JPS6068645U - IC test equipment - Google Patents

IC test equipment

Info

Publication number
JPS6068645U
JPS6068645U JP16050183U JP16050183U JPS6068645U JP S6068645 U JPS6068645 U JP S6068645U JP 16050183 U JP16050183 U JP 16050183U JP 16050183 U JP16050183 U JP 16050183U JP S6068645 U JPS6068645 U JP S6068645U
Authority
JP
Japan
Prior art keywords
attitude
magazine
chute
magazines
detecting means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16050183U
Other languages
Japanese (ja)
Other versions
JPH0238453Y2 (en
Inventor
博史 佐藤
徳幸 五十嵐
義仁 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP16050183U priority Critical patent/JPS6068645U/en
Publication of JPS6068645U publication Critical patent/JPS6068645U/en
Application granted granted Critical
Publication of JPH0238453Y2 publication Critical patent/JPH0238453Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図はこの考案によるＩＣ試験装置の全体の構造を説
明するための斜視図、第２図はＩＣ試験装置に用いられ
るマガジンの構造を説明するための斜視図、第３図はこ
の考案によるＩＣ試験装置の要部を説明するための斜視
図、第４図はこの考案に用いた第１姿勢検出手段の動作
を説明するための側面図、第５図はこの考案に用いた第
２姿勢検出手段の動作を説明するための側面図、第６図
は第５図の状態を正面側から見た正面図である。 １・・・・・・ＩＣ自動供給部、２・・・・・・マガジ
ン、３・・・・・・ＩＣ，４・・・・・・測定部、６・
・・・・・シュート、７・・・・・・マガジン収納部、
８・・・・・・自動収納部、１１・・・・・・ストッパ
、１２・・・・・・マガジンプレス、１００・・・・・
・姿勢検出手段、１１０・・・・・・第１姿勢検出手段
、１２０・・・・・・第２姿勢検出手段、２００・・・
・・・駆動手段。Figure 1 is a perspective view for explaining the overall structure of the IC testing device according to this invention, Figure 2 is a perspective view for explaining the structure of the magazine used in the IC testing equipment, and Figure 3 is according to this invention. FIG. 4 is a perspective view for explaining the main parts of the IC testing device, FIG. 4 is a side view for explaining the operation of the first attitude detection means used in this invention, and FIG. 5 is a second attitude used in this invention. FIG. 6 is a side view for explaining the operation of the detection means, and FIG. 6 is a front view of the state shown in FIG. 5 when viewed from the front side. 1...IC automatic supply section, 2...Magazine, 3...IC, 4...Measurement section, 6.
...Chute, 7...Magazine storage section,
8...Automatic storage section, 11...Stopper, 12...Magazine press, 100...
- Attitude detection means, 110...First attitude detection means, 120...Second attitude detection means, 200...
...Driving means.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ＩＣが収納されたマガジンが複数装着されマガジンから
ＩＣを取出して測定部に供給する自動ＩＣ供給部を有し
、この自動ＩＣ供給部において空になったマガジンをシ
ュートに投下し、シュートを通じて空マガジンをマガジ
ン収納部に搬送するように構成したＩＣ試験装置におい
て、上記シュートの下端にマガジンの姿勢を検出する姿
勢検出手段と、この姿勢検出手段の検出結果によりマガ
ジンの姿勢を正規の姿勢となるように変換する駆動手段
とを設けて成るＩＣ試験装置。It has an automatic IC supply section in which a plurality of magazines storing ICs are installed, and the ICs are taken out from the magazines and supplied to the measurement section.The automatic IC supply section drops the empty magazines into a chute, and the empty magazines are removed through the chute. In the IC testing device configured to transport the magazine to the magazine storage section, there is an attitude detecting means for detecting the attitude of the magazine at the lower end of the chute, and an attitude detecting means for detecting the attitude of the magazine is provided at the lower end of the chute, and the attitude of the magazine is adjusted to the normal attitude based on the detection result of this attitude detecting means. An IC testing device comprising a driving means for converting into an IC tester.
JP16050183U 1983-10-17 1983-10-17 IC test equipment Granted JPS6068645U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16050183U JPS6068645U (en) 1983-10-17 1983-10-17 IC test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16050183U JPS6068645U (en) 1983-10-17 1983-10-17 IC test equipment

Publications (2)

Publication Number Publication Date
JPS6068645U true JPS6068645U (en) 1985-05-15
JPH0238453Y2 JPH0238453Y2 (en) 1990-10-17

Family

ID=30353002

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16050183U Granted JPS6068645U (en) 1983-10-17 1983-10-17 IC test equipment

Country Status (1)

Country Link
JP (1) JPS6068645U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62159440A (en) * 1986-01-03 1987-07-15 モトロ−ラ・インコ−ポレ−テツド High speed integrated circuit handler

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4934300U (en) * 1972-06-29 1974-03-26
JPS512524U (en) * 1974-06-24 1976-01-09
JPS56116644A (en) * 1980-02-20 1981-09-12 Hitachi Ltd Manufacture device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4934300U (en) * 1972-06-29 1974-03-26
JPS512524U (en) * 1974-06-24 1976-01-09
JPS56116644A (en) * 1980-02-20 1981-09-12 Hitachi Ltd Manufacture device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62159440A (en) * 1986-01-03 1987-07-15 モトロ−ラ・インコ−ポレ−テツド High speed integrated circuit handler

Also Published As

Publication number Publication date
JPH0238453Y2 (en) 1990-10-17

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