JPS60218005A - width measuring device - Google Patents

width measuring device

Info

Publication number
JPS60218005A
JPS60218005A JP7306284A JP7306284A JPS60218005A JP S60218005 A JPS60218005 A JP S60218005A JP 7306284 A JP7306284 A JP 7306284A JP 7306284 A JP7306284 A JP 7306284A JP S60218005 A JPS60218005 A JP S60218005A
Authority
JP
Japan
Prior art keywords
measured
light
width
light source
imaging device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7306284A
Other languages
Japanese (ja)
Inventor
Kenji Taguchi
田口 憲二
Tsuneo Shimozaki
下崎 恒雄
Toshio Ogata
利夫 緒形
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP7306284A priority Critical patent/JPS60218005A/en
Publication of JPS60218005A publication Critical patent/JPS60218005A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は物体表面に形成された凹、凸部の幅の測定を非
接触で行なうのに適した幅測定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a width measuring device suitable for measuring the width of concave and convex portions formed on the surface of an object in a non-contact manner.

〔発明の背景〕[Background of the invention]

従来、物体表面の凹、凸部の輪を非接触で測定する技術
としては、磁気式と光学式の2方式があった。
Conventionally, there have been two methods for non-contact measurement of concave and convex rings on the surface of an object: a magnetic method and an optical method.

磁気式は第1図(イ)に示すように鉄心3、励磁コイル
4、検出コイル5を有するセンサ2を用いて被測定部(
“図示例は物体表面の凹部)1の幅Eを測定しようとす
るもので、この方式は原理的に被測定部1を通る磁束f
の量の変化を利用しているため、被測定部である凹部の
深さや凸部の高さにより測定値のバラツキが生じやすい
。また、第1置が少しずれると測定不能になり、関係位
置のずれに対する裕度が小さいので、被測定部とセンサ
の位置関係が不安定な場合には適用しにくいとい光学式
は第2図に示すように撮像装置(イメージセンサ)6を
用いその受光面に結ばれた光学像から被測定部(図示例
は物体表面の凹部)1の幅lを測定しようとするもので
あるが、被測定部1と周囲の面との高さの差が小さく、
表面状態もほぼ同等である場合、普通のように物体表面
に一様に光を当てると、被測定部1と周囲の面との間に
明暗のコントラストか十分とれないため、この方式では
幅測定が困難であった。
The magnetic type uses a sensor 2 having an iron core 3, an excitation coil 4, and a detection coil 5 to detect the part to be measured (
“The illustrated example attempts to measure the width E of a concave portion 1 on the surface of an object, and this method is based on the principle that the magnetic flux f passing through the portion 1 to be measured is
Since changes in the amount of are used, variations in measured values are likely to occur depending on the depth of the concave portion and the height of the convex portion, which are the portions to be measured. In addition, if the first position deviates slightly, measurement becomes impossible, and the tolerance for deviations in the relative positions is small, so it is difficult to apply when the positional relationship between the part to be measured and the sensor is unstable. As shown in the figure, the width l of the part to be measured (the illustrated example is a concave part on the surface of an object) 1 is measured from the optical image formed on the light receiving surface of the imaging device (image sensor) 6. The difference in height between the measurement part 1 and the surrounding surface is small,
When the surface conditions are almost the same, if the object surface is uniformly illuminated as usual, there will not be enough contrast between the light and dark between the part to be measured 1 and the surrounding surfaces, so this method is not suitable for width measurement. was difficult.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、周囲の面との高さの差が小さく、表面
状態もほぼ同等な物体表面の凹、凸部の幅を非接触で精
度良(測定でき、被測定部との関係位置のずれによって
も影響を受けにくい幅測定装置を提供することにある。
The purpose of the present invention is to measure the width of concavities and convexities on the surface of an object with a small height difference and almost the same surface condition with high precision (non-contact), and to determine the relative position of the part to be measured. It is an object of the present invention to provide a width measuring device that is not easily affected by deviations in width.

〔発明の概要〕[Summary of the invention]

本発明は、受光部が被測定部である物体表面の凹、凸部
に対向し被測定部の幅方向と平行になるように設置され
た撮像装置と、測定時に被測定部の各立上り面の影を生
じさせるように被測定部に対しそれぞれ異なる方向から
投光する光源と、前記撮像装置の出力信号の段差により
被測定部の幅方向両端位置を検出する信号処理手段と、
これら2位置間の幅寸法を算出する演算手段とを備えた
ことを特徴とする幅測定装置である。
The present invention provides an imaging device in which a light-receiving section is installed so as to face concavities and convexities on the surface of an object to be measured and to be parallel to the width direction of the object to be measured, and each rising surface of the object to be measured during measurement. a light source that projects light from different directions onto the part to be measured so as to produce a shadow; and a signal processing means that detects the positions of both ends in the width direction of the part to be measured based on the level difference in the output signal of the imaging device.
This width measuring device is characterized by comprising a calculation means for calculating the width dimension between these two positions.

〔発明の実施例〕[Embodiments of the invention]

まず本発明の原理を第3図〜第6図により説明する。 First, the principle of the present invention will be explained with reference to FIGS. 3 to 6.

第3図は撮像装置、光源、被測定部の位置関係を示す図
で、撮像装置であるイメージセンサの受光部7は被測定
部(図示例は物体表面の凹部)1に対向して被測定部1
の幅方向と平行になるように配置され、光源8,9は受
光部7および被測定部1と同一平面上の受光部7を中心
とする左右対称位置にあって被測定部1に対し異なる方
向から投光するように配置されている。1oは被測定部
1の光学像を受光部7に結像させるためのレンズ、11
、12は光源8,9がも出た光を均一化して被測定部1
に当てるためのレンズである。受光部7を構成するセン
サ素子の種類は問わないが、ここでは受光部7がn個(
たとえは2,048個)の光電変換素子を1列に並べ、
入射光量に対応して各素子に蓄積された電荷を走査によ
り時間的に直列な電圧信号として取り出すホトダイオー
ドアレイにより構成されているものとする。
FIG. 3 is a diagram showing the positional relationship between the imaging device, the light source, and the part to be measured. The light receiving part 7 of the image sensor, which is the imaging device, is placed opposite the part to be measured (the illustrated example is a concave part on the surface of the object) 1. Part 1
The light sources 8 and 9 are located in symmetrical positions with respect to the light receiving part 7 on the same plane as the light receiving part 7 and the part to be measured 1, and are different from each other with respect to the part to be measured 1. It is arranged to project light from all directions. 1o is a lens for forming an optical image of the part to be measured 1 on the light receiving part 7;
, 12 homogenizes the light emitted by the light sources 8 and 9 and outputs it to the part to be measured 1.
It is a lens for exposing the Although the type of sensor element constituting the light receiving section 7 does not matter, here, the number of light receiving sections 7 is n (
For example, 2,048 photoelectric conversion elements are arranged in a row,
It is assumed that the photodiode array is composed of a photodiode array that extracts charges accumulated in each element in accordance with the amount of incident light as temporally serial voltage signals by scanning.

測定は光源苧、9を左右順次点灯させて行なう場合と左
右同時点灯−させて行なう場合とがあるがここでは前者
の場合について述べる。
The measurement may be carried out by turning on the left and right light sources 9 sequentially, or by turning on the left and right lights simultaneously; the former case will be described here.

今、左側の光源8を点灯させると、第4図(イ)に示す
ように光源8から出た光13により被測定部である凹部
(溝)1内に左側立上り面Iへの影15が生じる。この
ため、物体表面の凹部1と周囲の面との間に第4図(ロ
)に示すような明暗のコントラストが強く現われ、凹部
1の左端Aが明暗の境目となる。このとき、受光部7に
は反射光の強弱により凹部1の映像が結ばれるので、受
光部7を構成する光電変換素子には第6図に示すように
凹部1の左端Aに対応する明暗の境目A′が蓄積電荷と
して記憶される。この明暗の境目A′の位置は受光部7
を走査して得られた出力信号の段差により容易に検出す
ることができる。次に、右側の光源9を点灯させると、
第5図(イ)に示すように光源9から出た光14により
凹部1内に右側立上り面IBの影16が生じる。このた
め、物体表面の凹部1と周囲の面との間に第5図(ロ)
に示すような明暗のコントラストが強く現われ、凹部1
の右端Bか明暗の境目となる。このとき、受光部7を構
成する光電変換素子には第6図に示すように凹部1の右
端Bに対応する明暗の境目B′が蓄積電荷として記憶さ
れ、この明暗の境目B′の位置は上記と同様に受光部7
を走査して得られた出力信号の段差により容易に検出で
きる。受光部7の素子間隔はIC製造技術により正確に
規定されているので、検出されたA′、B’2位置間の
素子数(ビット数)に映像9倍率により定まる1ビット
当りの換算値ε鰭を掛けることにより、凹部1の幅寸法
がめられる。
Now, when the left light source 8 is turned on, the light 13 emitted from the light source 8 casts a shadow 15 on the left rising surface I in the recess (groove) 1, which is the part to be measured, as shown in FIG. 4(A). arise. Therefore, a strong contrast between light and dark as shown in FIG. 4(b) appears between the recess 1 on the surface of the object and the surrounding surfaces, and the left end A of the recess 1 becomes the boundary between bright and dark. At this time, an image of the recess 1 is focused on the light receiving section 7 depending on the intensity of the reflected light, so the photoelectric conversion element constituting the light receiving section 7 has bright and dark images corresponding to the left end A of the recess 1 as shown in FIG. The boundary A' is stored as accumulated charge. The position of this bright and dark boundary A' is at the light receiving part 7.
It can be easily detected by the step difference in the output signal obtained by scanning. Next, when you turn on the light source 9 on the right side,
As shown in FIG. 5(a), the light 14 emitted from the light source 9 creates a shadow 16 of the right rising surface IB within the recess 1. For this reason, there is a gap between the recess 1 on the object surface and the surrounding surface as shown in Fig. 5 (b).
A strong contrast between light and dark appears as shown in the figure, and the concave part 1
The right edge B is the boundary between light and darkness. At this time, the light and dark boundary B' corresponding to the right end B of the recess 1 is stored as an accumulated charge in the photoelectric conversion element constituting the light receiving section 7, as shown in FIG. 6, and the position of this bright and dark boundary B' is Similarly to the above, the light receiving section 7
It can be easily detected by the step difference in the output signal obtained by scanning. Since the spacing between the elements of the light receiving section 7 is precisely defined by IC manufacturing technology, the converted value ε per bit determined by the number of elements (number of bits) between the detected two positions A' and B' and the image magnification is By applying the fins, the width of the recess 1 can be determined.

このように本発明による幅測定装置は、測定時に被測定
部の各立上り面の影を生じさせるようにそれぞれ異なる
方向から投光することにより、物体表面の被測定部と周
囲の面との間に明暗のコントラストをつけ、撮像装置に
よる被測定部の幅方向両端位置の検出を容易にしたもの
であるから、撮像装置として現在市販されている2、0
48ビツトというような高分解能のイメージセンサを使
用すれば、被測定部と周囲の面との高さの差や表面状態
の異同にかかわらず精度良く幅測定ができる。
In this way, the width measuring device according to the present invention projects light from different directions so as to create shadows of each rising surface of the measured part during measurement, thereby measuring the distance between the measured part and the surrounding surfaces of the object surface. The contrast between light and dark is added to the image pickup device, making it easy for the image pickup device to detect the positions of both ends in the width direction of the part to be measured.
If a high-resolution image sensor such as 48 bits is used, the width can be accurately measured regardless of the difference in height or surface condition between the part to be measured and the surrounding surfaces.

第3図〜第5図には被測定部である凹部1の各立上り面
が周囲の面に対し直角な場合を示したが、凹部1の立上
り面が傾斜している場合でも第7図に示すように光源か
らの光14の入射角θを立上り面IBの傾斜角度より小
さくすることにより立上り面IBの影16を生じさせる
ことができ、立上り面IAについても同様に影を生じさ
せることができるので、両方の映像から幅測定ができる
。また、被測定部が凸部であっても第8図に示すように
被測定部1に矢印方向に光14を当て立上り面IAの影
15を生じさせた状態および同様に立上り面IBの影を
生じさせた状態で撮像することにより、A、B2点間の
幅測定ができる。本発明は第9図に示すような積層板の
上層部突合せ端の隙間により生じた四部10幅測定にも
応用可能であり、この場合も被測定部である凹部1に矢
印方向に光14を当て立上り面IBの影16を生じさせ
た状態および同様に立上り面I A 、17)影を生じ
させた状態で撮像す被測定部である凹、凸部が形成され
た物体表面は平面に限ることなく、円筒面等の曲面であ
っても差支えない。また、物体は光を通さないものであ
ればどのような材質であっても測定可能である。
Although FIGS. 3 to 5 show the case where each rising surface of the recess 1, which is the part to be measured, is perpendicular to the surrounding surface, FIG. As shown, by making the incident angle θ of the light 14 from the light source smaller than the inclination angle of the rising surface IB, a shadow 16 can be generated on the rising surface IB, and a shadow can be similarly generated on the rising surface IA. Therefore, the width can be measured from both images. Furthermore, even if the part to be measured is a convex part, as shown in FIG. By taking an image in a state where this occurs, the width between the two points A and B can be measured. The present invention can also be applied to measuring the width of the four parts 10 caused by the gap between the abutting ends of the upper layer of a laminate as shown in FIG. The object surface on which concavities and convexities are formed is limited to a flat surface, which is the part to be measured that is imaged in a state where the shadow 16 of the applied rising surface IB is produced and a similar rising surface IA, 17) where a shadow is produced. It may be a curved surface such as a cylindrical surface without any problem. Furthermore, any material that does not allow light to pass through the object can be measured.

この場合、被測定部1はレンズ10を通して読み取り可
能な撮像装置の視界内にあ糺はよく、第1図に示す磁気
センサに比べ被測定部との関係位置のずれによる影響を
受けに(いので、被測定部との位置関係が不安定な場合
にも適用できる。
In this case, the part to be measured 1 is well within the field of view of the imaging device that can be read through the lens 10, and is less susceptible to the effects of displacement in relation to the part to be measured than the magnetic sensor shown in FIG. Therefore, it can be applied even when the positional relationship with the part to be measured is unstable.

次に、本発明の一実施例を第10図〜第12図により具
体的に説明する。
Next, one embodiment of the present invention will be specifically described with reference to FIGS. 10 to 12.

第10図はシステム構成を示すブロック図である。FIG. 10 is a block diagram showing the system configuration.

17は受光部と映像信号を取り出す走査回路およで、撮
像装置17と投光用光源8,9は被測定部1に対して所
定の関係位置となるように1枚の支持板18に取付けで
ある。ここで、光源8−29を支持板18に設けた円弧
状のガイド溝19,20に沿って移動可能とし、任意の
位置で図示しない固定具により固定できるようにすれは
、被測定部1の形状、寸法に応じて光の入射角度−を調
整することができる。21は設定されたプログラムによ
り測定シーケンスを実行する制御部(シーケンサ)、2
2.23は被測定部10幅方向両端位置を検出するため
のアドレス設定スイッチ、24は制御部210指令によ
り動作するアドレス切換リレー、25は同光源切換リレ
ー、26は撮像装置17の出力信号の増幅、スライス処
理、マスク処理、ビットカウント等によF)被測定部1
の幅方向両端位置を検出する信号処理手段である信号処
理部で、スライスレベル設定用可変抵抗27とマスクビ
ット数設定用BCDスイッチ詔、29を備えている。3
0は信号処理部26の出力データにより被測定部10幅
寸法を算出する演算手段である演算部、31は測定結果
を数値表示する表示部である。
Reference numeral 17 denotes a light receiving section and a scanning circuit for extracting a video signal, and the imaging device 17 and the projecting light sources 8 and 9 are mounted on one support plate 18 so as to be in a predetermined relative position with respect to the part to be measured 1. It is. Here, the light source 8-29 is made movable along the arc-shaped guide grooves 19, 20 provided on the support plate 18, and can be fixed at any position with a fixture (not shown). The incident angle of light can be adjusted depending on the shape and dimensions. 21 is a control unit (sequencer) that executes a measurement sequence according to a set program;
2.23 is an address setting switch for detecting the positions of both ends in the width direction of the part to be measured 10; 24 is an address switching relay operated by a command from the control unit 210; 25 is a light source switching relay; 26 is an output signal switch for the image pickup device 17; F) Measured part 1 by amplification, slicing processing, mask processing, bit counting, etc.
The signal processing section is a signal processing means for detecting the positions of both ends in the width direction, and includes a variable resistor 27 for setting a slice level and a BCD switch 29 for setting the number of mask bits. 3
0 is an arithmetic unit that is an arithmetic means for calculating the width dimension of the part to be measured 10 based on the output data of the signal processing unit 26, and 31 is a display unit that numerically displays the measurement results.

第11図は信号処理部26で行なわれる信号処理の過程
を示す。光源8,9を左右順次点灯させたとき撮像装置
17から出力される生データ(反転信号)を増幅した後
、スライス処理して可変抵抗27により設定されたスラ
イスレベル以上の信号のみを取り出しパルス波形に変換
する。スライス処理されたデータには被測定部以外の物
体表面の暗部に相当する不要な信号が含まれているので
、次にマスク処理を行ない、イメージセンサ視野の両端
からBCDスイッチ28 、29により設定されたマス
クビット数Yl、 Y2の範囲内にあ舎不要な信号を消
去する。その結果、被測定部1の各立上り面の影に対応
した信号だけが残る。マスク処理後、光源左点灯時には
アドレス設定スイッチ22により設定された■−■間、
すなわちイメージセンサ視野の一端(■ビット)から信
号の立上り点(■ビット)までのビット数aをアドレス
カウンタでカウントする。これにより被測定部の映像の
左端位置(第6図A’ )が検出されたことになる。ま
た、光源右点灯時にはアドレス設定スイッチ23により
設定された■−■間、jなわちイメージセンサ視野の一
端(■ビット)から信号の立下り点(■ビット)までの
ビット数すをアドレスカウンタでカウントする。これに
より被測定部の映像の右端位置(第6図B/)が検出さ
れたことになり、この2つのビット数a、bが信号処理
部26の出力データとなる。
FIG. 11 shows the process of signal processing carried out in the signal processing section 26. After amplifying the raw data (inverted signal) output from the imaging device 17 when the light sources 8 and 9 are turned on left and right sequentially, slicing is performed to extract only signals above the slice level set by the variable resistor 27 and generate a pulse waveform. Convert to Since the slice-processed data contains unnecessary signals corresponding to dark areas on the surface of the object other than the part to be measured, mask processing is performed next, and the signals are set by the BCD switches 28 and 29 from both ends of the image sensor field of view. Eliminate unnecessary signals within the range of mask bit numbers Yl and Y2. As a result, only the signals corresponding to the shadows of each rising surface of the part to be measured 1 remain. After mask processing, when the left light source is turned on, the interval between ■ and ■ set by the address setting switch 22,
That is, the address counter counts the number of bits a from one end of the field of view of the image sensor (■ bit) to the rising point of the signal (■ bit). This means that the left end position of the image of the part to be measured (A' in FIG. 6) has been detected. When the right light source is on, the address counter measures the number of bits between ■ and ■ set by the address setting switch 23, that is, the number of bits from one end of the image sensor field of view (■ bit) to the falling point of the signal (■ bit). Count. This means that the right end position of the image of the part to be measured (B/ in FIG. 6) has been detected, and these two bit numbers a and b become the output data of the signal processing section 26.

第12図は制御部21、信号処理部26、演算部30の
動作関係を示すフローチャートである。
FIG. 12 is a flowchart showing the operational relationship among the control section 21, signal processing section 26, and calculation section 30.

測定に当り、制御部21はまずステップ101で光源左
点灯を光源切換リレー25に指令する。これにより光源
8から出た光13が被測定部1に当たる。
In the measurement, the control section 21 first instructs the light source switching relay 25 to turn on the left side of the light source in step 101. As a result, the light 13 emitted from the light source 8 hits the part to be measured 1 .

次にステップ102でアドレス設定スイッチ22により
設定されたアドレス■−■の選択をアドレス切換リレー
24に指令jる。すると信号処理部26はステップ20
1で前述したように撮像装置17の出力信号を処理し、
■−■間ビット数aを出力する。
Next, in step 102, a command is given to the address switching relay 24 to select the addresses ``--'' set by the address setting switch 22. Then, the signal processing section 26 performs step 20.
1, process the output signal of the imaging device 17 as described above,
Output the number of bits a between ■ and ■.

このとき制御部21はステップ103でタイマの設定時
間用の経過を待って次のステップ104に進む。
At this time, the control unit 21 waits for the set time of the timer to elapse in step 103, and then proceeds to the next step 104.

T1は信号処理に必要な時間で、たとえは1秒程度に設
定する。ステップ104で測定開始信号が出力され、こ
の信号により演算部30はステップ301で■−■間ピ
ット数aを読込み記憶し、続いてステップ302で測定
終了信号を出力する。この信号により制御部21はステ
ップ105で光源左消灯を、続いてステップ106で光
源右点灯を光源切換リレー25に指令する。これにより
光源8に代わって光源9から出た光14が被測定部1に
当たる。次に制御部21はステップ107でアドレス設
定スイッチ23により設定されたアドレスO−■の選択
をアドレス切換リレー24に指令する。すると信号処理
手段はステップ202で前述したように撮像装置17の
出力信号を処理し、■−■間ビット数すを出力する。
T1 is the time required for signal processing, and is set to about 1 second, for example. In step 104, a measurement start signal is output, and in response to this signal, the arithmetic unit 30 reads and stores the number a of pits between ■ and ■ in step 301, and then outputs a measurement end signal in step 302. Based on this signal, the control unit 21 instructs the light source switching relay 25 to turn off the left light source in step 105, and then to turn on the right light source in step 106. As a result, the light 14 emitted from the light source 9 instead of the light source 8 hits the part to be measured 1 . Next, in step 107, the control unit 21 instructs the address switching relay 24 to select the address O-■ set by the address setting switch 23. Then, in step 202, the signal processing means processes the output signal of the imaging device 17 as described above, and outputs the number of bits between ■ and ■.

このとき制御部21はステップ108で前記ステップ1
03と同様夕17の設定時間T+の経過を待って次のス
テップ109に進み、測定開始信号を出力する。この信
号により演算部30はステップ303で■−■間ビット
数すを読込み記憶し、続いてステップ304で測定終了
信号を出力する。この信号により制御部21は光源右消
灯を光源切換リレー25に指令する。演算部30はさら
にステップ305に進み、(b−a)ε=1(ε:1ピ
ット当り換算値、!=被測定部幅寸法)の演算を行なっ
た後、ステップ306で測定値!をチェックし、異常が
なけれはステップ307に進み、測定値!を表示部31
に表示させる。この演算部30の出力データは被測定部
の幅寸法を決定する製造装置の制御用データや製品の選
別用データとしても利用することができる。
At this time, the control unit 21 performs the step 1 in step 108.
As in 03, the process waits for the elapse of the set time T+ of 17, then proceeds to the next step 109, and outputs a measurement start signal. In response to this signal, the calculation unit 30 reads and stores the bit number between ■ and ■ in step 303, and then outputs a measurement end signal in step 304. Based on this signal, the control unit 21 instructs the light source switching relay 25 to turn off the right light source. The calculation unit 30 further proceeds to step 305 and performs the calculation of (ba) ε=1 (ε: converted value per pit, !=width dimension of the part to be measured), and then in step 306 calculates the measured value! Check and if there is no abnormality, proceed to step 307 and check the measured value! The display section 31
to be displayed. The output data of the calculation unit 30 can also be used as data for controlling a manufacturing device that determines the width dimension of the part to be measured, and as data for selecting products.

アドレス切換リレー24や光源切換リレー25は手動操
作としてもよいが、上記のようにプログラム設定された
制御部21の指令で動作させることにより測定の自動化
を実現できる。
Although the address switching relay 24 and the light source switching relay 25 may be operated manually, automation of measurement can be realized by operating them according to commands from the control section 21 programmed as described above.

次に、光源を左右同時点灯させて幅測定を行なう実施例
について説明する。
Next, an embodiment will be described in which the width is measured by turning on the left and right light sources simultaneously.

たとえは第13図(イ)に示すように左右の光源(図示
せず)から出た同じ色の光13.14を被測定部である
物体表面の凹部1に同時に当てると、凹部1内に左右の
立上り面IA、IBによる半影15’、 !6’が生じ
るため、物体表面の凹部1と周囲の面との間に第13図
(ロ)に示すような明暗のコントラストが現われ、凹部
1の左右端部A、Bが明暗の境目となる。
For example, as shown in Fig. 13(A), if light 13.14 of the same color emitted from the left and right light sources (not shown) is simultaneously applied to the recess 1 on the surface of the object to be measured, the light inside the recess 1 Penumbra 15' due to left and right rising planes IA and IB, ! 6' occurs, a bright and dark contrast as shown in Figure 13 (B) appears between the recess 1 on the object surface and the surrounding surfaces, and the left and right ends A and B of the recess 1 become the boundary between bright and dark. .

したがって感度の良い撮像装置を使用すれば、その出力
信号から左右端部A、Hの位置を十分判別でき、幅測定
が可能である。
Therefore, if a sensitive imaging device is used, the positions of the left and right ends A and H can be sufficiently determined from the output signals thereof, and the width can be measured.

また、左右の光源から出る光の色を違え、たとえは第1
4図(イIK示すように左側光源から出た緑色光◎と右
側光源から出た赤色光■を被測定部である物体表面の凹
部1に同時に当てると1.四部1内の緑色光◎が遮ぎら
れた左側立上り面IAの陰の部分には赤色の影15“が
生じ、赤色光■が遮ぎられた右側立上り面IBの陰の部
分には緑色の影16“が生じる。凹部1の周囲の面には
緑色光〇と赤色光■の両方か当たるので、撮像装置(図
示せず)の前面に設けたフィルタ32を切換え、緑色光
のみを透過させたときには第14図(ロ)に示すような
明暗のコントラストを持つ像が撮像され、赤色光のみを
透過させたときには第14図(ハ)に示すような明暗の
コントラストを持つ像か撮像されることになる。
In addition, the color of the light emitted from the left and right light sources is different, and the first example is
Figure 4 (A) When the green light ◎ emitted from the left light source and the red light ■ emitted from the right light source are simultaneously applied to the recess 1 on the surface of the object, which is the part to be measured, as shown in Fig. A red shadow 15'' is generated in the shaded portion of the left rising surface IA where the red light ■ is blocked, and a green shadow 16'' is generated in the shaded portion of the right rising surface IB where the red light ■ is blocked.Recessed portion 1 Since both the green light 〇 and the red light ■ strike the surrounding surface, when the filter 32 provided on the front of the imaging device (not shown) is switched to allow only the green light to pass through, the image shown in Fig. 14 (b) is obtained. An image having a contrast between bright and dark as shown in FIG. 14(C) is captured, and when only red light is transmitted, an image having a contrast between light and dark as shown in FIG. 14(C) is captured.

したがって第10図〜第12図の実施例と同様な信号処
理手段と演算手段を用いてそれぞれの映像の明暗の境目
となる凹部1の左右端部A、Bの位置を検出し、幅測定
を行なうことができる。すなわち、本例では光源の左右
切換の代わりにフィルタの切換を行なえはよい。
Therefore, the positions of the left and right ends A and B of the concave portion 1, which are the boundaries between brightness and darkness of each image, are detected using the same signal processing means and calculation means as in the embodiment shown in FIGS. 10 to 12, and the width is measured. can be done. That is, in this example, it is better to switch the filter instead of switching the light source left and right.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、異なる方向からの投光により被測定部
である物体表面の凹、凸部の各立上り面の影を生じさせ
、物体表面に被測定部の左右端部を境目とする明暗のコ
ントラストを強制的に発生させた状態で撮像を行ない、
これにより得られた映像信号の段差から被測定部の幅方
向両端位置を検出して幅測定を行なう構成としたため、
被測定部と周囲の面との高さの差が小さく、表面状態が
ほぼ同等な場合でも容易に幅測定かヂき、被測定部と周
囲の面との高さの差により影響されない精度の良い測定
結果が得られる。また、撮像装置の視界内であれは被測
定部の位置がずれても差支えないので、測定装置に対す
る被測定部の位置関係か不安定な場合にも適用すること
ができる。
According to the present invention, by projecting light from different directions, shadows are created on the rising surfaces of the concave and convex portions of the object surface, which is the part to be measured, and the contrast between the left and right ends of the part to be measured is defined on the object surface. Imaging is performed with a forced contrast of
The configuration is such that the width is measured by detecting the positions of both ends in the width direction of the part to be measured from the step difference in the video signal obtained as a result.
Even if the difference in height between the part to be measured and the surrounding surfaces is small and the surface conditions are almost the same, the width can be easily measured, and the accuracy is not affected by the difference in height between the part to be measured and the surrounding surfaces. Good measurement results can be obtained. Further, since there is no problem even if the position of the part to be measured shifts within the field of view of the imaging device, it can be applied even when the positional relationship of the part to be measured with respect to the measuring device is unstable.

【図面の簡単な説明】[Brief explanation of drawings]

第1図および第2図は従来の幅測定技術の説明図、第3
図は本発明における撮像装置受光部と投光用光源と被測
定部の位置関係を示す説明図、第4図、第5図は光源を
左右順次点灯させたときの被測定部の影の発生状態を示
す説明図、第6図は撮像装置受光部の平面図、第7図〜
第9図は被測定部の他の例を示す断面図、第10図は本
発明の一実施例を示すブロック図、第11図は本実施例
における信号処理の過程を示す図表、第12図は動作説
明用フローチャート、第13図、第14図は本発明の他
の実施例における被測定部の影の発生状態を示す説明図
である。 1:被測定部 IA、IB:立上り面 A、B :幅方向両端部 7:撮像装置受光部8.9:
光源 15 、15’、 15“、 16 、16’、 16
”:影17:撮像装置 26:信号処理手段 30:演算手段 代理人弁理士 中 村純之助 9 を
Figures 1 and 2 are explanatory diagrams of conventional width measurement techniques;
The figure is an explanatory diagram showing the positional relationship between the light receiving section of the imaging device, the projecting light source, and the part to be measured in the present invention. Figures 4 and 5 show the occurrence of shadows on the part to be measured when the light sources are turned on sequentially from left to right. An explanatory diagram showing the state, FIG. 6 is a plan view of the light receiving section of the imaging device, and FIGS.
FIG. 9 is a sectional view showing another example of the part to be measured, FIG. 10 is a block diagram showing an embodiment of the present invention, FIG. 11 is a chart showing the signal processing process in this embodiment, and FIG. 12 13 and 14 are flowcharts for explaining the operation, and FIGS. 13 and 14 are explanatory diagrams showing the state of occurrence of shadows of the part to be measured in other embodiments of the present invention. 1: Part to be measured IA, IB: Rising surfaces A, B: Both ends in the width direction 7: Imaging device light receiving section 8.9:
Light sources 15, 15', 15", 16, 16', 16
”: Shadow 17: Imaging device 26: Signal processing means 30: Computing means Attorney Junnosuke Nakamura 9

Claims (1)

【特許請求の範囲】[Claims] 受光部が被測定部である物体表面の凹、凸部に対向し被
測定部の幅方向と平行になるように設置された撮像装置
と、測定時に被測定部の各立上り面の影を生じさせるよ
うに被測定部に6対しそれぞれ異なる方向から投光する
光源と、前記撮像装置の出力信号の段差により被測定部
の幅方向両端位置を検出する信号処理手段と、これら2
位置間の幅寸法を算出する演算手段とを備えてなる幅測
定装置。
The imaging device is installed so that the light receiving part faces the concave and convex parts of the surface of the object to be measured and is parallel to the width direction of the object to be measured. a light source that projects light from six different directions onto the measurement target part, a signal processing means that detects the positions of both ends in the width direction of the measurement target part based on a step difference in the output signal of the imaging device;
A width measuring device comprising calculation means for calculating a width dimension between positions.
JP7306284A 1984-04-13 1984-04-13 width measuring device Pending JPS60218005A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7306284A JPS60218005A (en) 1984-04-13 1984-04-13 width measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7306284A JPS60218005A (en) 1984-04-13 1984-04-13 width measuring device

Publications (1)

Publication Number Publication Date
JPS60218005A true JPS60218005A (en) 1985-10-31

Family

ID=13507485

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7306284A Pending JPS60218005A (en) 1984-04-13 1984-04-13 width measuring device

Country Status (1)

Country Link
JP (1) JPS60218005A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009133766A (en) * 2007-11-30 2009-06-18 Kubota Matsushitadenko Exterior Works Ltd Size measuring method of building plate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009133766A (en) * 2007-11-30 2009-06-18 Kubota Matsushitadenko Exterior Works Ltd Size measuring method of building plate

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