JPS6033679A - モ−メント算出回路 - Google Patents

モ−メント算出回路

Info

Publication number: JPS6033679A
Authority: JP; Japan
Prior art keywords: moment; point; trace; closed loop; area
Prior art date: 1983-08-04
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

JP58142926A

Other languages

English (en)

Japanese (ja)

Other versions

JPH0571992B2 (da

Inventor

Joji Tajima

田島　讓二

Tomoki Shiyudo

首藤　友喜

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

NEC Corp

Original Assignee

NEC Corp

Nippon Electric Co Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1983-08-04

Filing date

1983-08-04

Publication date

1985-02-21

1983-08-04 Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp

1983-08-04 Priority to JP58142926A priority Critical patent/JPS6033679A/ja

1985-02-21 Publication of JPS6033679A publication Critical patent/JPS6033679A/ja

1993-10-08 Publication of JPH0571992B2 publication Critical patent/JPH0571992B2/ja

Status Granted legal-status Critical Current

Links

230000001186 cumulative effect Effects 0.000 claims abstract description 18
238000009825 accumulation Methods 0.000 claims description 5
230000010354 integration Effects 0.000 abstract description 6
238000001514 detection method Methods 0.000 description 7
230000035508 accumulation Effects 0.000 description 4
238000010586 diagram Methods 0.000 description 4
230000010365 information processing Effects 0.000 description 4
230000005484 gravity Effects 0.000 description 3
238000007796 conventional method Methods 0.000 description 1
230000004044 response Effects 0.000 description 1

Landscapes

Image Analysis (AREA)

JP58142926A 1983-08-04 1983-08-04 モ−メント算出回路 Granted JPS6033679A (ja)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP58142926A JPS6033679A (ja)	1983-08-04	1983-08-04	モ−メント算出回路

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP58142926A JPS6033679A (ja)	1983-08-04	1983-08-04	モ−メント算出回路

Publications (2)

Publication Number	Publication Date
JPS6033679A true JPS6033679A (ja)	1985-02-21
JPH0571992B2 JPH0571992B2 (da)	1993-10-08

Family

ID=15326843

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP58142926A Granted JPS6033679A (ja)	1983-08-04	1983-08-04	モ−メント算出回路

Country Status (1)

Country	Link
JP (1)	JPS6033679A (da)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2008181124A (ja) *	2007-01-10	2008-08-07	Applied Materials Israel Ltd	マスクの評価すべきパターンを評価するための方法及びシステム
JP2014511608A (ja) *	2011-02-25	2014-05-15	フラウンホッファー−ゲゼルシャフトツァフェルダールングデァアンゲヴァンテンフォアシュンクエー．ファオ	対象物のモデル変換に基づくモデルパラメータの決定

Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS587512A (ja) *	1981-07-07	1983-01-17	Nec Corp	面積算出回路

1983
- 1983-08-04 JP JP58142926A patent/JPS6033679A/ja active Granted

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS587512A (ja) *	1981-07-07	1983-01-17	Nec Corp	面積算出回路

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2008181124A (ja) *	2007-01-10	2008-08-07	Applied Materials Israel Ltd	マスクの評価すべきパターンを評価するための方法及びシステム
JP2014511608A (ja) *	2011-02-25	2014-05-15	フラウンホッファー−ゲゼルシャフトツァフェルダールングデァアンゲヴァンテンフォアシュンクエー．ファオ	対象物のモデル変換に基づくモデルパラメータの決定

Also Published As

Publication number	Publication date
JPH0571992B2 (da)	1993-10-08

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