JPS6033028A - Tracing method of bench mark in tensile test or the like - Google Patents

Tracing method of bench mark in tensile test or the like

Info

Publication number
JPS6033028A
JPS6033028A JP14334183A JP14334183A JPS6033028A JP S6033028 A JPS6033028 A JP S6033028A JP 14334183 A JP14334183 A JP 14334183A JP 14334183 A JP14334183 A JP 14334183A JP S6033028 A JPS6033028 A JP S6033028A
Authority
JP
Japan
Prior art keywords
line
test
lateral
photoelectric converters
apparent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14334183A
Other languages
Japanese (ja)
Other versions
JPH0259944B2 (en
Inventor
Kosaku Otani
大谷 耕作
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyo Seiki Seisaku-sho Ltd
Original Assignee
Toyo Seiki Seisaku-sho Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyo Seiki Seisaku-sho Ltd filed Critical Toyo Seiki Seisaku-sho Ltd
Priority to JP14334183A priority Critical patent/JPS6033028A/en
Publication of JPS6033028A publication Critical patent/JPS6033028A/en
Publication of JPH0259944B2 publication Critical patent/JPH0259944B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02Details
    • G01N3/06Special adaptations of indicating or recording means
    • G01N3/068Special adaptations of indicating or recording means with optical indicating or recording means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/06Indicating or recording means; Sensing means
    • G01N2203/0641Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
    • G01N2203/0647Image analysis

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

PURPOSE:To take a measurement easily with high precision without moving a test-piece intentionally for its position correction by making apparent corrections of the lateral and longitudinal shifts in chucking position of the test-piece given a bench mark. CONSTITUTION:For example, upper bench marks 2 of the test-piece 1 made of rubber, synthetic resin, etc., given lateral lines are irradiated with light L1 through the condenser lens system in a tracing device 12 and its reflected light L10 is guided to a photodetection block 34 through the condenser lens system 31. The photodetection block 34 includes photoelectric converters A and B consist ing of optical fibers 35 and photodetecting elements 36 in combination laterally and photoelectric converters C and D longitudinally, and they are exposed to lateral and longitudinal reflected light beams from the upper bench marks 2. Then a differential amplifier 37 detects the difference between the output signals of the photoelectric converters A and B, and a servomotor 33 is so operated as to eliminate the difference for lateral apparent corrections; and lateral apparent corrections are made on the basis of the output signals of the photoelectric converters C and D.

Description

【発明の詳細な説明】 本発明は標線を附したゴム、合成樹脂等の試験片の引張
試験に際し、該試験片のチャッキングの位置か横方向及
び縦方向にずれてもみかけ上補正し、試験後の標線の中
心位置を常に正確に捕捉し、高精度の測定を行うことが
出来るように成した引張試験等に於妙る標線追跡方法に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention corrects the apparent deviation of the chucking position of the test piece in the horizontal and vertical directions when performing a tensile test on a marked test piece of rubber, synthetic resin, etc. This invention relates to a method for tracking a marked line in tensile tests, etc., which allows the center position of the marked line to be accurately captured at all times after the test and enables highly accurate measurements.

以下に図示の実施例に基きその内容について説明する。The contents will be explained below based on the illustrated embodiment.

第1図には標線追跡装置の全体概略図を示してあ)、l
はゴム、合成樹脂等から成る試験片で適宜位置に所定距
離tをもって上部標線2及び下部標線3を布置しである
Figure 1 shows an overall schematic diagram of the marking line tracking device.
The upper gauge line 2 and the lower gauge line 3 are placed at appropriate positions with a predetermined distance t between test pieces made of rubber, synthetic resin, etc.

4は上部クランプで試験片1の上側部5を挟持している
。この上部り2ンプ4はロードセル6に取シ付けてア)
、固定側クランプでもある。
Reference numeral 4 is an upper clamp that clamps the upper side portion 5 of the test piece 1. This upper 2 pump 4 is attached to the load cell 6 a)
, also a fixed side clamp.

7は下部クランプで試験片lの下側部8を挟持してお)
、この下部クランプ7は線杆9にょシ矢標T方向に移行
せしめられる移動側クランプでもある。
7 holds the lower part 8 of the test piece l with the lower clamp)
, this lower clamp 7 is also a movable side clamp that is moved in the direction of the arrow T from the wire rod 9.

10は螺杵9と連繋したギヤヘッドでモーター11によ
シ作動し該螺杵9を矢標T方向に移行せしめて試験片工
の引張シ試験を行うものでおる。
Reference numeral 10 denotes a gear head connected to a screw punch 9, which is operated by a motor 11 to move the screw punch 9 in the direction of arrow T to perform a tensile test on the specimen.

12は上部標線追跡装置で螺杵13に装着してアシ該線
杆13の回転によシ上下方向に移動すべくなしてるる。
Reference numeral 12 denotes an upper marking line tracking device which is attached to a screw punch 13 and is configured to move vertically as the screw rod 13 rotates.

14は下部標線追跡装置で螺杵15に装着してあ多核線
杆15の回転により上下方向に移動すべくなしである。
Reference numeral 14 denotes a lower marking line tracking device which is attached to a screw punch 15 and is to be moved in the vertical direction by the rotation of the multi-nucleated rod 15.

16は螺杵13を回転せしめるためのモーターでモータ
ー制御器エフにコントロールされて回転方向及び回転量
が決められるものである。
Reference numeral 16 denotes a motor for rotating the screw punch 13, and is controlled by a motor controller F to determine the direction and amount of rotation.

18は螺杵15を回転せしめるためのモーターでモータ
ー制御器19にコントロールされて回転方向及び回転量
が決められるものである。
Reference numeral 18 is a motor for rotating the screw punch 15, and is controlled by a motor controller 19 to determine the direction and amount of rotation.

20はエンコーダで螺杵13に装着してあシ、該螺杵1
3の移動管検出し、結果的に試験片1の上部標線2の移
動を検出するものである。
20 is an encoder attached to the screw punch 13, and the screw punch 1
3 is detected, and as a result, the movement of the upper marking line 2 of the test piece 1 is detected.

21はエンコーダで螺杵15に装着してあシ、該螺杵1
5の移動を検出し、結果的に試験片1の下部標線3の移
動を検出するものである。
21 is an encoder attached to the screw punch 15, and the screw punch 1
5 is detected, and as a result, the movement of the lower marked line 3 of the test piece 1 is detected.

前記、上部標線追跡装置12及び下部標線追跡装置14
からは夫々照射光Ll及びL2がスポット状に上部標線
2及び下部標線3に向けて照射され、その反射光Lso
XLzoを受光ずべく成しである。
The upper mark line tracking device 12 and the lower mark line tracking device 14
The irradiation lights Ll and L2 are irradiated in spots toward the upper marked line 2 and the lower marked line 3, respectively, and the reflected light Lso
It is designed to receive XLzo.

反射光LIOを受光した上部標線追跡装置12は光電変
換してその電気信号P+を差動増幅器22に入力すべく
成しである。
The upper marking line tracking device 12 that receives the reflected light LIO is configured to photoelectrically convert the reflected light LIO and input the electrical signal P+ to the differential amplifier 22.

又反射光L20を受光した下部標線追跡装置14は元!
変換してその電気信号P2を差動増幅器23に入力すべ
く成しである。
Also, the lower marking line tracking device 14 that received the reflected light L20 is the original!
This is done to convert the electrical signal P2 and input it to the differential amplifier 23.

24aマイクロコンピュータ−装置でエンコーダー(2
0、21>からの信号を妬ポート24Aで受けて試験片
lの伸びを算出し、表示器25にデジタル又はアナログ
表示をする。26及び27はオア回路でマイクロコンピ
ュータ−装置24の稙ポート24Aを通して初期条件信
号と差動増幅器22及び23からの信号を夫々入力すべ
く成してアシ、上部標線追跡装置12及び下部標線追跡
装置14を上部標線2及び下部標線3の移動に従って追
跡すべく成しである。
24a Microcomputer-device encoder (2
0, 21> is received at the cable port 24A, the elongation of the test piece l is calculated, and the elongation is displayed on the display 25 in digital or analog form. 26 and 27 are OR circuits configured to input the initial condition signal and the signals from the differential amplifiers 22 and 23, respectively, through the base port 24A of the microcomputer device 24. The tracking device 14 is configured to track the movement of the upper marked line 2 and the lower marked line 3.

28はCPUである。28 is a CPU.

而して、第1図に示した標線追跡装置に於いては、試験
片1の上部標線2及び下部標線3を常に捕捉すべく上部
標線追跡装置12及び下部標線追跡装置14が夫々上下
方向に移動するものである。
In the marked line tracking device shown in FIG. move in the vertical direction, respectively.

次に試験片1の標線間隔を測定する以前の位置の設定に
ついて説明する。
Next, the setting of the position before measuring the gauge line interval of the test piece 1 will be explained.

試験片1を上部クランプ4及び下部クランプ7により挟
持した後、上部標線追跡装置12からの照射光L1をス
ポット状にして試験片1に於ける上部標線2の近傍位置
例へばPI (第2図示)に照射しておく。
After the test piece 1 is clamped between the upper clamp 4 and the lower clamp 7, the irradiation light L1 from the upper mark line tracking device 12 is applied to a spot in the vicinity of the upper mark line 2 on the test piece 1. (as shown in the figure).

又、下部標線追跡装置14からの照射光L2をスポット
状にして下部標線3の近傍位置例へdQlに照射してお
く。尚上部標線追跡装置12と下部標線追跡装置14の
光学系は同じである。
Further, the irradiation light L2 from the lower marked line tracking device 14 is made into a spot shape and is irradiated to an example of a position near the lower marked line 3 at dQl. The optical systems of the upper marker line tracking device 12 and the lower marker line tracking device 14 are the same.

而して、CPU28からの初期条件指令によシ稙ボー)
 24 A、オア回路(26,27)、モーター制御器
(17,19)、モーター(18,18)、螺杵(1B
、15)が作動し上部標線追跡装置12下部標線追跡装
置14が夫々標!(2,8)を追跡すべく移動し照射光
L1を点P2上にスポットせしめ又照射光L2は点Qz
上にスポットせしめるものである。
Then, according to the initial condition command from the CPU 28,
24 A, OR circuit (26, 27), motor controller (17, 19), motor (18, 18), screw punch (1B
, 15) are activated, and the upper mark line tracking device 12 and the lower mark line tracking device 14 are respectively marked! (2, 8) and spots the irradiated light L1 on the point P2, and the irradiated light L2 spots the point Qz
It is a spot on the top.

試験片の横方向のみかり補正について。(第3図乃至第
11図) 29は上部標線追跡装置12内に設けた集光レンズ系で
光源80からの光を照射光L1としてスポット状に上部
標線2に照射せしめである。
About correction of the lateral visibility of the test piece. (FIGS. 3 to 11) Reference numeral 29 denotes a condensing lens system provided in the upper marked line tracing device 12, which irradiates the upper marked line 2 with light from the light source 80 in the form of a spot as irradiation light L1.

(第2図上R厘で示す環状部) 3工は反射光Lsoを集光するレンズ系で反射鏡82の
前方に配置しである。受光ブロック34には上部標線2
の像が写るようになっている。
(An annular portion indicated by R in the upper part of FIG. 2) The third element is a lens system that condenses the reflected light Lso and is disposed in front of the reflecting mirror 82. The light receiving block 34 has an upper marking line 2.
The image is now visible.

この反射鏡32はサーボモーター33によシ適宜偏角回
動せしめられるように成しである。
This reflecting mirror 32 is configured to be rotated by a servo motor 33 as appropriate.

34は反射鏡32による反射光を受光するために適宜配
置した受光ブロックで金属製の枠体内に受光部としての
光ファイバー35と受光素子36とを組み合わせた光電
変換器A及びBを横方向に配設しである。(第6図参照
)又受光部として他の受光器を採用してもよい。
Reference numeral 34 denotes a light receiving block appropriately arranged to receive the light reflected by the reflecting mirror 32, and photoelectric converters A and B, which are a combination of an optical fiber 35 as a light receiving part and a light receiving element 36, are arranged laterally within a metal frame. It is set up. (See FIG. 6) Also, other light receivers may be employed as the light receiver.

而して、上部標線2の横方向の反射光を捕捉することが
出来る。
Thus, it is possible to capture the reflected light in the lateral direction of the upper gauge line 2.

光電変換器A及びBと同様の光電変換器C及びDは縦方
向に配設してあり、上部標線2の縦方向の反射光を捕捉
するものでおる。
Photoelectric converters C and D, which are similar to photoelectric converters A and B, are arranged in the vertical direction and capture the reflected light of the upper gauge line 2 in the vertical direction.

37は差動増幅器で光電変換器A及びBの出力信号の差
を検出しその差が零になるようにサーボモーター33を
作動し反射鏡32を偏角回動すべく成しである。
A differential amplifier 37 detects the difference between the output signals of the photoelectric converters A and B, and operates the servo motor 33 to rotate the reflecting mirror 32 by an angle of deviation so that the difference becomes zero.

尚、下部標線追跡装置14も上部標線追跡装置12と同
様の構成であって同様に作動するので説明は省略した。
Note that the lower marked line tracking device 14 has the same configuration as the upper marked line tracking device 12 and operates in the same manner, so a description thereof will be omitted.

次に上部標線2の横方向のみかけ補正の作動態様につい
て説明する。
Next, the operation mode of the horizontal direction correction of the upper gauge line 2 will be explained.

サーボモーター33、反#鏡32を介して光電変換器A
及びBに等しい光量が入射するように各機器が作動して
停止する。(第9図参照)而I7て、試験片1が矢標F
方向にずれてbても見かけ上試験片1が真ん中に正しく
チャッキングされたこととなシ横方向の見かけ補正が成
される。
Photoelectric converter A via servo motor 33 and mirror 32
Each device operates and stops so that the amount of light equal to and B is incident. (See Figure 9) Then, test piece 1 is at arrow F.
Even if the test specimen 1 deviates in the direction b, it appears that the test piece 1 is correctly chucked in the center, and the apparent correction in the lateral direction is performed.

尚、下部標a3の見かけ補正は上部標M2の見かけ補正
と同じなので説明は省略する。
Note that the apparent correction of the lower mark a3 is the same as the apparent correction of the upper mark M2, so a description thereof will be omitted.

◎試験片の縦方向のみかけ補正について。(第12図乃
至第17図) 方向にM積装置しである。(第7図参照)これら光電変
換器C及び光電変換器りも上部標線追跡装置12と下部
標線追跡装置14とに夫々設けてあり同じ構成であるの
で上Bl(Q線追跡装置12を例にとって説明する。
◎About the vertical appearance correction of the test piece. (FIGS. 12 to 17) The M stacking device is in the direction. (See FIG. 7) These photoelectric converters C and photoelectric converters are also provided in the upper marker line tracking device 12 and the lower marker line tracking device 14, respectively, and have the same configuration. Let me explain using an example.

而してこの光電変換器C及び光電変換器りは上部標線2
の縦方向の反射光を捕捉することが出来る。
Therefore, this photoelectric converter C and the photoelectric converter 2 are
It is possible to capture the reflected light in the vertical direction.

この上部標線2の縦方向のみかけ補正の作動態様は下記
の如くである。
The operating mode of the vertical direction appearance correction of the upper gauge line 2 is as follows.

今、試験片1を矢標G方向(第13図参照)にずれて上
部クランプ5と下部クランプ7との間に挟持したとする
Now, assume that the test piece 1 is shifted in the direction of arrow G (see FIG. 13) and is held between the upper clamp 5 and the lower clamp 7.

然る時、上部標線2の反射光LtOは反射鏡32によシ
反射されて受光ブロック34の光電変換器Cに入射せし
められる。(第7図、第12図、第16図、第17図参
照) 従って、光電変換器Cと光電変換器りとの間に出力信号
の不平衡が生じる。この生じた光電変換器CとDの信号
を差動増幅器22を介してオア回路27(OR回路)に
入力しその差を零にすべくモーター制御器17、モータ
ー16、螺杵13を介して上部標線追跡装置12を移動
せしめ、光電変換器Cと光電変換器りとに等しい光量が
入射するように成して停止する。(第14図、第15図
参照) 従って、見かけ上試験片1が真ん中に正しくチャッキン
グされたこととなシ上部標線2の縦方向の見かけ補正が
なされる。
At that time, the reflected light LtO from the upper marker line 2 is reflected by the reflecting mirror 32 and is made to enter the photoelectric converter C of the light receiving block 34. (See FIGS. 7, 12, 16, and 17) Therefore, an imbalance of output signals occurs between the photoelectric converter C and the photoelectric converter C. The generated signals from the photoelectric converters C and D are inputted to an OR circuit 27 (OR circuit) via a differential amplifier 22, and are inputted via a motor controller 17, a motor 16, and a screwdriver 13 in order to make the difference zero. The upper marker tracking device 12 is moved so that the same amount of light is incident on the photoelectric converters C and 2, and then stopped. (See FIGS. 14 and 15) Therefore, it appears that the test piece 1 is correctly chucked in the middle, and the vertical direction of the top gauge line 2 is corrected.

又、試該片1が矢徐f1方向(g13図参照)にずれて
チャッキングされた時は下部標線2の反射光LIOは反
射鏡32を介して受光ブロック34に於ける光電変換器
DIliIに入射せしめら牡る。(第7図、第16図、
第17図参照)従って、この場合も前記同様に作動し上
部伸線追跡装置12を移動せしめ、光電変換器Cと光t
K換器りとに等しい光電が入射するように成して停止す
る。(第14図、第1b図参照)この状態においては、
上部像線2の織方向の見かけ補正がなされたこととなる
Furthermore, when the sample piece 1 is chucked with a shift in the arrow f1 direction (see figure g13), the reflected light LIO from the lower marking line 2 is transmitted to the photoelectric converter DIliI in the light receiving block 34 via the reflecting mirror 32. Let it enter into the sky. (Figure 7, Figure 16,
(See FIG. 17) Therefore, in this case as well, it operates in the same manner as described above, moves the upper wire drawing tracking device 12, and connects the photoelectric converter C and the light t.
The K exchanger stops after a photoelectric current equal to that of the K converter is incident. (See Figures 14 and 1b) In this state,
This means that the apparent correction of the weaving direction of the upper image line 2 has been made.

尚、下部標線3の緩方向の補正に1カしては下部標蕨追
跡装N14が上部g、線追跡装置12と同様な作動をす
るので、その説明は省略した。
Incidentally, in order to correct the lower marker line 3 in the gentle direction, the lower marker bracken tracking device N14 operates in the same way as the upper marker g and the line tracking device 12, so a description thereof will be omitted.

次に叙上の構成より成る不発(力の全体の作用について
説明する。
Next, we will explain the overall action of the unexploded force consisting of the above structure.

第18図に示す如き上部標線2及び下部標線3を有する
試験片1を上部クランプ4と下部クランプ7との間に挟
持する。
A test piece 1 having an upper marked line 2 and a lower marked line 3 as shown in FIG. 18 is held between an upper clamp 4 and a lower clamp 7.

然る時、上部標線追跡装置12は上部標線2の横方向及
び縦方向の見かけ補正全光電変換器(A 、 B ) 
(C、D )で行う如く作動する一方下部標線追跡装置
1,4も下部標線3の横方向及び縦方向の見かけ補正を
光電変讃器(A、B)(C,D)で行う。
At that time, the upper gauge line tracking device 12 performs apparent correction in the horizontal and vertical directions of the upper gauge line 2 with full photoelectric converters (A, B).
(C, D), while the lower marking line tracking devices 1 and 4 also perform horizontal and vertical apparent correction of the lower marking line 3 using photoelectric transducers (A, B) (C, D). .

而して、上部標線2及び下部標線3は夫々みかけ補正さ
れたこととなる。このような見かけ補正は引張試験中で
も常に行われておシ、常にマーク像(上部標線2、下部
標線3)は光ファイバー35の中心に結像されるもので
ある。
Thus, the upper marked line 2 and the lower marked line 3 are each subjected to apparent correction. Such apparent correction is always performed even during the tensile test, and the mark image (upper marked line 2, lower marked line 3) is always focused on the center of the optical fiber 35.

このように試験片1の横方向位置及び縦方向位置のみか
け補正が終了した後、モーター11、ギヤヘッド10、
線杆9、下部クラングア等を介して試験片1を矢標T方
向に引っ張ると第19図に示す如く試験片1は伸長され
て変形し上部標線2及び下部標線3間の距離はt+Δ1
 = 11となると同時に上部標線2及び下部標線8の
形も変形せしめられる。(第21図参照)この上部標線
2と下部標線8との伸張距離11は上部標線追跡装置1
2と下部標線追跡装置14とによシ測定され表示器26
に表示される。
After completing the apparent correction of the horizontal and vertical positions of the test piece 1, the motor 11, gear head 10,
When the test piece 1 is pulled in the direction of the arrow T through the wire rod 9, the lower crane, etc., the test piece 1 is elongated and deformed as shown in FIG. 19, and the distance between the upper marked line 2 and the lower marked line 3 becomes t+Δ1.
= 11, and at the same time, the shapes of the upper marked line 2 and the lower marked line 8 are also deformed. (See Figure 21) The extension distance 11 between the upper gauge line 2 and the lower gauge line 8 is the upper gauge line tracking device 1.
2 and the lower marking line tracking device 14 and the indicator 26
will be displayed.

この上部標線2及び下部標線3の変形態様が、第21図
に示す如く常にその位置を自動補正され適確に光ファイ
バー35の中心位置にマーク像を結びながら引っ張られ
る。
The deformation of the upper marked line 2 and the lower marked line 3 is always automatically corrected as shown in FIG. 21, and the mark image is accurately connected to the center position of the optical fiber 35 as it is pulled.

従って、マーク像の変形形状に左右されずに常に引張シ
方向(縦方向の成分)の中心位M(1/位置)を捕捉す
るため、正しい標線間距離を測定することが出来る。
Therefore, since the center position M (1/position) in the tensile direction (vertical direction component) is always captured regardless of the deformed shape of the mark image, it is possible to measure the correct distance between the gauge lines.

而して、本発明は叙上の如き構成及び作用を有するもの
であり、特に試験片に於ける標線の横方向及び縦方向の
ずれをみかけ補正したので試験片をわざわざ動かしてそ
の位置補正をする必要なく簡単に精度の高い測定を行う
ことが出来る。
Therefore, the present invention has the above-mentioned configuration and operation, and in particular, since the apparent deviation of the marking line on the test piece in the horizontal and vertical directions is corrected, it is necessary to move the test piece to correct its position. It is possible to easily perform highly accurate measurements without the need for

又受光ブロック内に光ファイバー等の受光部を十字状に
配設したので横方向及び縦方向の変位成分を高精度をも
って検出できるものである。
Furthermore, since light receiving sections such as optical fibers are arranged in a cross shape within the light receiving block, displacement components in the horizontal and vertical directions can be detected with high precision.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の全体の概略説明図、第2図は同じく試
験片の要部の正面図、第3図は上部標線追跡装置と上部
標線との関係を示す平面図で試験片が横方向にずれ動い
た場合を示しである。第4図は試験片の横方向へのずれ
動きを説明するための図、第5図は受光ブロックの正面
図、第6図は受光ブロックの横断平面図、第7図は受光
ブロックの縦断側面図、第8図は反射鏡と光電変換器(
A、B)との関係を示す説明図、第9図乃至第11図は
受光ブロックに於ける光電変換器(A、B)と入党状態
を示す正面図、第12図は上部標線追跡装置と上部標線
との関係を示す平面図で試験片が縦方向にずれ動いた場
合を示しである。第18図は試験片の縦方向のずれ動き
を説明するだめの図、第14図は第15図の拡大正面図
、第15図乃至第16図線受光ブロックに於ける光電変
換器(C,D)と入党状態を示す正面図、第17図は縦
方向のマーク像を映す反射鏡と光電変換器(C,D)を
有する受光ブロックとの関係を示す斜視図、第18図は
引っ張シ試験前の試験片の正面図、第19図は引っ張シ
試験後の試験片の正面図である。第20図は引っ張り試
験前の上部標線による反射光が光電変換器(A、B)(
C,D)に等しく入光している状態を示す正面図、第2
1図は引っ張シ試験中の上部標線による反射光が光電変
換器(A、B)(C,D)に等しく入光している状態を
示す正面図である。 1−・試験片 2・・・土部標線 12・・・土部標線追跡装置 14・・・下部標線追跡装置 34・・・受光ブロック A、B、C,D・・・光電変換器
FIG. 1 is an overall schematic explanatory diagram of the present invention, FIG. 2 is a front view of the main parts of the test piece, and FIG. 3 is a plan view showing the relationship between the upper gauge line tracking device and the upper gauge line of the test piece. The figure shows the case where the axis shifts in the lateral direction. Fig. 4 is a diagram for explaining the displacement movement of the test piece in the lateral direction, Fig. 5 is a front view of the light receiving block, Fig. 6 is a cross-sectional plan view of the light receiving block, and Fig. 7 is a vertical cross-sectional side view of the light receiving block. Figure 8 shows the reflector and photoelectric converter (
A, B) are explanatory diagrams showing the relationship between the two, Figures 9 to 11 are front views showing the photoelectric converters (A, B) in the light receiving block and the joining state, and Figure 12 is the upper marking line tracking device. This is a plan view showing the relationship between the test piece and the upper gauge line, and shows the case where the test piece shifts in the vertical direction. FIG. 18 is a diagram for explaining the vertical displacement movement of the test piece, FIG. 14 is an enlarged front view of FIG. 15, and FIGS. 15 and 16 show the photoelectric converter (C, D) is a front view showing the joining state, FIG. 17 is a perspective view showing the relationship between a reflecting mirror that reflects a mark image in the vertical direction and a light receiving block having photoelectric converters (C, D), and FIG. 18 is a front view showing the joining state. FIG. 19 is a front view of the test piece before the test, and FIG. 19 is a front view of the test piece after the tensile strength test. Figure 20 shows that the light reflected by the upper gauge line before the tensile test is reflected from the photoelectric converters (A, B) (
Front view showing the state where light is equally incident on C and D), 2nd
FIG. 1 is a front view showing a state in which the reflected light from the upper marking line during a tensile test is equally incident on the photoelectric converters (A, B) (C, D). 1-・Test piece 2... Dobe mark line 12... Dobe mark line tracking device 14... Lower mark line tracking device 34... Light receiving blocks A, B, C, D... Photoelectric conversion vessel

Claims (1)

【特許請求の範囲】 (1)標線を附した試験片の横方向のチャッキングずれ
を見かけ補正する段階と、該試験片の縦方向のチャッキ
ングずれを見かけ補正する段階と、前記両方の見かけ補
正を行いながら引つ張シ試験を行う段階とから成る引張
試験等に於ける標線追跡方法 C) 標線を附した試験片の横方向のチャッキングずれ
を見かけ補正する段階と該試験片の縦方向のチャッキン
グずれを見かけ補正する段階とを、受光ブロック内に十
字状に配設した受光部によシ行い、前記両方の見かけ補
正を行いながら引つ張シ試験を行う段階とから成る引張
試験等に於ける標線追跡方法 (3) 特許請求の範囲第1項の記載に於いて、横方向
及び縦方向の見かけ補正を上部標線と下部標線とで夫々
独立して各々行うようにした引張試験等に於ける標線追
跡方法
[Scope of Claims] (1) A step of apparently correcting the chucking deviation in the horizontal direction of the specimen with marked lines; a step of apparently correcting the chucking deviation in the vertical direction of the specimen; A method for tracking marked lines in tensile tests, etc., consisting of a step of performing a tensile test while performing apparent correction C) A step of apparently correcting the chucking deviation in the lateral direction of a specimen with marked lines attached, and the test. A step of apparently correcting the longitudinal chucking deviation of the piece using a light receiving section arranged in a cross shape within the light receiving block, and a step of performing a tension test while performing both of the above apparent corrections. Mark tracing method in tensile tests, etc. (3) In the statement of claim 1, the apparent correction in the horizontal and vertical directions is performed independently for the upper marked line and the lower marked line. Method for tracking marked lines in tensile tests, etc.
JP14334183A 1983-08-04 1983-08-04 Tracing method of bench mark in tensile test or the like Granted JPS6033028A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14334183A JPS6033028A (en) 1983-08-04 1983-08-04 Tracing method of bench mark in tensile test or the like

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14334183A JPS6033028A (en) 1983-08-04 1983-08-04 Tracing method of bench mark in tensile test or the like

Publications (2)

Publication Number Publication Date
JPS6033028A true JPS6033028A (en) 1985-02-20
JPH0259944B2 JPH0259944B2 (en) 1990-12-13

Family

ID=15336531

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14334183A Granted JPS6033028A (en) 1983-08-04 1983-08-04 Tracing method of bench mark in tensile test or the like

Country Status (1)

Country Link
JP (1) JPS6033028A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61269008A (en) * 1985-05-23 1986-11-28 Shimadzu Corp Elongation-measuring apparatus for test piece
JPS63135841A (en) * 1986-11-27 1988-06-08 Toyo Seiki Seisakusho:Kk Marked line tracking of colored sample for tension test and sample

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5213436A (en) * 1975-07-24 1977-02-01 Toppan Printing Co Ltd Production method for metal mesh plate
JPS57184948A (en) * 1981-05-11 1982-11-13 Yokohama Rubber Co Ltd:The Creep testing device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5213436A (en) * 1975-07-24 1977-02-01 Toppan Printing Co Ltd Production method for metal mesh plate
JPS57184948A (en) * 1981-05-11 1982-11-13 Yokohama Rubber Co Ltd:The Creep testing device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61269008A (en) * 1985-05-23 1986-11-28 Shimadzu Corp Elongation-measuring apparatus for test piece
JPS63135841A (en) * 1986-11-27 1988-06-08 Toyo Seiki Seisakusho:Kk Marked line tracking of colored sample for tension test and sample

Also Published As

Publication number Publication date
JPH0259944B2 (en) 1990-12-13

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