JPS60200960A - Formation of sputtered alloy film for diffusion joining - Google Patents

Formation of sputtered alloy film for diffusion joining

Info

Publication number
JPS60200960A
JPS60200960A JP5608684A JP5608684A JPS60200960A JP S60200960 A JPS60200960 A JP S60200960A JP 5608684 A JP5608684 A JP 5608684A JP 5608684 A JP5608684 A JP 5608684A JP S60200960 A JPS60200960 A JP S60200960A
Authority
JP
Japan
Prior art keywords
bonding
alloy
joined
diffusion
materials
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5608684A
Other languages
Japanese (ja)
Inventor
Mitsuo Kato
光雄 加藤
Takao Funamoto
舟本 孝雄
Hiroshi Wachi
和知 弘
Kazuya Takahashi
和弥 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP5608684A priority Critical patent/JPS60200960A/en
Publication of JPS60200960A publication Critical patent/JPS60200960A/en
Pending legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/001Interlayers, transition pieces for metallurgical bonding of workpieces
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は、各種材料の拡散接合のインサート方法に係り
、特に耐熱合金の拡散接合に好適なインサート方法とし
てスパッタ蒸着法によってスパッタ膜を形成する方法に
関する。
[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to an insert method for diffusion bonding of various materials, and in particular, a method of forming a sputtered film by sputter vapor deposition as an insert method suitable for diffusion bonding of heat-resistant alloys. Regarding.

〔発明の背景〕[Background of the invention]

拡散接合法は、同相拡散接合法と液相拡散接合法の2種
類に分類される。固相拡散接合法は、接合時に比較的高
い圧力を加え、接合面間の密着を計り接合を行うが、接
合面の表面状態(表面凹凸。
Diffusion bonding methods are classified into two types: in-phase diffusion bonding method and liquid phase diffusion bonding method. In the solid-phase diffusion bonding method, relatively high pressure is applied during bonding to ensure close contact between the bonding surfaces.

酸化)により、接合性(接合不良)が左右される。oxidation) affects bonding performance (bonding defects).

このため、接合面間の密着を向上させ、健全な拡散接合
部を得るために、接合面間にインサート材を介して接合
を行なう方法がしばしば用いられる。
Therefore, in order to improve the adhesion between the bonding surfaces and obtain a healthy diffusion bond, a method is often used in which the bonding surfaces are bonded via an insert material.

しかし、接合面間にインサー1〜材を介在させるため均
質な拡散接合部を得るには、長時間の接合が必要になる
However, since the insert 1 to the material are interposed between the bonding surfaces, a long bonding time is required to obtain a homogeneous diffusion bonded portion.

液相拡散接合法は、接合部材に接合面間にインサー1〜
材を介在させ、接合温度に加熱するとインサート材が溶
融し、液相となって接合面間を満たす。その後、この状
態で液相と接合部材間の相互拡散が行われ、接合部材の
組成に近づくことにより等温凝固が起り、同相となり、
さらに拡散が進行し接合部材の組成と同一になるという
接合法である。(米国特許第363219号、米国特許
3678570号)しかしこの方法では、インザート方
法として、箔や粉末を使用するため接合面からズレや欠
損を起こし、接合不良欠陥が生じやすくなったり、接合
部に酸化物が存在しやすい。またインサート作業工程も
時間がかかり、作業性も悪い。インザート材に接合部材
を含む多元合金を使用する場合、その多元合金は脆弱で
あるため使用に制限ある。
In the liquid phase diffusion bonding method, inserts 1 to 1 are placed between the bonding surfaces of the bonding members.
When the insert material is interposed and heated to the bonding temperature, the insert material melts and becomes a liquid phase that fills the space between the bonding surfaces. Thereafter, mutual diffusion between the liquid phase and the joining member occurs in this state, and as the composition approaches that of the joining member, isothermal solidification occurs and the phase becomes the same.
This is a bonding method in which diffusion progresses further and the composition becomes the same as that of the bonding member. (U.S. Pat. No. 363,219, U.S. Pat. No. 3,678,570) However, since this method uses foil or powder as an insert method, it may cause misalignment or damage from the bonding surface, making it easy to cause bonding defects or oxidation at the bonding area. Things tend to exist. Furthermore, the insert work process is time consuming and has poor workability. When a multi-component alloy including a joining member is used as an insert material, the multi-component alloy is brittle and therefore has limited use.

さらにインサー1−月を接合面間に介在させるため均質
な拡散接合部を得るには、長時間の接合が必要となる。
Furthermore, since the inserter is interposed between the bonding surfaces, a long bonding time is required to obtain a homogeneous diffusion bond.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、接合面に被接合材の組成を含む拡散接
合用インサート膜を均一に形成できることを可能にし、
かつまた接合作業を簡便にし、接合不良欠陥を防止し高
品質の拡散接合部が得・られる拡散接合用合金スパッタ
膜形成法を提供することにある。
An object of the present invention is to make it possible to uniformly form a diffusion bonding insert film containing the composition of the materials to be bonded on the bonding surface,
Another object of the present invention is to provide a method for forming an alloy sputtered film for diffusion bonding, which simplifies the bonding work, prevents defective bonding, and provides a high-quality diffusion bonded portion.

〔発明の概要〕[Summary of the invention]

本発明は、被接合材の接合面に拡散接合用合金スパッタ
膜をスパッタ蒸着法によって形成するに際し、スパッタ
蒸着装置のターゲット構造を接合ノ 用合金部材と前記被接合材の組成と同一の部材からなる
複合ターゲラ1へ構造にし、被接合材の接合面に接合用
合金スパッタ膜を形成するようにしたものである。
In the present invention, when forming an alloy sputtered film for diffusion bonding on the bonding surface of materials to be bonded by sputter deposition, the target structure of a sputter deposition apparatus is made of an alloy member for bonding and a member having the same composition as the materials to be bonded. This composite targeter 1 has a structure in which a bonding alloy sputtered film is formed on the bonding surfaces of the materials to be bonded.

〔発明の実施例〕[Embodiments of the invention]

次に本発明の拡散接合用合金スパッタ膜の形成法を第1
図及び第2図を基に説明する。
Next, the method for forming the alloy sputtered film for diffusion bonding of the present invention will be explained in the first step.
This will be explained based on the figure and FIG.

第1図はマグネトロン型スパッタ装置の概略を、第2図
は複合ターゲット構造を示す。チャンバ6内の希薄Ar
i囲気中において、第2図に示すようにバッキングプレ
ー1へ7上に接合用合金部材8と被接今月5から構成さ
れた複合ターゲットをターゲラ1−1とし、磁石N、S
によって形成された磁場2内に閉じこめられた電子によ
り、複合ターゲットの惜成物質3をたたき出して被接合
材5の接合面に付着させ、合金スパッタ膜4を形成する
FIG. 1 shows an outline of a magnetron type sputtering apparatus, and FIG. 2 shows a composite target structure. Dilute Ar in chamber 6
In an atmosphere, as shown in Fig. 2, a composite target consisting of a bonding alloy member 8 and a welding member 5 is placed on a backing plate 1 and a target plate 1-1, and magnets N and S are attached.
By the electrons trapped in the magnetic field 2 formed by the above, the material 3 of the composite target is knocked out and attached to the bonding surface of the material to be bonded 5, thereby forming an alloy sputtered film 4.

次にスパッタ蒸着によって接合面に合金スパッタ膜4を
形成した被接合材5は、第3図に示すように拡散接合す
る。すなわち、被接合材5の接合面に形成された合金ス
パッタ膜4同士を加圧し密着させ、所定の温度に加熱保
持して接合を行い、均質な接合部が得られる。
Next, the materials 5 to be joined, on which the alloy sputtered film 4 has been formed on the joining surfaces by sputter vapor deposition, are diffusion-bonded as shown in FIG. That is, the sputtered alloy films 4 formed on the joint surfaces of the materials 5 to be joined are pressed and brought into close contact with each other, heated and maintained at a predetermined temperature, and joined, thereby obtaining a homogeneous joint.

被接合材5としては、金属、合金並びに無機材料、特に
耐熱合金が好適である。耐熱合金としては、Ni基、C
o基、Fe基耐熱合金がよい。接合用合金部材8は、被
接合材との相性が良く、被接合材内への拡散速度が早い
ものが望ましい。したがって接合用合金部材8としては
、金属、合金、あるいはその他無機材料で構成すること
ができる。
As the material to be joined 5, metals, alloys, and inorganic materials, particularly heat-resistant alloys, are suitable. Heat-resistant alloys include Ni-based, C
O-based and Fe-based heat-resistant alloys are preferable. The joining alloy member 8 is desirably one that has good compatibility with the materials to be joined and has a fast diffusion rate into the materials to be joined. Therefore, the joining alloy member 8 can be made of metal, alloy, or other inorganic material.

さらに接合用合金部材8は、被接合材5の固相線温度よ
りも低い融点をもつ金属、合金あるいは無機材料である
ことが望ましい。
Further, the joining alloy member 8 is preferably a metal, an alloy, or an inorganic material having a melting point lower than the solidus temperature of the materials 5 to be joined.

被接合材がNi基耐熱合金の場合、複合ターゲラ1へを
構成する接合用合金部材にNi基耐熱合金であるNiと
共晶を形成して低融点化が計ることのできるBを含むN
i合金が望ましい。さらにスパッタ蒸着により接合面に
スパッタ膜を形成する前に、接合面をArイオンビーム
により清浄処理すると密着性のよいスパッタ膜が形成で
きる。
When the material to be joined is a Ni-based heat-resistant alloy, the joining alloy member constituting the composite targeter 1 contains N containing B, which can lower the melting point by forming a eutectic with Ni, which is a Ni-based heat-resistant alloy.
i-alloy is preferred. Furthermore, before forming a sputtered film on the bonded surface by sputter vapor deposition, if the bonded surface is cleaned with an Ar ion beam, a sputtered film with good adhesion can be formed.

以下、本発明の実施例について説明する。Examples of the present invention will be described below.

表1は被接合材の化学組成を示す。被接合材は析出強化
型Ni基耐熱合金である。第1図及び第2図に示すよう
に複合構造のターゲラl−を用いマグネトロンスパッタ
装置により、被接合材の接合面に拡散接合用の合金スパ
ッタ膜を形成させた。
Table 1 shows the chemical composition of the materials to be joined. The material to be joined is a precipitation-strengthened Ni-based heat-resistant alloy. As shown in FIGS. 1 and 2, an alloy sputtered film for diffusion bonding was formed on the bonding surfaces of the materials to be bonded using a magnetron sputtering device using a composite structure targeter l-.

表2は複合ターゲラ1−の構成を示す。ターゲラ1への
構造は、第2図に示すように接合用合金材と被接合材の
組成と同一の部材からなる複合構造であり、ターゲラ1
−(寸法: 150m1l+X ]、 20+++n+
X4t)の全面積に占める接合用合金材の面積率を75
%とし、被接今月の組成と同一の部材の面積率を25%
とした。接合用合金材の組成は、Ni基耐熱合金の主成
分であるNiと共晶を起こし、低融点化が計られるBを
462%含むNi合金である。
Table 2 shows the composition of composite targetera 1-. As shown in Fig. 2, the structure attached to Targera 1 is a composite structure consisting of members having the same composition as the joining alloy material and the material to be joined.
-(Dimensions: 150ml+X], 20+++n+
The area ratio of the joining alloy material to the total area of
%, and the area ratio of members with the same composition as this month's composition is 25%.
And so. The composition of the bonding alloy material is a Ni alloy containing 462% B, which forms a eutectic with Ni, which is the main component of the Ni-based heat-resistant alloy, and lowers the melting point.

次に複合ターゲットを用い、マグネ1−ロンスパッタ処
理を行った。表3はスパッタ処理条件を示す。マグネ1
〜ロンスパツタ処理は、被接合材(寸法:直径50■φ
X長さ30暗)を用意し、被接合材の接合面をエメリー
紙(#1000.)で研磨し、この接合面に出カニ2.
2KW、雰囲気: 3 X10−’TorrのAr、タ
ーゲラ1〜距離70冊、スパッタ速度: 3.5 X 
10−Iμm/minの条件で15m1n行ない、合金
スパッタ膜を形成した。
Next, Magne 1-ron sputtering was performed using a composite target. Table 3 shows the sputtering conditions. Magne 1
~ Ron spatsuta processing is performed on the material to be joined (dimensions: diameter 50■φ
2. Polish the joint surfaces of the materials to be joined with emery paper (#1000.) and place a crab on this joint surface.
2KW, Atmosphere: 3X10-'Torr Ar, Targera 1 to 70 volumes, Sputtering speed: 3.5X
An alloy sputtered film was formed by performing 15 m1n under the condition of 10-I μm/min.

表4は合金スパッタ膜の特性を示す。被接合材の接合面
に形成された合金スパッタ膜の厚さは、約5μmであり
、接合面に均一に形成されている。
Table 4 shows the characteristics of the alloy sputtered film. The thickness of the sputtered alloy film formed on the joint surface of the materials to be joined is approximately 5 μm, and is uniformly formed on the joint surface.

また合金スパッタ膜の融点は約1120℃であり、被接
合材の同相線温度(約1250°C)より約130℃低
下している。合金スパッタ膜の被接合材へのぬれ性が良
好なことから、合金スパッタ膜は、拡散接合用のスパッ
タ膜として有効である。
Further, the melting point of the sputtered alloy film is approximately 1120°C, which is approximately 130°C lower than the common phase temperature (approximately 1250°C) of the materials to be joined. Since the sputtered alloy film has good wettability to the materials to be joined, the sputtered alloy film is effective as a sputtered film for diffusion bonding.

次に接合面に合金スパッタ膜が形成されたNi基耐熱合
金同志を第3図に示すように合金スパッタ膜が互に接す
るようにして第5表に示す条件で拡散接合処理した。N
i基耐熱合金の拡散接合部には、接合不良やボイド欠陥
の発生もなく、約3hの接合時間によって均質な接合部
が得られ、従来法(riや粉末インサート法)に比較し
、約115時間である。
Next, the Ni-based heat-resistant alloys having sputtered alloy films formed on their bonding surfaces were diffusion bonded under the conditions shown in Table 5 so that the sputtered alloy films were in contact with each other as shown in FIG. N
In the diffusion bonding of i-base heat-resistant alloys, there are no bonding defects or void defects, and a homogeneous bonding time of approximately 3 hours is obtained, and compared to conventional methods (RI and powder insert methods), the bonding time is approximately 115%. It's time.

第4図は拡散接合部の機械的性質を示す。拡散接合部の
機械的性質(引張強さ、02%耐力、伸び)は、被接合
材と同程度である。
Figure 4 shows the mechanical properties of the diffusion bond. The mechanical properties (tensile strength, 02% yield strength, elongation) of the diffusion bonded portion are comparable to those of the materials to be bonded.

表 1 表 2 表3 表4 表 5 以上のように本発明によれば、インサー1〜箔又は粉末
を被接合材の接合面に介在させる従来法のようにインサ
ート箔又は粉末のズレや欠損が生じることなく、かつま
た接合作業の際のインサート箔又は粉末を酸化させるこ
となく、作業が簡便で高品質の接合部が得られる。また
被接合材の接合すべき面に多元合金系のスパッタ膜を寸
法精度よく、かつ均一に形成できる。さらに本発明によ
って得られる接合用のスパッタ膜は、被接合材の組成を
含むので短時間の接合を可能にし、良好な拡散接合部を
得ることができる。
Table 1 Table 2 Table 3 Table 4 Table 5 As described above, according to the present invention, unlike the conventional method in which the insert 1 to foil or powder is interposed on the joining surfaces of the materials to be joined, there is no misalignment or loss of the insert foil or powder. The process is simple and high-quality joints can be obtained without causing any oxidation or oxidation of the insert foil or powder during the joining process. Further, a multi-component alloy sputtered film can be formed uniformly and with high dimensional accuracy on the surfaces of the materials to be joined. Further, since the sputtered film for bonding obtained by the present invention includes the composition of the materials to be bonded, bonding can be performed in a short time, and a good diffusion bonded portion can be obtained.

【図面の簡単な説明】 第1図はマグネl−ロンスパッタ装置を示す概略図、第
2図は複合ターゲラ1〜溝造を示す概略図、第3図は拡
散接合態様を示す図、第4図は拡散接合部及び被接合材
の機械的性質を示す図である。 1・・・ターゲット、2・・磁場、3・・・ターゲラ1
〜構成物質、4・・・合金スパッタ膜、5−被接合材、
6・・・チャンバ、7・・・バッキングプレー1〜.8
・・・接合用第1図 第2図 l 第3図 第4に 〈被接@材〉 〈払散捧合部〉 115θ’Cx3h
[Brief Description of the Drawings] Fig. 1 is a schematic diagram showing a magnetron sputtering device, Fig. 2 is a schematic diagram showing a composite targeter 1 to groove structure, Fig. 3 is a diagram showing a diffusion bonding mode, The figure is a diagram showing the mechanical properties of the diffusion bonded portion and the materials to be bonded. 1...Target, 2...Magnetic field, 3...Targera 1
~ Constituent material, 4... Alloy sputtered film, 5- Material to be joined,
6...Chamber, 7...Backing play 1~. 8
・・・For joining Fig. 1 Fig. 2 l Fig. 3 Fig. 4〈To be joined @ Material〉〈Dispersion joint portion〉 115θ'Cx3h

Claims (1)

【特許請求の範囲】 1、被接合材の接合面にスパッタ蒸着法によって拡散接
合用の合金スパッタ膜を形成する方法において、スパッ
タ蒸着装置のターゲットを前記被接合材の組成と同一の
部材と接合用器金部材からなる複合構造にし、前記被接
合材の接合面に合金スパッタ膜を形成することを特徴と
する拡散接合用の合金スパッタ膜形成法。 2、特許請求の範囲第1項において、前記拡散接合用の
合金スパッタ膜が前記被接合材の融点より低い合金スパ
ッタ膜であることを特徴とする拡散接合用スパッタ膜形
成法。
[Claims] 1. In a method of forming an alloy sputtered film for diffusion bonding on the joining surface of materials to be joined by sputter deposition, a target of a sputter deposition apparatus is joined to a member having the same composition as the material to be joined. 1. A method for forming an alloy sputtered film for diffusion bonding, characterized in that a composite structure is formed of metal members, and an alloy sputtered film is formed on the bonding surfaces of the materials to be bonded. 2. The method for forming a sputtered film for diffusion bonding according to claim 1, wherein the sputtered alloy film for diffusion bonding is an alloy sputtered film having a melting point lower than the melting point of the material to be bonded.
JP5608684A 1984-03-26 1984-03-26 Formation of sputtered alloy film for diffusion joining Pending JPS60200960A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5608684A JPS60200960A (en) 1984-03-26 1984-03-26 Formation of sputtered alloy film for diffusion joining

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5608684A JPS60200960A (en) 1984-03-26 1984-03-26 Formation of sputtered alloy film for diffusion joining

Publications (1)

Publication Number Publication Date
JPS60200960A true JPS60200960A (en) 1985-10-11

Family

ID=13017277

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5608684A Pending JPS60200960A (en) 1984-03-26 1984-03-26 Formation of sputtered alloy film for diffusion joining

Country Status (1)

Country Link
JP (1) JPS60200960A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7963435B2 (en) 2008-01-23 2011-06-21 Seiko Epson Corporation Method of forming bonded body and bonded body
US7967185B2 (en) 2008-01-23 2011-06-28 Seiko Epson Corporation Method of forming bonded body and bonded body
US7980448B2 (en) 2008-01-23 2011-07-19 Seiko Epson Corporation Method of forming bonded body and bonded body

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7963435B2 (en) 2008-01-23 2011-06-21 Seiko Epson Corporation Method of forming bonded body and bonded body
US7967185B2 (en) 2008-01-23 2011-06-28 Seiko Epson Corporation Method of forming bonded body and bonded body
US7980448B2 (en) 2008-01-23 2011-07-19 Seiko Epson Corporation Method of forming bonded body and bonded body

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