JPS6095306A - Position measuring device - Google Patents
Position measuring deviceInfo
- Publication number
- JPS6095306A JPS6095306A JP20383583A JP20383583A JPS6095306A JP S6095306 A JPS6095306 A JP S6095306A JP 20383583 A JP20383583 A JP 20383583A JP 20383583 A JP20383583 A JP 20383583A JP S6095306 A JPS6095306 A JP S6095306A
- Authority
- JP
- Japan
- Prior art keywords
- lens
- light
- focusing
- spot diameter
- spot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明は、例えばレーザ加工装置において加工対象物の
加工面の位置を測定するために使用される位置測定装置
の改良に関するり
〔発明の技術的背景とその問題点〕
従来、この種の装置として、光源から発生した光を集束
レンズで呆光して被測定対象物に照射し、その反射像を
上記照射光の光軸に対し任意の角度を隔てて配設した受
光系で受光検出することにより上記被測定対象物の位置
を測定する。いわゆる三角測量法を応用した装置が知ら
れている。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an improvement in a position measuring device used for measuring the position of a processing surface of a workpiece in a laser processing device, for example. Background and Problems] Conventionally, this type of device uses a converging lens to dim the light generated from a light source and irradiates it onto the object to be measured, and the reflected image is set at an arbitrary angle with respect to the optical axis of the irradiated light. The position of the object to be measured is measured by receiving and detecting light with a light receiving system placed apart from the object. Devices applying the so-called triangulation method are known.
ところで、この甑の装置では、測定分解能を高めようと
すると、照射光の照射スポットをできるだけ小さくする
必要がある。しかし、この照射スポットを小さくすると
、スポット径を小さく保てる光軸方向の範囲が狭くなっ
て測定可能範囲が小範囲に限定されるといった不具合を
生じる。例えば、半導体レーザを用いて0.1龍の照射
スポットを得ようとすると、このQ、l mmのスポッ
トを保てる範囲はわずかに±l Mln程度となる。そ
こで、従来では1例えばHe−Neレーザ等の拡がり角
の小さな光を用いて測定を行なう試みがなされている。By the way, in this Koshiki device, in order to increase the measurement resolution, it is necessary to make the irradiation spot of the irradiation light as small as possible. However, if this irradiation spot is made smaller, the range in the optical axis direction in which the spot diameter can be kept small becomes narrower, resulting in a problem that the measurable range is limited to a small range. For example, when trying to obtain an irradiation spot of 0.1 mm using a semiconductor laser, the range in which this Q, l mm spot can be maintained is only about ±l Mln. Therefore, in the past, attempts have been made to perform measurements using light with a small divergence angle, such as a He--Ne laser.
このHe −N eレーザの場合、照射スポットa、s
umで±20@糞の測定範囲を実現できる。しかしなが
ら、このHe−N’eレーザを用いたとしても、レーザ
自体が持つ性能以上の測定梢反の向上およびgl11定
範囲の拡大は当然不可能であり、しかもこのHe−Ne
レーザを用いると装置が大形化し、かつ高価になる欠点
があり、実用に適さなかった。In the case of this He-N e laser, the irradiation spots a, s
A measurement range of ±20@feces can be achieved in um. However, even if this He-N'e laser is used, it is naturally impossible to improve the measured treetop resistance beyond the performance of the laser itself and to expand the gl11 constant range.
Using a laser has disadvantages in that the device becomes large and expensive, making it unsuitable for practical use.
本発明は、装置の大形化を招くことな(広範囲にわたっ
て高精度の測定を行なえるようにし、小形かつ安価で測
定性能が著しく高い位置測定装置を提供することを目的
とする。SUMMARY OF THE INVENTION An object of the present invention is to provide a position measuring device that is small, inexpensive, and has extremely high measurement performance, without increasing the size of the device (which can perform highly accurate measurements over a wide range).
本発明は、上記目的を達成するために、光源と集束レン
ズとの間にその光軸方向に移動可能な可動レンズを配設
ターるとともに、集束制御回路を設け、この集束制f1
1回路により、上記受光部に結像された反射像のスポッ
ト径を検出し。In order to achieve the above object, the present invention disposes a movable lens movable in the optical axis direction between the light source and the focusing lens, and also provides a focusing control circuit, which controls the focusing f1.
One circuit detects the spot diameter of the reflected image formed on the light receiving section.
このスポット径を縮小する方向へ上記oT&IIレンズ
を移動させるようにしたものである。The oT&II lens is moved in a direction to reduce the spot diameter.
第1図は、本発明の一実施例における位置測定装置の概
略構成図である。この装置は、被fill定幻象物r
Vcit+j定用の光を集光照射する投ツ0系2と、上
記被辿」定灼象物t VCよる反射光を受光検出する受
光系3と、集束制動回路4と力・ら構成されている。FIG. 1 is a schematic configuration diagram of a position measuring device according to an embodiment of the present invention. This device is designed to fill a fixed phantom object r
It is composed of a projection system 2 that condenses and irradiates light for determining Vcit+j, a light receiving system 3 that receives and detects the reflected light from the above-mentioned VC, and a focusing braking circuit 4. There is.
投光系2は、例えば半導体レーザ装飯力)らなる光源2
ノを翁し、この光源21力・ら発生された光22をコリ
メートレンズ23で平行光にしたのち、可動レンズ24
および集束レンズ26をそれぞれ介して被6111定対
象物lに照射1−るものである。ここで上記可動ワンX
24ハ、utJJr様描25により光軸方向(矢印入方
向)に移堕j可能となっている。The light projection system 2 includes a light source 2 consisting of, for example, a semiconductor laser device.
The light 22 generated from the light source 21 is made into parallel light by the collimating lens 23, and then the movable lens 24
and a converging lens 26, respectively, to irradiate a fixed object 6111. Here the above movable one
24c, utJJr's drawing 25 makes it possible to move in the optical axis direction (in the direction of the arrow).
一方受光系3は、上記投光系2の光軸に対し所定角度隔
てて被測定対象物lにおける照射スポット形成位置の斜
め上方に配設されている。On the other hand, the light receiving system 3 is arranged at a predetermined angle with respect to the optical axis of the light projecting system 2, diagonally above the irradiation spot formation position on the object to be measured l.
そして、上記被る(11定対象物Iの反射光31を、結
像レンズ32を介して受光器33で受光している。この
受光器33は、反射像の受光スボツ′トの光量分布を検
出するもので、例えば工業用テレビジョン(ITV )
カメラや固体撮像素子を用いたラインセンサから構成さ
れる。Then, the reflected light 31 from the above-mentioned (11 constant object I) is received by a light receiver 33 via an imaging lens 32. This light receiver 33 detects the light intensity distribution of the light receiving spot of the reflected image. For example, industrial television (ITV)
It consists of a line sensor using a camera and a solid-state image sensor.
さて集束制御回路4は、上記受光系3の受光器33の出
力から受光スポットの径を検出するスポット径検出回路
41と、マイクロプロセッサを中央制御部として有する
制御回路本体(CPU)42と、このCPU42の制御
信号に応じて前記可動し/ズ24の移動機構25を駆顛
ル、これKより可動し/ズ24を光軸方向に移動せしめ
る移動制御回路43とから構成されティる。上記c P
U 4zは、スポット径検出回路41で検出されたス
ポット径情報に基づいてこのスポット径を縮小するため
の制御信号を発生するものである。Now, the focusing control circuit 4 includes a spot diameter detection circuit 41 that detects the diameter of the light receiving spot from the output of the light receiver 33 of the light receiving system 3, a control circuit main body (CPU) 42 having a microprocessor as a central control section, and It is comprised of a movement control circuit 43 that drives the moving mechanism 25 of the movable lens 24 in response to a control signal from the CPU 42, and moves the movable lens 24 in the optical axis direction. Above c P
U 4z generates a control signal for reducing the spot diameter based on the spot diameter information detected by the spot diameter detection circuit 41.
次に、以上のように構成された装置の作用を説明する。Next, the operation of the device configured as above will be explained.
いま、第2図のように被測定対象物1′に対し可動レン
ズ24の位置を■に設定したときに照射スポットの径が
最小になっているとする。Assume now that when the position of the movable lens 24 is set to {circle around (2)} with respect to the object to be measured 1' as shown in FIG. 2, the diameter of the irradiation spot becomes the minimum.
この状態で、例えば被測定対象物の位置が図中二点鎖線
l“の位置になったとすると、照射光の焦点が外れて照
射スポットの径が大きくなり、それに応じて受光器33
に形成される受光スポットの径が大きくなる。そうする
と、上記受光スポットの径の増加はスポット径検出回路
4Zで検出され、CPU4zに導入される。ここで上記
受光スポット径は1例えはスポット中2
心における受光強度のe の値の幅として検出される。In this state, for example, if the position of the object to be measured reaches the position indicated by the two-dot chain line l" in the figure, the irradiation light will be defocused and the diameter of the irradiation spot will increase, and the light receiver 33 will move accordingly.
The diameter of the light-receiving spot formed becomes larger. Then, the increase in the diameter of the light receiving spot is detected by the spot diameter detection circuit 4Z and introduced to the CPU 4z. Here, the diameter of the light-receiving spot is detected as the width of the value e of the light-receiving intensity at two centers in the spot, for example.
そうしてスポット径の検用値M力XCPUし/ズ24を
矢印A′力方向移動させるための制御信号を作成し、こ
の制御信号を移動制御回路43に送出して可動レンズ2
4の光軸位置を移lIIさせる。そして、この移動が終
了するとスポット径検出回路41の検出値を再び導入し
、この検出値Nと先に尋人した検出値Mとを比較して、
M≧Nであれば可動レンズ24の移動方向が正しいもの
と判断して以後スポット径の検出値を監視しながら可動
レンズ24を一定量ずつ矢印A′力方向移動させる。一
方、上記比較の結果M(Nであった場合には、可動レン
ズ24を上記矢印A′方向とは反対の矢印A“方向へ一
定量移動させる。そして、この移動後にスポット径の検
出値を入力し、この値が最初に入力した値M以下になる
と以後可動レンズ24の移動方向を矢印A′力方向変更
して一定量ずつ可動レンズ24を移@hさせる。かくし
て、被測定対象物i//への照射スポット径が最小とな
るように可動レンズ24の光軸位置が移動制御される。Then, a control signal for moving the spot diameter detection value M force
The optical axis position of No. 4 is moved. When this movement is completed, the detected value of the spot diameter detection circuit 41 is introduced again, and this detected value N is compared with the previously detected detected value M.
If M≧N, it is determined that the moving direction of the movable lens 24 is correct, and thereafter the movable lens 24 is moved by a fixed amount in the direction of arrow A' while monitoring the detected value of the spot diameter. On the other hand, if the result of the above comparison is M(N), the movable lens 24 is moved by a certain amount in the direction of arrow A" opposite to the direction of arrow A'. After this movement, the detected value of the spot diameter is When this value becomes less than the initially input value M, the direction of movement of the movable lens 24 is changed to the direction of the arrow A' force, and the movable lens 24 is moved by a fixed amount @h.In this way, the object to be measured i The movement of the optical axis position of the movable lens 24 is controlled so that the diameter of the irradiation spot on // is minimized.
第2図ウニ点鎖線@は、この移動制御後の可動レンズ2
4の位置を示すもので、二点鎖線θ、Oはそのときの照
射光および反射光の軌跡を示している。The dotted chain line @ in Figure 2 indicates the movable lens 2 after this movement control.
4, and the two-dot chain lines θ and O indicate the trajectories of the irradiated light and reflected light at that time.
このように、本実施例の装置であれば、たとえスポット
径を小さく保てる範囲の狭いレーザな用いたとしても、
受光スポット径を監視してこの径が常に最小となるよう
に可動レンズ24を移動させるようにしたので、被測定
対象物が如何なる位置にあろうともこの対象物に対して
常に最小のスポット径となるように照射光を照射するこ
とができる。すなわち、結果的にスポット径を小さく保
てる範囲を大幅に拡げることができる。したがって、広
範囲にわたって高精度の位置測定を行うことができる。In this way, with the device of this example, even if a laser with a narrow range that can keep the spot diameter small is used,
The diameter of the light-receiving spot is monitored and the movable lens 24 is moved so that this diameter is always the minimum, so no matter where the object to be measured is located, the spot diameter is always the minimum for this object. The irradiation light can be irradiated so that the That is, as a result, the range in which the spot diameter can be kept small can be greatly expanded. Therefore, highly accurate position measurement can be performed over a wide range.
しかも、半導体レーザのようなそれほど拡がり角の小さ
くない光を測定光として使用できるので、He−Ne
レーザ等を用いる場合に比べて装置を小形化することが
でき、かつ安価な装置を提供することができる。Moreover, since light with a not-so-small divergence angle, such as a semiconductor laser, can be used as the measurement light, He-Ne
Compared to the case where a laser or the like is used, the device can be made smaller and can be provided at a lower cost.
なお、本発明は上記実施例に限定されるものではない。Note that the present invention is not limited to the above embodiments.
例えば、上記実施例では受光スポット径をピーク値に対
しe の強度を有する範囲として検出してこれを小さく
する方向[OT動レンズを移動制御したが、受光スポッ
ト出力のピーク値に着目してこのピーク値が最大となる
ように可動レンズを移動制御してもよい。また。For example, in the above embodiment, the diameter of the light receiving spot is detected as a range having an intensity of e relative to the peak value, and the OT dynamic lens is moved in a direction to reduce the diameter. The movement of the movable lens may be controlled so that the peak value is maximized. Also.
上記実施例では、可動レンズ24を一定量ずつ移動させ
るように制御したが、スポット径の検出値に応じて移動
量を可変設定してもよい。このようにすると、可動レン
ズ24の移動制御時1145をさらに短編することがで
きる。さらに、コリメータレンズと可動し/ズとを一体
化してもよく、またCPU0代わりに論理回路やデコー
ダを用いて制御信号を作成するようにしてもよ(ゝO
〔発明の効果〕
以上詳述したように本発明は、光源と集束レンズとの間
にその光軸方向に移動可能な可動レンズを配設するとと
もに、集束制御回路を設け、この回路により上記受光部
に結像された反射像のスポット径を検出し、このスポッ
ト径を綿小する方向に上記可動レンズを移動させるよう
にしたものである。In the above embodiment, the movable lens 24 is controlled to be moved by a constant amount, but the amount of movement may be variably set according to the detected value of the spot diameter. In this way, the time 1145 during movement control of the movable lens 24 can be further shortened. Furthermore, the collimator lens and the movable lens may be integrated, and the control signal may be created using a logic circuit or a decoder instead of the CPU0 (ゝO [Effects of the Invention] As described in detail above) According to the present invention, a movable lens movable in the optical axis direction is disposed between the light source and the focusing lens, and a focusing control circuit is also provided, and this circuit controls the reflected image formed on the light receiving section. The spot diameter is detected and the movable lens is moved in a direction to reduce the spot diameter.
したがって、本発明によれば、装置の大形化を招くこと
なく広範囲にわたって高精度の測定を行なうことができ
、小型かつ安価で測定性能力r著゛シ<高い位置測定装
置−を提供することができる。Therefore, according to the present invention, it is possible to provide a position measuring device that is small, inexpensive, and has excellent measurement performance, which can perform highly accurate measurements over a wide range without increasing the size of the device. I can do it.
第1図は本発明の一実施例における位置測定装置の概略
構成図、第2図および第3図は同装置こ
置の作用説8A前用いるためのもので、第2図は集束制
御動作を示す模式図、第3図はCPUの制御手順を示す
フローチャートである。
1.1’、l“ ・・・被測定対象物、2・・・投プ゛
C系、3・・・受光系、4・・・集束制御回路、21・
・・光源、24・・・Wtfjレンズ、25・・・移動
機構、26・・・集束レンズ、32・・・結像レンズ、
33・・・受光器。
41・・・スポット径検出回路、42・・・CPU、4
3・・・移動制御回路。
出願人代理人 弁理士 鈴 江 武 彦第1図
ム
第2図Fig. 1 is a schematic configuration diagram of a position measuring device according to an embodiment of the present invention, Figs. 2 and 3 are for use before the operation of the device, and Fig. 2 shows the focusing control operation. The schematic diagram shown in FIG. 3 is a flowchart showing the control procedure of the CPU. 1.1', l"... Object to be measured, 2... Projection C system, 3... Light receiving system, 4... Focusing control circuit, 21.
... Light source, 24... Wtfj lens, 25... Moving mechanism, 26... Focusing lens, 32... Imaging lens,
33... Light receiver. 41... Spot diameter detection circuit, 42... CPU, 4
3...Movement control circuit. Applicant's agent Patent attorney Takehiko Suzue Figure 1 Figure 2
Claims (1)
定対象に照射し、その反射像を上記照射光の光軸に対し
任意の角度を隔てて配設された受光系で受光検出するこ
とにより被測定対象物の位置を測定する位置測定装置に
おいて、前記光源と集束レンズとの間にその光軸方向に
移動OI′能に配設され′fc可動レンズと、前記受光
系の受光部に結像された反射像のスポット径を検出しこ
のスポット径を縮小する方向へ前記卯動レンズを移動さ
せる集束制御回路とを具備したことを特徴とする位置測
定装置。Light generated from a light source is focused by a focusing lens and irradiated onto the object to be measured, and the reflected image is received and detected by a light receiving system arranged at an arbitrary angle with respect to the optical axis of the irradiated light. In a position measuring device for measuring the position of an object to be measured, a movable lens is disposed between the light source and the focusing lens so as to be movable in the direction of the optical axis thereof, and a movable lens is disposed between the light source and the focusing lens, and A position measuring device comprising: a focusing control circuit that detects a spot diameter of a formed reflected image and moves the movable lens in a direction to reduce the spot diameter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20383583A JPH0227606B2 (en) | 1983-10-31 | 1983-10-31 | ICHISOKUTEISOCHI |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20383583A JPH0227606B2 (en) | 1983-10-31 | 1983-10-31 | ICHISOKUTEISOCHI |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6095306A true JPS6095306A (en) | 1985-05-28 |
| JPH0227606B2 JPH0227606B2 (en) | 1990-06-19 |
Family
ID=16480486
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20383583A Expired - Lifetime JPH0227606B2 (en) | 1983-10-31 | 1983-10-31 | ICHISOKUTEISOCHI |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0227606B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011196883A (en) * | 2010-03-19 | 2011-10-06 | Toshiba Corp | Distance measuring apparatus |
| JP2012007961A (en) * | 2010-06-24 | 2012-01-12 | Panasonic Corp | Shape measuring apparatus and shape measuring method |
-
1983
- 1983-10-31 JP JP20383583A patent/JPH0227606B2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011196883A (en) * | 2010-03-19 | 2011-10-06 | Toshiba Corp | Distance measuring apparatus |
| JP2012007961A (en) * | 2010-06-24 | 2012-01-12 | Panasonic Corp | Shape measuring apparatus and shape measuring method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0227606B2 (en) | 1990-06-19 |
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