivity ε of the object to be measured 1 is ε=ε, and ε=1.0.
Calculate the value η of Δεf/εf when it fluctuates to .
(12)式よシ
したがって、例えばΔT/T<1%の誤差が許されると
すれば、Δεf/ε、(n%が許されるので(17)式
にη−nを代入してgumをめることによシ、被測温物
体の放射率がε−ε騙〜1.0に変動しても見掛けの放
射率εfは、実質上、一定値で亭
あるとすることができるがわかる。ε關はΔT/Tの許
容誤差が決壕りしたがってηが決まっているときγ、の
函数となるのでこの様子を、第5図に示す。図中、実線
で示された曲線は(17)式よ請求まる次式を満足して
いる。According to equation (12), for example, if an error of ΔT/T<1% is allowed, then Δεf/ε, (n% is allowed, so substitute η−n into equation (17) to find gum. In particular, it can be seen that even if the emissivity of the temperature-measuring object varies from ε-ε to 1.0, the apparent emissivity εf can be assumed to remain at a substantially constant value. The ε function is a function of γ when the allowable error of ΔT/T is fixed, so when η is fixed, this situation is shown in Figure 5. In the figure, the curve shown by the solid line is (17) The following formula is satisfied.
被測温物体の放射率εがこの曲線よシ上の領域(斜線部
)にあるとき見掛けの放射率εfは、実質上一定と見な
せる。したがって、被測温物体の放射率がわからなくて
も、少なくともεmin上り大きいことが保証されてい
る場合、本発明が適用できる。When the emissivity ε of the temperature-measuring object is in the region (shaded area) above this curve, the apparent emissivity εf can be considered to be substantially constant. Therefore, even if the emissivity of the object to be measured is not known, the present invention can be applied if it is guaranteed that at least εmin rise is large.
第6図に、ΔT/T値をパラメータに、(18)式で示
される曲線群を示す。ここで(15)式よシΔT/T=
i・ηとし、n値は、測定波長λ=2μm1放射定数C
= 1.44X10’ μm IC、測定温度キロo。FIG. 6 shows a group of curves expressed by equation (18) using the ΔT/T value as a parameter. Here, according to equation (15), ΔT/T=
i・η, and the n value is the measurement wavelength λ = 2 μm1 radiation constant C
= 1.44X10' μm IC, measured temperature km o.
°に、η−12とした。いま、第3図の人工黒体カバー
8の具体的な構造として、内面全体が金メンキされてお
シ、キャビティ9の外径が30+o+nφ、小孔14の
位置の高さ30m1小孔を1m+nφとしたときの実効
反射率γ、を概算する。測定波長2μmの光について金
の反射率は0.983である。°, it was set to η-12. Now, the concrete structure of the artificial blackbody cover 8 shown in Fig. 3 is such that the entire inner surface is plated with gold, the outer diameter of the cavity 9 is 30 + o + nφ, and the height of the small hole 14 is 30 m1, and the small hole is 1 m + nφ. The effective reflectance γ when The reflectance of gold for light with a measurement wavelength of 2 μm is 0.983.
(13)式の右辺に於てγを、γ−0,983で近似す
る。On the right side of equation (13), γ is approximated by γ-0,983.
また小孔14から漏れる確率(1−P)は被測温物体1
から小孔14を見たときの立体角に正比例すると仮定す
ると、Pキ0.9998を得る。したがツー((13)
式よりr、 中0.983X0.9998=0.983
を得る。よりて第6図から、この例の人工黒体カバー8
を用いた場合、ΔT/T=5%の許容誤差範囲のとき、
被測温物体の放射率εが0.028以上あることが保証
されていれば、本発明が適用できることがわかる。第6
図より、できるだけ人工黒体カバーの反射率γ、を大き
く設計することが望しいことがわかる。人工黒体カバー
の内面を高反射率にするためには、内面に銀、銅、アル
ミニウムのメッキや酸化マグネシウム粉末の塗布も有効
である。さらに金属の反射率は波長が長くなるほど、高
くなるので、最適な測定波長を選択して用いることが望
ましい。Also, the probability (1-P) of leakage from the small hole 14 is the temperature measured object 1.
Assuming that it is directly proportional to the solid angle when looking at the small hole 14 from the angle, we obtain Pki 0.9998. But two ((13)
From the formula, r, medium 0.983X0.9998=0.983
get. Accordingly, from FIG. 6, the artificial black body cover 8 of this example
When using ΔT/T=5% tolerance range,
It can be seen that the present invention is applicable as long as it is guaranteed that the emissivity ε of the object to be measured is 0.028 or more. 6th
From the figure, it can be seen that it is desirable to design the reflectance γ of the artificial blackbody cover to be as large as possible. In order to make the inner surface of the artificial black body cover highly reflective, plating the inner surface with silver, copper, or aluminum or applying magnesium oxide powder is also effective. Furthermore, since the reflectance of metal increases as the wavelength becomes longer, it is desirable to select and use the optimum measurement wavelength.
人工黒体カバー8の温度は被測温物体の温度に比して低
く人工黒体カバー8から放射される熱輻射線は無視でき
るが、測定温度が高い場合は人工黒体カバー8を冷却す
ることが望しい。The temperature of the artificial black body cover 8 is lower than the temperature of the object to be measured and the thermal radiation emitted from the artificial black body cover 8 can be ignored, but if the measured temperature is high, the artificial black body cover 8 is cooled. That is desirable.
第7図、第8図は前記と異なる実施例を示す。FIGS. 7 and 8 show an embodiment different from the above.
第7図では、人工黒体カバー17の実効的な反射率r、
を高めるため、小孔14からの熱輻射線の漏れを防止す
る目的で、ミラー18.18’を設けた例を示している
。ミラー18はサポート19を介して人工黒体カバー1
7の内壁面に取付け、ミラー18′は直接取付けである
。第7図以降においては第3図に示した対物補助カバー
10の図示を省略しである。In FIG. 7, the effective reflectance r of the artificial black body cover 17,
An example is shown in which mirrors 18 and 18' are provided for the purpose of preventing the leakage of thermal radiation from the small hole 14 in order to increase the thermal energy. The mirror 18 is attached to the artificial black body cover 1 via the support 19.
7, and the mirror 18' is directly attached. From FIG. 7 onwards, illustration of the objective auxiliary cover 10 shown in FIG. 3 is omitted.
また、測温許容誤差が比較的大きい場合は、上記の対物
補助カバー10の設置を省略して人工黒体カバーを被測
定物にほぼ接触させて本発明方法を実施することもでき
る。Furthermore, if the temperature measurement tolerance is relatively large, the method of the present invention can be carried out by omitting the installation of the objective auxiliary cover 10 and bringing the artificial blackbody cover into almost contact with the object to be measured.
第8図の実施例も、第7図の実施例と同様に小(Li2
からの熱輻射線の漏洩を防止するように構成したもので
、本例における人工黒体カバー20は次のように構成し
である。The embodiment of FIG. 8 also has a small (Li2
The artificial blackbody cover 20 in this example is constructed as follows.
即ち、人工黒体カバー20は次に述べる扇形カバー20
2とドーナツ状カバー20bとを中心線Z−Zに関して
同心状に相貫せしめた形状の中空体に構成する。That is, the artificial black body cover 20 is a fan-shaped cover 20 described below.
2 and the donut-shaped cover 20b are formed into a hollow body having a shape that concentrically penetrates each other with respect to the center line Z-Z.
上記の扇状カバー208は、頂角θ1の扇形を、頂角の
2等分線の回りに回転せしめて形成される。The fan-shaped cover 208 described above is formed by rotating a sector having an apex angle θ1 around a bisector of the apex angle.
また、ドーナツ状カバー20bは半径R2の1/4円周
を中心線Z−Zの回りに回転せしめて形成される。この
ような人工黒体カバー20の形状を扇形冠状と名付ける
。Further, the donut-shaped cover 20b is formed by rotating a quarter circumference of the radius R2 around the center line ZZ. The shape of such an artificial black body cover 20 is named fan-shaped crown shape.
第8図の矢印dldD点から放射された熱輻射線の反射
径路の1例である。このように扇形冠状の人工黒体カバ
ーを設けると、小孔14から外界に漏洩する熱輻射線を
抑制できる。This is an example of a reflection path of thermal radiation emitted from the arrow dldD point in FIG. 8. By providing the fan-shaped crown-shaped artificial blackbody cover in this manner, it is possible to suppress thermal radiation leaking from the small holes 14 to the outside world.
第9図は、温度分布を測定するために局部温度を検出で
きるように構成した実施例を示している。FIG. 9 shows an embodiment configured to detect local temperature in order to measure temperature distribution.
本例における人工黒体カバー21は、その断面が扇形を
なし、かつ、該扇形の頂角の2等分線が被測定面に対し
て垂直をなしCいる。?c′i″Lによシ、被測温物体
1から放射された熱輻射線が、人工黒体カバー21で反
射された後、再び被測温物体1に集中し、見掛けの放射
率を高める構造になっている。The artificial black body cover 21 in this example has a fan-shaped cross section, and the bisector of the apex angle of the fan shape is perpendicular to the surface to be measured. ? c'i''L, the thermal radiation emitted from the temperature-measuring object 1 is reflected by the artificial black body cover 21 and then concentrated on the temperature-measuring object 1 again, increasing the apparent emissivity. It has a structure.
第10図は、温度分布測定用人工黒体カバーの他の一例
を示している。第9図に示されたものでは、温度分布を
測定するためには、人工黒体カバー21を移動させなけ
ればならないが、第10図では人工黒体カバー22は固
定して走査ミラー23により測温位置がスキャンニング
できるようになっている。・
〔発明の効果〕
以上詳述したように、本発明の表面温度測定法は、被測
定物体の表面上に人工黒体カバーを配置し、この人工黒
体カバーの下縁を被測定物にほぼ接触せしめて、該被測
定物体に個有の放射率に拘らずその見掛けの放射率を実
用上必要とする精度範囲内で一定値ならしめ、この見掛
けの放射率に基づいて被測定物体の表面温度を算出する
ことにより、被測定物体個有の放射率と関係なく被測定
物の表面温度を測定することができる。FIG. 10 shows another example of an artificial blackbody cover for measuring temperature distribution. In the one shown in FIG. 9, the artificial black body cover 21 must be moved in order to measure the temperature distribution, but in FIG. The temperature position can be scanned. - [Effects of the Invention] As detailed above, the surface temperature measurement method of the present invention places an artificial blackbody cover on the surface of the object to be measured, and places the lower edge of the artificial blackbody cover on the object to be measured. The apparent emissivity of the object to be measured is made to be a constant value within the accuracy range required for practical use, regardless of the emissivity specific to the object to be measured. By calculating the surface temperature, the surface temperature of the object to be measured can be measured regardless of the emissivity unique to the object to be measured.
第1図(a)、 (b)は従来の表面温度測定方法の説
明図、第2図は放射率に及ぼす表面粗さの影響の説明図
、第3図は本発明方法の一実施例を説明するための概要
的な断面図、第4図(a)、 (b)は本発明方法の原
理的説明図である。第5図及び第6図は被測温物体の放
射率と人工黒体カバーの反射率との関係を示す図表でち
る。第7図乃至第10図はそれぞれ上記と異なる実施例
を説明するための概要的な断面図である。
1・・・被測温物体、2・・・キャビティ、3・・・放
射温度計、4・・・フタ、5・・・キャビティ、6・・
・小孔、7・・・ギャップ、8・・・人工黒体カバー、
9・・・キャビティ、10・・・対物補助カバー、11
・・・突起、12・・・溝、13・・・スプリング、1
4・・・小孔、15・・・空洞、16・・・人工黒体カ
バー、17・・・人工点本カバー、18.18’ ・・
・ミラー、19・・・サポート、20・・・人工黒体カ
バー、21・・・人工黒体カバー、22・・・人工黒体
カバー、23・・・走査ミラー。
代理人 弁理士 秋本正実
第 1 呂
倣) (b)
千20
第30
弔4−霞
(’2L’) (bン
第 5霞
A工黒体カへ′−反射率と。
第 6図
□に工思イ木カバー反埼十をJ8
第q霞
吊10 [¥]Figures 1 (a) and (b) are illustrations of a conventional method for measuring surface temperature, Figure 2 is an illustration of the influence of surface roughness on emissivity, and Figure 3 is an illustration of an embodiment of the method of the present invention. 4(a) and 4(b) are schematic cross-sectional views for explaining the principle of the method of the present invention. FIGS. 5 and 6 are charts showing the relationship between the emissivity of the temperature-measuring object and the reflectance of the artificial blackbody cover. FIGS. 7 to 10 are schematic cross-sectional views for explaining embodiments different from those described above. 1... Temperature measured object, 2... Cavity, 3... Radiation thermometer, 4... Lid, 5... Cavity, 6...
・Small hole, 7... gap, 8... artificial black body cover,
9... Cavity, 10... Objective auxiliary cover, 11
...Protrusion, 12...Groove, 13...Spring, 1
4...Small hole, 15...Cavity, 16...Artificial black body cover, 17...Artificial point book cover, 18.18'...
- Mirror, 19... Support, 20... Artificial black body cover, 21... Artificial black body cover, 22... Artificial black body cover, 23... Scanning mirror. Agent Patent Attorney Masami Akimoto No. 1 Ryo imitation) (b) 1,200 No. 30 Condolences 4-Haze ('2L') (b No. 5 Haze A to engineering black body force'-reflectance. In Figure 6 □ Koushii wood cover anti-Saijyu J8 No. 1 Kasumi Tsuri 10 [¥]
Claims (1)
測定物体の表面上に人工黒体カバーを配置し、この人工
黒体カバーの下縁を被測定物にほぼ接触せしめて、該被
測定物体に個有の放射率に拘らずその見掛けの放射率を
実用上必要とする精定範囲内で一定値ならしめ、この見
掛けの放射率に基づいて被測定物体の表面温度を算出す
ることを特徴とする表面温度測定方法。 2、前記の人工黒体カバーは、高反射率の内面を有する
キャビティと、被測定物に接する補助カバーとから成る
ものであることを特徴とする特許請求の範囲第1項に記
載の表面温度測定方法。 3、前記の人工黒体カバーのキャビティは有頂無底の円
筒形とし、かつ前記の補助カバーは上記のキャビティに
摺動自圧に嵌合する円筒形としたことを特徴とする特許
請求の範囲第2項に記載の表面温度測定方法。 4、前記の人工黒体カバーは、その内部に反射鏡を設け
たものであることを特徴とする特許請求の範囲第2項に
記載の表面温度測定方法。 5、前記の人工黒体カバーは、その垂直断面が扇形冠状
をなすものでちることを特徴とする特許請求の範囲第2
項に記載の表面温度測定方法。 6、前記の人工黒体カバーは、その垂直断面が扇形をな
すものであることを特徴とする特許請求の範囲第2項記
載の表面温度測定方法。 7、前記の人工黒体カバーは、断面が扇形のキャビティ
と、走査ミラーとを備えたものであることを特徴とする
特許請求の範囲第1項若しくは同第2項に記載の表面温
度測定方法。[Claims] In a surface temperature measurement method using a 1° radiation thermometer, an artificial blackbody cover is placed on the surface of an object to be measured, and the lower edge of this artificial blackbody cover is brought into almost contact with the object to be measured. Then, the apparent emissivity of the object to be measured is set to a constant value within a precision range that is practically required, regardless of the emissivity specific to the object to be measured, and the surface temperature of the object to be measured is determined based on this apparent emissivity. A surface temperature measurement method characterized by calculating. 2. The surface temperature according to claim 1, wherein the artificial blackbody cover is composed of a cavity having an inner surface with high reflectance and an auxiliary cover in contact with the object to be measured. Measuring method. 3. The cavity of the artificial black body cover has a cylindrical shape with a top and bottom, and the auxiliary cover has a cylindrical shape that fits into the cavity in a sliding self-pressure manner. The surface temperature measuring method according to scope 2. 4. The surface temperature measuring method according to claim 2, wherein the artificial black body cover is provided with a reflecting mirror therein. 5. Claim 2, wherein the artificial black body cover has a vertical section having a fan-shaped crown shape.
Surface temperature measurement method described in section. 6. The surface temperature measuring method according to claim 2, wherein the artificial black body cover has a vertical cross section that is fan-shaped. 7. The surface temperature measuring method according to claim 1 or 2, wherein the artificial black body cover includes a cavity having a fan-shaped cross section and a scanning mirror. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58107964A JPS601529A (en) | 1983-06-17 | 1983-06-17 | Surface-temperature measuring method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58107964A JPS601529A (en) | 1983-06-17 | 1983-06-17 | Surface-temperature measuring method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS601529A true JPS601529A (en) | 1985-01-07 |
Family
ID=14472525
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58107964A Pending JPS601529A (en) | 1983-06-17 | 1983-06-17 | Surface-temperature measuring method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS601529A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6475814A (en) * | 1987-09-17 | 1989-03-22 | Hitachi Ltd | Control system for pressure in furnace |
| EP0612862A1 (en) * | 1993-02-24 | 1994-08-31 | Applied Materials, Inc. | Measuring wafer temperatures |
-
1983
- 1983-06-17 JP JP58107964A patent/JPS601529A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6475814A (en) * | 1987-09-17 | 1989-03-22 | Hitachi Ltd | Control system for pressure in furnace |
| EP0612862A1 (en) * | 1993-02-24 | 1994-08-31 | Applied Materials, Inc. | Measuring wafer temperatures |
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