JPS61105473A - レ−ザ−ダイオ−ド検査装置 - Google Patents

レ−ザ−ダイオ−ド検査装置

Info

Publication number: JPS61105473A
Authority: JP; Japan
Prior art keywords: laser diode; bottom plate; holder; upper lid; hole
Prior art date: 1984-10-29
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

JP22748684A

Other languages

English (en)

Japanese (ja)

Other versions

JPH0431067B2 (2

Inventor

Keiichi Morishita

森下　恵市

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Daito Denshi Kogyo Kk

Original Assignee

Daito Denshi Kogyo Kk

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1984-10-29

Filing date

1984-10-29

Publication date

1986-05-23

1984-10-29 Application filed by Daito Denshi Kogyo Kk filed Critical Daito Denshi Kogyo Kk

1984-10-29 Priority to JP22748684A priority Critical patent/JPS61105473A/ja

1986-05-23 Publication of JPS61105473A publication Critical patent/JPS61105473A/ja

1992-05-25 Publication of JPH0431067B2 publication Critical patent/JPH0431067B2/ja

Status Granted legal-status Critical Current

Links

238000007689 inspection Methods 0.000 claims abstract description 15
239000000758 substrate Substances 0.000 claims abstract description 12
239000011810 insulating material Substances 0.000 claims 1
239000000463 material Substances 0.000 claims 1
238000012360 testing method Methods 0.000 description 7
229910052782 aluminium Inorganic materials 0.000 description 2
XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
230000000694 effects Effects 0.000 description 2
229910052751 metal Inorganic materials 0.000 description 2
239000002184 metal Substances 0.000 description 2
238000000034 method Methods 0.000 description 2
230000032683 aging Effects 0.000 description 1
238000004140 cleaning Methods 0.000 description 1
239000004744 fabric Substances 0.000 description 1
229920000515 polycarbonate Polymers 0.000 description 1
239000004417 polycarbonate Substances 0.000 description 1
238000005476 soldering Methods 0.000 description 1
125000006850 spacer group Chemical group 0.000 description 1
230000000087 stabilizing effect Effects 0.000 description 1
238000009423 ventilation Methods 0.000 description 1

Landscapes

Testing Of Individual Semiconductor Devices (AREA)

JP22748684A 1984-10-29 1984-10-29 レ−ザ−ダイオ−ド検査装置 Granted JPS61105473A (ja)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP22748684A JPS61105473A (ja)	1984-10-29	1984-10-29	レ−ザ−ダイオ−ド検査装置

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP22748684A JPS61105473A (ja)	1984-10-29	1984-10-29	レ−ザ−ダイオ−ド検査装置

Publications (2)

Publication Number	Publication Date
JPS61105473A true JPS61105473A (ja)	1986-05-23
JPH0431067B2 JPH0431067B2 (2)	1992-05-25

Family

ID=16861638

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP22748684A Granted JPS61105473A (ja)	1984-10-29	1984-10-29	レ−ザ−ダイオ−ド検査装置

Country Status (1)

Country	Link
JP (1)	JPS61105473A (2)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS63281078A (ja) *	1987-05-13	1988-11-17	Daito Denshi Kogyo Kk	半導体素子のエ−ジング検査装置
JPH03104965U (2) *	1990-02-13	1991-10-30
JP2005121625A (ja) *	2003-09-24	2005-05-12	Sharp Corp	バーンイン装置
JP2012237645A (ja) *	2011-05-11	2012-12-06	Sharp Corp	半導体検査装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS5128190A (2) *	1974-07-01	1976-03-09	Snam Progetti
JPS56128590U (2) *	1980-02-29	1981-09-30
JPS5815837U (ja) *	1981-07-22	1983-01-31	中尾　重春	コンクリ−トブロツク煙筒

1984
- 1984-10-29 JP JP22748684A patent/JPS61105473A/ja active Granted

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS5128190A (2) *	1974-07-01	1976-03-09	Snam Progetti
JPS56128590U (2) *	1980-02-29	1981-09-30
JPS5815837U (ja) *	1981-07-22	1983-01-31	中尾　重春	コンクリ−トブロツク煙筒

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS63281078A (ja) *	1987-05-13	1988-11-17	Daito Denshi Kogyo Kk	半導体素子のエ−ジング検査装置
JPH03104965U (2) *	1990-02-13	1991-10-30
JP2005121625A (ja) *	2003-09-24	2005-05-12	Sharp Corp	バーンイン装置
JP2012237645A (ja) *	2011-05-11	2012-12-06	Sharp Corp	半導体検査装置

Also Published As

Publication number	Publication date
JPH0431067B2 (2)	1992-05-25

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Legal Events

Date	Code	Title	Description
2004-05-11	R250	Receipt of annual fees	Free format text: JAPANESE INTERMEDIATE CODE: R250
2004-10-29	EXPY	Cancellation because of completion of term