JPS60182779A - Photocoupler - Google Patents

Photocoupler

Info

Publication number
JPS60182779A
JPS60182779A JP59037823A JP3782384A JPS60182779A JP S60182779 A JPS60182779 A JP S60182779A JP 59037823 A JP59037823 A JP 59037823A JP 3782384 A JP3782384 A JP 3782384A JP S60182779 A JPS60182779 A JP S60182779A
Authority
JP
Japan
Prior art keywords
layer
photocoupler
substrate
light emitting
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59037823A
Other languages
Japanese (ja)
Inventor
Nobuyoshi Takagi
高城 信義
Tetsuya Ogawa
哲也 小川
Michiya Oura
大浦 道也
Shinichi Soeda
添田 信一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP59037823A priority Critical patent/JPS60182779A/en
Publication of JPS60182779A publication Critical patent/JPS60182779A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F55/00Radiation-sensitive semiconductor devices covered by groups H10F10/00, H10F19/00 or H10F30/00 being structurally associated with electric light sources and electrically or optically coupled thereto
    • H10F55/20Radiation-sensitive semiconductor devices covered by groups H10F10/00, H10F19/00 or H10F30/00 being structurally associated with electric light sources and electrically or optically coupled thereto wherein the electric light source controls the radiation-sensitive semiconductor devices, e.g. optocouplers
    • H10F55/25Radiation-sensitive semiconductor devices covered by groups H10F10/00, H10F19/00 or H10F30/00 being structurally associated with electric light sources and electrically or optically coupled thereto wherein the electric light source controls the radiation-sensitive semiconductor devices, e.g. optocouplers wherein the radiation-sensitive devices and the electric light source are all semiconductor devices
    • H10F55/255Radiation-sensitive semiconductor devices covered by groups H10F10/00, H10F19/00 or H10F30/00 being structurally associated with electric light sources and electrically or optically coupled thereto wherein the electric light source controls the radiation-sensitive semiconductor devices, e.g. optocouplers wherein the radiation-sensitive devices and the electric light source are all semiconductor devices formed in, or on, a common substrate

Landscapes

  • Optical Couplings Of Light Guides (AREA)
  • Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)

Abstract

PURPOSE:To enable miniaturization and mass production by a method wherein a light emitting element, photo detecting element, and photo guiding element formed by selective lamination of amorphous Si and its compound are integrally formed on the same substrate by connection. CONSTITUTION:The section where a clear electrode 3, an a(amorphous)-SiC layer, a-Si layer 6, a-SiC layer 7, electrode layer 8 have been laminated on the substrate 1 is the light emitting element 14. The part of lamination of a clear electrode 4, p<+> a-Si layer 9, I-a-Si layer 10, n<+> a-Si layer 11, and electrode layer 12 constitutes the photo detecting element, and the part of lamination of SiOx layer 13 on an SiO2 layer 2 constitutes the photo guiding element 16. The elements 14, 15, and 16 thus integrally formed to the substrate 1 constitute the photocoupler 17. Therefore, the photocoupler 17 formed by integral lamination of respective constituent elements on the substrate 1 allows the light generated in the element 14 to be effectively confined, and to input to the element 15 by progation through the layer 2. Such a construction enables the manufacture of an IC-processed photocoupler without using an expensive manufacturing process.

Description

【発明の詳細な説明】 (a)発明の技術分野 本発明は非品質シリコン(アモルファス・シリコン,以
下a−Stとする)を用いて同一基板上に発光素子と光
検出素子及びそれらの素子間を接続するλ導光素子とを
一体に形成したフォ1・カプラに関する。
Detailed Description of the Invention (a) Technical Field of the Invention The present invention uses non-quality silicon (amorphous silicon, hereinafter referred to as a-St) to fabricate a light emitting element, a photodetecting element, and a space between them on the same substrate. This invention relates to a photo coupler that is integrally formed with a λ light guide element that connects the λ light guide element.

(b)技術の背景 アイソレータやノイズサブレソサ及びインクラブタ等と
して使用されるフォトカブラは、電気的に絶縁された発
光部と受光部とが光学的に結合し構成されている。そし
て従来のフォ1・カプラ(光結合素子)は、GaAsの
発光素子とSiフォトダイオード素子(光検出素子)を
それぞれ個別に作成し、それらを機械的に結合して一体
化させた構成のものが一般的であり、IC化されたもの
としては、GaAs発光素子とGCIAS光検出素子及
びそれらを光学的に接続する導光素子からなるものがあ
る。
(b) Background of the Technology A photocoupler used as an isolator, a noise subreducer, an incluctor, etc. is constructed by optically coupling an electrically insulated light emitting section and a light receiving section. The conventional photo coupler (optical coupling device) has a structure in which a GaAs light emitting device and a Si photodiode device (photodetecting device) are each made separately, and then mechanically coupled to integrate them. is common, and some integrated circuit devices include a GaAs light emitting element, a GCIAS photodetecting element, and a light guide element that optically connects them.

(c)従来技術と問題点 上記構成になるフォトカブラにおいて、個別素子からな
るものは該個別素子を従来構成でIC化することが不可
能であるため小型化及び量産化の改善がされ難く、IC
化されたフォトカプラは大型で高価な装置を必要とする
MBE’(モレキュラ・ビ−ム・エピタキシャル)やM
OCVD法(有機金属CVD法)により作成されるため
高価格になるという欠点があった。
(c) Prior art and problems In the photocoupler having the above configuration, it is difficult to improve miniaturization and mass production because it is impossible to convert the individual elements into an IC with the conventional configuration. IC
Optical couplers are manufactured using MBE' (Molecular Beam Epitaxial) and MBE' (Molecular Beam Epitaxial), which require large and expensive equipment.
Since it is produced by the OCVD method (organometallic CVD method), it has the disadvantage of being expensive.

(d)発明の目的 本発明の目的は上記問題点を除去することである。(d) Purpose of the invention The purpose of the invention is to eliminate the above-mentioned problems.

(e)発明の構成 上記目的は、非晶質シリコン(a −Si )、非晶質
シリコンの化合物とを選択的に積層してなる発光素子と
光検出素子及び導光素子とを同一基板上に接続形成して
なることを特徴とするフォトカプラにより、達成される
(e) Structure of the Invention The above object is to provide a light emitting element formed by selectively laminating amorphous silicon (a-Si) and a compound of amorphous silicon, a photodetector element, and a light guide element on the same substrate. This is achieved by a photocoupler characterized in that it is formed by connecting to.

(f)発明の実施例 本発明はa−5iとその化合物を種々の素子構造で作成
することにより同一基板上に発光素子9m光素子、光検
知素子が形成可能であることを利用したものであり、発
光素子としてa −3iC/ a−3i/a−5iCの
′す゛ンドイソチ構造やp型a −5i/n型a−5t
のpn接合構造があり、導光素子としてばa −3iに
添加するNやC及びOの濃度を&続的に変化させ屈折率
を連続的に変化させた膜の多層構造として光を閉じ込め
る構造とし、光検知素子としてa−5iのpin接合構
造やpt電極とa −3iを用いたシミノドキー接合構
造並びに透明電極とa −3iを用いたベテロ接合構造
がある。
(f) Embodiments of the Invention The present invention utilizes the fact that a light emitting element, a 9m optical element, and a photodetecting element can be formed on the same substrate by creating a-5i and its compounds in various element structures. Yes, as light-emitting elements, a-3iC/a-3i/a-5iC's diisotropic structure and p-type a-5i/n-type a-5t are used.
It has a pn junction structure, and as a light guide element, it confines light as a multilayer structure of films whose refractive index is continuously changed by changing the concentration of N, C, and O added to a-3i. As a photodetecting element, there are an a-5i pin junction structure, a simino-dockey junction structure using a pt electrode and an a-3i, and a beterojunction structure using a transparent electrode and an a-3i.

以下に図面を用いて本発明の実施例に係わるフォトカプ
ラを説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Photocouplers according to embodiments of the present invention will be described below with reference to the drawings.

第1図は本発明の一実施例になるフォトカプラ要部の側
断面図である。
FIG. 1 is a side sectional view of a main part of a photocoupler according to an embodiment of the present invention.

第1図において、1はガラス等にてなる基板、2はW仮
1の上面に被着形成され導光路となるSiO□層、3.
4は5IOzTr!J2の対向端それぞれから基板lの
上面の一部に跨がりITO(In、Ti、0)で形成さ
れた一対の透明電極、5.7はa−3iC層、6ばi 
a−3i層、8は八βにてなる電極層、9はp“a−3
i層、10は1a−5i層、11はn″a −3i層、
12は八βにてなる電極層、13はSiO□層2に光を
閉じ込めるための5iOX層である。そして、透明電極
3+a S+C層5. a −3i層5. a−3iC
層7.電極層8を積層した部分が発光素子14であり、
透明電極4、p”a −3i層9+ ia St層IQ
、n’ a −54層11゜電極層12を積層した部分
が光検出素子I5、SiO□層2に5iOB層13を積
層した部分が感光素子16を構成し、基板1に一体形成
された発光素子14と光検出素子15と導光素子I6と
がフオI・カプラ17を構成する。 従って、各構成素
子を一体にガラス基板上へ積層形成したフ第1・カプラ
17は、発光素子■4の対向電極である透明電極3とA
ρ電極層8との間に適当な電圧を印可して発生される光
が、外方に発散されることなく効果的に閉じ込められて
SiO□層2を伝播して光検出素子15に入力し、その
受光時の電流が透明電極4とΔβ電極層12とで検出さ
れることになる。
In FIG. 1, 1 is a substrate made of glass or the like, 2 is an SiO□ layer formed on the upper surface of the W temporary 1 and serves as a light guide path, and 3.
4 is 5IOzTr! A pair of transparent electrodes formed of ITO (In, Ti, 0) spanning from each opposing end of J2 to a part of the upper surface of the substrate l, 5.7 a-3iC layer, 6b
a-3i layer, 8 is an electrode layer consisting of 8β, 9 is p“a-3
i layer, 10 is 1a-5i layer, 11 is n″a-3i layer,
12 is an electrode layer made of 8β, and 13 is a 5iOX layer for confining light in the SiO□ layer 2. Then, transparent electrode 3+a S+C layer 5. a-3i layer 5. a-3iC
Layer 7. The part where the electrode layer 8 is laminated is the light emitting element 14,
Transparent electrode 4, p"a -3i layer 9+ ia St layer IQ
, n' a -54 layer 11° The part where the electrode layer 12 is laminated constitutes the photodetecting element I5, the part where the 5iOB layer 13 is laminated on the SiO□ layer 2 constitutes the photosensitive element 16, and the light emitting element integrally formed on the substrate 1. The element 14, the photodetector element 15, and the light guide element I6 constitute a photo I coupler 17. Therefore, the first coupler 17, in which each constituent element is integrally laminated on a glass substrate, is connected to the transparent electrode 3, which is the opposing electrode of the light emitting element 4, and the A
Light generated by applying an appropriate voltage between the ρ electrode layer 8 is effectively confined without being diffused outward, propagates through the SiO□ layer 2, and enters the photodetector element 15. , the current upon receiving the light is detected by the transparent electrode 4 and the Δβ electrode layer 12.

第2図はフォトカプラ17を作成する主要工程を工程順
に示した図である。
FIG. 2 is a diagram showing the main steps for producing the photocoupler 17 in the order of steps.

第2図(イ)〜(ニ)において、第2図(イ)はガラス
裁板1の上にプラズマCV I)法で被着した5ta2
膜を選択エツチングしSiO□層2をパターン形成させ
た状態を示す。そして次の工程を説明するだめの第2図
(ロ)は、前記SiO□層2を覆うように透明電極のI
Qを被着しそれを選択エツチングして、透明電極3.4
をパターン形成させたのち、透明電極3と透明電極4の
対向間に露呈する5iOz層2の表面を適当深さにエツ
チングしたものである。次いで第2図(ハ)に示ず如(
、前記SiO7層2のエツチング部分に反応ガスを用い
たグロー放電分解法等により5iOX層13を形成させ
る。しかるのぢ、第2図(ニ)に示す如く透明電極3の
上にa−3iC層5 + a S 1層5. a−3i
C層7の積層パターンを形成し、透明電極4の」二にp
″a −Si層9. i a −3i層10+ n’ 
a 54層11の積層パターンを形成してから、それら
を覆うように被着させた44層を選択エツチングして、
第1図の発光素子14と光検出素子15とλq光素子1
6とが完成される。
In Figures 2 (a) to (d), Figure 2 (a) shows 5ta2 deposited on the glass cutting plate 1 by the plasma CV I) method.
A state in which the SiO□ layer 2 is patterned by selectively etching the film is shown. FIG. 2 (b), which is used to explain the next step, shows the transparent electrode I
By depositing Q and selectively etching it, a transparent electrode 3.4 is formed.
After forming a pattern, the surface of the 5iOz layer 2 exposed between the opposing transparent electrodes 3 and 4 was etched to an appropriate depth. Next, as shown in Figure 2 (c) (
Then, a 5iOX layer 13 is formed on the etched portion of the SiO7 layer 2 by a glow discharge decomposition method using a reactive gas. However, as shown in FIG. 2(d), an a-3iC layer 5 + a S 1 layer 5. a-3i
A laminated pattern of the C layer 7 is formed, and the second p of the transparent electrode 4 is formed.
"a-Si layer 9. i a-3i layer 10+ n'
a After forming a laminated pattern of 54 layers 11, selectively etching the 44 layers deposited to cover them,
Light emitting element 14, photodetecting element 15, and λq optical element 1 in FIG.
6 is completed.

(g)発明の詳細 な説明した如く本発明によれば、非晶質シリコン、非晶
質シリコンの化合物とを選択的に積層してなる発光素子
と光検出素子及び導光素子とを同一、l!l(板上で一
体に接続形成してフナ1−カブラが措成さ句、でいる。
(g) As described in detail, according to the present invention, a light emitting element formed by selectively laminating amorphous silicon and a compound of amorphous silicon, a photodetecting element, and a light guiding element are the same; l! 1 (The crucian carp 1-cabra is formed by integrally connecting and forming on the board.)

そのため、MBE装置やMOCVD装置の如き高価な製
造プロセスを必要としないでIC化されたフォトカプラ
の製造が可能となり、フォトカプラの小型化と大FA’
AI産が実現されるようになった効果は極めて顕著であ
る。
Therefore, it is possible to manufacture IC photocouplers without the need for expensive manufacturing processes such as MBE equipment or MOCVD equipment, which allows for smaller photocouplers and larger FA's.
The effects of AI production being realized are extremely remarkable.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例になるフォトカプラ要部の側
断面図、第2図はフォトカプラ17を作成する主要工程
を工程順に示した図である。 図中において、1はガラス裁板、2ばW板1の」二面に
被着形成され導光路となるSiO□層、3,4はSiO
□層2の対向端それぞれから基板1の」二面の一部に跨
がり ITO(In、T+、0)で形成された一対の透
明電極、5.7はa−5iC層、6はi a−5i層、
81’、J:Al!にてなる電ン折層、9はp’a−S
i層、10はi a−Si層、11は0”a−5i層、
12は八ρにてなる電極層、I3は5i0z層2に光を
閉じ込めるための5in)、層、14ば発光素子、15
は光検知素子、16は導光素子をしめす。 第1図
FIG. 1 is a side cross-sectional view of the main parts of a photocoupler according to an embodiment of the present invention, and FIG. 2 is a diagram showing the main steps for producing the photocoupler 17 in order of process. In the figure, 1 is a glass cutting plate, 2 is a SiO□ layer formed on two sides of the W plate 1 and serves as a light guide path, and 3 and 4 are SiO
□ A pair of transparent electrodes formed of ITO (In, T+, 0) spanning from each opposing end of layer 2 to a part of the two sides of substrate 1, 5.7 is a-5iC layer, 6 is ia -5i layer,
81', J: Al! Electron folding layer consisting of, 9 is p'a-S
i layer, 10 is i a-Si layer, 11 is 0''a-5i layer,
12 is an electrode layer made of 8ρ, I3 is a 5in layer for confining light in the 5i0z layer 2, 14 is a light emitting element, 15
1 is a photodetecting element, and 16 is a light guiding element. Figure 1

Claims (2)

【特許請求の範囲】[Claims] (1)非晶質シリコン、非晶質シリコンの化合物とを選
択的に積層してなる発光素子と光検出素子及び導光素子
とを同一基板上に接続形成してなることを特徴とするフ
ォトカプラ。
(1) A photovoltaic device comprising a light-emitting element formed by selectively laminating amorphous silicon or a compound of amorphous silicon, a photodetector element, and a light guide element connected to each other on the same substrate. coupler.
(2)前記発光素子が非晶質シリコンの層を一対の非晶
質炭化シリコン層で挟んで構成され、前記光検出素子が
非晶質シリコンと非晶質シリコンとを接続構成し、それ
らの発光素子と光検出素子とが前記同一基板上に、酸化
シリコンにてなる前記導光素子で接続形成されてなるこ
とを特徴とする特許 ラ。
(2) The light emitting element is configured by sandwiching an amorphous silicon layer between a pair of amorphous silicon carbide layers, and the photodetecting element connects the amorphous silicon and the amorphous silicon. Patent La, characterized in that a light emitting element and a photodetecting element are connected and formed on the same substrate by the light guiding element made of silicon oxide.
JP59037823A 1984-02-29 1984-02-29 Photocoupler Pending JPS60182779A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59037823A JPS60182779A (en) 1984-02-29 1984-02-29 Photocoupler

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59037823A JPS60182779A (en) 1984-02-29 1984-02-29 Photocoupler

Publications (1)

Publication Number Publication Date
JPS60182779A true JPS60182779A (en) 1985-09-18

Family

ID=12508237

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59037823A Pending JPS60182779A (en) 1984-02-29 1984-02-29 Photocoupler

Country Status (1)

Country Link
JP (1) JPS60182779A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4847848A (en) * 1987-02-20 1989-07-11 Sanyo Electric Co., Ltd. Semiconductor laser device
US4871129A (en) * 1988-03-25 1989-10-03 Daiwa Seiko Inc. Speed change of fishing reel
US4884119A (en) * 1988-04-22 1989-11-28 American Telephone & Telegraph Company Integrated multiple quantum well photonic and electronic devices
US4912533A (en) * 1986-10-09 1990-03-27 Mitsubishi Denki Kabushiki Kaisha End face light emitting element
US5262656A (en) * 1991-06-07 1993-11-16 Thomson-Csf Optical semiconductor transceiver with chemically resistant layers
US5466948A (en) * 1994-10-11 1995-11-14 John M. Baker Monolithic silicon opto-coupler using enhanced silicon based LEDS

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4912533A (en) * 1986-10-09 1990-03-27 Mitsubishi Denki Kabushiki Kaisha End face light emitting element
US4847848A (en) * 1987-02-20 1989-07-11 Sanyo Electric Co., Ltd. Semiconductor laser device
US4871129A (en) * 1988-03-25 1989-10-03 Daiwa Seiko Inc. Speed change of fishing reel
US4884119A (en) * 1988-04-22 1989-11-28 American Telephone & Telegraph Company Integrated multiple quantum well photonic and electronic devices
US5262656A (en) * 1991-06-07 1993-11-16 Thomson-Csf Optical semiconductor transceiver with chemically resistant layers
US5466948A (en) * 1994-10-11 1995-11-14 John M. Baker Monolithic silicon opto-coupler using enhanced silicon based LEDS

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