JPS6046056U - Fluorescent X-ray measuring device - Google Patents
Fluorescent X-ray measuring deviceInfo
- Publication number
- JPS6046056U JPS6046056U JP13821783U JP13821783U JPS6046056U JP S6046056 U JPS6046056 U JP S6046056U JP 13821783 U JP13821783 U JP 13821783U JP 13821783 U JP13821783 U JP 13821783U JP S6046056 U JPS6046056 U JP S6046056U
- Authority
- JP
- Japan
- Prior art keywords
- fluorescent
- rays
- voltage
- pulse
- pulses
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005855 radiation Effects 0.000 claims description 9
- 230000000087 stabilizing effect Effects 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 2
- 229910001335 Galvanized steel Inorganic materials 0.000 description 1
- 239000000295 fuel oil Substances 0.000 description 1
- 239000008397 galvanized steel Substances 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は本考案による螢光Ｘ線測定装置の実施例を示し
たブロック図、第２図は同実施例装置のヘッド部を拡大
して示した図、第３図は重油のエネルギスペクトルを示
した図、第４図は同実施例装置の波高安定化回路を詳細
に示したブロック図である。第５図は亜鉛メッキ鋼板の
エネルギスペクトルを示した図である。
１・・・放射線源、２・・・試料、３・・・放射線検出
器、４・・・高円電源、５・・・前置増幅器、６・・・
比例増幅器、７・・・波高安定化回路、７１・・・波高
制御器、７２・・・波高分析器、７３・・・直流電源、
７４・・・交流発生器、７５・・・加算器、７６・・・
単安定マルチバイブレータ、７７・・・スイッチ回路、
７８・・・積分器、８・・・波高分析器、９・・・スケ
ーラ。Figure 1 is a block diagram showing an embodiment of the fluorescent X-ray measuring device according to the present invention, Figure 2 is an enlarged view of the head of the same embodiment, and Figure 3 shows the energy spectrum of heavy oil. The figure shown in FIG. 4 is a block diagram showing in detail the pulse height stabilizing circuit of the device of the same embodiment. FIG. 5 is a diagram showing the energy spectrum of a galvanized steel sheet. DESCRIPTION OF SYMBOLS 1... Radiation source, 2... Sample, 3... Radiation detector, 4... High circle power supply, 5... Preamplifier, 6...
Proportional amplifier, 7... Wave height stabilization circuit, 71... Wave height controller, 72... Wave height analyzer, 73... DC power supply,
74... AC generator, 75... Adder, 76...
Monostable multivibrator, 77... switch circuit,
78... Integrator, 8... Wave height analyzer, 9... Scaler.
Claims (1)
れる放射線により試料から発生する螢光Ｘ線と散乱線を
同時に検出しそのエネルギに比例する電圧パルスを出力
する放射線検出器と、前記放射線検出器に電圧を供給す
る高圧電源と、前記放射線検出器の出力を一定の割合で
増幅する増幅器と、前記増幅器で増幅された電圧パルス
のうち螢光Ｘ線に対応するパルスの波高を検出する波高
分析器と、前記増幅器で増幅された電圧パルスのうち散
乱線に対応するパルスを検出してこのパルスが基準電圧
に等しくなるように制御することにより前記波高分析器
へ入力される螢光Ｘ線に対応するパルスの波高を一定に
保持する波高安定化回路と、前記波高分析器で選別した
螢光Ｘ線に対応するパルスを計数するスケーラとから構
成した螢光Ｘ線測定装置。a radiation source that excites a sample; a radiation detector that simultaneously detects fluorescent X-rays and scattered rays generated from the sample by radiation irradiated from the radiation source and outputs a voltage pulse proportional to the energy thereof; and the radiation detector. a high-voltage power supply that supplies voltage to the radiation detector; an amplifier that amplifies the output of the radiation detector at a constant rate; and a wave height that detects the wave height of a pulse corresponding to fluorescent X-rays among the voltage pulses amplified by the amplifier. an analyzer, and fluorescent X-rays that are input to the pulse height analyzer by detecting pulses corresponding to scattered rays among the voltage pulses amplified by the amplifier and controlling the pulses so that they are equal to a reference voltage. A fluorescent X-ray measurement device comprising: a pulse height stabilizing circuit that maintains a constant wave height of pulses corresponding to the pulse height; and a scaler that counts pulses corresponding to the fluorescent X-rays selected by the pulse height analyzer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13821783U JPS6046056U (en) | 1983-09-06 | 1983-09-06 | Fluorescent X-ray measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13821783U JPS6046056U (en) | 1983-09-06 | 1983-09-06 | Fluorescent X-ray measuring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6046056U true JPS6046056U (en) | 1985-04-01 |
Family
ID=30310198
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13821783U Pending JPS6046056U (en) | 1983-09-06 | 1983-09-06 | Fluorescent X-ray measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6046056U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9297571B1 (en) | 2008-03-10 | 2016-03-29 | Liebert Corporation | Device and methodology for the removal of heat from an equipment rack by means of heat exchangers mounted to a door |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5018083A (en) * | 1973-06-12 | 1975-02-26 | ||
| JPS5286385A (en) * | 1976-01-14 | 1977-07-18 | Rigaku Denki Kogyo Kk | Wave height stabilizing apparatus for radiation detecting pulse |
-
1983
- 1983-09-06 JP JP13821783U patent/JPS6046056U/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5018083A (en) * | 1973-06-12 | 1975-02-26 | ||
| JPS5286385A (en) * | 1976-01-14 | 1977-07-18 | Rigaku Denki Kogyo Kk | Wave height stabilizing apparatus for radiation detecting pulse |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9297571B1 (en) | 2008-03-10 | 2016-03-29 | Liebert Corporation | Device and methodology for the removal of heat from an equipment rack by means of heat exchangers mounted to a door |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS6046058U (en) | Fluorescent X-ray measuring device | |
| JPS6046057U (en) | Fluorescent X-ray measuring device | |
| CN210665549U (en) | A device for measuring uranium concentration in spent fuel extract | |
| JPS598143U (en) | Optical rot detection device | |
| JPS5810075U (en) | Pulse height discrimination circuit for X-ray analyzer | |
| JPS6212475B2 (en) | ||
| JPS5985978U (en) | Electronic counting device | |
| JPH03128899U (en) | ||
| JPS60127504U (en) | Fluorescent X-ray composite plating thickness measuring device | |
| Sekimoto et al. | A simple facility to measure the scalar neutron spectrum in an assembly | |
| JPS58117608U (en) | X-ray exposure dose monitoring device for CT equipment | |
| JPS59163969U (en) | Transformer polarity measuring device | |
| SU135580A1 (en) | Scintillation electromyograph | |
| JPS59181573U (en) | Sample chamber exhaust system in charged particle beam equipment | |
| JP2025528653A (en) | Apparatus for detecting low intensity alpha particles | |
| JPS59109061U (en) | Electron beam welding equipment | |
| JPS5866348U (en) | Fluorescent X-ray measuring device | |
| JPS58152800U (en) | X-ray filament heating device | |
| JPS622167A (en) | Reference voltage measuring apparatus | |
| JPS58110846U (en) | Automatic threshold voltage setting device for radiation measurement equipment | |
| JPS6024356U (en) | Electrostatic precipitator reverse ionization detection device | |
| JPS62122636A (en) | X-ray ct apparatus | |
| JPS58142956U (en) | Power monitor circuit for laser equipment | |
| JPS59103260U (en) | Radiation applied measurement device | |
| GB939757A (en) | Improvements in well logging apparatus |