JPS6079178U - Noise figure meter calibration device - Google Patents

Noise figure meter calibration device

Info

Publication number
JPS6079178U
JPS6079178U JP17251983U JP17251983U JPS6079178U JP S6079178 U JPS6079178 U JP S6079178U JP 17251983 U JP17251983 U JP 17251983U JP 17251983 U JP17251983 U JP 17251983U JP S6079178 U JPS6079178 U JP S6079178U
Authority
JP
Japan
Prior art keywords
noise
circuit
attenuation circuit
meter
generates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17251983U
Other languages
Japanese (ja)
Inventor
忠 近藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP17251983U priority Critical patent/JPS6079178U/en
Publication of JPS6079178U publication Critical patent/JPS6079178U/en
Pending legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は雑音指数の基本概念説明図、第2図はYファク
タ法の概念説明図、第3図は雑音指数計の回路構成図、
第4図は従来の雑音指数計校正装置の構成図、第5図は
従来のタイミングチャート図、第6図はこの考案の雑音
指数計校正装置の構成図、第7図はこの考案のタイミン
グチャート図である。 図中、15は雑音指数計、17は信号発振器、25は変
調器、26は第1の切換回路A127は固定減衰回路、
28は第2の切換回路B129は可変減衰回路、30は
切換制御回路である。尚、図中同一あるいは相当部分に
は同一符号を付して示しである。
Figure 1 is a diagram explaining the basic concept of noise figure, Figure 2 is a diagram explaining the concept of Y-factor method, Figure 3 is a circuit diagram of the noise figure meter,
Fig. 4 is a block diagram of a conventional noise figure meter calibration device, Fig. 5 is a conventional timing chart diagram, Fig. 6 is a block diagram of a noise figure meter calibration device of this invention, and Fig. 7 is a timing chart of this invention. It is a diagram. In the figure, 15 is a noise figure meter, 17 is a signal oscillator, 25 is a modulator, 26 is a first switching circuit A127 is a fixed attenuation circuit,
28 is a second switching circuit B129 is a variable attenuation circuit, and 30 is a switching control circuit. In the drawings, the same or corresponding parts are denoted by the same reference numerals.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] Yファクタ法を用(、する雑音指数計校正装置において
、連続波信号を発生する信号発振器と、雑音源ゲート信
号を発生する雑音指数計と、固定減衰回路、可変減衰回
路、上記連続波信号を上記固定減衰回路と可変減衰回路
に交互に与えるための第1の切換回路、上記固定減衰回
路と可変減衰回路の出力を交互に上記雑音指数計に導入
させるための第2の切換回路および上記雑音ゲート信号
に基づいて上記第1、第2の切換回路を制御する切換制
御回路とを有し、上記固定減衰回路の減衰量と上記可変
減衰回路の減衰量差により、任意な雑音指数に相当する
Yファクタを発生する変調器とを、具備したことを特徴
とする雑音指数計校正装置。
A noise figure meter calibration device that uses the Y-factor method includes a signal oscillator that generates a continuous wave signal, a noise figure meter that generates a noise source gate signal, a fixed attenuation circuit, a variable attenuation circuit, and a noise figure meter that generates a continuous wave signal. a first switching circuit for alternately applying outputs to the fixed attenuation circuit and the variable attenuation circuit; a second switching circuit for alternately introducing the outputs of the fixed attenuation circuit and the variable attenuation circuit to the noise figure meter; a switching control circuit that controls the first and second switching circuits based on a gate signal, and the attenuation difference between the fixed attenuation circuit and the variable attenuation circuit corresponds to an arbitrary noise figure. A noise figure meter calibration device comprising: a modulator that generates a Y factor.
JP17251983U 1983-11-08 1983-11-08 Noise figure meter calibration device Pending JPS6079178U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17251983U JPS6079178U (en) 1983-11-08 1983-11-08 Noise figure meter calibration device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17251983U JPS6079178U (en) 1983-11-08 1983-11-08 Noise figure meter calibration device

Publications (1)

Publication Number Publication Date
JPS6079178U true JPS6079178U (en) 1985-06-01

Family

ID=30376042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17251983U Pending JPS6079178U (en) 1983-11-08 1983-11-08 Noise figure meter calibration device

Country Status (1)

Country Link
JP (1) JPS6079178U (en)

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