JPS6036660A - Plasma CVD equipment - Google Patents
Plasma CVD equipmentInfo
- Publication number
- JPS6036660A JPS6036660A JP58143778A JP14377883A JPS6036660A JP S6036660 A JPS6036660 A JP S6036660A JP 58143778 A JP58143778 A JP 58143778A JP 14377883 A JP14377883 A JP 14377883A JP S6036660 A JPS6036660 A JP S6036660A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- discharge
- cathode electrode
- film
- drum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Plasma & Fusion (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Light Receiving Elements (AREA)
- Photoreceptors In Electrophotography (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、所謂プラズマ0VT)装置に関し、殊に、円
筒状基体表面にアモルファスシリコン膜を堆積させ、感
光体ドラムを生産すること等に好適に使用できるプラズ
マ0VD装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a so-called plasma 0VT) device, and in particular to a plasma 0VD device that can be suitably used for depositing an amorphous silicon film on the surface of a cylindrical substrate and producing photoreceptor drums. .
従来、プラズマ0VA)を用いた電子′Lf真用応用感
光ドラム造装面として提案されているものは、大別して
、誘導結合型と容[U結合型とに分目られる。Conventionally, the photosensitive drum constructions that have been proposed for electronic Lf applications using plasma (0VA) can be roughly divided into inductively coupled types and U-coupled types.
前者は、ドラム基体を取り囲むようにしてコイルを配置
し、該コイルに高周波電力をフィードし、電磁エネルギ
ーで原料ガス(気体)をプラズマ化し、前記基体−1−
に膜を形成するものであるが、コイルの径、間隔等のず
れやコイルの定在波に起因する放電ムラが発生し易く、
形成された膜は厚さや電気特性が不均一となる。In the former method, a coil is arranged to surround the drum base, high-frequency power is fed to the coil, and the raw material gas (gas) is turned into plasma by electromagnetic energy.
However, uneven discharge is likely to occur due to deviations in coil diameter, spacing, etc. and standing waves in the coil.
The formed film has non-uniform thickness and electrical properties.
一方、後者のタイプは、外部電極でもある円筒型の堆積
槽内の内部に内部電極としてドラム基体そのものを用い
た二重同軸円筒電極を使用し、両円筒電極間にガスを流
しながら、両電極間に直流若しくは交流の電界を印加し
、この際のグロー放電によってガスプラズマを形成させ
、堆積膜をドラム基体I―に形成さけるものである。On the other hand, the latter type uses double coaxial cylindrical electrodes using the drum base itself as the internal electrode inside a cylindrical deposition tank that also serves as the external electrode. A direct current or alternating current electric field is applied between the drums, gas plasma is formed by glow discharge at this time, and a deposited film is formed on the drum base I-.
このようtI″従来型の円筒状プラズマCVD装置σ)
代表的な一例の概略を第1図に示す。第1図中、■は真
空チャンバーを構成している円筒状のカソード電極、2
は該真空チャンバーの中心軸の周りに回転するようにこ
れと同心に配置された対向電極たるアノード電極を構成
している円筒状の基体、8は前記真空チャンバーの上下
の壁体、1(は該壁体を前記カソード電極から絶縁する
だめのドーナツ形の絶縁ガイシ、5は高周波電源、6は
原料ガス供給パイプ、7は刊気系、8はヒーター、9は
−1−記の円筒状の基体を回転させる回転機構、10は
アース、11は原料ガス放出穴を示す。In this way, the conventional cylindrical plasma CVD device σ)
An outline of a typical example is shown in FIG. In Figure 1, ■ is the cylindrical cathode electrode that constitutes the vacuum chamber, and 2
8 is a cylindrical base constituting an anode electrode which is a counter electrode arranged concentrically with the central axis of the vacuum chamber so as to rotate around the central axis; 8 is a top and bottom wall of the vacuum chamber; A donut-shaped insulating insulator for insulating the wall body from the cathode electrode, 5 a high-frequency power source, 6 a raw material gas supply pipe, 7 a ventilation system, 8 a heater, and 9 a cylindrical insulator as indicated in -1-. A rotation mechanism for rotating the base body, 10 is a ground, and 11 is a raw material gas discharge hole.
上記のプラズマCVD装置の動作を簡i1iに以下に説
明する。The operation of the above plasma CVD apparatus will be briefly explained below.
まず、真空チャンバー内に円筒状の基体2を七ッl−1
,、JIJI気系7によって千ヤンバー内を真空にする
。同時に基体2をヒーター8によって加熱し、基体2を
回転機構9によって回転させ、基体の温度分布を均一に
する。このとき、ヒーターは固定されている。括体温度
が、−・宇に4rったら、ガス供給バイブロから原r1
ガスを真空千ヤンハー内に供給する。原料ガスは円r;
i状の電極の多数のカス放出穴から入(;体2に向G」
て放出される。真空チャンバー内にガスが安定して供給
されている状態で〆高周波電源5によりカソード電極1
に1.3.56 MT−Tzの高周波電圧を印加し、ア
ース接地された基体2との間でグロー放電を発生させ、
カソード電極から飛び出した電子のガス分子への側突に
より、ガス分子をラジカル反応させて基体−にに堆積さ
せ、基体2−1−に堆積膜、例えばアモルファスシリコ
ン膜を成膜させることができる。First, place seven cylindrical substrates 2 in a vacuum chamber.
,, Make the inside of Senyanbar a vacuum using the JIJI gas system 7. At the same time, the substrate 2 is heated by the heater 8 and rotated by the rotation mechanism 9 to make the temperature distribution of the substrate uniform. At this time, the heater is fixed. When the bulk temperature reaches -4r, the gas supply vibro to the original r1
Gas is supplied into the vacuum chamber. Raw material gas is yen r;
It enters through the many dregs discharge holes of the i-shaped electrode (; toward the body 2).
released. While gas is stably supplied into the vacuum chamber, the cathode electrode 1 is connected to the high frequency power source 5.
1.3.56 Apply a high frequency voltage of MT-Tz to generate a glow discharge between it and the grounded base 2,
The side impact of electrons ejected from the cathode electrode onto gas molecules causes the gas molecules to undergo a radical reaction and is deposited on the substrate 2-1, thereby forming a deposited film, for example, an amorphous silicon film, on the substrate 2-1-.
上記のようなプラズマCVD装置において、堆積した膜
の膜厚分布は装置の排気[1の位置や、原料カス流量、
放電時の高周波電力の大きさによる膜の堆積速度、さら
には真空度や、原料ガス放出穴の位置によって変化する
。アモルファスシリコン感光体膜の利用目的からすれば
、大面積の11を体上に広範囲な膜厚分布の均一性が要
求される。In the plasma CVD equipment described above, the film thickness distribution of the deposited film is determined by the position of the equipment exhaust [1], the raw material waste flow rate,
The film deposition rate varies depending on the magnitude of high-frequency power during discharge, the degree of vacuum, and the position of the source gas discharge hole. Considering the purpose of use of the amorphous silicon photoreceptor film, uniformity of the film thickness distribution over a wide range of the large area 11 is required.
プラズマCVD装置では、ガス流h1や、高周波電力の
大きさ、真空度等は膜特性に影響をおよぼすため、膜厚
分布を調整する手段として用いることはできない。排気
[lの位置も、装置構成−に自由に変更することは備し
い。す2rわち、膜厚分布を調整する方法としては、ガ
ス放出穴の穴径や位置を調整することが、最も容易な手
段と考えられる。In a plasma CVD apparatus, the gas flow h1, the magnitude of high-frequency power, the degree of vacuum, etc. affect the film characteristics, and therefore cannot be used as means for adjusting the film thickness distribution. It is possible to freely change the position of the exhaust gas [l] depending on the device configuration. In other words, adjusting the diameter and position of the gas release holes is considered to be the easiest method for adjusting the film thickness distribution.
一方、プラズマC■■)装置では、特定の膜特性を得る
為にガス流1Bや流速を選定する必要があり膜厚分布も
そのつど変動するために、ガス放出穴の穴径や位置は選
択の自由度が高いものであることが要求される。従来の
円筒状壁面放出型のプラズマCVD装置には、原料ガス
放出穴を不規則に多数制量(1したものや、回転軸方向
に多数列間[Iしたものがほとんどで、穴数が多過ぎる
ため、膜厚分布の均一化のために最適な穴位置を選択す
るのが難しかった。また、穴径の自由度に対してほとん
ど考慮されていなかったため、膜厚分布の調整は穴位置
の選定のみにたよっていた。このため、有効堆積範囲が
広くなるのに比例して、その膜厚分布調整が難しくなる
という欠点が有った。On the other hand, in plasma C■■) equipment, it is necessary to select the gas flow 1B and flow rate in order to obtain specific film characteristics, and the film thickness distribution also changes each time, so the hole diameter and position of the gas release hole must be selected. A high degree of freedom is required. Conventional cylindrical wall discharge type plasma CVD equipment has a large number of holes for releasing raw material gas (most of them have irregularly controlled numbers of holes), and those that have many holes spaced in multiple rows in the direction of the rotation axis. Therefore, it was difficult to select the optimal hole position to make the film thickness distribution uniform.Furthermore, since little consideration was given to the degree of freedom of the hole diameter, adjustment of the film thickness distribution was made by adjusting the hole position. Therefore, as the effective deposition range becomes wider, it becomes more difficult to adjust the film thickness distribution.
本発明は、これらの“1f実に鑑のなされたものであり
、l−、記の問題点を解決する新規4rプラズマOVD
装置を提供することを主たる目的とする。The present invention has been made in consideration of these "1F" problems, and is a novel 4R plasma OVD that solves the problems described above.
The main purpose is to provide equipment.
本発明の他の[」的は、例えば電気特性、環境安定性に
優れ、感光体全域にわたって良好な画像を提供すること
のできる電子写真感光体用の光導電膜を、低コスト、高
歩留りで製造するのに好適′1.rプラズマ0VI)装
置を提供することにある。Another object of the present invention is to provide a photoconductive film for electrophotographic photoreceptors, which has excellent electrical properties and environmental stability, and can provide good images over the entire area of the photoreceptor, at low cost and with high yield. Suitable for manufacturing'1. r plasma 0VI) device.
」二記の目的は、以下の本発明によって達成される。The second object is achieved by the present invention as follows.
真空にし得るチャンバー内に第1−の電極と第2の電極
とを具備し、前記第1−の電極と前記第2の電極との間
で放電を生じさせ、この放電により前記チャンバー内に
導入された原料気体から、必要に応じて前記チャンバー
内に設置された基体−にに堆積膜を形成させる装置に於
いて、前記第1の電極が円筒状形状であり、かつ上下作
動しうるようにしたことを特徴とするプラズマCV11
)装置。A first electrode and a second electrode are provided in a chamber that can be evacuated, an electric discharge is generated between the first electrode and the second electrode, and the electric discharge is introduced into the chamber. In the apparatus for forming a deposited film on a substrate installed in the chamber as necessary from the raw material gas, the first electrode has a cylindrical shape and can move up and down. Plasma CV11 is characterized by
)Device.
本装置においては、第1の電極が調節された速度で一上
下作動しうるようにすることが好ましく、リyには、上
下作動が連続的にできることが特に好ましい。In the present device, it is preferred that the first electrode can be moved up and down at a controlled speed, and it is especially preferred that the first electrode can be moved up and down continuously.
第1の電極は5〜22m・7分の速度で、1〜数回移動
するのが好ましい。The first electrode is preferably moved once to several times at a speed of 5 to 22 m/7 minutes.
尚、以下の説明に於いては、主として堆積層を形成する
基体を電子写真用円筒状基体(ドラlz )とした実施
例について本発明を説明するが、本発明装置は、長方形
の基体を円筒状の対向電極−1−に多角形を成すように
配置し、アモルファス感光体膜や演算素子用アモルファ
ス半導体膜を堆積する「I的にも利用することができ、
また、金型、バイト等の摩耗し易い工具等の表面に超硬
質膜を堆積することによって、耐摩耗性を向上させ、寿
命を延ばす1]的にも利用することもできる。In the following description, the present invention will mainly be explained with reference to an embodiment in which the substrate on which the deposited layer is formed is a cylindrical substrate for electrophotography (drill). It can also be used for ``I'' purposes, in which an amorphous photoreceptor film or an amorphous semiconductor film for an arithmetic element is deposited on the counter electrode -1- in the form of a polygon.
Furthermore, by depositing an ultra-hard film on the surface of tools that are prone to wear, such as molds and bits, it can be used to improve wear resistance and extend the life of tools.
第2図は、本発明に係るプラズマCVD装置の実施例を
示したものである。図中、第1図に示す装置に於ける部
分と同様の部分は同じ参照数字によって指示しである。FIG. 2 shows an embodiment of a plasma CVD apparatus according to the present invention. In the figures, similar parts to those in the apparatus shown in FIG. 1 are designated by the same reference numerals.
図中、1は上下動機構を有する円筒状のカソード電極、
2は該真空チャンバーの中心軸の周りに回転するように
これと同心に配置された円筒状のアノード電極を構成す
るJI(体、8は真空チャンバーを構成している上1・
σ)壁体、4+は該壁体を前記カソード電極から絶縁す
るためのドーナツ形の絶縁ガイシ、5は前記カソード電
極に高周波電力を供給しグロー放電を起すだめの高周波
電源、6は原料ガス供給パイプ、7は真空チャンバーを
真空に保つための排気系、8は円筒状の基体を加熱する
ためのl−一ター、9は円筒状の基体を回転させて堆積
膜の膜厚を均一にするための回転機構、10は基体を設
置するアース、l]は原料ガス放出穴、12は前記カッ
−ド電極を」−下させる駆動機構を示す。In the figure, 1 is a cylindrical cathode electrode with a vertical movement mechanism;
2 is a JI (body) constituting a cylindrical anode electrode arranged concentrically with the central axis of the vacuum chamber so as to rotate around the central axis; 8 is an upper 1.
σ) Wall body, 4+ is a donut-shaped insulating insulator for insulating the wall body from the cathode electrode, 5 is a high frequency power source for supplying high frequency power to the cathode electrode to cause glow discharge, 6 is a raw material gas supply A pipe, 7 is an exhaust system for keeping the vacuum chamber in a vacuum, 8 is a l-liter for heating the cylindrical substrate, and 9 is a rotating cylindrical substrate to make the thickness of the deposited film uniform. 10 is a ground for installing the substrate, 1 is a source gas discharge hole, and 12 is a drive mechanism for lowering the quad electrode.
次に、上記の装置の各部の動作を順を追って説明する。Next, the operation of each part of the above device will be explained in order.
まず、真空チャンバー内に円筒状の基体2をセットし、
排気系7によってチャンバー内を真空にする。一般に排
気系には、所用到達真空度と生産性との兼ね合いで、ロ
ータリーポンプ、メカニカルブースターポンプ、ディフ
ュージョンポンプまたはそれらを組み合わせたものが使
用される。チャンバー内を真空にするのと同時に基体2
をヒーター8によって加熱し、基体2をモーターに連結
された回転軸9によって通常数〜数十秒回転し、基体の
温度分布を均一にする。この時、ヒーターは固定されて
いる。また、カソード電極はあらかじめ基体の下端また
は上端に位1aさせておく、基体温度が一定になったら
、ガス供給バイブロがら原料ガスを真空チャンバー内に
供給する。原料ガスはカソード電極の内部に設けられた
ガス室1aに入り放出穴11から基体に向って放出され
る。ここでガス供給パイプは真空チャンバー内では、カ
ソード電極1の1−下動に追従できるようにフレキシブ
ルチューブになっている。また、各放出穴がら放出され
るガス量は放出口の穴径によっても制御される。真空チ
ャンバー内にガスが安定して供給されている状態で、高
周波電源5によりカソード。First, a cylindrical base 2 is set in a vacuum chamber,
The inside of the chamber is evacuated by the exhaust system 7. Generally, a rotary pump, a mechanical booster pump, a diffusion pump, or a combination thereof is used for the exhaust system, depending on the desired degree of vacuum and productivity. At the same time as vacuuming the chamber, the substrate 2
is heated by a heater 8, and the substrate 2 is rotated by a rotating shaft 9 connected to a motor, usually for several to several tens of seconds, to make the temperature distribution of the substrate uniform. At this time, the heater is fixed. Further, the cathode electrode is placed in advance at the lower end or upper end 1a of the substrate. When the temperature of the substrate becomes constant, a raw material gas is supplied into the vacuum chamber using a gas supply vibro. The raw material gas enters the gas chamber 1a provided inside the cathode electrode and is released from the release hole 11 toward the substrate. Here, the gas supply pipe is a flexible tube in the vacuum chamber so that it can follow the downward movement of the cathode electrode 1. Further, the amount of gas released from each discharge hole is also controlled by the hole diameter of the discharge port. While gas is being stably supplied into the vacuum chamber, the high frequency power source 5 is used to connect the cathode.
電極]、に高周波電圧を印加し、アース設置されたアノ
ード電極]−4(との間でグロー放電を発生させ、カソ
ード電極から飛び出した電子のガス分子への衝突により
、ガス分子をラジカル反応させて基体上に堆積させ、堆
積膜を成膜させる。カソード電極をカソード電極駆動機
構12により5〜22而/分の速度で移動させる。カソ
ード電極の移動は、必要な膜厚が得られるように1〜数
回行なう。A high-frequency voltage is applied to the anode electrode]-4 (grounded), and a glow discharge is generated between the anode electrode]-4 (grounded), and the collision of the electrons ejected from the cathode electrode with the gas molecules causes the gas molecules to undergo a radical reaction. The cathode electrode is moved at a speed of 5 to 22 min/min by the cathode electrode drive mechanism 12.The cathode electrode is moved in such a way as to obtain the required film thickness. Do this one to several times.
本発明のプラズマCVD装置においては、カソード電極
の移動速度、移動回数、原料ガス供給計等を変えること
により、大面積の基体」二に膜厚が均一な堆積膜を再現
性良く形成することができる。In the plasma CVD apparatus of the present invention, by changing the movement speed of the cathode electrode, the number of movements, the raw material gas supply meter, etc., it is possible to form a deposited film with uniform thickness on a large area substrate with good reproducibility. can.
以−Iこの本発明のプラズマCVD装置に原料ガスを導
入し、基体の温度を100℃〜850℃ に保ち13.
56MHzの高周波電源によりカソード電極に高周波電
圧を印加して成膜を行なったところ、ガスの種類を随時
種々変更しても順調なグロー放電が継続され、電子写真
用の感光体として均一性の高い成膜を低コストで歩留り
良〈実施することができた。なお、原料ガスとしては、
アモルファスシリコン成膜材料としてのシラン(SjJ
T4.5j−2T(6,513TTs 、Sl、i r
ho等)の他、ベースガスとしてのT12、希ガス、フ
ッソ導入用のSコ−F4 、pまたはn伝導の制御用の
B2■I6、■)■■3、AsTl3、窒素ドープ用の
N2 、N H3、酸素ドープ用のN20、NO1炭素
ドープ川の用化水素例えばCH4,021T4等をはじ
め、その他のプラズマCVDによってドーピング可能な
ものとして知られている各種ガスを、マスフローコント
ローラー等を用いて所定の比率で混合したものを使用す
ることができる。13. Introducing source gas into the plasma CVD apparatus of the present invention and maintaining the temperature of the substrate at 100°C to 850°C.
When a high-frequency voltage was applied to the cathode electrode using a 56 MHz high-frequency power source to form a film, smooth glow discharge continued even when the type of gas was changed at any time, making it a highly uniform photoreceptor for electrophotography. Film formation was possible at low cost and with good yield. In addition, as raw material gas,
Silane (SjJ) as an amorphous silicon film forming material
T4.5j-2T (6,513TTs, Sl, i r
ho, etc.), T12 as a base gas, rare gas, Sco-F4 for introducing fluorine, B2■I6 for controlling p or n conduction, ■)■■3, AsTl3, N2 for nitrogen doping, N H3, N20 for oxygen doping, NO1 hydrogen for carbon doping, for example, CH4,021T4, and various other gases known to be dopable by plasma CVD are controlled in a predetermined manner using a mass flow controller, etc. A mixture of the following ratios can be used.
第1図は従来型の円筒型プラズマCVT)装置の代表的
−例を示す断面図、第2図は本発明のプラズマCVD装
置の実施例を示す断面図である。
特許出願人 キャノン株式会社
11−
第 2 図FIG. 1 is a sectional view showing a typical example of a conventional cylindrical plasma CVD apparatus, and FIG. 2 is a sectional view showing an embodiment of the plasma CVD apparatus of the present invention. Patent applicant Canon Co., Ltd. 11- Figure 2
Claims (1)
2の電極とを具備し、前記第1の電極と前記第2の電極
との間で放電を生じさせ、この放電により前記チャンバ
ー内に導入された原料気体から、必要に応じて前記チャ
ンバー内に設置された基体−■−に堆積膜を形成させる
装置に於いて、前記第1の電極が円筒状形状であり、か
つ上下作動しうるようにしたことを特徴とするプラズマ
0VD装置。 2)前記第1の電極が調節された速度で−に不作動しう
るようにしたことを特徴とする特許請求の範囲第1項記
載のプラズマ0VD装置。 6、)前記第1−の電極の上下作動が連続的に行ないう
るようにしたことを特徴とする特許請求の範囲第1項又
は第2項記載のプラズマOVA’)装置。[Claims] 1) C (a chamber to be emptied 11 is provided with a first electrode and a second electrode, and a discharge is caused between the first electrode and the second electrode) , in an apparatus for forming a deposited film from the raw material gas introduced into the chamber by this discharge on a substrate installed in the chamber as necessary, the first electrode has a cylindrical shape; 2) A plasma 0VD device characterized in that the first electrode is capable of operating up and down. The plasma 0VD device according to scope 1. 6.) The plasma OVA') apparatus according to claim 1 or 2, characterized in that the first electrode can be moved up and down continuously.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58143778A JPS6036660A (en) | 1983-08-08 | 1983-08-08 | Plasma CVD equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58143778A JPS6036660A (en) | 1983-08-08 | 1983-08-08 | Plasma CVD equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6036660A true JPS6036660A (en) | 1985-02-25 |
Family
ID=15346789
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58143778A Pending JPS6036660A (en) | 1983-08-08 | 1983-08-08 | Plasma CVD equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6036660A (en) |
-
1983
- 1983-08-08 JP JP58143778A patent/JPS6036660A/en active Pending
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