JPS60187034A - Universal fixture - Google Patents

Abstract

PURPOSE:To simplify the operation of a fixture by inserting a probing pin being in contact only with a latticed printed conductor when latticed printed conductors and a plurality of pin boards with matrix-shaped holes positioned at the intersections of the printed conductors are superposed in a susceptor and the desired pin board is connected to the printed conductor. CONSTITUTION:A latticed printed conductor 20 is printed on a pin board 10, matrix-shaped holes 11 are each board to the intersections of these printed conductors, and a plurality of the boards 10 are superposed and laminated in a susceptor 30, an outer circumferential surface thereof has a connector 31 and a plurality of connecting pins 32. Pairs of contacts 44 on the outer circumferential surface opposite to contacting pins 41 at the tips of probing pins 40 are formed to the probing pins 40 inserted into the holes 11, and sections except these contacts are covered previously with insulating sleeves 42. Height is selected so as to be in contact only with either board of a plurality of the boards 10a-10h regarding the positions of the contacts 44 formed to the pins 40, and the pin 40 corresponding to a connection to the desired board is selected and inserted into the holes 11 of the board when the printed conductor is connected to the desired board.

Description

DETAILED DESCRIPTION OF THE INVENTION Technical Field The present invention relates to a universal fixture that automatically brings a conductor into contact with a terminal of a component to perform various measurements.

Conventional technology The in-circuit checker and 7
When connecting the board to be inspected and the tester in an action checker, in the method shown in Figure 1 (,), a jig in which multiple conductors l are arranged like a sword pin is created for each board to be inspected 2. . 3 is the part to be inspected.

However, with this method, when the number of types of substrates 2 to be inspected increases, it is necessary to create a jig each time, and the manufacturing period is
Cost is an issue, and a lot of storage space is required.

Therefore, as shown in Fig. 1(b), pins 4 are set up for the least common multiple required for several types of boards, and pins that are not needed for each model are masked with a mask plate 5 so that they do not come into contact with the board. Figure 1 (c)
), hold the pin 4 on the grid in advance, place it in the required pin position for each model, and drive the inter 7 ace pin 8 into the connection part with the turbine 7 and the necessary tester. Board 1] A method of switching pins and wiring is known.

However, even with these methods, it is necessary to create a mask plate and an individual riser board depending on the board to be inspected, and these methods are not satisfactory.

Furthermore, in the mask plate method shown in FIG. 1(b), unused probe pins are masked with a mask plate;
Unnecessary force is applied to the probe pin, shortening the probe pin's spring life. In addition, with this method, if a probe pin that picks up a small DC signal in one model picks up a large AC signal in the next model, the connection between the checker circuit and the probe pin can be switched. is necessary. The wired system shown in FIG. 1(c) has improved this point, but because of the +77 turbine and wrapping wiring, it still has the disadvantage that the storage space is larger, although it is less than that in FIG. 1(a).

It is an object of the present invention to provide a universal fixture that is easy to operate and saves storage space, etc., while eliminating the above-mentioned drawbacks.

In FIG. 2, the pin board 10 has holes 11 formed in a matrix, and as shown in FIG. They are insulated and stacked so that the holes 11 match.

As shown in FIG. 5, each pin board 10 is provided with a grid-shaped printed conductor 20, and the inner peripheral surface 21 of the hole 11 is also covered with this printed conductor.

The printed conductors 20 of the pinboards 10a to 10h are attached to each connection bin 32a, 32 of the connector 31 provided on the support stand 30.
b, . . . are independently connected to each other.

On the other hand, the probe pin 40 has a contact pin 41 made of a conductor and a covering sleeve 42 made of an insulator, as shown in FIG.
A pair of contacts 44 are protruded from the outer peripheral surface of the covering sleeve 42 at positions symmetrical with respect to the center of force.

The position of the contact 44 varies depending on the probe pin, and the contact 44 of the probe pin 40a is located on the top pin board 10a.
The contact point 44 of 40b is in contact with the inner circumferential surface of the hole 11 of the second pin board 10b from the top, and the contact point 44 of 40h is the position of the contact point 44 of the bottom pin board 10.
It is provided at a position that contacts the inner circumferential surface of the hole 11 of b.

Contact point 44 and contact bottle 41 are electrically connected.

As described above, when multiple types of probe pins 40 with different contact positions are selected and, for example, the probe pin 40a is inserted into the hole 11 of the pin board 10 until the bottom of the bottle reaches the base 50, the top pin board 10a and contact point 44
come into contact with. In this way, depending on which type of probe pin is inserted into the hole of the pin board 10, the contact 4
It is possible to select the pinboards 10a to 1011 with which the contact bin 41 contacts, and as a result, the pinboard connected to the contact bin 41 can be changed depending on the type of probe pin.

Therefore, when the board to be tested is brought into contact with the contact bin 41 using the pin board into which various probe pins are inserted as described above, the element R as shown in FIG.
1 can be connected to the pin board 10a via the contact 44 of the probe pin 40a.

Element R2 can also be connected to pin board 10c.

In addition, connect the probe pin with the desired contact point to pin board 1.
In order to automatically insert the probe pins into the pins 0, for example, a robot '60 for pin transplantation is used, and the robot 60 selectively takes out the desired probe pins from the conveyor 61 on which the probe pins 40a to 4011 are individually mounted. Hey, pinboard 1
It is sufficient to select hole 11 of No. 0 and implant the probe pin taken out there.

Note that a contact 45 may be provided at the lower end of each probe pin and brought into contact with a contact 51 provided on the base 50 to connect this to a general-purpose sensor/driver circuit.

FIG. 6 shows an example of a checker system using the universal fixture of the present invention. Main processor 1
01 controls each part according to the check procedures etc. stored in the program memory 102 in rough format.
Check the board to be inspected. The general-purpose sensor/driver 103 shown in the figure is, for example, a circuit that handles signals at the GoTL level (5V amplitude), and whether it operates as a sensor or a driver can be switched by a program. The dedicated sensor/driver 103 is a circuit that handles signals other than TTL level, the resistance ladder 104 is a variable resistor for simulating a thermistor, etc., and the AC0N10FF circuit 105 is a circuit that supplies AC power to the board to be tested.

Most of the checkpoints on general boards are only at the TTL level, and others are often just a few points.

Signals at several points that cannot be handled by this general-purpose sensor/dry six-circuit are connected to a dedicated circuit by selecting probe pins and planting them. Note that 106 is a connector to which the pin board 10 is connected. Note that 107 is a circuit that handles TTL level signals.

In the present invention, if two sets of pinboards 10 are prepared, there is no need to create a new dedicated pinboard no matter how many types are generated, and the pins can be completed by planting the pins in the necessary places for that model. Also, when changing models, while one model is flowing through the inspection line, you can plant the necessary fins for the next model on the other pin board and set it as a pin board according to the type. This can be done instantly by replacing the pinboard when changing models.

Car 1 As detailed above, the present invention stacks a plurality of pin boards in an insulating relationship and selectively uses probe bins having contacts at different positions corresponding to the holes of each pin board. Since the connection relationship between the contact pins of the probe bin and the pin board can be selected, it is possible to provide a universal fixture that can be easily adapted to any desired test board.

[Brief explanation of the drawing]

Fig. 1 (a) to (c) are side sectional views showing an example of a conventional universal fixture, Fig. 2 is a perspective view showing an embodiment of the present invention, and Fig. 3 is a pin board in Fig. 2. Fig. 4 is a perspective view showing probe bins with different contact positions, Fig. 5 is a perspective view showing a part of the pin board, Fig. 6 is a cross-sectional view showing the relationship between the probe bin and the device shown in Fig. 1 is a block diagram of a test device used as a test device. DESCRIPTION OF SYMBOLS 10... Pin board, 11... Hole, 20... Printed conductor, 40... Probe bottle, 41... Contact pin, 42... Sleeve, 44... Contact. Patent Applicant: Sharp Corporation Attorney: Two Patent Attorneys: Sogai Aoyama Figure 1 (b) 1st TI! J(c)

Claims (1)

[Claims] (1) In a universal fixture, the probe pins necessary to check a given model are planted in holes drilled on a grid or in predetermined arbitrary positions, and contacts are placed at different positions. A universal fixture characterized by changing the connection relationship by planting the probe pins on a pin board with multiple layers.