JPS6021329B2 - thermography equipment - Google Patents
thermography equipmentInfo
- Publication number
- JPS6021329B2 JPS6021329B2 JP52056168A JP5616877A JPS6021329B2 JP S6021329 B2 JPS6021329 B2 JP S6021329B2 JP 52056168 A JP52056168 A JP 52056168A JP 5616877 A JP5616877 A JP 5616877A JP S6021329 B2 JPS6021329 B2 JP S6021329B2
- Authority
- JP
- Japan
- Prior art keywords
- subject
- signal
- emissivity
- contact
- infrared
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J5/064—Ambient temperature sensor; Housing temperature sensor; Constructional details thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/70—Passive compensation of pyrometer measurements, e.g. using ambient temperature sensing or sensing of temperature within housing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
- G01J5/802—Calibration by correcting for emissivity
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
Description
【発明の詳細な説明】
本発明は被写体の放射率が1でないことに基づく誤隻葦
及び被写体の周囲環境より放射され被写体上で反射する
反射赤外線が赤外線検出器に混入することに基づく誤差
の補正を自動的に行うことのできるサーモグラフィー装
置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention eliminates errors caused by the fact that the emissivity of the subject is not 1, and errors caused by reflected infrared rays emitted from the surrounding environment of the subject and reflected on the subject, which enter the infrared detector. The present invention relates to a thermography device that can automatically perform correction.
一般に、温度Tを有する被写体から放射される赤外線の
強度Wは次式で表わされる。Generally, the intensity W of infrared rays emitted from a subject having a temperature T is expressed by the following equation.
但し〇は比例定数、zは被写体の放射率である。VV=
ごOTソ ………【11該
被写体からの赤外線を赤外線検出器にて検出する場合、
検出器に入射する赤外線は被写体から放射される赤外線
のほかに被写体表面上で反射する温度Ta(通常は室温
)の周囲の赤外線放射面からの赤外線(下記■式の第2
項で与えられる)が入射することになり、赤外線検出器
に入射する赤外線の強度Wは次際には次式のようになる
。However, 〇 is a proportionality constant, and z is the emissivity of the subject. VV=
[11] When detecting infrared rays from the subject with an infrared detector,
The infrared rays incident on the detector include infrared rays emitted from the subject as well as infrared rays from the infrared ray emitting surface around the temperature Ta (usually room temperature) reflected on the subject surface (the second in the following equation
) is incident on the infrared detector, and the intensity W of the infrared rays incident on the infrared detector is given by the following equation.
W=ご。r+(1−ご)。Ta4 .....・【
2}従って、赤外線検出器によって得られる上記強度W
に対応した信号は被写体の真温度Tのみに関係した強度
成分OT4に対応していないため、Wに対応した信号に
補正を加えて下記{3’式で与えられるような。でに対
応した信号を得、この信号を陰極線管面上に展開して、
被写体の真温度を表わす像を得ている。。W = Go. r+(1-go). Ta4. .. .. .. ..・【
2} Therefore, the above intensity W obtained by the infrared detector
Since the signal corresponding to W does not correspond to the intensity component OT4 that is related only to the true temperature T of the subject, the signal corresponding to W is corrected and given by the following equation {3'. Obtain the corresponding signal, spread this signal on the cathode ray tube surface,
An image representing the true temperature of the subject is obtained. .
r=W−OTa4十。T34 ..・…
t3}即ちこの式から明らかな様に被写体の真温温度に
対応した信号を得るために、放射率が1でないことに基
づく誤差の補正と反射赤外線の混入に基づく誤差の補正
とが必要となる。従来装置では可変抵抗等をつまみで調
整することにより補正を行う放射率補正機構及び室温反
射補正機構を設け、あらかじめ接触型温度計を用いて被
写体表面の側温を行って放射率を測定した後、これらの
つまみを手動により調節している。そのため観測するご
とに前述の二つの補正用つまみを操作しなければならず
、取扱いが面題であり、又事前に被写体の放射率の測定
を行なわなければならないので、手間がかかっていた。
本発明は斯様な不都合を解決するために、前述した放射
率及び反射赤外線に関連した補正を自動的に行うことの
できるサーモグラフィー装直を提供するもので、以下そ
の原理を詳説する。r=W-OTa40. T34. ..・…
t3} That is, as is clear from this equation, in order to obtain a signal corresponding to the true temperature of the subject, it is necessary to correct the error based on the fact that the emissivity is not 1, and the error due to the inclusion of reflected infrared rays. . Conventional equipment has an emissivity correction mechanism and a room temperature reflection correction mechanism that perform corrections by adjusting variable resistors etc. with knobs, and after measuring the emissivity by measuring the side temperature of the subject surface using a contact thermometer in advance , these knobs are adjusted manually. Therefore, each time an observation is made, it is necessary to operate the two correction knobs mentioned above, which is difficult to handle, and the emissivity of the subject must be measured in advance, which is time-consuming.
In order to solve these problems, the present invention provides a thermography system that can automatically perform corrections related to emissivity and reflected infrared rays, and the principle thereof will be explained in detail below.
先ず被写体の放射率ごは前記■式の変形により次式で求
められる。First, the emissivity of the object is determined by the following equation by modifying the equation (2) above.
W−。W-.
Tゞ ...……【4’ご=。rIO
Tゞそこで赤外線検出器で検出された被写体のある点A
における赤外線強度Wと被写体の点Aの温度Tに基づく
赤外線強度。T. .. .. ...[4'go=. rIO
TゞThe point A of the object detected by the infrared detector
The infrared intensity is based on the infrared intensity W at , and the temperature T at the point A of the subject.
rに対応した接触型温度計よりの検出信号と、被写体周
囲の環境温度Taに基づく反射赤外線強度OTa4 に
対応した接触型温度計よりの検出信号とを放射率測定回
路に導入することにより上記【4’式の演算を行い、被
写体の点Aにおける放射率ごに対応した信号を得る。と
ころでこのとき得られたある点Aの放射率は通常被写体
の他の部分における放射率とさほどかわらない。従って
放射率測定回路で求められた放射率fに対応した出力信
号と前記環境温度Taに基づく反射赤外線強度OTa4
に対応した接舷型温度計よりの出力信号と赤外線検出
器からの強度Wに対応した出力信号とを補正回路に導入
して、前記‘3}式の演算を行なえば、放射率及び反射
赤外線に関連した誤差が自動的に補正され、被写体の真
の温度に対応する信号が得られるわけである。図面は上
記原理に従った実施例を示すもので、1は被写体2から
放射される赤外線を走査集光して赤外線検出器3に導く
ための光学的走査手段で、走査回路4からの走査信号に
基づいて二次元的に走査される。前記赤外線検出器3で
検出された赤外線信号は増幅器5により増幅された後、
補正回路6に送られて放射率及び反射赤外線強度の補正
が行なわれる。該補正回路からの出力信号はリニアリテ
イ補正回路7により被写体の温度とIJニアな関係を有
する温度信号に変換された後、前記光学的走査手段1と
同期した陰極線管8のグリッド‘こ供総合される。9a
及び9bは例えば熱電対やサーミスター等の如き接触型
温度計で、温度計9aは前記被写体2の任意な場所の温
度を、又温度計9bは被写体周囲の環境温度、例えば室
壁等の温度を測定するためのものである。The above [[ Equation 4' is calculated to obtain a signal corresponding to each emissivity at point A of the object. By the way, the emissivity at a certain point A obtained at this time is usually not much different from the emissivity at other parts of the subject. Therefore, the output signal corresponding to the emissivity f determined by the emissivity measurement circuit and the reflected infrared intensity OTa4 based on the environmental temperature Ta
By introducing the output signal from the side-type thermometer corresponding to Errors associated with temperature are automatically corrected, resulting in a signal that corresponds to the true temperature of the subject. The drawing shows an embodiment according to the above principle, in which 1 is an optical scanning means for scanning and condensing infrared rays emitted from a subject 2 and guiding them to an infrared detector 3, which receives a scanning signal from a scanning circuit 4. is scanned two-dimensionally based on After the infrared signal detected by the infrared detector 3 is amplified by the amplifier 5,
The signal is sent to a correction circuit 6 where the emissivity and reflected infrared intensity are corrected. The output signal from the correction circuit is converted by the linearity correction circuit 7 into a temperature signal having an IJ-near relationship with the temperature of the object, and then integrated into the grid of the cathode ray tube 8 synchronized with the optical scanning means 1. Ru. 9a
and 9b are contact type thermometers such as thermocouples or thermistors, the thermometer 9a measures the temperature at any location on the subject 2, and the thermometer 9b measures the environmental temperature around the subject, such as the temperature of a room wall, etc. It is for measuring.
これらの温度計からの出力信号は夫々マッチング回磯1
0a及び10bを経て、放射率測定回路11に導入され
る。該放射率測定回路には更に前記赤外線検出器3から
の出力信号の一部が出力取出回路12により取出されて
導入されており、該放射率測定回略からの出力信号は前
記補正回路6に導入される。核補正回路には更に前記マ
ッチング回路10aからの出力信号も導入されている。
前記出力取出回路12は陰極線管の画面上に例えば水平
マーカ−及び垂直マーカーを表示せしめ、両マーカーが
交叉する位置に対応する赤外線検出器3からの出力信号
を取出すように構成されている。上述した構成において
、先ず被写体2の任意の点Aに温度計9aを接触させ、
又反射赤外線放射線となる室壁13に温度計gbを接触
させると、各温度計からは測定温度に応じた出力信号が
マッチング回路10a及び10bに夫々送られる。The output signals from these thermometers are matched with each other.
It is introduced into the emissivity measuring circuit 11 via 0a and 10b. Further, a part of the output signal from the infrared detector 3 is taken out and introduced into the emissivity measurement circuit by an output extraction circuit 12, and the output signal from the emissivity measurement circuit is sent to the correction circuit 6. be introduced. The output signal from the matching circuit 10a is also introduced into the nuclear correction circuit.
The output extraction circuit 12 is configured to display, for example, a horizontal marker and a vertical marker on the screen of the cathode ray tube, and to extract an output signal from the infrared detector 3 corresponding to the position where both markers intersect. In the above-described configuration, first, the thermometer 9a is brought into contact with an arbitrary point A on the subject 2,
When the thermometers gb are brought into contact with the chamber wall 13 that emits reflected infrared radiation, each thermometer sends an output signal corresponding to the measured temperature to matching circuits 10a and 10b, respectively.
この両マッチング回路において各温度計の出力信号のゲ
インとしベルを適宜に調整することにより、10aから
は前記{41式における。rの値に対応する信号が、又
10bからは同式中OTa4の値に対応する信号が夫々
得られ、該得られた両信号は放射率測定回路11に導入
される。又10bからの信号は補正回路6にも導入され
る。一方光学的走査手段1を走査せしめることにより陰
極線管8上には被写体の放射率及び反射赤外線強度の補
正がなされていない見掛上の温度分布像が表示されると
同時に温度計9aの外観像が映し出されるため、出力取
出回路12によって被写体の温度計9aが接触している
点Aに水平及び垂直マーカーの交点を一致させることに
より被写体の点Aにおける赤外線検出器3からの赤外線
強度信号、即ち前記【4)式中Wの値に対応する信号を
取出す。該取出された信号は前記放射率測定回路11に
導入されるため、該放射率測定回路において前記■式の
演算が行なわれ、被写体2の点Aにおける放射率ごが測
定される。この放射率の測定が終了すると該放射率測定
回路11からは放射率に相当する出力信号を補正回路6
に導入するため、該補正回路において前記‘3}式の演
算が行われ、被写体各点における真の温度に対応する信
号が得られる。該得られた信号はリニアリティ補正回路
7により温度信号に変換されて陰極線管8に供給される
ため、正確な被写体2の温度分布像が表示される。以上
の如く構成する事により本発明は放射率及び反射赤外線
の混入に基づく誤差の補正を自動的に行うことのできる
サーモグラフイ−装置を得ることができ、実用性大なる
効果を有する。By appropriately adjusting the gain and the bell of the output signal of each thermometer in both matching circuits, from 10a onward, the equation {41 above is obtained. A signal corresponding to the value of r and a signal corresponding to the value of OTa4 in the same equation are obtained from 10b, respectively, and both of the obtained signals are introduced into the emissivity measuring circuit 11. The signal from 10b is also introduced into correction circuit 6. On the other hand, by scanning the optical scanning means 1, an apparent temperature distribution image is displayed on the cathode ray tube 8 without correction of the emissivity of the subject and the intensity of reflected infrared rays, and at the same time an external image of the thermometer 9a is displayed. is displayed, the output extraction circuit 12 aligns the intersection of the horizontal and vertical markers with the point A where the thermometer 9a of the subject is in contact, thereby obtaining the infrared intensity signal from the infrared detector 3 at the point A of the subject, i.e. A signal corresponding to the value of W in the above formula (4) is extracted. Since the extracted signal is introduced into the emissivity measuring circuit 11, the above-mentioned equation (2) is calculated in the emissivity measuring circuit 11, and the emissivity at point A of the subject 2 is measured. When the emissivity measurement is completed, the emissivity measurement circuit 11 sends an output signal corresponding to the emissivity to the correction circuit 6.
In order to introduce the true temperature at each point of the object, the correction circuit calculates the equation '3} to obtain a signal corresponding to the true temperature at each point of the object. The obtained signal is converted into a temperature signal by the linearity correction circuit 7 and supplied to the cathode ray tube 8, so that an accurate temperature distribution image of the subject 2 is displayed. By configuring as described above, the present invention can provide a thermography apparatus that can automatically correct errors due to the inclusion of emissivity and reflected infrared rays, and has great practical effects.
図面は本発明の一実施例を示す礎成図である。 The drawing is a basic diagram showing an embodiment of the present invention.
Claims (1)
ることにより得られる赤外線を赤外線検出器にて検出し
、その検出信号を前記光学的走査手段と同期した表示手
段に導入せしめて被写体の温度分布像を得る装置におい
て、前記被写体表面上の一点に接触された第1の接触型
温度計と、被写体周囲の赤外線放射面上の一点に接触さ
れた第2の接触型温度計と、被写体表面上の前記第1の
接触型温度計が接触している点に対応する前記赤外線検
出器の検出信号を取出す手段と、該取出された検出信号
と前記第1及び第2の接触型温度計からの信号に基づい
て被写体の放射率に対応した信号を得る手段と、該手段
からの放射率に対応した信号と前記被写体周囲の赤外線
放射面に接触された接触型温度計からの信号とによつて
前記赤外線検出器からの信号を被写体の真温度に対応し
た信号に変換する手段とを設けた事を特徴とするサーモ
グラフイー装置。1. Infrared rays obtained by two-dimensionally scanning an object with an optical scanning means are detected by an infrared detector, and the detection signal is introduced into a display means synchronized with the optical scanning means to display the object. The device for obtaining a temperature distribution image includes: a first contact thermometer that is in contact with a point on the surface of the subject; a second contact thermometer that is in contact with a point on an infrared radiation surface around the subject; means for extracting a detection signal of the infrared detector corresponding to a point in contact with the first contact thermometer on a surface, and the extracted detection signal and the first and second contact thermometers; means for obtaining a signal corresponding to the emissivity of the subject based on a signal from the means, and a signal corresponding to the emissivity from the means and a signal from a contact thermometer in contact with an infrared radiation surface around the subject. Therefore, a thermography apparatus characterized in that it is provided with means for converting a signal from the infrared detector into a signal corresponding to the true temperature of the subject.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP52056168A JPS6021329B2 (en) | 1977-05-16 | 1977-05-16 | thermography equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP52056168A JPS6021329B2 (en) | 1977-05-16 | 1977-05-16 | thermography equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS53141683A JPS53141683A (en) | 1978-12-09 |
| JPS6021329B2 true JPS6021329B2 (en) | 1985-05-27 |
Family
ID=13019555
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP52056168A Expired JPS6021329B2 (en) | 1977-05-16 | 1977-05-16 | thermography equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6021329B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4705945A (en) * | 1986-01-31 | 1987-11-10 | Barnes Engineering Company | Narcissus correction for infrared scanning microscope |
| JPH02298830A (en) * | 1989-05-15 | 1990-12-11 | Nippon Avionics Co Ltd | Measuring apparatus of surface temperature distribution |
| JPH0772702B2 (en) * | 1992-11-09 | 1995-08-02 | 日本アビオニクス株式会社 | Infrared imaging system |
-
1977
- 1977-05-16 JP JP52056168A patent/JPS6021329B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS53141683A (en) | 1978-12-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7994480B2 (en) | Visible light and IR combined image camera | |
| US4878247A (en) | Method for the photogrammetrical pick up of an object with the aid of at least one opto-electric solid-state surface sensor | |
| CN107588854B (en) | High precision measuring temperature method based on built-in reference body | |
| US7102672B1 (en) | Integrated CMOS imaging array dark current monitor | |
| US3830970A (en) | Automatic intensity control for picture tube display systems | |
| CN110095193A (en) | A kind of thermal infrared imager noise equivalent temperature difference test method and system | |
| JPS6221532B2 (en) | ||
| JPS6021329B2 (en) | thermography equipment | |
| US4480189A (en) | Thermoluminescence dosimeter reader | |
| JPS6025413A (en) | Method and device for leveling rod scale detection in leveling | |
| CN117898748A (en) | X-ray detector region previewing method and device, equipment, medium and product | |
| US20050174558A1 (en) | Method and apparatus for electronically generating an outline indicating the size of an energy zone imaged onto the IR detector of a radiometer | |
| JP2796373B2 (en) | Color temperature measuring instrument | |
| Fowler et al. | High accuracy measurement of aperture area relative to a standard known aperture | |
| CN113093156B (en) | Multi-optical axis calibration system and method for LD laser range finder | |
| US20060034418A1 (en) | Tomography appliance, and method for a tomography appliance | |
| US5872830A (en) | Device and method of imaging or measuring of a radiation source | |
| JPH043829B2 (en) | ||
| JPS6366020B2 (en) | ||
| US3398279A (en) | Radiometer having a wide range of spectral response | |
| US3917974A (en) | Scintillation camera brightness calibrating apparatus | |
| US20040130629A1 (en) | Distortion correction of an image intensifier | |
| JPH01503639A (en) | Thickness/density measuring device | |
| JPH06109549A (en) | Infrared imaging device | |
| JP3417076B2 (en) | Radiation imaging device |