JPS61202143A - Absorbance measuring apparatus - Google Patents

Absorbance measuring apparatus

Info

Publication number
JPS61202143A
JPS61202143A JP4284285A JP4284285A JPS61202143A JP S61202143 A JPS61202143 A JP S61202143A JP 4284285 A JP4284285 A JP 4284285A JP 4284285 A JP4284285 A JP 4284285A JP S61202143 A JPS61202143 A JP S61202143A
Authority
JP
Japan
Prior art keywords
flash lamp
light
absorbance
xenon flash
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4284285A
Other languages
Japanese (ja)
Inventor
Morihito Inoue
井上 守人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP4284285A priority Critical patent/JPS61202143A/en
Publication of JPS61202143A publication Critical patent/JPS61202143A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255Details, e.g. use of specially adapted sources, lighting or optical systems

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To enable a highly accurate absorption analysis using a Xe flash lamp, by making light of the Xe flash lamp into a sample through a diffusion plate and further the transmission light into a detector through a spectral analysis to calculate the absorbance with several wavelength differences from the output thereof. CONSTITUTION:A high voltage from a high voltage power source 10 is applied to a Xe flash lamp 1 under the control with a CPU11, a pulse light generated is transmitted through a sample in a diffusion plate 2, a condenser lens 3a and a reaction tube 4 and spectrally analyzed with a diffraction grating 6 via a condenser 3b and a slit 5 to be made incident into a detector 7. The output is inputted into an arithmetic means 9 via an amplifier 8. The absorbance with several wavelengths is calculated by the arithmetic means 9. A highly accurate absorption analysis can be done with the stabilization by the diffusion plate 2 using the Xe flash lamp 1.

Description

【発明の詳細な説明】 [発明の技術分野] この発明は、自動化学分析装置における吸光度測定装置
に係り、さらに詳しくは、光源からの光を反応セルに投
光し、その後多波長に分光して吸光度の測定を行う後分
光方式の吸光度測定装置に関するものである。
[Detailed Description of the Invention] [Technical Field of the Invention] The present invention relates to an absorbance measurement device in an automatic chemical analyzer, and more specifically, to a device for measuring absorbance in an automatic chemical analyzer, and more specifically, it projects light from a light source into a reaction cell, and then spectrally spectra it into multiple wavelengths. The present invention relates to a post-spectroscopic absorbance measuring device that measures absorbance using a post-spectroscopic method.

[発明の技術的背景] 自動化学分析等においては、検体を収納した反応管を直
接測光することにより、従来の70−セルタイプに比べ
て微量な検体で吸光度測定が可能となっている。
[Technical Background of the Invention] In automatic chemical analysis and the like, by directly measuring the light of a reaction tube containing a specimen, it is possible to measure the absorbance of a much smaller amount of specimen compared to the conventional 70-cell type.

この直接測光方式には、分光器からの単色光を反応管に
入射させて吸光分析を行う前分光方式と、反応管の透過
光を分光して吸光分析を行う後分光方式とがある。
This direct photometry method includes a pre-spectroscopic method in which monochromatic light from a spectrometer is incident on a reaction tube and absorption analysis is performed, and a post-spectroscopic method in which light transmitted through the reaction tube is spectrally divided and absorption analysis is performed.

前分光方式では迷光に伴う問題が避けられないため、近
年では多くの機種に後分光方式が採用されている。
Since problems associated with stray light cannot be avoided with the front spectroscopy method, in recent years many models have adopted the rear spectroscopy method.

この場合、光源としては多くはハロゲンタングステンラ
ンプ等の連続光が用いられている。
In this case, continuous light such as a halogen tungsten lamp is often used as the light source.

[背景技術の問題点] 最近の生化学分析法の主流を占める酵素活性反応(RA
TE法)の測定においては、測定に供する測光波長が3
40nmの紫外領域に集中しでいる。
[Problems with background technology] Enzyme activity reaction (RA), which occupies the mainstream of recent biochemical analysis methods,
In the measurement using the TE method, the photometric wavelength used for measurement is 3.
It is concentrated in the ultraviolet region of 40 nm.

ところで、前記ハロゲンタングステンランプは、発光′
点のバラツキが少なく安定な光源としての利点があるが
、第1図図示aに示すように、紫外領域の光量は可視光
量のピークに比べて100倍近く低くなっている。この
ため、最新の半導体検出器の感度特性(第1図図示す参
照)をもってしても、光量検出に際して極めて高いS−
N比が要求される。
By the way, the halogen tungsten lamp does not emit light.
Although it has the advantage of being a stable light source with little variation in points, as shown in Figure 1 (a), the amount of light in the ultraviolet region is nearly 100 times lower than the peak amount of visible light. For this reason, even with the sensitivity characteristics of the latest semiconductor detectors (see Figure 1), extremely high S-
N ratio is required.

また、ハロゲンタングステンランプによって、紫外領域
での所定の光量を確保するとすれば、出力(ワット数)
を高めなければならない。このため、高出力の安定化電
源を必要とし、また、高出力に伴う発熱の問題をも生ず
る。例えば、後分光方式においては、反応管に相当量の
光が入射するため、試料の光分解が生じ熱的影響が大き
い。
Also, if a halogen tungsten lamp is used to secure a certain amount of light in the ultraviolet region, the output (wattage)
must be increased. Therefore, a stabilized power source with high output is required, and the problem of heat generation due to high output also occurs. For example, in the post-spectroscopy method, a considerable amount of light enters the reaction tube, resulting in photodecomposition of the sample, which has a large thermal effect.

さらに、近年の光ファイバの技術進歩に伴い吸光度測定
装置における光ガイドとして光ファイバが使用されてい
るが、使用されている光ファイバの充填率が低いため光
損失が大きく、光量の少な−リ − 光ファイバの使用が困難となっている。
Furthermore, with the recent advances in optical fiber technology, optical fibers are being used as light guides in absorbance measurement devices, but the low filling rate of the optical fibers used results in large optical losses and leads to low light intensity. It has become difficult to use optical fiber.

そこで、前記ハロゲンタングステンランプに変わる新た
な光源として、キセノンフラッシュランプが注目されて
いる。キセノンフラッシュランプとは、パルス点灯方式
によって高輝度の光を発するものであり、第1図図示C
に示すように、紫外領域におけるキセノンフラッシュラ
ンプの光量は前記ハロゲンタングステンランプの光量に
比べてほぼ1000倍に達する。しかも、キセノンフラ
ッシュランプは閃光時間が数μsecと短いため、光量
の時間当りの積分値が著しく小さく化学反応への悪影響
が生じない。このように、キセノンフラッシュランプを
用いることにより、ハロゲンタングステンランプの欠点
を全て解決することができる。
Therefore, xenon flash lamps are attracting attention as a new light source to replace the halogen tungsten lamps. A xenon flash lamp emits high-intensity light using a pulse lighting method, as shown in Figure 1 C.
As shown in FIG. 2, the amount of light from a xenon flash lamp in the ultraviolet region reaches approximately 1000 times the amount of light from the tungsten halogen lamp. Furthermore, since the flash time of the xenon flash lamp is as short as several microseconds, the integral value of the amount of light per unit of time is extremely small and does not adversely affect the chemical reaction. Thus, by using a xenon flash lamp, all the drawbacks of tungsten halogen lamps can be overcome.

しかしながら、キセノンランプはその発光点がばらつく
という欠点を有し、パルス点灯方式によるキセノンフラ
ッシュランプにあってはさらにそのばらつきが大きく光
源として不安定である欠点を有する。
However, the xenon lamp has the disadvantage that its light emitting point varies, and the xenon flash lamp using the pulse lighting method has the disadvantage that the variation is even greater and it is unstable as a light source.

゛ 従って、光量9発熱の面で理想的なキレノンフラッ
シュランプは、光源としての安定性に欠けるという唯一
の欠点のために、吸光度測定装置に採用されていないの
が現状である゛。
Therefore, the xyrenon flash lamp, which is ideal in terms of light intensity and heat generation, is currently not used in absorbance measurement devices because of its only drawback of lacking stability as a light source.

[発明の目的] この発明は前記事情に鑑みて成されたものであり、キセ
ノンフラッシュランプを光源として用いながらも高精痕
の吸光分析を行うことのできる吸光度測定装置を提供す
ることを目的とするものである。
[Purpose of the Invention] This invention has been made in view of the above circumstances, and an object thereof is to provide an absorbance measurement device that can perform absorption analysis of highly refined marks while using a xenon flash lamp as a light source. It is something to do.

[発明の概要1 前記目的を達成するためのこの発明の概要は、呈色反応
後の試料を吸光度分析する吸光度測定装置において、高
輝度の光をパルス状に発するキセノンフラッシュランプ
と、該キセノンフラッシュランプが発する光を均一化す
□る拡散板と、同一試料につき前記キセノンフラッシュ
ランプにパルス高電圧を印加する高圧N8Iと、前記キ
セノンフラッシュランプが発する光を前記試料を介して
入射すると共に、これを分光する分光素子と、該分光素
子からの単色光を検出する検出器と、該検出器の出力を
入力して複数波長差の吸光度値を算出する演算手段とを
有することを特徴とするものである。
[Summary of the Invention 1] A summary of the present invention for achieving the above-mentioned object is to provide a xenon flash lamp that emits high-brightness light in a pulsed manner, and a a diffusion plate that homogenizes the light emitted by the lamp; a high-voltage N8I that applies a high pulse voltage to the xenon flash lamp for the same sample; and a high voltage N8I that applies a pulse high voltage to the xenon flash lamp for the same sample; It is characterized by having a spectroscopic element that performs spectroscopy, a detector that detects monochromatic light from the spectroscopic element, and a calculation means that inputs the output of the detector and calculates the absorbance value of a plurality of wavelength differences. be.

[発明の実施例] 以下、この発明・の一実施例を図面を参照して説明する
[Embodiment of the Invention] An embodiment of the present invention will be described below with reference to the drawings.

第2図は、この発明の一実施例である吸光度測定装置の
ブロックダイヤグラムである。第2図において、キセノ
ンフラッシュランプ1はパルス点灯方式によって高輝度
の光を発する。拡散板2は前記キセノンフラッシュラン
プ1に近接して設けられて、キセノンフラッシュランプ
1から発せられる光を振動の少ない均一な光となるよう
に動く。
FIG. 2 is a block diagram of an absorbance measuring device that is an embodiment of the present invention. In FIG. 2, a xenon flash lamp 1 emits high-intensity light using a pulse lighting method. The diffuser plate 2 is provided close to the xenon flash lamp 1 and moves so that the light emitted from the xenon flash lamp 1 becomes uniform light with little vibration.

高圧電源10はCPU11の制御に基づいて同一試料に
対して前記キセノンフラッシュランプ1をパルス点灯さ
せるごとく高電圧を印加する集光レンズ3aは前記キセ
ノンフラッシュランプ1の光を集光して反応管4に導く
。反応管4内の試料の透過光は集光レンズ3b、スリン
1〜5を介して例えば回折格子6に導かれる。回折格子
6は前記透過光を複数波長例えば2波艮λ1.λ2に分
光する。検出器7は波長λ1.λ2の単色光を検出する
。増幅器8は前記検出器7の出力を入力し、これを増幅
して出力する。演算手段9は、前記増幅器8の出力する
波長λ1.λ2について透過光II(λ1)、1(λ2
)を入力して2波長差の吸光度値を求める。
The high voltage power supply 10 applies a high voltage to the same sample under the control of the CPU 11 so as to pulse-light the xenon flash lamp 1.The condensing lens 3a collects the light from the xenon flash lamp 1 into the reaction tube 4. lead to. The transmitted light of the sample in the reaction tube 4 is guided to, for example, a diffraction grating 6 via a condenser lens 3b and Surins 1 to 5. The diffraction grating 6 converts the transmitted light into multiple wavelengths, for example, two wavelengths λ1. Split into λ2. Detector 7 detects wavelength λ1. Detect monochromatic light of λ2. The amplifier 8 inputs the output of the detector 7, amplifies it, and outputs it. The calculation means 9 calculates the wavelength λ1 . Transmitted light II(λ1), 1(λ2
) to find the absorbance value of the difference between the two wavelengths.

以上のように構成された吸光度測定装置の作用について
説明する。
The operation of the absorbance measuring device configured as above will be explained.

反応管4内の同一試料に対して、キセノンフラッシュラ
ンプ1からパルス状の光が発せられると、このパルス状
の光は拡散板2によって均一化された後反応管4内の試
料を透過して順次回折格子6に入射する。この回折格子
6で波長λ1.λ2に分光された光は検出器7で検出さ
れ、検出器7の出力は増幅器8を介して演算手段9に入
力する。
When pulsed light is emitted from the xenon flash lamp 1 to the same sample in the reaction tube 4, this pulsed light is made uniform by the diffusion plate 2 and then passes through the sample in the reaction tube 4. The light is incident on the sequential order diffraction grating 6. This diffraction grating 6 has a wavelength λ1. The light separated into wavelengths of λ2 is detected by a detector 7, and the output of the detector 7 is inputted to an arithmetic means 9 via an amplifier 8.

これにより演算手段9は2波長λ1.λ2の差の吸光度
値を求める。
As a result, the calculating means 9 calculates two wavelengths λ1. Obtain the absorbance value of the difference in λ2.

フラッシュランプ1に近接して設けた場合について説明
したが、キセノンフラッシュランプ1の出射面に接触し
て設けるようにしても良い。
Although the case has been described in which it is provided close to the flash lamp 1, it may also be provided in contact with the emission surface of the xenon flash lamp 1.

[発明の効果] 以上説明したように、この発明によると、キセノンフラ
ッシュランプを光源として用いながらも、拡散板のよう
な簡単な光学材料を用いることにより安定した光源とな
すことができるので高精度の吸光分析を行う吸光度測定
装置を提供することができる。従って、吸光度測定装置
の光源にキセノンフラッシュランプを採用した場合の利
益即ち紫外領域における所定の光量の確保、試料の光分
解の防止及び充填率の低い光ファイバの採用等の利益を
もたらすことができる。
[Effects of the Invention] As explained above, according to the present invention, even though a xenon flash lamp is used as a light source, it can be made into a stable light source by using a simple optical material such as a diffuser plate, resulting in high precision. It is possible to provide an absorbance measurement device that performs absorption analysis. Therefore, the advantages of using a xenon flash lamp as the light source of the absorbance measurement device include securing a predetermined amount of light in the ultraviolet region, preventing photodecomposition of the sample, and using an optical fiber with a low filling rate. .

【図面の簡単な説明】[Brief explanation of drawings]

第1図は各波長に対するハロゲンタングステンランプと
キセノンフラッシュランプとの光量及び半導体検出器の
感度を示す特性図、第2図はこの発明の一実施例である
吸光度測定装置のブロックダイヤグラムである。 1・・・・・・キセノンフラッシュランプ、2・・・・
・・拡散板、4・・・・・・反応管、6・・・・・・分
光素子、7・・・・・・検出器、9・・・・・・演算手
段、10・・・・・・高圧電源。 代理人 弁理士 則近憲佑(はが1名)込(m7n−)
FIG. 1 is a characteristic diagram showing the light intensity of a halogen tungsten lamp and a xenon flash lamp and the sensitivity of a semiconductor detector for each wavelength, and FIG. 2 is a block diagram of an absorbance measuring device which is an embodiment of the present invention. 1...Xenon flash lamp, 2...
... Diffusion plate, 4 ... Reaction tube, 6 ... Spectroscopic element, 7 ... Detector, 9 ... Calculation means, 10 ... ...High voltage power supply. Agent: Patent attorney Kensuke Norichika (1 person) included (m7n-)

Claims (1)

【特許請求の範囲】[Claims] 呈色反応後の試料を吸光度分析する吸光度測定装置にお
いて、高輝度の光をパルス状に発するキセノンフラッシ
ュランプと、該キセノンフラッシュランプが発する光を
均一化する拡散板と、同一試料につき前記キセノンフラ
ッシュランプにパルス高電圧を印加する高圧電源と、前
記キセノンフラッシュランプが発する光を前記試料を介
して入射すると共に、これを分光する分光素子と、該分
光素子からの単色光を検出する検出器と、該検出器の出
力を入力して複数波長差の吸光度値を算出する演算手段
とを有することを特徴とする吸光度測定装置。
An absorbance measurement device that analyzes the absorbance of a sample after a color reaction includes a xenon flash lamp that emits high-intensity light in a pulsed manner, a diffuser plate that homogenizes the light emitted by the xenon flash lamp, and a xenon flash for the same sample. a high-voltage power supply that applies a pulsed high voltage to the lamp; a spectroscopic element that makes light emitted by the xenon flash lamp incident through the sample and spectrally spectra it; and a detector that detects the monochromatic light from the spectroscopic element. , and a calculation means for inputting the output of the detector and calculating absorbance values for a plurality of wavelength differences.
JP4284285A 1985-03-06 1985-03-06 Absorbance measuring apparatus Pending JPS61202143A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4284285A JPS61202143A (en) 1985-03-06 1985-03-06 Absorbance measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4284285A JPS61202143A (en) 1985-03-06 1985-03-06 Absorbance measuring apparatus

Publications (1)

Publication Number Publication Date
JPS61202143A true JPS61202143A (en) 1986-09-06

Family

ID=12647245

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4284285A Pending JPS61202143A (en) 1985-03-06 1985-03-06 Absorbance measuring apparatus

Country Status (1)

Country Link
JP (1) JPS61202143A (en)

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