JPS61155907A - 検出または測定用ユニツトの特定的高さ調節手段を備えた座標測定装置 - Google Patents

検出または測定用ユニツトの特定的高さ調節手段を備えた座標測定装置

Info

Publication number: JPS61155907A
Authority: JP; Japan
Prior art keywords: measuring; coordinate measuring; measuring device; support arm; detection
Prior art date: 1984-12-27
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Pending

Application number

JP29093085A

Other languages

English (en)

Japanese (ja)

Inventor

ペーター・マツツロート

クラウス・シユトルツエンベルク

ホルスト・ドーナート

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Jenoptik AG

Carl Zeiss Jena GmbH

Original Assignee

VEB Carl Zeiss Jena GmbH

Carl Zeiss Jena GmbH

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1984-12-27

Filing date

1985-12-25

Publication date

1986-07-15

1985-12-25 Application filed by VEB Carl Zeiss Jena GmbH, Carl Zeiss Jena GmbH filed Critical VEB Carl Zeiss Jena GmbH

1986-07-15 Publication of JPS61155907A publication Critical patent/JPS61155907A/ja

Status Pending legal-status Critical Current

Links

238000005259 measurement Methods 0.000 title claims description 22
238000001514 detection method Methods 0.000 title claims description 15
238000005286 illumination Methods 0.000 claims description 27
230000003287 optical effect Effects 0.000 claims description 12
230000005484 gravity Effects 0.000 claims description 3
239000004575 stone Substances 0.000 description 5
230000005540 biological transmission Effects 0.000 description 4
238000011156 evaluation Methods 0.000 description 2
238000003384 imaging method Methods 0.000 description 2
230000001133 acceleration Effects 0.000 description 1
238000005452 bending Methods 0.000 description 1
238000010586 diagram Methods 0.000 description 1
230000000694 effects Effects 0.000 description 1
230000008030 elimination Effects 0.000 description 1
238000003379 elimination reaction Methods 0.000 description 1

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
- G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
- G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
A Measuring Device Byusing Mechanical Method (AREA)
Length Measuring Devices By Optical Means (AREA)
Instruments For Measurement Of Length By Optical Means (AREA)

JP29093085A 1984-12-27 1985-12-25 検出または測定用ユニツトの特定的高さ調節手段を備えた座標測定装置 Pending JPS61155907A (ja)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
DD27181284A DD233175A1 (de)	1984-12-27	1984-12-27	Koordinatenmessgeraet mit definierter hoehenverstellung einer abtast- oder messeinheit
DD01B/271812-5		1984-12-27

Publications (1)

Publication Number	Publication Date
JPS61155907A true JPS61155907A (ja)	1986-07-15

Family

ID=5564179

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP29093085A Pending JPS61155907A (ja)	1984-12-27	1985-12-25	検出または測定用ユニツトの特定的高さ調節手段を備えた座標測定装置

Country Status (3)

Country	Link
JP (1)	JPS61155907A (de)
DD (1)	DD233175A1 (de)
DE (1)	DE3540596A1 (de)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPH03255301A (ja) *	1990-03-05	1991-11-14	Dainippon Screen Mfg Co Ltd	テーブル型測長装置
CN113140001A (zh) *	2020-01-17	2021-07-20	宋彤云	物件扫描仪高度拓展系统
CN113865534A (zh) *	2021-09-01	2021-12-31	慈溪莱普森机械有限公司	三坐标测量仪

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE3719422A1 (de) *	1986-12-19	1988-06-30	Hommelwerke Gmbh	Vorrichtung zur beruehrungsfreien messung eines abstandes von einer oberflaeche, insbesondere zur abtastung einer kontur einer oberflaeche eines werkstueckes laengs eines messweges
CN100494878C (zh) *	2005-09-02	2009-06-03	中国科学院上海光学精密机械研究所	多维可调光学移相装置
CN101126631B (zh) *	2007-09-25	2010-06-02	中国航空工业第一集团公司北京航空精密机械研究所	三坐标测量机光栅读数头自适应机构

1984
- 1984-12-27 DD DD27181284A patent/DD233175A1/de not_active IP Right Cessation
1985
- 1985-11-15 DE DE19853540596 patent/DE3540596A1/de not_active Withdrawn
- 1985-12-25 JP JP29093085A patent/JPS61155907A/ja active Pending

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPH03255301A (ja) *	1990-03-05	1991-11-14	Dainippon Screen Mfg Co Ltd	テーブル型測長装置
CN113140001A (zh) *	2020-01-17	2021-07-20	宋彤云	物件扫描仪高度拓展系统
CN113140001B (zh) *	2020-01-17	2022-05-20	深圳市安骏物流有限公司	物件扫描仪高度拓展系统
CN113865534A (zh) *	2021-09-01	2021-12-31	慈溪莱普森机械有限公司	三坐标测量仪

Also Published As

Publication number	Publication date
DD233175A1 (de)	1986-02-19
DE3540596A1 (de)	1986-07-10

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