JPS6053040A - Ｉｃハンドラ - Google Patents

Ｉｃハンドラ

Info

Publication number
JPS6053040A
JPS6053040A JP58160247A JP16024783A JPS6053040A JP S6053040 A JPS6053040 A JP S6053040A JP 58160247 A JP58160247 A JP 58160247A JP 16024783 A JP16024783 A JP 16024783A JP S6053040 A JPS6053040 A JP S6053040A
Authority
JP
Japan
Prior art keywords
handler
runway
test
height
rail
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58160247A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0436463B2 (2
Inventor
Hideo Hirokawa
広川　英夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Electronics Engineering Co Ltd
Priority to JP58160247A priority Critical patent/JPS6053040A/ja
Publication of JPS6053040A publication Critical patent/JPS6053040A/ja
Publication of JPH0436463B2 publication Critical patent/JPH0436463B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices

Landscapes

  • Chutes (AREA)
  • Branching, Merging, And Special Transfer Between Conveyors (AREA)
  • Sorting Of Articles (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP58160247A 1983-09-02 1983-09-02 Ｉｃハンドラ Granted JPS6053040A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58160247A JPS6053040A (ja) 1983-09-02 1983-09-02 Ｉｃハンドラ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58160247A JPS6053040A (ja) 1983-09-02 1983-09-02 Ｉｃハンドラ

Publications (2)

Publication Number Publication Date
JPS6053040A true JPS6053040A (ja) 1985-03-26
JPH0436463B2 JPH0436463B2 (2) 1992-06-16

Family

ID=15710874

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58160247A Granted JPS6053040A (ja) 1983-09-02 1983-09-02 Ｉｃハンドラ

Country Status (1)

Country Link
JP (1) JPS6053040A (2)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62171824A (ja) * 1986-01-22 1987-07-28 Shimadzu Corp 電子部品用自動検査機
JPS62185605A (ja) * 1986-02-10 1987-08-14 Hitachi Electronics Eng Co Ltd Ｉｃハンドラの搬送機構
CN111822380A (zh) * 2020-07-21 2020-10-27 方炜 一种电路板检测装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5857735A (ja) * 1981-10-01 1983-04-06 Nec Corp 選別装置
JPS58124240A (ja) * 1982-01-20 1983-07-23 Hitachi Ltd 半導体装置用検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5857735A (ja) * 1981-10-01 1983-04-06 Nec Corp 選別装置
JPS58124240A (ja) * 1982-01-20 1983-07-23 Hitachi Ltd 半導体装置用検査装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62171824A (ja) * 1986-01-22 1987-07-28 Shimadzu Corp 電子部品用自動検査機
JPS62185605A (ja) * 1986-02-10 1987-08-14 Hitachi Electronics Eng Co Ltd Ｉｃハンドラの搬送機構
CN111822380A (zh) * 2020-07-21 2020-10-27 方炜 一种电路板检测装置

Also Published As

Publication number Publication date
JPH0436463B2 (2) 1992-06-16

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