JPS60209142A - 大きな面の特徴づけに特に適する建築物現状態の解析のための方法 - Google Patents

大きな面の特徴づけに特に適する建築物現状態の解析のための方法

Info

Publication number
JPS60209142A
JPS60209142A JP59281899A JP28189984A JPS60209142A JP S60209142 A JPS60209142 A JP S60209142A JP 59281899 A JP59281899 A JP 59281899A JP 28189984 A JP28189984 A JP 28189984A JP S60209142 A JPS60209142 A JP S60209142A
Authority
JP
Japan
Prior art keywords
building
photographing
optical
areas
characterizing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59281899A
Other languages
English (en)
Japanese (ja)
Inventor
ニコラウス　レグートケ
マンフレツト　シヨルツ
ハルトムート　バウムバツハ
ロルフ　ヘルゲルト
ヴエルナー　シユポルベルト
クレーマー ヨアヒム
ゼツブ　シユヴアーベ
ペーテル　ルドルフ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BEBU KOMUBINAATO FUYUA BAUREPARATOUUREN UNTO REKONSUTORUKUCHION RAIPUCHITSUHI
FUYUA BAUREPARATOUUREN UNTO RE
Original Assignee
BEBU KOMUBINAATO FUYUA BAUREPARATOUUREN UNTO REKONSUTORUKUCHION RAIPUCHITSUHI
FUYUA BAUREPARATOUUREN UNTO RE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BEBU KOMUBINAATO FUYUA BAUREPARATOUUREN UNTO REKONSUTORUKUCHION RAIPUCHITSUHI, FUYUA BAUREPARATOUUREN UNTO RE filed Critical BEBU KOMUBINAATO FUYUA BAUREPARATOUUREN UNTO REKONSUTORUKUCHION RAIPUCHITSUHI
Publication of JPS60209142A publication Critical patent/JPS60209142A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B37/00—Panoramic or wide-screen photography; Photographing extended surfaces, e.g. for surveying; Photographing internal surfaces, e.g. of pipe

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Working Measures On Existing Buildindgs (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
JP59281899A 1984-01-02 1984-12-26 大きな面の特徴づけに特に適する建築物現状態の解析のための方法 Pending JPS60209142A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DD84259086A DD232117B1 (de) 1984-01-02 1984-01-02 Verfahren zur bauzustandsanalyse
DD04B/259086-5 1984-01-02

Publications (1)

Publication Number Publication Date
JPS60209142A true JPS60209142A (ja) 1985-10-21

Family

ID=5553903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59281899A Pending JPS60209142A (ja) 1984-01-02 1984-12-26 大きな面の特徴づけに特に適する建築物現状態の解析のための方法

Country Status (11)

Country Link
JP (1) JPS60209142A (de)
BE (1) BE901320A (de)
DD (1) DD232117B1 (de)
DE (1) DE3440611A1 (de)
FR (1) FR2557693B1 (de)
GB (1) GB2158267B (de)
GR (1) GR82489B (de)
HU (1) HUT38405A (de)
IT (1) IT1178342B (de)
LU (1) LU85720A1 (de)
NL (1) NL8403681A (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4119180A1 (de) * 1991-06-11 1992-12-17 Merkel Peter Dr Verfahren und vorrichtung zur vermessung und dokumentation der geometrie, struktur- und materialbeschaffenheit von dreidimensionalen objekten, wie fassaden und raeume sowie deren waende, einrichtungen und installationen
DE19816706A1 (de) * 1998-04-15 1999-10-21 Juergen Hofele Verfahren und Vorrichtung zur Ermittlung der Maße eines Gebäudes oder eines Gebäudeteils
FR2807603B1 (fr) * 2000-04-05 2002-10-11 Freyssinet Int Stup Procede et systeme pour effectuer des releves de caracteristiques visibles sur des parois
CN115184372B (zh) * 2022-07-13 2023-04-18 水利部交通运输部国家能源局南京水利科学研究院 混凝土结构难达部位微裂纹荧光渗透智能探测装置与方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5179382A (ja) * 1974-12-31 1976-07-10 Shimadzu Corp Satsuzozukeikaisekisochi
JPS5191784A (de) * 1974-07-17 1976-08-11

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3700438A (en) * 1971-01-12 1972-10-24 Spectral Data Corp Mulitspectral photography
US3822098A (en) * 1973-05-02 1974-07-02 Mc Donnell Douglas Corp Multispectral sensor means measuring depolarized radiation

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5191784A (de) * 1974-07-17 1976-08-11
JPS5179382A (ja) * 1974-12-31 1976-07-10 Shimadzu Corp Satsuzozukeikaisekisochi

Also Published As

Publication number Publication date
NL8403681A (nl) 1985-08-01
IT8449375A0 (it) 1984-12-28
DD232117A1 (de) 1986-01-15
FR2557693A1 (fr) 1985-07-05
FR2557693B1 (fr) 1990-03-23
HUT38405A (en) 1986-05-28
LU85720A1 (de) 1985-07-24
BE901320A (nl) 1985-04-16
GR82489B (en) 1985-05-07
GB2158267B (en) 1988-04-13
GB8432634D0 (en) 1985-02-06
GB2158267A (en) 1985-11-06
DD232117B1 (de) 1988-10-05
DE3440611A1 (de) 1985-07-11
IT1178342B (it) 1987-09-09

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