JPS6040978A - Obstacle detecting apparatus - Google Patents
Obstacle detecting apparatusInfo
- Publication number
- JPS6040978A JPS6040978A JP58149867A JP14986783A JPS6040978A JP S6040978 A JPS6040978 A JP S6040978A JP 58149867 A JP58149867 A JP 58149867A JP 14986783 A JP14986783 A JP 14986783A JP S6040978 A JPS6040978 A JP S6040978A
- Authority
- JP
- Japan
- Prior art keywords
- light
- light emitting
- obstacle
- light receiving
- detecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005856 abnormality Effects 0.000 claims abstract description 13
- 238000001514 detection method Methods 0.000 claims description 16
- 230000007423 decrease Effects 0.000 claims description 5
- 238000004092 self-diagnosis Methods 0.000 abstract description 9
- 230000005855 radiation Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 8
- 230000002159 abnormal effect Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/497—Means for monitoring or calibrating
Landscapes
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Geophysics And Detection Of Objects (AREA)
- Optical Radar Systems And Details Thereof (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、自己診断機能を備えた光学式の障害物検知装
置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an optical obstacle detection device with a self-diagnosis function.
反射型の光学式障害物検知装置では、発光素子、受光素
子または処理回路の異常により、発光が起らなかったり
、反射光があっても検出できなかったり、増幅できなか
ったりする場合や、或む柚１光光部、受光部の窓のよご
れの為に発光、受光の効率が落ちた場合に、障害物があ
っても装置としては障害物なしと判断する不都合がある
。Reflective optical obstacle detection devices may not emit light, may not be able to detect reflected light, or may not be able to amplify reflected light due to an abnormality in the light emitting element, light receiving element, or processing circuit. If the light emitting and light receiving efficiency decreases due to dirt on the windows of the Muyu 1 light section and light receiving section, there is a problem in that even if there is an obstacle, the device will judge that there is no obstacle.
従来はこの様な点を回避するために、第１図に示すよう
に障害物検知装置１の前方に特定の試料２を置き、その
検知電圧が所定の範囲内であるか否かを検知して装置の
正、異常判別をしている。Conventionally, in order to avoid such problems, a specific sample 2 was placed in front of an obstacle detection device 1, as shown in Fig. 1, and it was detected whether the detected voltage was within a predetermined range. to determine whether the device is correct or abnormal.
ところが、この様な方法では特別の試料を用意しなけれ
ばならない点で不便であり、特に任意の時点で随時自己
診断を行うことかできない欠点がある。However, such a method is inconvenient in that a special sample must be prepared, and particularly has the disadvantage that self-diagnosis cannot be performed at any time.
本発明は、発光部から直接受光部へ光を入射させること
により反射型障害物検知装置の自己診断を任意の時点で
節単に行うことかできるようにするものである。The present invention enables self-diagnosis of a reflective obstacle detection device to be easily and conveniently performed at any time by allowing light to directly enter the light receiving portion from the light emitting portion.
本発明は、障害物検知用の発光素子から外部に向けて光
を照射し、その照射領域内の障害物からの反射光を受光
素子で受光する障害物検知装置において、該受光素子に
対し光を直接入射できる装置異常検出用の発光素子を設
け、該受光素子の出力が低下したときは該装置異常検出
用の発光素子を自動的に駆動して装置異常か障害物無し
かを１′す断するようにしてなることを特徴とするが、
１グ１−図示の実施例を参照しながらこれを詳細に説明
する。The present invention provides an obstacle detection device in which light is emitted outward from a light emitting element for detecting an obstacle, and a light receiving element receives reflected light from an obstacle within the irradiation area. A light-emitting element for detecting an abnormality in the apparatus is provided, and when the output of the light-receiving element decreases, the light-emitting element for detecting an abnormality in the apparatus is automatically driven to check whether there is an abnormality in the apparatus or there is no obstruction. It is characterized by being cut off,
1 - This will be explained in more detail with reference to the illustrated embodiment.
第２図は本発明の一実施例を示す概略図で、１０は発光
部、２０は受光部である。発光部１０には障害物検知用
の発光ダイオード’ＬＥＤ＋があり、その光１．＋を窓
１１を通して外部へ照射する。そして、Ｌｌの照射領域
内に障害物があると、その反射光Ｌ３が受光部２０の窓
２１を通して受光素子（例えばフォトダイオード）ＰＤ
へ入射する。FIG. 2 is a schematic diagram showing an embodiment of the present invention, in which 10 is a light emitting section and 20 is a light receiving section. The light emitting unit 10 has a light emitting diode 'LED+' for detecting an obstacle, and its light 1. + is irradiated to the outside through the window 11. If there is an obstacle within the irradiation area of Ll, the reflected light L3 passes through the window 21 of the light receiving section 20 and is transmitted to the light receiving element (for example, a photodiode) PD.
incident on the
障害物がなければ受光素子ＰＤへの入射光量は少ないの
で、この差から照射領域内の障害物の有無が判別できる
。本例ではかかる反射型の障害物検知用置の発光部１０
に自己診断用の発光ダイオードＬＥＤ２を設けて自己診
断を行う。Ｌ２０、このために発光ダイオードＬＥＤ
２から受光素子ＰＤへ直接入射する光である。If there is no obstacle, the amount of light incident on the light receiving element PD will be small, so the presence or absence of an obstacle within the irradiation area can be determined from this difference. In this example, the light emitting unit 10 for such a reflection type obstacle detection
A light emitting diode LED2 for self-diagnosis is provided to perform self-diagnosis. L20, for this a light emitting diode LED
This is light that directly enters the light receiving element PD from the light receiving element PD.
第３図は発光部１０と受光部２０の詳細を示すブロック
図である。発振器１２は発光ダイオードＬＥＤ １．Ｌ
ＥＤ ２の出力光に変調をかげる駆動源である。本例で
はダイオードＬＥＤＩ、ＬＥＤ２が直列に接続され、障
害物検知用の発光ダイオードＬＥＤ ＋は當時駆動され
るが、自己診断用の発光ダイオードＬＥＤ ２はそれと
並列のスイッチＳＷが開放された期間だけ駆動されるよ
うになっている。１３はスイッチＳＷを開閉制御するス
イッチング回路である。FIG. 3 is a block diagram showing details of the light emitting section 10 and the light receiving section 20. The oscillator 12 is a light emitting diode LED 1. L
This is a driving source that modulates the output light of ED 2. In this example, the diodes LEDI and LED2 are connected in series, and the light emitting diode LED + for obstacle detection is driven at all times, but the light emitting diode LED 2 for self-diagnosis is driven only while the switch SW in parallel with it is open. It is now possible to do so. 13 is a switching circuit that controls opening and closing of the switch SW.
受光部２０は、受光素子ＰＤの出力を増幅する増幅器２
２と、その出力ａを検波する検波器２３と、その出力を
基準値と比較して正常であればＩ］（ハイ）、異常、で
あればＬ（ロー）となる出力すを生ずる比較器２４と、
その出力すを積分する積分器２５と、その積分出力Ｃを
３段階に分けて比較してその比較結果ｄに応じて装置の
正、異常および障害物の有無を表示する表示器２Ｇとを
備える。The light receiving section 20 includes an amplifier 2 that amplifies the output of the light receiving element PD.
2, a detector 23 that detects the output a, and a comparator that compares the output with a reference value and outputs I] (high) if normal, and L (low) if abnormal. 24 and
It is equipped with an integrator 25 that integrates the output C, and a display 2G that compares the integrated output C in three stages and displays whether the device is correct, abnormal, and the presence or absence of an obstacle according to the comparison result d. .
発光部１０と受光部２０の回路の一部は第２図−の室３
０に収容される。発光部１０の窓（ガラス板等）１１と
受光部２０の窓２１は互いに向き合う方向に側斜してい
て、ｈ光ダイオードＬ ＥＩ） ２の直接光Ｌ２が発光
素子ＰＤへ入射しやずいようになっている。比較器２４
の出力すばスイッチング回路１３に帰還されてスイッチ
ＳＷの開閉制御に使用される。つまり、自己診断は、受
光素子１）Ｄへの入射−’１ｔＪｋが減ると比較器２４
の出力すが■。A part of the circuit of the light emitting part 10 and the light receiving part 20 is shown in the chamber 3 of FIG.
It is accommodated in 0. The window (glass plate, etc.) 11 of the light emitting unit 10 and the window 21 of the light receiving unit 20 are slanted sideways in directions facing each other, so that the direct light L2 of the photodiode L2 is less likely to enter the light emitting element PD. It has become. Comparator 24
The output signal is fed back to the switching circuit 13 and used to control the opening and closing of the switch SW. In other words, in the self-diagnosis, when the incidence on the light receiving element 1) D -'1tJk decreases, the comparator 24
The output is ■.
となって自動的に行われる。そして、原因が装置正常で
、障害物無しの場合なのか、装置異常なのかを判別する
ためにスイッチＳＷを開いて発光ダイオードＬＥＤ ２
も点灯して見る。装置型１；ニジであれば受光素子ＰＤ
への入射光量が増すので比較器２４の出力すはＨになり
、障害物監視へ復帰する。This will be done automatically. Then, in order to determine whether the cause is that the device is normal and there is no obstruction, or whether the device is abnormal, open the switch SW and turn on the light emitting diode LED 2.
Also turn on and see. Device type 1: If it is rainbow, the light receiving element PD
Since the amount of light incident on the sensor increases, the output of the comparator 24 becomes H, and the operation returns to obstacle monitoring.
第５図はこのときの波形図で、増幅器出力ａ４；Ｉ：
ｉ＋’ｊ接光Ｌ２によるものである（反射光Ｌ ３はな
い）。Figure 5 is a waveform diagram at this time, showing the amplifier output a4;I:
This is due to the i+'j contact light L2 (there is no reflected light L3).
このケースでは比較器２４の出力すはＨ，Ｌを繰り返す
一種の発振状態となるので、積分器２５１：１その平均
レベルをとる。このとき表示器２６は、積分出力ＣがＨ
，Ｌの中間的なレー、ルを相続するので装置正常、障害
物無しと判断し、障害物検知ランプおよび装置異常ラン
プをいずれも点灯しない。これが通常のケースである。In this case, since the output of the comparator 24 is in a kind of oscillation state repeating H and L, the average level of the integrator 251:1 is taken. At this time, the display 26 indicates that the integral output C is H.
, L, it is determined that the device is normal and there is no obstacle, and neither the obstacle detection lamp nor the device error lamp is lit. This is the normal case.
これに対し、装置正常、障害物有りのケースでは第４図
のようになる。つまり、診断期間の増幅器出力ａは直接
光Ｌ２と反射光Ｌ３の和によるものであるのに対し、監
視期間は反射光Ｌ３だけによるものである。この場合に
は積分出力ＣはＨまで達し、障害物検知ランプだけが点
灯する。On the other hand, in a case where the device is normal and there is an obstacle, the situation is as shown in FIG. That is, the amplifier output a during the diagnosis period is based on the sum of the direct light L2 and the reflected light L3, whereas during the monitoring period it is based on only the reflected light L3. In this case, the integral output C reaches H and only the obstacle detection lamp lights up.
一方、装置異常の場合には第６図のように増幅器出力ａ
は直接光Ｌ２だりであるが、第５図のケースと異なりそ
のレベルが低いので比較器２４の出力すはＨにならない
。このため積分出力ＣはＬのままで、装置界雷ランプだ
けが点灯する。On the other hand, in the case of a device abnormality, the amplifier output a
is the direct light L2, but unlike the case of FIG. 5, its level is low, so the output of the comparator 24 does not become H. Therefore, the integral output C remains at L, and only the device field lamp lights up.
以」二の方式によると、■障害物検知用発光ダイオード
ＥＤ＋の開放事故、■受光素子ＰＤの感度低下、０発光
、受光回路の異常、■窓１１．２１の汚れによる発光効
率又は受光感度の低下が検出されるが、■の検査が不要
である場合は第７図のようにスイッチＳＷで発光ダイオ
ードＬＥＩ）＋。According to the second method, ■ Accidental opening of the light emitting diode ED+ for obstacle detection, ■ Decreased sensitivity of the light receiving element PD, 0 emission, abnormality of the light receiving circuit, ■ Decrease in luminous efficiency or light receiving sensitivity due to dirt on the window 11.21. If a drop is detected, but the test (2) is not necessary, turn on the light emitting diode (LEI)+ with the switch SW as shown in FIG.
ＬＥＤ２を切り換えてもよい。You may switch LED2.
以上述べたように本発明によれば、反射型の障害物検知
装置の装置界雷を自動的に、しかも菫常発生時に直ちに
検出できるので、障害物に接近しているにもかかわらず
そのことを検出できないという事態を未然に防止するこ
とができる。As described above, according to the present invention, it is possible to automatically detect lightning in the reflection type obstacle detection device and immediately when it occurs, so that it can be detected even when the obstacle is close to the object. It is possible to prevent a situation in which the detection cannot be performed.
第１図は従来の反射型障害物検知装置の装置異常検出法
の説明図、第２図は本発明の一実ｈｆＩｉ例を示す概略
構成図、第３図はその詳細ブ１．１ツク図、第４図〜第
６図は動作波形図、第７図は本発明の他の実施例を示す
要部構成図である
図中、１０は発光部、１１はその窓、１２は発振器、１
３はスイッチング回路、ＳＷはスイッチ、ＬＥＩ）＋は
障害物検知用発光ダイオード、１．、 Ｅ ＋） ２は
装置異常検出用の発光ダイオード、２０は受光部、２１
はその窓、２２ば増幅器、２３ ＆、ｌ検波器、２４は
比較器、２５は積分器、２６は表示器、■）Ｄは受光素
子である。
出 願 人 、冨士通テン株式会柑
代理人弁理士 青 柳 稔
第４１ｍ
古多旧往 ′ 監イ見
笛６μＩ
２
（ａ） □
翔
第５図
（ａ） ん■−Ｗ■−
（ｂ）Ｌ二「し牢ロー
第７ト１
２Fig. 1 is an explanatory diagram of a conventional reflective obstacle detection device abnormality detection method, Fig. 2 is a schematic configuration diagram showing an example of the present invention, and Fig. 3 is a detailed block diagram thereof. , FIGS. 4 to 6 are operation waveform diagrams, and FIG. 7 is a main part configuration diagram showing another embodiment of the present invention. In the figure, 10 is a light emitting part, 11 is a window thereof, 12 is an oscillator,
3 is a switching circuit, SW is a switch, LEI)+ is a light emitting diode for detecting obstacles, 1. , E +) 2 is a light emitting diode for detecting device abnormality, 20 is a light receiving section, 21
22 is an amplifier, 23 &, l detector, 24 is a comparator, 25 is an integrator, 26 is a display, (2) D is a light receiving element. Applicant: Fujitsu Ten Co., Ltd. Representative Patent Attorney Minoru Aoyagi 41m Furuta Kukoro' Kanai Mifue 6μI 2 (a) □ Sho Figure 5 (a) N■-W■- (b) L2 “Jail Law Part 7 1 2
Claims (1)
射し、その照射領域内の障害物からの反射光を受光素子
で受光する障害物検知装置において、該受光素子に対し
光を直接入射できる装置異系′検出用の発光素子を設け
、該受光素子の出力が低下したときは該装置異常検出用
の発光素子を自動的に駆動して装置異常が障害物熱しか
を判断するようにしてなることを特徴とする、自己診［
折１浅能を係１えた障害物検知装置。In an obstacle detection device in which a light emitting element for detecting an obstacle emits light to the outside and a light receiving element receives reflected light from an obstacle within the irradiation area, the light is emitted to the light receiving element. A light-emitting element is provided for detecting an abnormality in the apparatus, and when the output of the light-receiving element decreases, the light-emitting element for detecting an abnormality in the apparatus is automatically driven to determine whether the abnormality in the apparatus is caused by heat from an obstacle. Self-examination [
Obstacle detection device with one function.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58149867A JPS6040978A (en) | 1983-08-17 | 1983-08-17 | Obstacle detecting apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58149867A JPS6040978A (en) | 1983-08-17 | 1983-08-17 | Obstacle detecting apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6040978A true JPS6040978A (en) | 1985-03-04 |
Family
ID=15484384
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58149867A Pending JPS6040978A (en) | 1983-08-17 | 1983-08-17 | Obstacle detecting apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6040978A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62276482A (en) * | 1986-05-26 | 1987-12-01 | Omron Tateisi Electronics Co | Sensor circuit |
| WO2019155621A1 (en) * | 2018-02-09 | 2019-08-15 | 株式会社Ihi | Obstacle detection system |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS504348U (en) * | 1973-05-08 | 1975-01-17 | ||
| JPS5198073A (en) * | 1975-02-25 | 1976-08-28 |
-
1983
- 1983-08-17 JP JP58149867A patent/JPS6040978A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS504348U (en) * | 1973-05-08 | 1975-01-17 | ||
| JPS5198073A (en) * | 1975-02-25 | 1976-08-28 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62276482A (en) * | 1986-05-26 | 1987-12-01 | Omron Tateisi Electronics Co | Sensor circuit |
| WO2019155621A1 (en) * | 2018-02-09 | 2019-08-15 | 株式会社Ihi | Obstacle detection system |
| RU2753616C1 (en) * | 2018-02-09 | 2021-08-18 | АйЭйчАй КОРПОРЕЙШН | Obstacle detection system |
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